ES8401807A1 - Conjunto sistematico de exploracion para un registro de desplazamiento. - Google Patents
Conjunto sistematico de exploracion para un registro de desplazamiento.Info
- Publication number
- ES8401807A1 ES8401807A1 ES518009A ES518009A ES8401807A1 ES 8401807 A1 ES8401807 A1 ES 8401807A1 ES 518009 A ES518009 A ES 518009A ES 518009 A ES518009 A ES 518009A ES 8401807 A1 ES8401807 A1 ES 8401807A1
- Authority
- ES
- Spain
- Prior art keywords
- counter
- shift register
- scan
- operator
- constant
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318555—Control logic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318558—Addressing or selecting of subparts of the device under test
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Complex Calculations (AREA)
Abstract
CONJUNTO SISTEMATICO DE EXPLORACION PARA UN REGISTRO DE DESPLAZAMIENTO, ESPECIALMENTE CON UN SISTEMA DE EXPLORACION QUE PERMITE RECORRER POR EXPLORACION UN REGISTRO DE DESPLAZAMIENTO FORMADO POR UNA MEMORIA O ARCHIVO DE REGISTRO.CONSTA DE UN ARCHIVO DE REGISTRO (5) O MEMORIA, DE UN REGISTRO DE DIRECCION DE LECTURA (6), DE UN REGISTRO DE DIRECCION DE ESCRITURA (7), DE UN REGISTRO DE LECTURA (8), Y DE DISPOSITIVOS DE MULTIPLEX (9, 10), DISPUESTOS EN EL LADO DE ENTRADA DEL OPERADOR PARA CALCULAR LA DIRECCION DE LECTURA DE LA MEMORIA.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56196746A JPS58121458A (ja) | 1981-12-09 | 1981-12-09 | スキヤンアウト方式 |
Publications (2)
Publication Number | Publication Date |
---|---|
ES8401807A1 true ES8401807A1 (es) | 1984-01-01 |
ES518009A0 ES518009A0 (es) | 1984-01-01 |
Family
ID=16362911
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES518009A Granted ES518009A0 (es) | 1981-12-09 | 1982-12-07 | Conjunto sistematico de exploracion para un registro de desplazamiento. |
Country Status (7)
Country | Link |
---|---|
US (1) | US4491935A (es) |
EP (1) | EP0081966B1 (es) |
JP (1) | JPS58121458A (es) |
AU (1) | AU539000B2 (es) |
CA (1) | CA1181846A (es) |
DE (1) | DE3277598D1 (es) |
ES (1) | ES518009A0 (es) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2564619B1 (fr) * | 1984-05-21 | 1986-09-26 | Enertec | Dispositif elementaire de traitement de donnees |
DE3431785A1 (de) * | 1984-08-29 | 1986-03-13 | Siemens AG, 1000 Berlin und 8000 München | Schaltungsanordnung fuer einen nach dem warteschlangenprinzip arbeitenden steuerspeicher (fifo-speicher) |
JPS63291134A (ja) * | 1987-05-22 | 1988-11-29 | Toshiba Corp | 論理集積回路 |
US6128758A (en) * | 1998-05-20 | 2000-10-03 | National Semiconductor Corporation | Modular re-useable bus architecture |
US6851080B1 (en) * | 1999-02-05 | 2005-02-01 | 3Com Corporation | Automatic activation of ASIC test mode |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3806891A (en) * | 1972-12-26 | 1974-04-23 | Ibm | Logic circuit for scan-in/scan-out |
JPS5352029A (en) * | 1976-10-22 | 1978-05-12 | Fujitsu Ltd | Arithmetic circuit unit |
US4169289A (en) * | 1977-07-08 | 1979-09-25 | Bell Telephone Laboratories, Incorporated | Data processor with improved cyclic data buffer apparatus |
JPS5853774B2 (ja) * | 1978-12-29 | 1983-12-01 | 株式会社日立製作所 | 情報処理装置 |
-
1981
- 1981-12-09 JP JP56196746A patent/JPS58121458A/ja active Granted
-
1982
- 1982-12-02 AU AU91088/82A patent/AU539000B2/en not_active Ceased
- 1982-12-07 DE DE8282306522T patent/DE3277598D1/de not_active Expired
- 1982-12-07 ES ES518009A patent/ES518009A0/es active Granted
- 1982-12-07 EP EP82306522A patent/EP0081966B1/en not_active Expired
- 1982-12-07 US US06/447,659 patent/US4491935A/en not_active Expired - Lifetime
- 1982-12-08 CA CA000417266A patent/CA1181846A/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
US4491935A (en) | 1985-01-01 |
AU9108882A (en) | 1983-06-16 |
ES518009A0 (es) | 1984-01-01 |
CA1181846A (en) | 1985-01-29 |
JPS58121458A (ja) | 1983-07-19 |
DE3277598D1 (en) | 1987-12-10 |
EP0081966A3 (en) | 1985-05-29 |
JPS6150340B2 (es) | 1986-11-04 |
EP0081966B1 (en) | 1987-11-04 |
EP0081966A2 (en) | 1983-06-22 |
AU539000B2 (en) | 1984-09-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FD1A | Patent lapsed |
Effective date: 20001102 |