ES483234A1 - Una disposicion para determinar la longitud de registros de desplazamiento arbitrarios - Google Patents
Una disposicion para determinar la longitud de registros de desplazamiento arbitrariosInfo
- Publication number
- ES483234A1 ES483234A1 ES483234A ES483234A ES483234A1 ES 483234 A1 ES483234 A1 ES 483234A1 ES 483234 A ES483234 A ES 483234A ES 483234 A ES483234 A ES 483234A ES 483234 A1 ES483234 A1 ES 483234A1
- Authority
- ES
- Spain
- Prior art keywords
- length
- shift
- test object
- test
- shift register
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318522—Test of Sequential circuits
- G01R31/31853—Test of registers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C19/00—Digital stores in which the information is moved stepwise, e.g. shift registers
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Shift Register Type Memory (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Communication Control (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Image Processing (AREA)
- Automotive Seat Belt Assembly (AREA)
- Image Analysis (AREA)
- Cash Registers Or Receiving Machines (AREA)
Abstract
Una disposición para determinar la longitud Lx de registros de desplazamiento arbitrarios (objetos de prueba) que no excedan de una longitud máxima predeterminada Lmáx, caracterizada por las siguientes propiedades: una disposición conectada a la entrada del objeto de prueba para generar un patrón de desplazamiento de prueba de la longitud Lmáx+K, siendo K >= 2, la cual consiste en una configuración de bitios definida con una transición de datos definida en su extremo que mira hacia el objeto de prueba y que es desplazado a través del objeto de prueba; una memoria de la longitud Lmáx+K, la cual está conectada a la salida del objeto de prueba y que, al ser desplazado el patrón de desplazamiento, acomoda la información de la longitud Lx del objeto de prueba y la parte Lmáx+K-Lx del patrón de desplazamiento de prueba, y un campo de presentación, cada uno de cuyos campos individuales está asociado permanentemente con una célula de memoria de la memoria, indicando el contenido de dicha célula, demodo que se puede determinar la transición de datos y, por consiguiente, el final y la longitud Lx del objeto de prueba.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE2839950A DE2839950B1 (de) | 1978-09-14 | 1978-09-14 | Einrichtung zur Feststellung der Laenge beliebiger Schieberegister |
Publications (1)
Publication Number | Publication Date |
---|---|
ES483234A1 true ES483234A1 (es) | 1980-04-16 |
Family
ID=6049405
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES483234A Expired ES483234A1 (es) | 1978-09-14 | 1979-08-08 | Una disposicion para determinar la longitud de registros de desplazamiento arbitrarios |
Country Status (11)
Country | Link |
---|---|
US (1) | US4283620A (es) |
EP (1) | EP0009099B1 (es) |
JP (1) | JPS5542391A (es) |
AT (1) | ATE1079T1 (es) |
AU (1) | AU530376B2 (es) |
BR (1) | BR7905863A (es) |
CA (1) | CA1125913A (es) |
DD (1) | DD145972A5 (es) |
DE (2) | DE2839950B1 (es) |
ES (1) | ES483234A1 (es) |
IT (1) | IT1165293B (es) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4941124A (en) * | 1982-01-25 | 1990-07-10 | Skinner Jr James T | Text comparator with counter shift register |
US4667339A (en) * | 1983-12-05 | 1987-05-19 | Texas Instruments Incorporated | Level sensitive latch stage |
EP0151653B1 (fr) * | 1983-12-15 | 1987-09-16 | International Business Machines Corporation | Dispositif de sérialisation/désérialisation de configuration de bits de longueur variable |
JPS6110999U (ja) * | 1984-06-27 | 1986-01-22 | 株式会社 徳田製作所 | 油拡散真空ポンプ |
US4682330A (en) * | 1985-10-11 | 1987-07-21 | International Business Machines Corporation | Hierarchical test system architecture |
US4855681A (en) * | 1987-06-08 | 1989-08-08 | International Business Machines Corporation | Timing generator for generating a multiplicty of timing signals having selectable pulse positions |
US5195055A (en) * | 1987-11-30 | 1993-03-16 | Mitsubishi Denki Kabushiki Kaisha | Serial data input circuit for the shifting-in of variable length data |
US6654920B1 (en) * | 1999-12-20 | 2003-11-25 | Texas Instruments Incorporated | LBIST controller circuits, systems, and methods with automated maximum scan channel length |
US6647518B1 (en) * | 2000-04-28 | 2003-11-11 | Conexant Systems, Inc. | Methods and apparatus for estimating a bit error rate for a communication system |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3398403A (en) * | 1958-04-21 | 1968-08-20 | Bell Telephone Labor Inc | Data processing circuit |
US3805152A (en) * | 1971-08-04 | 1974-04-16 | Ibm | Recirculating testing methods and apparatus |
US3815025A (en) * | 1971-10-18 | 1974-06-04 | Ibm | Large-scale integrated circuit testing structure |
US3790888A (en) * | 1972-10-06 | 1974-02-05 | Gen Electric | Lag adjustment means for a watthour meter |
FR2330014A1 (fr) * | 1973-05-11 | 1977-05-27 | Ibm France | Procede de test de bloc de circuits logiques integres et blocs en faisant application |
US3987311A (en) * | 1975-04-25 | 1976-10-19 | Xerox Corporation | Shift register utilizing amorphous semiconductor threshold switches |
US4001673A (en) * | 1975-06-30 | 1977-01-04 | International Business Machines Corporation | Method of testing and repairing magnetic bubble domain chip |
US4099048A (en) * | 1976-11-09 | 1978-07-04 | Westinghouse Electric Corp. | Count logic circuit |
-
1978
- 1978-09-14 DE DE2839950A patent/DE2839950B1/de active Granted
-
1979
- 1979-07-02 US US06/054,327 patent/US4283620A/en not_active Expired - Lifetime
- 1979-07-31 EP EP79102720A patent/EP0009099B1/de not_active Expired
- 1979-07-31 AT AT79102720T patent/ATE1079T1/de active
- 1979-07-31 DE DE7979102720T patent/DE2962897D1/de not_active Expired
- 1979-08-07 CA CA333,248A patent/CA1125913A/en not_active Expired
- 1979-08-08 ES ES483234A patent/ES483234A1/es not_active Expired
- 1979-08-29 AU AU50395/79A patent/AU530376B2/en not_active Ceased
- 1979-08-29 JP JP10924979A patent/JPS5542391A/ja active Granted
- 1979-08-30 IT IT25365/79A patent/IT1165293B/it active
- 1979-09-10 DD DD79215444A patent/DD145972A5/de unknown
- 1979-09-13 BR BR7905863A patent/BR7905863A/pt not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
IT7925365A0 (it) | 1979-08-30 |
AU530376B2 (en) | 1983-07-14 |
DE2839950C2 (es) | 1980-07-24 |
DE2962897D1 (en) | 1982-07-08 |
EP0009099A3 (en) | 1980-09-17 |
CA1125913A (en) | 1982-06-15 |
JPS5745000B2 (es) | 1982-09-25 |
EP0009099A2 (de) | 1980-04-02 |
DE2839950B1 (de) | 1979-10-25 |
AU5039579A (en) | 1980-03-20 |
US4283620A (en) | 1981-08-11 |
EP0009099B1 (de) | 1982-05-19 |
JPS5542391A (en) | 1980-03-25 |
ATE1079T1 (de) | 1982-06-15 |
DD145972A5 (de) | 1981-01-14 |
BR7905863A (pt) | 1980-05-27 |
IT1165293B (it) | 1987-04-22 |
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