GB1318400A - Mass spectrometry - Google Patents
Mass spectrometryInfo
- Publication number
- GB1318400A GB1318400A GB1318400DA GB1318400A GB 1318400 A GB1318400 A GB 1318400A GB 1318400D A GB1318400D A GB 1318400DA GB 1318400 A GB1318400 A GB 1318400A
- Authority
- GB
- United Kingdom
- Prior art keywords
- multiplexing
- mass
- mass spectrometer
- beams
- ion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/107—Arrangements for using several ion sources
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/32—Static spectrometers using double focusing
- H01J49/326—Static spectrometers using double focusing with magnetic and electrostatic sectors of 90 degrees
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
1318400 Mass spectrometers ASSOCIATED ELECTRICAL INDUSTRIES Ltd 26 Aug 1971 [28 Aug 1970] 41519/70 Heading H1D A mass spectrometry method comprises time division multiplexing a plurality of ion beams, e.g. from sources 1, 2, on a collinear array, to form a single beam to be analysed in a mass spectrometer (12) (Fig. 1, not shown), the mass spectrometer output at any time representing the passage of ions of a given mass to change ratio, to provide data on the plurality of beams. The output of the mass spectrometer may be sampled and digitized preferably by a digital computer further programmed to account for the multiplexing. Preferably the mass spectrometer is a scanning type and analyses a range of mass to charge ratios, in which case the multiplexing is preferably at a rate to sample individual peaks several times. The time divisions may be unequal to vary the relative sensitivities of the ion collections of the respective beams, the single beam focussing may be changed to vary the resolution, and the spectrometer may be single or double focusing, with magnetic sector and B and E sector respectively, time of flight, cycloidal focusing, or quadrupole type. Mass marking may be performed by including one or more reference substances separately or with the examined substance, e.g. hoptacosa fluorotributylamine and perfluorokerosene. The multiplexing may be by a plurality of pairs of plates (e.g. 20, 22) at different interlaced voltages and/or a hexapole ion beam deflecting arrangement, the multiplexing deflecting system being at the point of beam intersection. Ions striking detector (14) may be amplified by an electron multiplier. Data processing unit (16) may demultiplex the signal to form individual analyses, synchronizing link (18) being utilized, but not being necessary if unit (16) is sensitive to the beam switching or if detector (14) is so sensitive and informs unit (16), or may be programmed digital computer sampling at least once during each time division (cf. Fig. 2). Deflector fringe field correcting plates 36, 38 may be adjacent cylindrical beam deflector 30, the latter being earthed on beam 2 passage and multiplexing being via changeover switch 26 which is preferably a semi-conductor type. Reference is made to Specifications 1,161,432, 1,233,812 and 1,318,200.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB4151970 | 1970-08-28 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1318400A true GB1318400A (en) | 1973-05-31 |
Family
ID=10420063
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB1318400D Expired GB1318400A (en) | 1970-08-28 | 1970-08-28 | Mass spectrometry |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE2142942C3 (en) |
GB (1) | GB1318400A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000052735A1 (en) * | 1999-03-05 | 2000-09-08 | Bruker Daltronics, Inc. | Ionization chamber for atmospheric pressure ionization mass spectrometry |
GB2443219A (en) * | 2006-02-28 | 2008-04-30 | Agilent Technologies Inc | Mass spectrometer calibration |
WO2013192161A3 (en) * | 2012-06-18 | 2014-03-13 | Leco Corporation | Tandem time-of-flight mass spectrometry with non-uniform sampling |
EP2539919A4 (en) * | 2010-02-26 | 2015-03-11 | Zoex Corp | Pulsed mass calibration in time-of-flight mass spectrometry |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2014096916A1 (en) * | 2012-12-20 | 2014-06-26 | Dh Technologies Development Pte. Ltd. | Interlacing to improve sampling of data when ramping parameters |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1161432A (en) * | 1966-05-17 | 1969-08-13 | Ass Elect Ind | Improvements relating to Mass Spectrometry |
US3600573A (en) * | 1968-10-09 | 1971-08-17 | Jeol Ltd | Ion beam intensity control with pulsed beam deflection and synchronized ion source blanking |
-
1970
- 1970-08-28 GB GB1318400D patent/GB1318400A/en not_active Expired
-
1971
- 1971-08-27 DE DE19712142942 patent/DE2142942C3/en not_active Expired
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000052735A1 (en) * | 1999-03-05 | 2000-09-08 | Bruker Daltronics, Inc. | Ionization chamber for atmospheric pressure ionization mass spectrometry |
US6410914B1 (en) | 1999-03-05 | 2002-06-25 | Bruker Daltonics Inc. | Ionization chamber for atmospheric pressure ionization mass spectrometry |
US7315020B2 (en) | 1999-03-05 | 2008-01-01 | Bruker Daltonics, Inc. | Ionization chamber for atmospheric pressure ionization mass spectrometry |
GB2443219A (en) * | 2006-02-28 | 2008-04-30 | Agilent Technologies Inc | Mass spectrometer calibration |
GB2443219B (en) * | 2006-02-28 | 2011-11-02 | Agilent Technologies Inc | Mass spectrometry system and method of calibration |
EP2539919A4 (en) * | 2010-02-26 | 2015-03-11 | Zoex Corp | Pulsed mass calibration in time-of-flight mass spectrometry |
WO2013192161A3 (en) * | 2012-06-18 | 2014-03-13 | Leco Corporation | Tandem time-of-flight mass spectrometry with non-uniform sampling |
GB2518100A (en) * | 2012-06-18 | 2015-03-11 | Leco Corp | Tandem time-of-flight mass spectrometry with non-uniform sampling |
US9472390B2 (en) | 2012-06-18 | 2016-10-18 | Leco Corporation | Tandem time-of-flight mass spectrometry with non-uniform sampling |
GB2518100B (en) * | 2012-06-18 | 2018-02-28 | Leco Corp | Tandem time-of-flight mass spectrometry with non-uniform sampling |
Also Published As
Publication number | Publication date |
---|---|
DE2142942A1 (en) | 1972-03-02 |
DE2142942B2 (en) | 1981-02-19 |
DE2142942C3 (en) | 1981-12-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed | ||
732 | Registration of transactions, instruments or events in the register (sect. 32/1977) | ||
PCNP | Patent ceased through non-payment of renewal fee |