ES2197000B2 - Metodo de ajuste de una caracteristica en un procedimiento de fabricacion de productos. - Google Patents
Metodo de ajuste de una caracteristica en un procedimiento de fabricacion de productos.Info
- Publication number
- ES2197000B2 ES2197000B2 ES200200702A ES200200702A ES2197000B2 ES 2197000 B2 ES2197000 B2 ES 2197000B2 ES 200200702 A ES200200702 A ES 200200702A ES 200200702 A ES200200702 A ES 200200702A ES 2197000 B2 ES2197000 B2 ES 2197000B2
- Authority
- ES
- Spain
- Prior art keywords
- procedure
- characteristic
- product manufacturing
- control
- processing condition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G16—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS
- G16Z—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS, NOT OTHERWISE PROVIDED FOR
- G16Z99/00—Subject matter not provided for in other main groups of this subclass
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Program-control systems
- G05B19/02—Program-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
- G05B19/41865—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by job scheduling, process planning, material flow
-
- G06F19/00—
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/31—From computer integrated manufacturing till monitoring
- G05B2219/31426—Real time database management for production control
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/45—Nc applications
- G05B2219/45031—Manufacturing semiconductor wafers
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Automation & Control Theory (AREA)
- Feedback Control In General (AREA)
- Measuring Oxygen Concentration In Cells (AREA)
- General Factory Administration (AREA)
- Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
- Management, Administration, Business Operations System, And Electronic Commerce (AREA)
Abstract
Método de ajuste de una característica en un procedimiento de fabricación de productos. En una base de datos de control del procedimiento, las características intermedias, la condición de procesamiento para controlar una característica y una característica final en un procedimiento de fabricación de productos son almacenados como conjunto de datos para cada lote de productos. En "Procedimiento 1" es preparado un conjunto de datos para cada lote de productos. A continuación en "Procedimiento 2" es realizado un procedimiento por conglomerados sobre cada conjunto de datos obtenidos en "Procedimiento 1". En "Procedimiento 3", usando el conjunto de datos obtenidos en "Procedimiento 2", son introducidas las características intermedias y la condición de procesamiento para controlar una característica y es obtenida la característica final, y una relación causal entre la entrada y la salida es cuantificada mediante una red neural para confeccionar un modelo de aprendizaje. En una etapa de aplicacióndel modelo es seleccionada la condición de procesamiento más apropiada para controlar una característica usando el modelo de aprendizaje y las características intermedias en las etapas anteriores.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001089882A JP4677679B2 (ja) | 2001-03-27 | 2001-03-27 | 製品の製造プロセスにおける特性調整方法 |
| JP2001-89882 | 2001-03-27 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| ES2197000A1 ES2197000A1 (es) | 2003-12-16 |
| ES2197000B2 true ES2197000B2 (es) | 2004-11-16 |
Family
ID=18944744
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ES200200702A Expired - Fee Related ES2197000B2 (es) | 2001-03-27 | 2002-03-25 | Metodo de ajuste de una caracteristica en un procedimiento de fabricacion de productos. |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US6662059B2 (es) |
| JP (1) | JP4677679B2 (es) |
| ES (1) | ES2197000B2 (es) |
Families Citing this family (62)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10350525A1 (de) * | 2003-10-29 | 2005-06-09 | Bayer Technology Services Gmbh | Verfahren zur Visualisierung der ADME-Eigenschaften chemischer Substanzen |
| JP3705296B1 (ja) | 2004-04-30 | 2005-10-12 | オムロン株式会社 | 品質制御装置およびその制御方法、品質制御プログラム、並びに該プログラムを記録した記録媒体 |
| JP4364828B2 (ja) * | 2005-04-11 | 2009-11-18 | 住友重機械工業株式会社 | 成形機監視装置、方法及びプログラム |
| US7536364B2 (en) * | 2005-04-28 | 2009-05-19 | General Electric Company | Method and system for performing model-based multi-objective asset optimization and decision-making |
| US20060247798A1 (en) * | 2005-04-28 | 2006-11-02 | Subbu Rajesh V | Method and system for performing multi-objective predictive modeling, monitoring, and update for an asset |
| US7672745B1 (en) * | 2006-03-20 | 2010-03-02 | Tuszynski Steve W | Manufacturing process analysis and optimization system |
| DE102007025447A1 (de) * | 2006-10-09 | 2008-04-17 | Siemens Ag | Verfahren zur Steuerung und/oder Regelung eines industriellen Prozesses |
| US7546170B2 (en) * | 2007-01-02 | 2009-06-09 | Neuroblast, Inc. | Easily tuned and robust control algorithm for single or multiple variable systems |
| JP4498376B2 (ja) * | 2007-03-26 | 2010-07-07 | 日本特殊陶業株式会社 | ガスセンサの製造方法 |
| EP2150971B1 (en) | 2007-05-11 | 2018-11-28 | Umicore AG & Co. KG | Method and apparatus for making uniform and ultrasmall nanoparticles |
| US8481449B1 (en) | 2007-10-15 | 2013-07-09 | SDCmaterials, Inc. | Method and system for forming plug and play oxide catalysts |
| JP5338492B2 (ja) * | 2009-06-08 | 2013-11-13 | 富士電機株式会社 | 入力変数選択支援装置 |
| US9149797B2 (en) | 2009-12-15 | 2015-10-06 | SDCmaterials, Inc. | Catalyst production method and system |
| US9119309B1 (en) | 2009-12-15 | 2015-08-25 | SDCmaterials, Inc. | In situ oxide removal, dispersal and drying |
| US8545652B1 (en) | 2009-12-15 | 2013-10-01 | SDCmaterials, Inc. | Impact resistant material |
| US8557727B2 (en) | 2009-12-15 | 2013-10-15 | SDCmaterials, Inc. | Method of forming a catalyst with inhibited mobility of nano-active material |
| US8652992B2 (en) | 2009-12-15 | 2014-02-18 | SDCmaterials, Inc. | Pinning and affixing nano-active material |
| US9126191B2 (en) | 2009-12-15 | 2015-09-08 | SDCmaterials, Inc. | Advanced catalysts for automotive applications |
| US8803025B2 (en) | 2009-12-15 | 2014-08-12 | SDCmaterials, Inc. | Non-plugging D.C. plasma gun |
| US8470112B1 (en) | 2009-12-15 | 2013-06-25 | SDCmaterials, Inc. | Workflow for novel composite materials |
| JP5571528B2 (ja) * | 2010-10-28 | 2014-08-13 | 株式会社日立製作所 | 生産情報管理装置および生産情報管理方法 |
| US8669202B2 (en) | 2011-02-23 | 2014-03-11 | SDCmaterials, Inc. | Wet chemical and plasma methods of forming stable PtPd catalysts |
| EP2744590A4 (en) | 2011-08-19 | 2016-03-16 | Sdcmaterials Inc | COATED SUBSTRATES FOR USE IN CATALYSIS AND CATALYSTS AND METHOD FOR COATING SUBSTRATES WITH PRIMING COMPOSITIONS |
| CN102393855B (zh) * | 2011-10-18 | 2013-07-31 | 国电南瑞科技股份有限公司 | 一种过程数据有损压缩比动态控制方法 |
| US9156025B2 (en) | 2012-11-21 | 2015-10-13 | SDCmaterials, Inc. | Three-way catalytic converter using nanoparticles |
| US9511352B2 (en) | 2012-11-21 | 2016-12-06 | SDCmaterials, Inc. | Three-way catalytic converter using nanoparticles |
| US9586179B2 (en) | 2013-07-25 | 2017-03-07 | SDCmaterials, Inc. | Washcoats and coated substrates for catalytic converters and methods of making and using same |
| JP2016535664A (ja) | 2013-10-22 | 2016-11-17 | エスディーシーマテリアルズ, インコーポレイテッド | リーンNOxトラップの組成物 |
| US9427732B2 (en) | 2013-10-22 | 2016-08-30 | SDCmaterials, Inc. | Catalyst design for heavy-duty diesel combustion engines |
| EP3119500A4 (en) | 2014-03-21 | 2017-12-13 | SDC Materials, Inc. | Compositions for passive nox adsorption (pna) systems |
| JP6477423B2 (ja) * | 2015-11-02 | 2019-03-06 | オムロン株式会社 | 製造プロセスの予測システムおよび予測制御システム |
| JP6351880B2 (ja) * | 2016-01-15 | 2018-07-04 | 三菱電機株式会社 | 計画生成装置、計画生成方法及び計画生成プログラム |
| JP6583097B2 (ja) * | 2016-03-31 | 2019-10-02 | 株式会社デンソーウェーブ | パラメータ調整装置 |
| JP6748474B2 (ja) * | 2016-04-18 | 2020-09-02 | 株式会社日立製作所 | 意思決定支援システムおよび意思決定支援方法 |
| JP6781957B2 (ja) * | 2017-03-14 | 2020-11-11 | オムロン株式会社 | 通知装置、通知方法、及びそのプログラム |
| JP6781956B2 (ja) * | 2017-03-14 | 2020-11-11 | オムロン株式会社 | 学習結果比較装置、学習結果比較方法、及びそのプログラム |
| JP6778666B2 (ja) * | 2017-08-24 | 2020-11-04 | 株式会社日立製作所 | 探索装置及び探索方法 |
| JP6896590B2 (ja) * | 2017-11-08 | 2021-06-30 | 三菱重工航空エンジン株式会社 | 予知モデル維持システム、予知モデル維持方法及び予知モデル維持プログラム |
| US12346834B2 (en) | 2018-01-22 | 2025-07-01 | International Business Machines Corporation | Free-form production based on causal predictive models |
| JP7153477B2 (ja) * | 2018-06-13 | 2022-10-14 | 日本放送協会 | 情報判定モデル学習装置およびそのプログラム |
| JP7062577B2 (ja) * | 2018-11-21 | 2022-05-06 | 株式会社日立製作所 | 製造条件特定システムおよび方法 |
| JP7301968B2 (ja) | 2018-12-18 | 2023-07-03 | アルセロールミタル | 中間金属製品のグループからの最終金属製品のグループの製造を制御するための方法および電子デバイス、関連するコンピュータプログラム、製造方法および設備 |
| US11209795B2 (en) | 2019-02-28 | 2021-12-28 | Nanotronics Imaging, Inc. | Assembly error correction for assembly lines |
| JP7584409B2 (ja) * | 2019-06-04 | 2024-11-15 | ホソカワミクロン株式会社 | 学習モデルの生成方法、コンピュータプログラム、学習モデル、制御装置、及び制御方法 |
| JP7439467B2 (ja) * | 2019-06-11 | 2024-02-28 | 富士電機株式会社 | 情報処理装置、情報処理システム、モデルの学習方法 |
| US11156991B2 (en) | 2019-06-24 | 2021-10-26 | Nanotronics Imaging, Inc. | Predictive process control for a manufacturing process |
| US11063965B1 (en) | 2019-12-19 | 2021-07-13 | Nanotronics Imaging, Inc. | Dynamic monitoring and securing of factory processes, equipment and automated systems |
| US11100221B2 (en) | 2019-10-08 | 2021-08-24 | Nanotronics Imaging, Inc. | Dynamic monitoring and securing of factory processes, equipment and automated systems |
| WO2021092329A1 (en) * | 2019-11-06 | 2021-05-14 | Nanotronics Imaging, Inc. | Systems, methods, and media for manufacturing processes |
| US12165353B2 (en) | 2019-11-06 | 2024-12-10 | Nanotronics Imaging, Inc. | Systems, methods, and media for manufacturing processes |
| US12153408B2 (en) | 2019-11-06 | 2024-11-26 | Nanotronics Imaging, Inc. | Systems, methods, and media for manufacturing processes |
| JP7438723B2 (ja) | 2019-11-15 | 2024-02-27 | 株式会社日立製作所 | 製造プロセスの適正化システムおよびその方法 |
| EP4062285A4 (en) | 2019-11-20 | 2023-12-27 | Nanotronics Imaging, Inc. | SECURING INDUSTRIAL MANUFACTURING FROM SOPHISTICATED ATTACKS |
| KR102952338B1 (ko) * | 2019-11-25 | 2026-04-15 | 삼성전자주식회사 | 반도체 공정 시뮬레이션 시스템 및 그것의 시뮬레이션 방법 |
| US11086988B1 (en) | 2020-02-28 | 2021-08-10 | Nanotronics Imaging, Inc. | Method, systems and apparatus for intelligently emulating factory control systems and simulating response data |
| JP7479874B2 (ja) * | 2020-03-09 | 2024-05-09 | イビデン株式会社 | 連続焼成炉及び連続焼成方法 |
| US20230185290A1 (en) | 2020-06-16 | 2023-06-15 | Konica Minolta, Inc. | Prediction score calculation device, prediction score calculation method, prediction score calculation program, and learning device |
| JP7548839B2 (ja) | 2021-02-09 | 2024-09-10 | 住友重機械イオンテクノロジー株式会社 | イオン注入装置およびイオン注入方法 |
| JP7563250B2 (ja) * | 2021-03-11 | 2024-10-08 | オムロン株式会社 | 制御システム、予測モデル生成装置、及びコンピュータプログラム |
| JP2023008857A (ja) * | 2021-07-05 | 2023-01-19 | 株式会社島津製作所 | データ処理装置および推論方法 |
| US12613518B2 (en) * | 2022-01-27 | 2026-04-28 | Hitachi, Ltd. | Optimizing execution of multiple machine learning models over a single edge device |
| KR102554905B1 (ko) * | 2023-05-10 | 2023-07-12 | 셀렉트스타 주식회사 | 학습데이터 모집단에서 최종학습데이터셋을 도출하는 방법, 컴퓨팅장치 및 컴퓨터-판독가능 매체 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5397514A (en) * | 1990-10-25 | 1995-03-14 | Bruckner Maschinenbau Gernot Bruckner Gmbh & Co. Kg | Process for producing flat and annular-cross-section extrudates and device for implementing the process |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62264854A (ja) * | 1986-05-12 | 1987-11-17 | Seiko Epson Corp | 製造プラント管理システム |
| JPH05204407A (ja) | 1992-01-28 | 1993-08-13 | Matsushita Electric Works Ltd | プロセスの特性予測方法ならびにその予測方法を用いたプロセスの監視方法およびプロセスの制御方法 |
| JPH06301690A (ja) * | 1993-04-13 | 1994-10-28 | Hitachi Ltd | 製造ライン及び該製造ラインにおける条件設定方法 |
| US5692107A (en) * | 1994-03-15 | 1997-11-25 | Lockheed Missiles & Space Company, Inc. | Method for generating predictive models in a computer system |
| WO1997012300A1 (en) * | 1995-09-26 | 1997-04-03 | Boiquaye William J N O | Adaptive control process and system |
| US6363289B1 (en) * | 1996-09-23 | 2002-03-26 | Pavilion Technologies, Inc. | Residual activation neural network |
| JPH10187206A (ja) | 1996-12-27 | 1998-07-14 | Kawasaki Steel Corp | 処理プロセス予測値算出装置および圧延処理プロセス予測値算出装置 |
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| US6405140B1 (en) * | 1999-09-15 | 2002-06-11 | General Electric Company | System and method for paper web time-break prediction |
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-
2001
- 2001-03-27 JP JP2001089882A patent/JP4677679B2/ja not_active Expired - Lifetime
-
2002
- 2002-03-22 US US10/102,975 patent/US6662059B2/en not_active Expired - Lifetime
- 2002-03-25 ES ES200200702A patent/ES2197000B2/es not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5397514A (en) * | 1990-10-25 | 1995-03-14 | Bruckner Maschinenbau Gernot Bruckner Gmbh & Co. Kg | Process for producing flat and annular-cross-section extrudates and device for implementing the process |
Non-Patent Citations (1)
| Title |
|---|
| DANIEL PEÑA. "Estadística Modelos y Métodos 2. Modelos Lineales y series temporales". 2ª Edición. 1993. Ed. Alianza Universal Textos. Capítulo 8, páginas 29-78. * |
Also Published As
| Publication number | Publication date |
|---|---|
| JP4677679B2 (ja) | 2011-04-27 |
| ES2197000A1 (es) | 2003-12-16 |
| JP2002287803A (ja) | 2002-10-04 |
| US20020143417A1 (en) | 2002-10-03 |
| US6662059B2 (en) | 2003-12-09 |
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