ES454412A1 - Dispositivo de analisis por espectrometria fotoelectronica de una muestra de material aislante. - Google Patents

Dispositivo de analisis por espectrometria fotoelectronica de una muestra de material aislante.

Info

Publication number
ES454412A1
ES454412A1 ES454412A ES454412A ES454412A1 ES 454412 A1 ES454412 A1 ES 454412A1 ES 454412 A ES454412 A ES 454412A ES 454412 A ES454412 A ES 454412A ES 454412 A1 ES454412 A1 ES 454412A1
Authority
ES
Spain
Prior art keywords
sample
insulating material
radiation
analysis
electrons
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES454412A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Publication of ES454412A1 publication Critical patent/ES454412A1/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
ES454412A 1975-12-19 1976-12-18 Dispositivo de analisis por espectrometria fotoelectronica de una muestra de material aislante. Expired ES454412A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7539096A FR2335839A1 (fr) 1975-12-19 1975-12-19 Procede d'analyse d'echantillons en matiere isolante par spectrometrie photo-electronique et porte-echantillon pour la mise en oeuvre dudit procede

Publications (1)

Publication Number Publication Date
ES454412A1 true ES454412A1 (es) 1977-12-01

Family

ID=9163968

Family Applications (1)

Application Number Title Priority Date Filing Date
ES454412A Expired ES454412A1 (es) 1975-12-19 1976-12-18 Dispositivo de analisis por espectrometria fotoelectronica de una muestra de material aislante.

Country Status (8)

Country Link
US (1) US4097738A (es)
JP (1) JPS5277792A (es)
BE (1) BE849129A (es)
DE (1) DE2657439A1 (es)
ES (1) ES454412A1 (es)
FR (1) FR2335839A1 (es)
GB (1) GB1556075A (es)
SE (1) SE409906B (es)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3128814A1 (de) * 1981-07-21 1983-02-10 Siemens AG, 1000 Berlin und 8000 München Elektrisch leitende probenhalterung fuer die analysentechnik der sekundaerionen-massenspektrometrie
JPH0711495B2 (ja) * 1982-05-07 1995-02-08 株式会社日立製作所 光電子測定方法
JPS60121652A (ja) * 1983-12-02 1985-06-29 Hitachi Ltd 質量分析用試料ホルダ−
JPS60135846A (ja) * 1983-12-26 1985-07-19 Anelva Corp 二次イオン質量分析方法
US4590376A (en) * 1984-05-30 1986-05-20 Photo Acoustic Technology, Inc. Apparatus and technique for monitoring photoelectron emission from surfaces
DE3576213D1 (de) * 1984-09-18 1990-04-05 Integrated Circuit Testing Gegenfeld-spektrometer fuer die elektronenstrahl-messtechnik.
EP0661385A1 (en) * 1991-08-19 1995-07-05 OHMI, Tadahiro Method for forming oxide film
US6146135A (en) 1991-08-19 2000-11-14 Tadahiro Ohmi Oxide film forming method
US8307665B2 (en) * 2006-04-06 2012-11-13 National Institute Of Advanced Industrial Science And Technology Sample cooling apparatus
CN114047215B (zh) * 2021-10-20 2023-08-15 北京科技大学顺德研究生院 一种用于消除被测样品表面不均匀荷电的装置及方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1282498A (en) * 1969-11-17 1972-07-19 Ass Elect Ind Improvements in or relating to apparatus for use in electron spectroscopy
US3749926A (en) * 1971-08-03 1973-07-31 Du Pont Charged particle energy analysis
US3822383A (en) * 1973-04-13 1974-07-02 Weston Instruments Inc Profile gauging system

Also Published As

Publication number Publication date
US4097738A (en) 1978-06-27
BE849129A (fr) 1977-04-01
GB1556075A (en) 1979-11-21
DE2657439A1 (de) 1977-07-07
JPS5277792A (en) 1977-06-30
SE7614161L (sv) 1977-06-20
SE409906B (sv) 1979-09-10
FR2335839B1 (es) 1980-01-25
FR2335839A1 (fr) 1977-07-15

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