ES8203156A1 - Procedimiento para la deteccion en tiempo real de defectos en objetos industriales - Google Patents

Procedimiento para la deteccion en tiempo real de defectos en objetos industriales

Info

Publication number
ES8203156A1
ES8203156A1 ES498464A ES498464A ES8203156A1 ES 8203156 A1 ES8203156 A1 ES 8203156A1 ES 498464 A ES498464 A ES 498464A ES 498464 A ES498464 A ES 498464A ES 8203156 A1 ES8203156 A1 ES 8203156A1
Authority
ES
Spain
Prior art keywords
faults
image
sample
objects
real time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES498464A
Other languages
English (en)
Other versions
ES498464A0 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tasco SpA
Original Assignee
Tasco SpA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tasco SpA filed Critical Tasco SpA
Publication of ES8203156A1 publication Critical patent/ES8203156A1/es
Publication of ES498464A0 publication Critical patent/ES498464A0/es
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Image Processing (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Image Analysis (AREA)

Abstract

PROCEDIMIENTO PARA LA DETECCION Y LA INDICACION EN TIEMPO REAL DE DEFECTOS EN OBJETOS INDUSTRIALES POR MEDIO DE COMPARACION CON UNA MUESTRA. SE LEVANTA LA IMAGEN DEL OBJETO, Y DE UN NUMERO DE PUNTOS DE LA MISMA SE CONVIERTEN LAS SEÑALES ANALOGICAS DE LOS NIVELES DE LUMINOSIDAD EN SEÑALES DIGITALES CORRESPONDIENTES SEGUN UNA ESCALA DE NIVELES. SE MEMORIZAN ESTOS VALORES DIGITALES EN UNA MEMORIA DE CUADRO, PREVEYENDO LA FORMACION DE PARAMETROS CARACTERISTICOS PARA CADA IMAGEN QUE SE COMPARAN CON LOS CORRESPONDIENTES PARAMETROS LEVANTADOS SOBRE UNA IMAGEN DE MUESTRA, DESPUES DE LA CUAL SE PRODUCE UNA SEÑAL APTA PARA DISTINGUIR EL OBJETO ANALIZADO.
ES498464A 1980-01-14 1981-01-13 Procedimiento para la deteccion en tiempo real de defectos en objetos industriales Granted ES498464A0 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT19205/80A IT1129509B (it) 1980-01-14 1980-01-14 Procedimento ed apparecchiatura per il ritrovamento in tempo reale di difetti in oggetti industriali

Publications (2)

Publication Number Publication Date
ES8203156A1 true ES8203156A1 (es) 1982-03-01
ES498464A0 ES498464A0 (es) 1982-03-01

Family

ID=11155775

Family Applications (1)

Application Number Title Priority Date Filing Date
ES498464A Granted ES498464A0 (es) 1980-01-14 1981-01-13 Procedimiento para la deteccion en tiempo real de defectos en objetos industriales

Country Status (6)

Country Link
US (1) US4433385A (es)
EP (1) EP0032592A1 (es)
JP (1) JPS56107158A (es)
BR (1) BR8100229A (es)
ES (1) ES498464A0 (es)
IT (1) IT1129509B (es)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2048659A2 (es) * 1992-07-14 1994-03-16 Univ Cordoba Metodo de logicial para vision artificial en metalografia.

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JPS58106409A (ja) * 1981-12-18 1983-06-24 Seiko Instr & Electronics Ltd 部品の姿勢判別装置
EP0085380B1 (en) * 1982-01-25 1988-07-27 Hitachi, Ltd. Method for testing a joint
CH656160A5 (de) * 1982-05-18 1986-06-13 Zellweger Uster Ag Verfahren und vorrichtung zur ueberwachung von einzeladern bei verseilprozessen.
GB2133135B (en) * 1982-12-21 1986-09-10 Ferranti Plc Automatic testing equipment
DE3314465A1 (de) * 1983-04-21 1984-10-25 Robert Bosch Gmbh, 7000 Stuttgart Verfahren zur optischen oberflaechenpruefung
GB2186365B (en) * 1983-07-16 1988-05-25 Nat Res Dev Inspecting textile items
EP0136760A3 (en) * 1983-10-05 1986-04-09 Louis Vermeiren Device for cutting cross-wise textile products woven to one other
GB8415996D0 (en) * 1984-06-22 1984-07-25 Bank Of England Image model
US4697245A (en) * 1984-11-29 1987-09-29 Cbit Corporation Inspection and measuring apparatus and method
GB8508390D0 (en) * 1985-03-30 1985-05-09 Ae Plc Measurement & machining engineering components
US4690284A (en) * 1985-10-04 1987-09-01 Cochlea Corporation Method of and apparatus for inspecting objects using multiple position detectors
US4718027A (en) * 1985-10-28 1988-01-05 Halliburton Company Dynamically adjustable linear data discriminator
US4719586A (en) * 1985-11-01 1988-01-12 Moyer Process And Control Company, Inc. Manufacturing process control
DE3540100A1 (de) * 1985-11-12 1987-06-11 Mania Gmbh Verfahren zur optischen pruefung von leiterplatten
US4943930A (en) * 1986-04-18 1990-07-24 Radjy Farrokh F Method and apparatus for non-destructive evaluation of concrete
US4953100A (en) * 1986-10-03 1990-08-28 Omron Tateisi Electronics Co. Apparatus for inspecting packaged electronic device
US5159474A (en) * 1986-10-17 1992-10-27 E. I. Du Pont De Nemours And Company Transform optical processing system
US5078501A (en) * 1986-10-17 1992-01-07 E. I. Du Pont De Nemours And Company Method and apparatus for optically evaluating the conformance of unknown objects to predetermined characteristics
JP2510687B2 (ja) * 1987-08-13 1996-06-26 日本電信電話株式会社 高速欠陥検出方法および装置
FR2624608A1 (fr) * 1987-12-11 1989-06-16 Tech Bois Ameublement Centre Dispositif de detection automatique de defauts dans un lot heterogene d'objets
DE3819183A1 (de) * 1988-06-06 1989-12-07 Sick Optik Elektronik Erwin Verfahren zur fehlererkennung bei laufenden materialbahnen
US4896278A (en) * 1988-07-11 1990-01-23 Northrop Corporation Automated defect recognition system
US4882567A (en) * 1988-09-29 1989-11-21 C & K Systems, Inc. Intrusion detection system and a method therefor
JPH03260866A (ja) * 1990-03-12 1991-11-20 Ricoh Co Ltd 統計演算装置
US5210704A (en) * 1990-10-02 1993-05-11 Technology International Incorporated System for prognosis and diagnostics of failure and wearout monitoring and for prediction of life expectancy of helicopter gearboxes and other rotating equipment
US5287293A (en) * 1990-12-31 1994-02-15 Industrial Technology Research Institute Method and apparatus for inspecting the contours of a gear
DE4402338B4 (de) * 1994-01-27 2004-04-08 Heidelberger Druckmaschinen Ag Verfahren zum Steuern von geometrischen Veränderungen eines Bedruckstoffes bei einem Betriebsvorgang des Druckens und Trocknens eines Druckbilds
DE19940879A1 (de) * 1999-08-27 2001-03-08 Innomess Elektronik Gmbh Verfahren und Vorrichtung zum automatisierten Vergleich von Druckbildern an Druckmaschinen
JP4172761B2 (ja) * 2002-10-08 2008-10-29 大日本スクリーン製造株式会社 欠陥検査装置、欠陥検査方法およびプログラム
NL1025711C2 (nl) * 2004-03-12 2005-09-13 Q I Press Controls Holding B V Werkwijze en systeem voor het controleren van door een drukpers vervaardigd drukwerk.
JP4130435B2 (ja) * 2004-11-30 2008-08-06 本田技研工業株式会社 撮像装置の異常検知装置
US8131055B2 (en) * 2008-01-31 2012-03-06 Caterpillar Inc. System and method for assembly inspection
US8515675B2 (en) * 2008-04-02 2013-08-20 Bakes Hughes Incorporated Method for analyzing strain data
AT507939B1 (de) * 2009-03-10 2012-02-15 Polymer Competence Ct Leoben Gmbh Verfahren zum automatisierten nachweis eines defektes an einer oberfläche eines formteils
CN102253047B (zh) * 2011-04-27 2013-06-05 3i系统公司 太阳能硅片光致发光在线抽样检测系统及其检测方法
US9254583B2 (en) 2012-01-23 2016-02-09 Quipip, Llc Systems, methods and apparatus for providing comparative statistical information for a plurality of production facilities in a closed-loop production management system
US9836801B2 (en) 2012-01-23 2017-12-05 Quipip, Llc Systems, methods and apparatus for providing comparative statistical information in a graphical format for a plurality of markets using a closed-loop production management system
US10184928B2 (en) 2014-01-29 2019-01-22 Quipip, Llc Measuring device, systems, and methods for obtaining data relating to condition and performance of concrete mixtures
US9194855B2 (en) 2014-02-28 2015-11-24 Quipip, Llc Systems, methods and apparatus for providing to a driver of a vehicle carrying a mixture real-time information relating to a characteristic of the mixture
WO2016123228A1 (en) 2015-01-30 2016-08-04 Quipip, Llc Systems, apparatus and methods for testing and predicting the performance of concrete mixtures
US11084225B2 (en) 2018-04-02 2021-08-10 Nanotronics Imaging, Inc. Systems, methods, and media for artificial intelligence process control in additive manufacturing
US11209795B2 (en) 2019-02-28 2021-12-28 Nanotronics Imaging, Inc. Assembly error correction for assembly lines
US10481579B1 (en) * 2019-02-28 2019-11-19 Nanotronics Imaging, Inc. Dynamic training for assembly lines
CN114450135A (zh) 2019-09-10 2022-05-06 纳米电子成像有限公司 用于制造过程的系统、方法和介质
KR20220133712A (ko) * 2021-03-25 2022-10-05 현대자동차주식회사 차량의 품질 관리 시스템 및 그 방법

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GB1310572A (en) * 1970-03-09 1973-03-21 Telomex Group Ltd Computing circuits
US3876872A (en) * 1971-10-14 1975-04-08 Industrial Nucleonics Corp Process control system and method with integral-action set-point optimization using statistically-variable gain control responsive to fraction defective
JPS5425782B2 (es) * 1973-03-28 1979-08-30
US3908118A (en) * 1973-09-27 1975-09-23 California Inst Of Techn Cross correlation anomaly detection system
JPS51116255A (en) * 1975-04-07 1976-10-13 Asahi Chemical Ind Tester for yarn quality
US3996421A (en) * 1975-09-02 1976-12-07 Hughes Aircraft Company Television display utilizing local area brightness control
CH615031A5 (es) * 1976-04-30 1979-12-28 Gretag Ag
US4056716A (en) * 1976-06-30 1977-11-01 International Business Machines Corporation Defect inspection of objects such as electronic circuits
JPS54133022A (en) * 1978-04-07 1979-10-16 Hitachi Ltd Comparison and inspection system for two dimensional picture
US4320463A (en) * 1980-02-25 1982-03-16 S. Himmelstein And Company Production control system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2048659A2 (es) * 1992-07-14 1994-03-16 Univ Cordoba Metodo de logicial para vision artificial en metalografia.

Also Published As

Publication number Publication date
IT8019205A0 (it) 1980-01-14
BR8100229A (pt) 1981-08-04
EP0032592A1 (en) 1981-07-29
IT1129509B (it) 1986-06-04
US4433385A (en) 1984-02-21
ES498464A0 (es) 1982-03-01
JPS56107158A (en) 1981-08-25

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