IT7925365A0 - Dispositivo per determinare la lunghezza di registri di spostamento. - Google Patents

Dispositivo per determinare la lunghezza di registri di spostamento.

Info

Publication number
IT7925365A0
IT7925365A0 IT7925365A IT2536579A IT7925365A0 IT 7925365 A0 IT7925365 A0 IT 7925365A0 IT 7925365 A IT7925365 A IT 7925365A IT 2536579 A IT2536579 A IT 2536579A IT 7925365 A0 IT7925365 A0 IT 7925365A0
Authority
IT
Italy
Prior art keywords
determining
length
displacement registers
registers
displacement
Prior art date
Application number
IT7925365A
Other languages
English (en)
Other versions
IT1165293B (it
Inventor
Heinz Drescher
Heinrich Imbusch
Hans Hermann Lampe
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of IT7925365A0 publication Critical patent/IT7925365A0/it
Application granted granted Critical
Publication of IT1165293B publication Critical patent/IT1165293B/it

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3185Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318522Test of Sequential circuits
    • G01R31/31853Test of registers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C19/00Digital stores in which the information is moved stepwise, e.g. shift registers
IT25365/79A 1978-09-14 1979-08-30 Dispositivo per determinare la lunghezza di registri di spostamento IT1165293B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2839950A DE2839950B1 (de) 1978-09-14 1978-09-14 Einrichtung zur Feststellung der Laenge beliebiger Schieberegister

Publications (2)

Publication Number Publication Date
IT7925365A0 true IT7925365A0 (it) 1979-08-30
IT1165293B IT1165293B (it) 1987-04-22

Family

ID=6049405

Family Applications (1)

Application Number Title Priority Date Filing Date
IT25365/79A IT1165293B (it) 1978-09-14 1979-08-30 Dispositivo per determinare la lunghezza di registri di spostamento

Country Status (11)

Country Link
US (1) US4283620A (it)
EP (1) EP0009099B1 (it)
JP (1) JPS5542391A (it)
AT (1) ATE1079T1 (it)
AU (1) AU530376B2 (it)
BR (1) BR7905863A (it)
CA (1) CA1125913A (it)
DD (1) DD145972A5 (it)
DE (2) DE2839950B1 (it)
ES (1) ES483234A1 (it)
IT (1) IT1165293B (it)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4941124A (en) * 1982-01-25 1990-07-10 Skinner Jr James T Text comparator with counter shift register
US4667339A (en) * 1983-12-05 1987-05-19 Texas Instruments Incorporated Level sensitive latch stage
EP0151653B1 (fr) * 1983-12-15 1987-09-16 International Business Machines Corporation Dispositif de sérialisation/désérialisation de configuration de bits de longueur variable
JPS6110999U (ja) * 1984-06-27 1986-01-22 株式会社 徳田製作所 油拡散真空ポンプ
US4682330A (en) * 1985-10-11 1987-07-21 International Business Machines Corporation Hierarchical test system architecture
US4855681A (en) * 1987-06-08 1989-08-08 International Business Machines Corporation Timing generator for generating a multiplicty of timing signals having selectable pulse positions
US5195055A (en) * 1987-11-30 1993-03-16 Mitsubishi Denki Kabushiki Kaisha Serial data input circuit for the shifting-in of variable length data
US6654920B1 (en) * 1999-12-20 2003-11-25 Texas Instruments Incorporated LBIST controller circuits, systems, and methods with automated maximum scan channel length
US6647518B1 (en) * 2000-04-28 2003-11-11 Conexant Systems, Inc. Methods and apparatus for estimating a bit error rate for a communication system

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3398403A (en) * 1958-04-21 1968-08-20 Bell Telephone Labor Inc Data processing circuit
US3805152A (en) * 1971-08-04 1974-04-16 Ibm Recirculating testing methods and apparatus
US3815025A (en) * 1971-10-18 1974-06-04 Ibm Large-scale integrated circuit testing structure
US3790888A (en) * 1972-10-06 1974-02-05 Gen Electric Lag adjustment means for a watthour meter
FR2330014A1 (fr) * 1973-05-11 1977-05-27 Ibm France Procede de test de bloc de circuits logiques integres et blocs en faisant application
US3987311A (en) * 1975-04-25 1976-10-19 Xerox Corporation Shift register utilizing amorphous semiconductor threshold switches
US4001673A (en) * 1975-06-30 1977-01-04 International Business Machines Corporation Method of testing and repairing magnetic bubble domain chip
US4099048A (en) * 1976-11-09 1978-07-04 Westinghouse Electric Corp. Count logic circuit

Also Published As

Publication number Publication date
EP0009099B1 (de) 1982-05-19
DE2839950C2 (it) 1980-07-24
IT1165293B (it) 1987-04-22
DE2839950B1 (de) 1979-10-25
ATE1079T1 (de) 1982-06-15
JPS5745000B2 (it) 1982-09-25
EP0009099A3 (en) 1980-09-17
DD145972A5 (de) 1981-01-14
US4283620A (en) 1981-08-11
AU530376B2 (en) 1983-07-14
EP0009099A2 (de) 1980-04-02
BR7905863A (pt) 1980-05-27
CA1125913A (en) 1982-06-15
ES483234A1 (es) 1980-04-16
DE2962897D1 (en) 1982-07-08
AU5039579A (en) 1980-03-20
JPS5542391A (en) 1980-03-25

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