ES8101782A1 - Detector de radiaciones de estado solido - Google Patents

Detector de radiaciones de estado solido

Info

Publication number
ES8101782A1
ES8101782A1 ES486947A ES486947A ES8101782A1 ES 8101782 A1 ES8101782 A1 ES 8101782A1 ES 486947 A ES486947 A ES 486947A ES 486947 A ES486947 A ES 486947A ES 8101782 A1 ES8101782 A1 ES 8101782A1
Authority
ES
Spain
Prior art keywords
layer
nickel
thickness
selenium
solid state
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES486947A
Other languages
English (en)
Spanish (es)
Other versions
ES486947A0 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of ES486947A0 publication Critical patent/ES486947A0/es
Publication of ES8101782A1 publication Critical patent/ES8101782A1/es
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914Measurement of spatial distribution of radiation
    • G01T1/2921Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/29Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to radiation having very short wavelengths, e.g. X-rays, gamma-rays or corpuscular radiation
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/301Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices being sensitive to very short wavelength, e.g. being sensitive to X-rays, gamma-rays or corpuscular radiation
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • H10F39/191Photoconductor image sensors

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Light Receiving Elements (AREA)
  • Measurement Of Radiation (AREA)
ES486947A 1978-12-14 1979-12-14 Detector de radiaciones de estado solido Expired ES8101782A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/969,545 US4233514A (en) 1978-12-14 1978-12-14 Solid state radiation detector and arrays thereof

Publications (2)

Publication Number Publication Date
ES486947A0 ES486947A0 (es) 1980-12-16
ES8101782A1 true ES8101782A1 (es) 1980-12-16

Family

ID=25515670

Family Applications (2)

Application Number Title Priority Date Filing Date
ES486947A Expired ES8101782A1 (es) 1978-12-14 1979-12-14 Detector de radiaciones de estado solido
ES494233A Granted ES494233A0 (es) 1978-12-14 1980-08-13 Conjunto de detectores de radiacion de estado solido

Family Applications After (1)

Application Number Title Priority Date Filing Date
ES494233A Granted ES494233A0 (es) 1978-12-14 1980-08-13 Conjunto de detectores de radiacion de estado solido

Country Status (6)

Country Link
US (1) US4233514A (https=)
JP (1) JPS55104776A (https=)
DE (1) DE2949862A1 (https=)
ES (2) ES8101782A1 (https=)
FR (1) FR2444341B1 (https=)
GB (1) GB2037077B (https=)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5670673A (en) * 1979-11-14 1981-06-12 Hitachi Ltd Photoelectric converter
US4363969A (en) * 1980-07-16 1982-12-14 Ong Poen S Light switched segmented tomography detector
JPS58117478A (ja) * 1982-01-05 1983-07-13 Fuji Xerox Co Ltd 放射線ctスキャナ装置用放射線センサアレイ
JPS58182572A (ja) * 1982-04-20 1983-10-25 Toshiba Corp 二次元放射線検出器
JPS6243586A (ja) * 1985-08-21 1987-02-25 Nippon Mining Co Ltd 放射線検出器
FR2601499B1 (fr) * 1986-07-08 1988-09-30 Thomson Csf Detecteur d'image a photoconducteur a memoire
FR2605167B1 (fr) * 1986-10-10 1989-03-31 Thomson Csf Capteur d'images electrostatique
KR890702257A (ko) * 1987-10-15 1989-12-23 원본 미기재 저 노이즈 광검출 및 그것을 위한 광 검출기
DE4227096A1 (de) * 1992-08-17 1994-02-24 Philips Patentverwaltung Röntgenbilddetektor
DE69637638D1 (de) * 1995-09-12 2008-09-25 Philips Intellectual Property Röntgenbildsensor
JP3805100B2 (ja) 1997-04-10 2006-08-02 キヤノン株式会社 光電変換装置
JP4059463B2 (ja) * 1998-12-10 2008-03-12 株式会社島津製作所 放射線検出装置
JP3832615B2 (ja) * 1999-08-26 2006-10-11 株式会社島津製作所 放射線検出装置
JP4225531B2 (ja) * 2001-02-07 2009-02-18 京セミ株式会社 放射線検出器および放射線検出素子
US7138290B2 (en) * 2004-12-03 2006-11-21 Micron Technology, Inc. Methods of depositing silver onto a metal selenide-comprising surface and methods of depositing silver onto a selenium-comprising surface
US7507512B2 (en) * 2005-11-29 2009-03-24 General Electric Company Particle-in-binder X-ray sensitive coating using polyimide binder
WO2013082721A1 (en) 2011-12-09 2013-06-13 Karim Karim S Radiation detector system and method of manufacture
EP3322342B1 (en) 2015-07-14 2023-11-22 DOSE Smart Imaging Apparatus for radiation detection in a digital imaging system
US9698193B1 (en) 2016-09-15 2017-07-04 Ka Imaging Inc. Multi-sensor pixel architecture for use in a digital imaging system
CN110132326B (zh) * 2019-05-16 2021-08-17 京东方科技集团股份有限公司 Msm型探测器及其偏置电压调整方法和装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2706792A (en) * 1951-05-25 1955-04-19 Gen Electric X-ray detection
US2706791A (en) * 1951-06-18 1955-04-19 Gen Electric Semi-conductor
US3602721A (en) * 1967-11-20 1971-08-31 Malsushita Electric Ind Co Ltd Photoelectric device with enhanced photoconductive sensitivity and storage effect of input radiation
BE758451A (fr) * 1969-11-07 1971-04-16 Siemens Ag Detecteur pour le comptage de particules nucleaires et de rayons x"
DE2107928A1 (en) * 1971-02-19 1972-10-05 Siemens Ag Radiation-sensitive resistance cell - contg selenium layer as sensitive element
DE2141934A1 (de) * 1971-08-20 1973-03-01 Siemens Ag Strahlenmessgeraet
DE2361635A1 (de) * 1973-12-11 1975-06-12 Eichinger Peter Halbleiter-gammastrahlungsdetektor
US4085327A (en) * 1977-01-14 1978-04-18 General Electric Company Direct charge readout electron radiography apparatus with improved signal-to-noise ratio
GB1559664A (en) * 1977-02-17 1980-01-23 Tokyo Shibaura Electric Co Semiconductor radiation detector

Also Published As

Publication number Publication date
JPS6257954B2 (https=) 1987-12-03
ES486947A0 (es) 1980-12-16
ES8105482A1 (es) 1981-05-16
JPS55104776A (en) 1980-08-11
FR2444341B1 (fr) 1985-10-04
DE2949862A1 (de) 1980-07-03
GB2037077B (en) 1983-04-13
US4233514A (en) 1980-11-11
GB2037077A (en) 1980-07-02
FR2444341A1 (fr) 1980-07-11
ES494233A0 (es) 1981-05-16

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