IT8019205A0 - Procedimento ed apparecchiatura per il ritrovamento in tempo reale di difetti in oggetti industriali. - Google Patents

Procedimento ed apparecchiatura per il ritrovamento in tempo reale di difetti in oggetti industriali.

Info

Publication number
IT8019205A0
IT8019205A0 IT8019205A IT1920580A IT8019205A0 IT 8019205 A0 IT8019205 A0 IT 8019205A0 IT 8019205 A IT8019205 A IT 8019205A IT 1920580 A IT1920580 A IT 1920580A IT 8019205 A0 IT8019205 A0 IT 8019205A0
Authority
IT
Italy
Prior art keywords
defects
real
procedure
equipment
time finding
Prior art date
Application number
IT8019205A
Other languages
English (en)
Other versions
IT1129509B (it
Inventor
De Gasperi Mario Marco
Racciu Antonio
Nari Dario
Original Assignee
Tasco Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tasco Spa filed Critical Tasco Spa
Priority to IT19205/80A priority Critical patent/IT1129509B/it
Publication of IT8019205A0 publication Critical patent/IT8019205A0/it
Priority to EP80108223A priority patent/EP0032592A1/en
Priority to US06/224,665 priority patent/US4433385A/en
Priority to ES498464A priority patent/ES498464A0/es
Priority to JP457381A priority patent/JPS56107158A/ja
Priority to BR8100229A priority patent/BR8100229A/pt
Application granted granted Critical
Publication of IT1129509B publication Critical patent/IT1129509B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Image Processing (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Image Analysis (AREA)
IT19205/80A 1980-01-14 1980-01-14 Procedimento ed apparecchiatura per il ritrovamento in tempo reale di difetti in oggetti industriali IT1129509B (it)

Priority Applications (6)

Application Number Priority Date Filing Date Title
IT19205/80A IT1129509B (it) 1980-01-14 1980-01-14 Procedimento ed apparecchiatura per il ritrovamento in tempo reale di difetti in oggetti industriali
EP80108223A EP0032592A1 (en) 1980-01-14 1980-12-27 Method and apparatus for real time detection of faults in industrial objects
US06/224,665 US4433385A (en) 1980-01-14 1981-01-13 Method and apparatus for real time detection of faults in industrial objects
ES498464A ES498464A0 (es) 1980-01-14 1981-01-13 Procedimiento para la deteccion en tiempo real de defectos en objetos industriales
JP457381A JPS56107158A (en) 1980-01-14 1981-01-13 Method and device for real in time detection and signalizing of defects in industrial products
BR8100229A BR8100229A (pt) 1980-01-14 1981-01-14 Metodo e equipamento para a localizacao automatica de falhas em artigos industriais

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT19205/80A IT1129509B (it) 1980-01-14 1980-01-14 Procedimento ed apparecchiatura per il ritrovamento in tempo reale di difetti in oggetti industriali

Publications (2)

Publication Number Publication Date
IT8019205A0 true IT8019205A0 (it) 1980-01-14
IT1129509B IT1129509B (it) 1986-06-04

Family

ID=11155775

Family Applications (1)

Application Number Title Priority Date Filing Date
IT19205/80A IT1129509B (it) 1980-01-14 1980-01-14 Procedimento ed apparecchiatura per il ritrovamento in tempo reale di difetti in oggetti industriali

Country Status (6)

Country Link
US (1) US4433385A (it)
EP (1) EP0032592A1 (it)
JP (1) JPS56107158A (it)
BR (1) BR8100229A (it)
ES (1) ES498464A0 (it)
IT (1) IT1129509B (it)

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GB2186365B (en) * 1983-07-16 1988-05-25 Nat Res Dev Inspecting textile items
EP0136760A3 (en) * 1983-10-05 1986-04-09 Louis Vermeiren Device for cutting cross-wise textile products woven to one other
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US4697245A (en) * 1984-11-29 1987-09-29 Cbit Corporation Inspection and measuring apparatus and method
GB8508390D0 (en) * 1985-03-30 1985-05-09 Ae Plc Measurement & machining engineering components
US4690284A (en) * 1985-10-04 1987-09-01 Cochlea Corporation Method of and apparatus for inspecting objects using multiple position detectors
US4718027A (en) * 1985-10-28 1988-01-05 Halliburton Company Dynamically adjustable linear data discriminator
US4719586A (en) * 1985-11-01 1988-01-12 Moyer Process And Control Company, Inc. Manufacturing process control
DE3540100A1 (de) * 1985-11-12 1987-06-11 Mania Gmbh Verfahren zur optischen pruefung von leiterplatten
US4943930A (en) * 1986-04-18 1990-07-24 Radjy Farrokh F Method and apparatus for non-destructive evaluation of concrete
EP0263473B1 (en) * 1986-10-03 1994-07-27 Omron Tateisi Electronics Co. Apparatus for inspecting packaged electronic device
US5078501A (en) * 1986-10-17 1992-01-07 E. I. Du Pont De Nemours And Company Method and apparatus for optically evaluating the conformance of unknown objects to predetermined characteristics
US5159474A (en) * 1986-10-17 1992-10-27 E. I. Du Pont De Nemours And Company Transform optical processing system
JP2510687B2 (ja) * 1987-08-13 1996-06-26 日本電信電話株式会社 高速欠陥検出方法および装置
FR2624608A1 (fr) * 1987-12-11 1989-06-16 Tech Bois Ameublement Centre Dispositif de detection automatique de defauts dans un lot heterogene d'objets
DE3819183A1 (de) * 1988-06-06 1989-12-07 Sick Optik Elektronik Erwin Verfahren zur fehlererkennung bei laufenden materialbahnen
US4896278A (en) * 1988-07-11 1990-01-23 Northrop Corporation Automated defect recognition system
US4882567A (en) * 1988-09-29 1989-11-21 C & K Systems, Inc. Intrusion detection system and a method therefor
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US5210704A (en) * 1990-10-02 1993-05-11 Technology International Incorporated System for prognosis and diagnostics of failure and wearout monitoring and for prediction of life expectancy of helicopter gearboxes and other rotating equipment
US5287293A (en) * 1990-12-31 1994-02-15 Industrial Technology Research Institute Method and apparatus for inspecting the contours of a gear
ES2048659B1 (es) * 1992-07-14 1996-12-16 Univ Cordoba Metodo de logicial para vision artificial en metalografia.
DE4402338B4 (de) * 1994-01-27 2004-04-08 Heidelberger Druckmaschinen Ag Verfahren zum Steuern von geometrischen Veränderungen eines Bedruckstoffes bei einem Betriebsvorgang des Druckens und Trocknens eines Druckbilds
DE19940879A1 (de) * 1999-08-27 2001-03-08 Innomess Elektronik Gmbh Verfahren und Vorrichtung zum automatisierten Vergleich von Druckbildern an Druckmaschinen
JP4172761B2 (ja) * 2002-10-08 2008-10-29 大日本スクリーン製造株式会社 欠陥検査装置、欠陥検査方法およびプログラム
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JP4130435B2 (ja) * 2004-11-30 2008-08-06 本田技研工業株式会社 撮像装置の異常検知装置
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US8515675B2 (en) * 2008-04-02 2013-08-20 Bakes Hughes Incorporated Method for analyzing strain data
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CN102253047B (zh) * 2011-04-27 2013-06-05 3i系统公司 太阳能硅片光致发光在线抽样检测系统及其检测方法
US9254583B2 (en) 2012-01-23 2016-02-09 Quipip, Llc Systems, methods and apparatus for providing comparative statistical information for a plurality of production facilities in a closed-loop production management system
US9836801B2 (en) 2012-01-23 2017-12-05 Quipip, Llc Systems, methods and apparatus for providing comparative statistical information in a graphical format for a plurality of markets using a closed-loop production management system
US10184928B2 (en) 2014-01-29 2019-01-22 Quipip, Llc Measuring device, systems, and methods for obtaining data relating to condition and performance of concrete mixtures
US9194855B2 (en) 2014-02-28 2015-11-24 Quipip, Llc Systems, methods and apparatus for providing to a driver of a vehicle carrying a mixture real-time information relating to a characteristic of the mixture
US9766221B2 (en) 2015-01-30 2017-09-19 Quipip, Llc Systems, apparatus and methods for testing and predicting the performance of concrete mixtures
US11084225B2 (en) 2018-04-02 2021-08-10 Nanotronics Imaging, Inc. Systems, methods, and media for artificial intelligence process control in additive manufacturing
US11209795B2 (en) 2019-02-28 2021-12-28 Nanotronics Imaging, Inc. Assembly error correction for assembly lines
US10481579B1 (en) * 2019-02-28 2019-11-19 Nanotronics Imaging, Inc. Dynamic training for assembly lines
US11117328B2 (en) 2019-09-10 2021-09-14 Nanotronics Imaging, Inc. Systems, methods, and media for manufacturing processes
KR20220133712A (ko) * 2021-03-25 2022-10-05 현대자동차주식회사 차량의 품질 관리 시스템 및 그 방법

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US3996421A (en) * 1975-09-02 1976-12-07 Hughes Aircraft Company Television display utilizing local area brightness control
CH615031A5 (it) * 1976-04-30 1979-12-28 Gretag Ag
US4056716A (en) * 1976-06-30 1977-11-01 International Business Machines Corporation Defect inspection of objects such as electronic circuits
JPS54133022A (en) * 1978-04-07 1979-10-16 Hitachi Ltd Comparison and inspection system for two dimensional picture
US4320463A (en) * 1980-02-25 1982-03-16 S. Himmelstein And Company Production control system

Also Published As

Publication number Publication date
BR8100229A (pt) 1981-08-04
IT1129509B (it) 1986-06-04
JPS56107158A (en) 1981-08-25
ES8203156A1 (es) 1982-03-01
US4433385A (en) 1984-02-21
ES498464A0 (es) 1982-03-01
EP0032592A1 (en) 1981-07-29

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