ES2887113T3 - Sistemas y métodos para determinar la calidad de un dispositivo óptico reproducido (fabricado) - Google Patents

Sistemas y métodos para determinar la calidad de un dispositivo óptico reproducido (fabricado) Download PDF

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Publication number
ES2887113T3
ES2887113T3 ES15858689T ES15858689T ES2887113T3 ES 2887113 T3 ES2887113 T3 ES 2887113T3 ES 15858689 T ES15858689 T ES 15858689T ES 15858689 T ES15858689 T ES 15858689T ES 2887113 T3 ES2887113 T3 ES 2887113T3
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Spain
Prior art keywords
profile
measured
surface profile
power profile
offset
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
ES15858689T
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English (en)
Spanish (es)
Inventor
Fabian Conrad
Ravi Chandra Bakaraju
Klaus Ehrmann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Brien Holden Vision Institute Ltd
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Brien Holden Vision Institute Ltd
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Publication of ES2887113T3 publication Critical patent/ES2887113T3/es
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0228—Testing optical properties by measuring refractive power
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/4205—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant
    • G02B27/4211—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant correcting chromatic aberrations
    • G—PHYSICS
    • G02—OPTICS
    • G02C—SPECTACLES; SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURES AS SPECTACLES; CONTACT LENSES
    • G02C7/00—Optical parts

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Geometry (AREA)
  • Health & Medical Sciences (AREA)
  • Ophthalmology & Optometry (AREA)
  • General Health & Medical Sciences (AREA)
  • Eyeglasses (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Lenses (AREA)
ES15858689T 2014-11-11 2015-11-11 Sistemas y métodos para determinar la calidad de un dispositivo óptico reproducido (fabricado) Active ES2887113T3 (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201462078310P 2014-11-11 2014-11-11
PCT/AU2015/050700 WO2016074034A2 (en) 2014-11-11 2015-11-11 Systems and methods for determining the quality of a reproduced (manufactured) optic device

Publications (1)

Publication Number Publication Date
ES2887113T3 true ES2887113T3 (es) 2021-12-21

Family

ID=55955207

Family Applications (1)

Application Number Title Priority Date Filing Date
ES15858689T Active ES2887113T3 (es) 2014-11-11 2015-11-11 Sistemas y métodos para determinar la calidad de un dispositivo óptico reproducido (fabricado)

Country Status (10)

Country Link
US (2) US10352816B2 (enIt.pdf)
EP (1) EP3218685B1 (enIt.pdf)
JP (3) JP2018503100A (enIt.pdf)
KR (1) KR20170080696A (enIt.pdf)
CN (1) CN107110740B (enIt.pdf)
ES (1) ES2887113T3 (enIt.pdf)
HU (1) HUE055799T2 (enIt.pdf)
SG (1) SG11201703751YA (enIt.pdf)
TW (1) TWI679466B (enIt.pdf)
WO (1) WO2016074034A2 (enIt.pdf)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018503100A (ja) * 2014-11-11 2018-02-01 ブリエン ホールデン ビジョン インスティチュート 複製（製造）光学デバイスの品質を判断するためのシステム及び方法
US10036685B2 (en) * 2016-05-18 2018-07-31 Jand, Inc. Fixtureless lensmeter and methods of operating same
US10557773B2 (en) 2016-05-18 2020-02-11 Jand, Inc. Fixtureless lensmeter system
US11488239B2 (en) 2019-08-26 2022-11-01 Warby Parker Inc. Virtual fitting systems and methods for spectacles
WO2021211374A1 (en) 2020-04-15 2021-10-21 Jand, Inc. Virtual try-on systems for spectacles using reference frames

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CN1615667A (zh) * 2002-01-21 2005-05-11 西门子移动通讯公司 分时隙系统中进行初始小区搜索的方法和移动台
DE60323630D1 (de) 2002-05-16 2008-10-30 Hoya Corp Verfahren und einrichtung zum bewerten einer brillenlinse oder form zum formen einer brillenlinse und verfahren und system zur herstellung einer brillenlinse
TW200606391A (en) * 2004-05-10 2006-02-16 Koninkl Philips Electronics Nv Device and method for optical precision measurement
JP2006105717A (ja) * 2004-10-04 2006-04-20 Matsushita Electric Ind Co Ltd 高さデータ推定方法、高さデータ推定用プログラム及び３次元形状測定装置
JP2007170888A (ja) * 2005-12-20 2007-07-05 Olympus Corp 光学素子検査装置
JP2007281003A (ja) * 2006-04-03 2007-10-25 Canon Inc 測定方法及び装置、並びに、露光装置
US7416300B2 (en) * 2006-05-25 2008-08-26 Coopervision International Holding Company, Lp Measurement of lenses and lens molds using optical coherence tomography
KR101404427B1 (ko) * 2006-12-21 2014-06-10 아리조나 보드 오브 리전츠 온 비해프 오브 더 유니버시티 오브 아리조나 안과용 렌즈를 위한 큐벳
JP2008172004A (ja) * 2007-01-11 2008-07-24 Nikon Corp 収差評価方法、調整方法、露光装置、露光方法、およびデバイス製造方法
US20100195093A1 (en) * 2007-02-14 2010-08-05 The Institute For Eye Research Limited Characterization of optical systems
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JP2009181689A (ja) * 2008-01-30 2009-08-13 Jds Uniphase Corp ２ミラー位相シフタを有する光ピックアップ・ユニット
WO2010098136A1 (ja) * 2009-02-27 2010-09-02 Hoya株式会社 レンズ用鋳型の製造方法および眼鏡レンズの製造方法
JP5540213B2 (ja) * 2010-12-20 2014-07-02 東海光学株式会社 眼鏡レンズの評価方法
WO2013119775A1 (en) * 2012-02-10 2013-08-15 Johnson & Johnson Vision Care, Inc. Method and apparatus for determining a thickness profile of an ophthalmic lens using a single point thickness and refractive index measurements
TWI588560B (zh) * 2012-04-05 2017-06-21 布萊恩荷登視覺協會 用於屈光不正之鏡片、裝置、方法及系統
US9201250B2 (en) * 2012-10-17 2015-12-01 Brien Holden Vision Institute Lenses, devices, methods and systems for refractive error
KR102199677B1 (ko) * 2012-10-17 2021-01-08 브리엔 홀덴 비전 인스티튜트 리미티드 굴절 오류를 위한 렌즈들, 디바이스들, 방법들 및 시스템들
US9671618B2 (en) 2012-11-14 2017-06-06 Essilor International (Compagnie Generale D'optique) Method of determining optical parameters of an ophthalmic lens
GB2508219A (en) * 2012-11-26 2014-05-28 Taylor Hobson Ltd Analysing and machining an optical profile
JP2018503100A (ja) * 2014-11-11 2018-02-01 ブリエン ホールデン ビジョン インスティチュート 複製（製造）光学デバイスの品質を判断するためのシステム及び方法

Also Published As

Publication number Publication date
SG11201703751YA (en) 2017-06-29
TW201632953A (zh) 2016-09-16
EP3218685A2 (en) 2017-09-20
JP2023078153A (ja) 2023-06-06
EP3218685B1 (en) 2021-06-16
HUE055799T2 (hu) 2021-12-28
CN107110740A (zh) 2017-08-29
WO2016074034A2 (en) 2016-05-19
EP3218685A4 (en) 2018-07-04
TWI679466B (zh) 2019-12-11
US10352816B2 (en) 2019-07-16
US20190391039A1 (en) 2019-12-26
US20170322110A1 (en) 2017-11-09
JP2018503100A (ja) 2018-02-01
KR20170080696A (ko) 2017-07-10
US10670495B2 (en) 2020-06-02
JP2021060420A (ja) 2021-04-15
CN107110740B (zh) 2021-04-30
WO2016074034A3 (en) 2016-06-23

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