ES443060A1 - Double chamber ion source - Google Patents
Double chamber ion sourceInfo
- Publication number
- ES443060A1 ES443060A1 ES443060A ES443060A ES443060A1 ES 443060 A1 ES443060 A1 ES 443060A1 ES 443060 A ES443060 A ES 443060A ES 443060 A ES443060 A ES 443060A ES 443060 A1 ES443060 A1 ES 443060A1
- Authority
- ES
- Spain
- Prior art keywords
- filament
- ion source
- chamber
- operated
- double chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J27/00—Ion beam tubes
- H01J27/02—Ion sources; Ion guns
- H01J27/08—Ion sources; Ion guns using arc discharge
- H01J27/14—Other arc discharge ion sources using an applied magnetic field
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/08—Ion sources; Ion guns
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Combustion & Propulsion (AREA)
- Electron Sources, Ion Sources (AREA)
- Particle Accelerators (AREA)
Abstract
The ion source is comprised of two discharge chambers one of which is provided with a filament and an aperture leading into the other chamber which in turn has an extraction orifice. A low voltage arc discharge is operated in an inert gas atmosphere in the filament chamber while an arc of higher voltage is operated in the second ionization chamber which contains a vapor which will give the desired dopant ion species. The entire source is immersed in an axial magnetic field parallel to a line connecting the filament, the aperture between the two chambers and the extraction orifice.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US528312A US3924134A (en) | 1974-11-29 | 1974-11-29 | Double chamber ion source |
Publications (1)
Publication Number | Publication Date |
---|---|
ES443060A1 true ES443060A1 (en) | 1977-04-01 |
Family
ID=24105152
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES443060A Expired ES443060A1 (en) | 1974-11-29 | 1975-11-28 | Double chamber ion source |
Country Status (12)
Country | Link |
---|---|
US (1) | US3924134A (en) |
JP (1) | JPS5318677B2 (en) |
BR (1) | BR7507901A (en) |
CA (1) | CA1039860A (en) |
CH (1) | CH587562A5 (en) |
DE (1) | DE2552783B2 (en) |
ES (1) | ES443060A1 (en) |
FR (1) | FR2293055A1 (en) |
GB (1) | GB1497913A (en) |
IT (1) | IT1042770B (en) |
NL (1) | NL7513431A (en) |
SE (1) | SE402672B (en) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4045677A (en) * | 1976-06-11 | 1977-08-30 | Cornell Research Foundation, Inc. | Intense ion beam generator |
US4105916A (en) * | 1977-02-28 | 1978-08-08 | Extranuclear Laboratories, Inc. | Methods and apparatus for simultaneously producing and electronically separating the chemical ionization mass spectrum and the electron impact ionization mass spectrum of the same sample material |
US4175234A (en) * | 1977-08-05 | 1979-11-20 | University Of Virginia | Apparatus for producing ions of thermally labile or nonvolatile solids |
US4206383A (en) * | 1978-09-11 | 1980-06-03 | California Institute Of Technology | Miniature cyclotron resonance ion source using small permanent magnet |
US4301391A (en) * | 1979-04-26 | 1981-11-17 | Hughes Aircraft Company | Dual discharge plasma device |
FR2550681B1 (en) * | 1983-08-12 | 1985-12-06 | Centre Nat Rech Scient | ION SOURCE HAS AT LEAST TWO IONIZATION CHAMBERS, PARTICULARLY FOR THE FORMATION OF CHEMICALLY REACTIVE ION BEAMS |
FR2595868B1 (en) * | 1986-03-13 | 1988-05-13 | Commissariat Energie Atomique | ION SOURCE WITH ELECTRONIC CYCLOTRON RESONANCE WITH COAXIAL INJECTION OF ELECTROMAGNETIC WAVES |
KR900003310B1 (en) * | 1986-05-27 | 1990-05-14 | 리가가구 겡큐소 | Ion producing apparatus |
US4841197A (en) * | 1986-05-28 | 1989-06-20 | Nihon Shinku Gijutsu Kabushiki Kaisha | Double-chamber ion source |
JP2530434B2 (en) * | 1986-08-13 | 1996-09-04 | 日本テキサス・インスツルメンツ株式会社 | Ion generator |
GB8726638D0 (en) * | 1987-11-13 | 1987-12-16 | Vg Instr Groups Ltd | High sensitivity mass spectrometer |
GB2230644B (en) * | 1989-02-16 | 1994-03-23 | Tokyo Electron Ltd | Electron beam excitation ion source |
JP2873693B2 (en) * | 1989-05-25 | 1999-03-24 | 東京エレクトロン株式会社 | Ion source |
RU2084085C1 (en) * | 1995-07-14 | 1997-07-10 | Центральный научно-исследовательский институт машиностроения | Closed electron drift accelerator |
US5962858A (en) * | 1997-07-10 | 1999-10-05 | Eaton Corporation | Method of implanting low doses of ions into a substrate |
US6452338B1 (en) * | 1999-12-13 | 2002-09-17 | Semequip, Inc. | Electron beam ion source with integral low-temperature vaporizer |
US6642641B2 (en) * | 2001-04-19 | 2003-11-04 | Inficon, Inc. | Apparatus for measuring total pressure and partial pressure with common electron beam |
CN103887132B (en) * | 2012-12-20 | 2016-12-28 | 中芯国际集成电路制造(上海)有限公司 | The ion source of injection device and ion injection method |
US20140374583A1 (en) * | 2013-06-24 | 2014-12-25 | Agilent Technologies, Inc. | Electron ionization (ei) utilizing different ei energies |
US9117617B2 (en) | 2013-06-24 | 2015-08-25 | Agilent Technologies, Inc. | Axial magnetic ion source and related ionization methods |
EP3084804B1 (en) | 2013-12-20 | 2018-03-14 | Nicholas R. White | A ribbon beam ion source of arbitrary length |
US10176977B2 (en) | 2014-12-12 | 2019-01-08 | Agilent Technologies, Inc. | Ion source for soft electron ionization and related systems and methods |
US11328919B2 (en) * | 2018-05-11 | 2022-05-10 | Leco Corporation | Two-stage ion source comprising closed and open ion volumes |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL285354A (en) * | 1961-12-11 | |||
GB1252569A (en) * | 1968-12-17 | 1971-11-10 | ||
FR2061809A5 (en) * | 1969-04-04 | 1971-06-25 | Commissariat Energie Atomique |
-
1974
- 1974-11-29 US US528312A patent/US3924134A/en not_active Expired - Lifetime
-
1975
- 1975-09-23 IT IT27524/75A patent/IT1042770B/en active
- 1975-09-26 JP JP11571375A patent/JPS5318677B2/ja not_active Expired
- 1975-10-06 FR FR7531451A patent/FR2293055A1/en active Granted
- 1975-10-21 SE SE7511786A patent/SE402672B/en unknown
- 1975-10-27 CA CA238,428A patent/CA1039860A/en not_active Expired
- 1975-10-30 GB GB44801/75A patent/GB1497913A/en not_active Expired
- 1975-11-18 NL NL7513431A patent/NL7513431A/en not_active Application Discontinuation
- 1975-11-25 DE DE19752552783 patent/DE2552783B2/en not_active Ceased
- 1975-11-26 CH CH1532075A patent/CH587562A5/xx not_active IP Right Cessation
- 1975-11-27 BR BR7507901*A patent/BR7507901A/en unknown
- 1975-11-28 ES ES443060A patent/ES443060A1/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
FR2293055A1 (en) | 1976-06-25 |
DE2552783B2 (en) | 1977-04-28 |
JPS5318677B2 (en) | 1978-06-16 |
DE2552783A1 (en) | 1976-08-12 |
CH587562A5 (en) | 1977-05-13 |
NL7513431A (en) | 1976-06-01 |
SE402672B (en) | 1978-07-10 |
SE7511786L (en) | 1976-05-31 |
US3924134A (en) | 1975-12-02 |
IT1042770B (en) | 1980-01-30 |
FR2293055B1 (en) | 1978-04-07 |
JPS5165299A (en) | 1976-06-05 |
GB1497913A (en) | 1978-01-12 |
BR7507901A (en) | 1976-08-10 |
CA1039860A (en) | 1978-10-03 |
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