ES2345294T3 - Calibracion eficaz de relojes en equipos electronicos. - Google Patents

Calibracion eficaz de relojes en equipos electronicos. Download PDF

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Publication number
ES2345294T3
ES2345294T3 ES07803389T ES07803389T ES2345294T3 ES 2345294 T3 ES2345294 T3 ES 2345294T3 ES 07803389 T ES07803389 T ES 07803389T ES 07803389 T ES07803389 T ES 07803389T ES 2345294 T3 ES2345294 T3 ES 2345294T3
Authority
ES
Spain
Prior art keywords
calibration
period
reference clock
signal
time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
ES07803389T
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English (en)
Spanish (es)
Inventor
Jacobus Haartsen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Telefonaktiebolaget LM Ericsson AB
Original Assignee
Telefonaktiebolaget LM Ericsson AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Telefonaktiebolaget LM Ericsson AB filed Critical Telefonaktiebolaget LM Ericsson AB
Application granted granted Critical
Publication of ES2345294T3 publication Critical patent/ES2345294T3/es
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L1/00—Stabilisation of generator output against variations of physical values, e.g. power supply
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
    • G01R23/10—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into a train of pulses, which are then counted, i.e. converting the signal into a square wave
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electric Clocks (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
  • Manipulation Of Pulses (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
  • Mobile Radio Communication Systems (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
ES07803389T 2006-10-12 2007-09-11 Calibracion eficaz de relojes en equipos electronicos. Active ES2345294T3 (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US548784 1995-10-26
US11/548,784 US7272078B1 (en) 2006-10-12 2006-10-12 Efficient clock calibration in electronic equipment

Publications (1)

Publication Number Publication Date
ES2345294T3 true ES2345294T3 (es) 2010-09-20

Family

ID=38543866

Family Applications (1)

Application Number Title Priority Date Filing Date
ES07803389T Active ES2345294T3 (es) 2006-10-12 2007-09-11 Calibracion eficaz de relojes en equipos electronicos.

Country Status (11)

Country Link
US (1) US7272078B1 (enExample)
EP (1) EP2089970B1 (enExample)
JP (1) JP4994456B2 (enExample)
CN (1) CN101523726B (enExample)
AT (1) ATE467272T1 (enExample)
BR (1) BRPI0717795B1 (enExample)
DE (1) DE602007006341D1 (enExample)
DK (1) DK2089970T3 (enExample)
ES (1) ES2345294T3 (enExample)
TW (1) TWI399548B (enExample)
WO (1) WO2008043629A1 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
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US8942150B2 (en) * 2007-03-19 2015-01-27 Qualcomm Incorporated Uplink timing control
US8170165B2 (en) * 2007-12-05 2012-05-01 Agere Systems Inc. Clock calibration in sleep mode
US7881895B2 (en) * 2008-05-27 2011-02-01 Sony Ericsson Mobile Communications Ab Methods of calibrating a clock using multiple clock periods with a single counter and related devices and methods
US8135553B2 (en) * 2008-07-31 2012-03-13 Mediatek Inc. Method for clock calibration
US8407037B2 (en) * 2008-11-05 2013-03-26 Qualcomm, Incorporated Methods and apparatus for clock simulation with calibration
EP2369438B1 (en) * 2010-02-24 2014-02-26 Fujitsu Semiconductor Limited Calibration method of a real time clock signal
US9766682B1 (en) * 2014-01-27 2017-09-19 Marvell International Ltd. Wakeup time system using drift estimation
KR102665713B1 (ko) * 2016-12-21 2024-05-14 에스케이하이닉스 주식회사 듀티 보정 회로 및 듀티 보정 방법
US10849086B2 (en) * 2017-07-20 2020-11-24 Itron Networked Solutions, Inc. Compensating for oscillator drift in wireless mesh networks
WO2019024064A1 (zh) * 2017-08-04 2019-02-07 深圳市汇顶科技股份有限公司 定时方法、时钟设备和终端设备
GB201800552D0 (en) * 2018-01-12 2018-02-28 Nordic Semiconductor Asa Clock calibration
CN113038445B (zh) * 2021-03-26 2022-11-18 上海磐启微电子有限公司 一种蓝牙休眠时钟的校准方法
CN114138056B (zh) * 2021-11-04 2024-05-17 珠海格力节能环保制冷技术研究中心有限公司 显示终端时钟校准方法、装置及显示终端
CN114489239B (zh) * 2022-01-21 2024-06-04 国微集团(深圳)有限公司 动态校准实时时钟的方法及装置
CN114886169B (zh) * 2022-03-31 2025-05-02 深圳市智慧芯图科技有限公司 一种电子烟吸烟检测方法、检测模块和电子烟

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CN1014468B (zh) * 1985-04-01 1991-10-23 霍尼韦尔资料系统有限公司 测量频率和时间的装置和方法
JPH0567967A (ja) 1991-09-09 1993-03-19 Nec Corp クロツク発生装置
US5424664A (en) * 1993-07-02 1995-06-13 Rockwell International Corporation Direct digital synthesizer with adjustable clock frequency
JP3125562B2 (ja) * 1994-03-10 2001-01-22 富士電機株式会社 クロック発生回路
KR960010758B1 (ko) * 1994-06-27 1996-08-08 엘지반도체 주식회사 주파수 측정회로
US6016312A (en) * 1997-02-28 2000-01-18 Motorola, Inc. Radiotelephone and method for clock calibration for slotted paging mode in a CDMA radiotelephone system
EP0939495B1 (en) 1998-02-26 2004-04-14 Motorola Semiconducteurs S.A. Power saving system for an electronic portable device
US6088602A (en) 1998-03-27 2000-07-11 Lsi Logic Corporation High resolution frequency calibrator for sleep mode clock in wireless communications mobile station
US6124764A (en) * 1999-01-22 2000-09-26 Telefonaktiebolaget Lm Ericsson Stable low-power oscillator
US6304517B1 (en) 1999-06-18 2001-10-16 Telefonaktiebolaget Lm Ericsson (Publ) Method and apparatus for real time clock frequency error correction
KR100295812B1 (ko) * 1999-06-18 2001-07-12 서평원 고속 위상검출기를 이용한 디지털 위상동기루프
EP1137186B1 (en) * 2000-03-20 2004-07-21 Motorola, Inc. An adjustable spread spectrum clock generator and a method thereof
US6725067B1 (en) * 2000-03-24 2004-04-20 International Business Machines Corporation Method and system for restarting a reference clock of a mobile station after a sleep period with a zero mean time error
DE10029421C2 (de) 2000-06-15 2002-07-11 Infineon Technologies Ag Kalibriervorrichtung und -verfahren für die Taktgenerierung auf einem integrierten Schaltkreis
US6889055B1 (en) 2000-10-16 2005-05-03 Qualcomm Inc. Technique for reducing average power consumption in a wireless communications device
EP1340321A1 (en) 2000-12-07 2003-09-03 QUALCOMM Incorporated Method and apparatus for compensating for frequency drift in a low frequency sleep clock within a mobile station operating in a slotted paging mode
EP1532738B1 (de) 2002-08-26 2008-01-02 Infineon Technologies AG Verfahren und vorrichtung zum erfassen von periodendauerschwankungen periodischer signale
GB2397465B (en) 2003-01-15 2004-12-29 Nec Technologies Mobile radio communications device and operating method
JP4119774B2 (ja) * 2003-03-13 2008-07-16 京セラ株式会社 携帯電話機及び携帯電話機のｒｔｃ補正方法
DE60311851D1 (de) 2003-12-29 2007-03-29 St Microelectronics Srl Vorrichtung und Verfahren zur Oszillatorfrequenzkalibrierung und Phasenregelkreis diese benützend.
US20050221870A1 (en) 2004-04-06 2005-10-06 Integration Associates Inc. Method and circuit for determining a slow clock calibration factor
KR100673885B1 (ko) * 2004-04-27 2007-01-26 주식회사 하이닉스반도체 반도체 기억 소자의 듀티 싸이클 교정 장치 및 그 방법

Also Published As

Publication number Publication date
DE602007006341D1 (de) 2010-06-17
US7272078B1 (en) 2007-09-18
WO2008043629A1 (en) 2008-04-17
EP2089970B1 (en) 2010-05-05
JP4994456B2 (ja) 2012-08-08
HK1133334A1 (en) 2010-03-19
BRPI0717795B1 (pt) 2020-01-07
EP2089970A1 (en) 2009-08-19
CN101523726B (zh) 2012-01-11
TWI399548B (zh) 2013-06-21
DK2089970T3 (da) 2010-08-16
CN101523726A (zh) 2009-09-02
BRPI0717795A2 (pt) 2014-04-15
TW200821588A (en) 2008-05-16
ATE467272T1 (de) 2010-05-15
JP2010506523A (ja) 2010-02-25

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