GB1282498A - Improvements in or relating to apparatus for use in electron spectroscopy - Google Patents

Improvements in or relating to apparatus for use in electron spectroscopy

Info

Publication number
GB1282498A
GB1282498A GB5614269A GB5614269A GB1282498A GB 1282498 A GB1282498 A GB 1282498A GB 5614269 A GB5614269 A GB 5614269A GB 5614269 A GB5614269 A GB 5614269A GB 1282498 A GB1282498 A GB 1282498A
Authority
GB
United Kingdom
Prior art keywords
sample
target electrode
electron
equipment
electron source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB5614269A
Inventor
Albert Ashcroft
John Merza Watson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Associated Electrical Industries Ltd
Original Assignee
Associated Electrical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Associated Electrical Industries Ltd filed Critical Associated Electrical Industries Ltd
Priority to GB5614269A priority Critical patent/GB1282498A/en
Priority to DE19702056123 priority patent/DE2056123A1/en
Priority to FR7041045A priority patent/FR2069510A5/fr
Publication of GB1282498A publication Critical patent/GB1282498A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/44Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46Static spectrometers
    • H01J49/48Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

1282498 Particle spectrometers; X-ray tubes ASSOCIATED ELECTRICAL INDUSTRIES Ltd 17 Nov 1970 [17 Nov 1969] 56142/69 Heading HID In apparatus which is for use in electron spectroscopy and in which a sample 6 may be irradiated with X-rays generated by bombardment of a target electrode 8 with electrons supplied by an electron source 14, said target electrode and said electron source are detachably mounted on a hollow body 1, 2 so that at least part of the target electrode 8 and of the electron source 14 lie within the cavity 13 in said body which is also adapted to contain the sample 6 to be investigated mounted close to said target electrode 8, the said body 1, 2 having an opening 38 through which pass for analysis electrons released from a sample, e.g. upon irradiation thereof by X-rays as aforesaid, and the path 36 of said released electrons through said opening being generally parallel to the path of the electron beam from the electron source 14 to the target electrode 8. A cylindrical electrode 9 may be maintained at a suitable potential to reduce the energy of the released electrons prior to their admission to an electromagnetic analyser or to a scanning electrostatic analyser (Fig. 3, not shown) provided with an electron multiplier and a counter or other display or recording device. The parts of the target electrode 8 and electron gun 14 projecting into the cavity 13 are surrounded by a generally tubular copper member 16 provided with a window 17, e.g. of Be or Al and a pumping port 37. The Cu target electrode 8 has a bombardment surface 23 coated with Mg or Al and is water-cooled internally. Sample inserting equipment (Fig. 4, not shown) includes means for rotating the rod 7 on which four samples 6 are mounted, means for heating electrically or cooling the samples, e.g. with liquid nitrogen, and a vacuum lock arrangement for maintaining the vacuum in the cavity 13 during the insertion of new samples. The body 1, 2 has a plurality of ports 24-30 to which the sample inserting equipment or other ancillary equipment may be connected, e.g. ion bombardment equipment for cleaning the sample; equipment for irradiating a sample with charged particles or light from a U.V. lamp; or a cup containing a liquid sample.
GB5614269A 1969-11-17 1969-11-17 Improvements in or relating to apparatus for use in electron spectroscopy Expired GB1282498A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
GB5614269A GB1282498A (en) 1969-11-17 1969-11-17 Improvements in or relating to apparatus for use in electron spectroscopy
DE19702056123 DE2056123A1 (en) 1969-11-17 1970-11-14 Device for electron spectroscopy
FR7041045A FR2069510A5 (en) 1969-11-17 1970-11-16

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB5614269A GB1282498A (en) 1969-11-17 1969-11-17 Improvements in or relating to apparatus for use in electron spectroscopy

Publications (1)

Publication Number Publication Date
GB1282498A true GB1282498A (en) 1972-07-19

Family

ID=10475834

Family Applications (1)

Application Number Title Priority Date Filing Date
GB5614269A Expired GB1282498A (en) 1969-11-17 1969-11-17 Improvements in or relating to apparatus for use in electron spectroscopy

Country Status (3)

Country Link
DE (1) DE2056123A1 (en)
FR (1) FR2069510A5 (en)
GB (1) GB1282498A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4097738A (en) * 1975-12-19 1978-06-27 Commissariat A L'energie Atomique Method of analysis of a sample of insulating material by photoelectronic spectrometry

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4097738A (en) * 1975-12-19 1978-06-27 Commissariat A L'energie Atomique Method of analysis of a sample of insulating material by photoelectronic spectrometry

Also Published As

Publication number Publication date
FR2069510A5 (en) 1971-09-03
DE2056123A1 (en) 1971-06-03

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Legal Events

Date Code Title Description
PS Patent sealed
PLNP Patent lapsed through nonpayment of renewal fees