GB1252569A - - Google Patents

Info

Publication number
GB1252569A
GB1252569A GB5994068A GB1252569DA GB1252569A GB 1252569 A GB1252569 A GB 1252569A GB 5994068 A GB5994068 A GB 5994068A GB 1252569D A GB1252569D A GB 1252569DA GB 1252569 A GB1252569 A GB 1252569A
Authority
GB
United Kingdom
Prior art keywords
ion
samples
ions
chamber
exit slit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB5994068A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of GB1252569A publication Critical patent/GB1252569A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J5/00—Details relating to vessels or to leading-in conductors common to two or more basic types of discharge tubes or lamps
    • H01J5/02—Vessels; Containers; Shields associated therewith; Vacuum locks
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Sources, Ion Sources (AREA)

Abstract

1,252,569. Ion sources. ASSOCIATED ELECTRICAL INDUSTRIES Ltd. 26 Nov., 1969 [17 Dec., 1968], No. 59940/68. Heading H1D. In an ion source for a mass spectrometer at least two different vaporized samples are introduced through separate inlets 17 into respective regions of an evacuable ionization chamber 10 in which the movement of the vaporized samples between the regions is restricted, for example by a partition 11, ions are produced in each region 12 by electron beam bombardment, and an electrode system 13, 14, 15 and 16 is provided to accelerate the ions so formed into anion beam 20 which contains ions from both or all the samples. As shown, the ion exit slit 14 may have tapered edges, and the edge of the partition 11 adjacent slit 14 may be similarly shaped. The formation of a single ion beam 20 may also be facilitated by shaping the repeller plates 13, one plate 13 being provided for each region and mounted insulated from each other on a ceramic support 21. The several ionizing electron beams may be derived from a single or separate cathodes, and the ionizing energies of the electron beams are preferably, though not necessarily, the same. Opposite edges of the ion exit slit 14 may be insulated from each other so that different potentials may be applied thereto to optimize the performance from each half of the source. Chamber 10 is continuously evacuated via ion exit slit 14 by a pump located outside the chamber. In an example, nitrogen and heptocosa fluoro tributylamine were the samples used.
GB5994068A 1968-12-17 1968-12-17 Expired GB1252569A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB5994068 1968-12-17

Publications (1)

Publication Number Publication Date
GB1252569A true GB1252569A (en) 1971-11-10

Family

ID=10484703

Family Applications (1)

Application Number Title Priority Date Filing Date
GB5994068A Expired GB1252569A (en) 1968-12-17 1968-12-17

Country Status (6)

Country Link
US (1) US3849656A (en)
DE (1) DE1962617A1 (en)
FR (1) FR2026374A1 (en)
GB (1) GB1252569A (en)
NL (1) NL6918712A (en)
SE (1) SE356396B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4855602A (en) * 1986-06-20 1989-08-08 Sharma Devendra N Beam deflector

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3924134A (en) * 1974-11-29 1975-12-02 Ibm Double chamber ion source
JPS5522741B2 (en) * 1975-01-16 1980-06-18
US4016421A (en) * 1975-02-13 1977-04-05 E. I. Du Pont De Nemours And Company Analytical apparatus with variable energy ion beam source
US4066894A (en) * 1976-01-20 1978-01-03 University Of Virginia Positive and negative ion recording system for mass spectrometer
JPS5812982B2 (en) * 1976-10-01 1983-03-11 株式会社日立製作所 chemical ionization ion source
US4164654A (en) * 1978-02-14 1979-08-14 The South African Inventions Development Corporation Device for generating an atomic cloud
US4314180A (en) * 1979-10-16 1982-02-02 Occidental Research Corporation High density ion source
JPS59113175A (en) * 1982-12-20 1984-06-29 Nisshin Haiboruteeji Kk Negative ion source
US5331158A (en) * 1992-12-07 1994-07-19 Hewlett-Packard Company Method and arrangement for time of flight spectrometry
US5808308A (en) * 1996-05-03 1998-09-15 Leybold Inficon Inc. Dual ion source
US6759807B2 (en) 2002-04-04 2004-07-06 Veeco Instruments, Inc. Multi-grid ion beam source for generating a highly collimated ion beam
JP4956746B2 (en) * 2004-12-28 2012-06-20 国立大学法人京都工芸繊維大学 Charged particle generator and accelerator
US7402799B2 (en) * 2005-10-28 2008-07-22 Northrop Grumman Corporation MEMS mass spectrometer
WO2013059724A1 (en) 2011-10-21 2013-04-25 California Institute Of Technology System and method for determining the isotopic anatomy of organic and volatile molecules
JP5680008B2 (en) * 2012-03-08 2015-03-04 株式会社東芝 Ion source, heavy particle beam irradiation apparatus, ion source driving method, and heavy particle beam irradiation method
WO2014059192A1 (en) * 2012-10-10 2014-04-17 California Institute Of Technology Mass spectrometer, system comprising the same, and methods for determining isotopic anatomy of compounds
JP2020535622A (en) * 2017-09-29 2020-12-03 パーキンエルマー・ヘルス・サイエンシーズ・カナダ・インコーポレイテッドＰｅｒｋｉｎｅｌｍｅｒ Ｈｅａｌｔｈ Ｓｃｉｅｎｃｅｓ Ｃａｎａｄａ， Ｉｎｃ． Off-axis ionization devices and systems
DE112019002405B4 (en) * 2018-05-11 2023-02-23 Leco Corporation Two-stage ion source, having closed and open ion volumes

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3355587A (en) * 1951-01-28 1967-11-28 Jenckel Ludolf Gas analysis apparatus comprising plural ionization chambers with different ionizing electron beam energy levels in the chambers
US2772362A (en) * 1955-04-26 1956-11-27 Gen Electric Ion source for a mass spectrometer
US3405263A (en) * 1966-01-14 1968-10-08 Exxon Research Engineering Co Dual mass spectrometer ion source comprising field ionization and electron bombardment sources and the method of use

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4855602A (en) * 1986-06-20 1989-08-08 Sharma Devendra N Beam deflector

Also Published As

Publication number Publication date
DE1962617A1 (en) 1970-07-16
FR2026374A1 (en) 1970-09-18
SE356396B (en) 1973-05-21
NL6918712A (en) 1970-06-19
US3849656A (en) 1974-11-19

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee