ES2180604T3 - Procedimiento y aparato para la carga y la descarga automatica de tarjetas de circuitos impresos en maquinas para la verificacion electrica. - Google Patents
Procedimiento y aparato para la carga y la descarga automatica de tarjetas de circuitos impresos en maquinas para la verificacion electrica.Info
- Publication number
- ES2180604T3 ES2180604T3 ES95117244T ES95117244T ES2180604T3 ES 2180604 T3 ES2180604 T3 ES 2180604T3 ES 95117244 T ES95117244 T ES 95117244T ES 95117244 T ES95117244 T ES 95117244T ES 2180604 T3 ES2180604 T3 ES 2180604T3
- Authority
- ES
- Spain
- Prior art keywords
- printed circuit
- circuits
- appliance
- machines
- area
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S209/00—Classifying, separating, and assorting solids
- Y10S209/905—Feeder conveyor holding item by suction
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Charge And Discharge Circuits For Batteries Or The Like (AREA)
Abstract
SE DESCRIBE UN METODO PARA LA CARGA Y DESCARGA AUTOMATICA DE TARJETAS DE CIRCUITO IMPRESO EN MAQUINAS PARA COMPROBACION ELECTRICA, EL METODO CONSTA DEL SUMINISTRO DE LOS CIRCUITOS A COMPROBAR A UN AREA DE RECOGIDA (16), LA DETECCION DE LA POSICION DE LOS CIRCUITOS SIMPLES Y LA COMPARACION DE LA POSICION DETECTADA CON UNA POSICION DE REFERENCIA CORRECTA, LA TRANSFERENCIA DE LOS CIRCUITOS DESDE EL AREA DE RECOGIDA (16) HASTA UN AREA DE CARGA (4) EN LA MAQUINA DE COMPROBACION, LA TOMA EN CUENTA DURANTE LA TRANSFERENCIA DE CUALQUIER DESVIACION DE LA POSICION ACTUAL DE LA TARJETA DE CIRCUITO IMPRESO DE LA POSICION DE REFERENCIA, DE MANERA QUE EL CIRCUITO IMPRESO SEA SIEMPRE RECOGIDO DE LA MISMA FORMA, PARA SER DISPUESTO EN LA REGION PREESTABLECIDA DEL AREA DE CARGA (4), Y LA DESCARGA DE LOS CIRCUITOS COMPROBADOS DESDE EL AREA (4) DE LA MAQUINA SOBRE UNA LINEA DE DESCARGA (7) PARA CIRCUITOS EN BUEN ESTADO Y UN DEPOSITO (17) PARA CIRCUITOS CON FALLOS, DEPENDIENDO DEL RESULTADO DE LA COMPROBACION.TAMBIEN SE DESCRIBE UN APARATO PARA LLEVAR A CABO EL METODO.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ITMI942422A IT1272853B (it) | 1994-11-30 | 1994-11-30 | Metodo e apparecchiatura per il carico e lo scarico automatico di circuiti stampati su macchine per l'esecuzione del test elettrico |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2180604T3 true ES2180604T3 (es) | 2003-02-16 |
Family
ID=11369933
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES95117244T Expired - Lifetime ES2180604T3 (es) | 1994-11-30 | 1995-11-02 | Procedimiento y aparato para la carga y la descarga automatica de tarjetas de circuitos impresos en maquinas para la verificacion electrica. |
Country Status (6)
Country | Link |
---|---|
US (1) | US5848705A (es) |
EP (1) | EP0715174B1 (es) |
CA (1) | CA2162785C (es) |
DE (1) | DE69527917T2 (es) |
ES (1) | ES2180604T3 (es) |
IT (1) | IT1272853B (es) |
Families Citing this family (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6429670B2 (en) * | 1995-07-18 | 2002-08-06 | Murata Manufacturing Co., Ltd. | Method of examining posture of an electronic part |
IT1282617B1 (it) * | 1996-02-13 | 1998-03-31 | Circuit Line Spa | Metodo e dispositivo per l'eliminazione dell'errore di centraggio nella fase di test elettrico di circuiti stampati |
US6112905A (en) * | 1996-07-31 | 2000-09-05 | Aseco Corporation | Automatic semiconductor part handler |
US6094061A (en) * | 1997-12-31 | 2000-07-25 | Gte Communication Systems Corporation | Automated testing method for electronic circuitry |
US6232766B1 (en) * | 1997-12-31 | 2001-05-15 | Gte Communication Systems Corporation | Test station for sequential testing |
US6246251B1 (en) * | 1998-04-24 | 2001-06-12 | International Rectifier Corp. | Test process and apparatus for testing singulated semiconductor die |
KR100269948B1 (ko) * | 1998-08-07 | 2000-10-16 | 윤종용 | 반도체 번-인 공정의 반도체 디바이스 추출/삽입 및자동분류장치 |
US6218852B1 (en) * | 1998-10-29 | 2001-04-17 | Paul E. Smith | Automated circuit board testing apparatus |
DE19923384A1 (de) * | 1999-05-21 | 2000-11-23 | Atg Test Systems Gmbh | Vorrichtung zum automatischen Testen von unbestückten Leiterplatten |
KR100310706B1 (ko) * | 1999-10-15 | 2001-10-18 | 윤종용 | 솔더볼 어탯치 시스템 및 그에 따른 솔더볼 어탯치 방법 |
US6521853B1 (en) * | 2000-05-08 | 2003-02-18 | Micro Component Technology, Inc. | Method and apparatus for sorting semiconductor devices |
FI117809B (fi) * | 2000-09-21 | 2007-02-28 | Cencorp Oyj | Testausjärjestelmä piirilevyvalmistuslinjassa piirilevyjen automaattiseksi testaamiseksi |
US7819163B2 (en) * | 2003-09-16 | 2010-10-26 | Masonite Corporation | Automated door assembly system and method |
US20050139525A1 (en) * | 2003-11-28 | 2005-06-30 | Tung-Hung Tsai | Chip sorting apparatus and method for fabricating the same |
US7345254B2 (en) * | 2003-12-09 | 2008-03-18 | Asm Assembly Automation Ltd. | Die sorting apparatus and method |
CN101900787A (zh) * | 2009-05-25 | 2010-12-01 | 鸿富锦精密工业(深圳)有限公司 | 电路板测试系统及方法 |
EP2284862A1 (en) * | 2009-08-11 | 2011-02-16 | Nederlandse Organisatie voor toegepast -natuurwetenschappelijk onderzoek TNO | System and method for picking and placement of chip dies |
CN101943708B (zh) * | 2010-09-01 | 2012-03-21 | 王少波 | 一种自动测试机 |
CN102103182B (zh) * | 2010-11-29 | 2013-09-04 | 经续检验技术(东莞)有限公司 | 耐高压自动检测设备 |
TW201228786A (en) * | 2011-01-13 | 2012-07-16 | Hon Hai Prec Ind Co Ltd | Mechanical arm movement controlling system and method |
CN102976097B (zh) * | 2012-11-30 | 2015-01-14 | 胡小青 | 自动完成检查装置的用途 |
CN104609126B (zh) * | 2012-11-30 | 2016-08-24 | 胡小青 | 一种自动完成检查装置的工作方法 |
CN102981080B (zh) * | 2012-11-30 | 2016-06-08 | 机械科学研究总院青岛分院 | 自动中间检查装置及其方法 |
WO2014145510A1 (en) | 2013-03-15 | 2014-09-18 | Masonite Corporation | Automated door assembly systems and methods |
US9511573B2 (en) | 2013-07-25 | 2016-12-06 | Masonite Corporation | Automated door assembly, press, and adhesive therefor |
CN104897053A (zh) * | 2014-03-05 | 2015-09-09 | 泰科电子(上海)有限公司 | 可编程数字化机器视觉检测平台 |
KR102650702B1 (ko) * | 2016-03-04 | 2024-03-25 | (주)테크윙 | 전자부품 공급용 트레이 공급대차 및 전자부품을 처리하는 핸들러 |
CN106324478A (zh) * | 2016-08-05 | 2017-01-11 | Tcl王牌电器(惠州)有限公司 | Pcba测试设备 |
CN108971023A (zh) * | 2017-01-03 | 2018-12-11 | 东莞理工学院 | 一种pcb线路板检测下料一体机 |
CN107470170B (zh) * | 2017-07-13 | 2019-03-19 | 上海第二工业大学 | 基于机器视觉的pcb检测分拣系统及方法 |
CN108144872A (zh) * | 2017-12-25 | 2018-06-12 | 东莞辰达电器有限公司 | 一种利用ccd视觉技术的pcba自动外观检查系统 |
CN110723523B (zh) * | 2019-10-23 | 2021-10-22 | 珠海格力智能装备有限公司 | 收板机的控制方法、装置及系统 |
CN110665832A (zh) * | 2019-11-18 | 2020-01-10 | 珠海景旺柔性电路有限公司 | Fpc功能测试与规范放取一体化的操作方法 |
CN111744820B (zh) * | 2020-06-13 | 2022-02-11 | 深圳市宏毅泰科技有限公司 | 一种印刷线路板的自动化测试设备及其流水线接驳方法 |
CN112526626B (zh) * | 2020-06-29 | 2023-09-12 | 北京清大视觉科技有限公司 | 一种安检托盘清空状态智能检测系统及方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2643809B2 (de) * | 1976-09-29 | 1980-10-09 | Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt | Verfahren zum Einjustieren eines Körpers |
US4208675A (en) * | 1978-03-20 | 1980-06-17 | Agence Nationale De Valorization De La Recherche (Anvar) | Method and apparatus for positioning an object |
DE2929846A1 (de) * | 1979-07-23 | 1981-03-12 | Siemens AG, 1000 Berlin und 8000 München | Opto-elektronisches pruefsystem zur automatischen beschaffenheitspruefung von leiterplatten, deren zwischenprodukte und druckwerkzeuge |
US4593820A (en) * | 1984-03-28 | 1986-06-10 | International Business Machines Corporation | Robotic, in-transit, device tester/sorter |
US4682695A (en) * | 1984-03-30 | 1987-07-28 | Hasenbalg Ralph D | Automated keyboard testing |
CH674817A5 (es) * | 1986-08-11 | 1990-07-31 | Hitachi Seiko Kk | |
DE3728818A1 (de) * | 1987-08-28 | 1989-03-16 | Muet Gmbh | Anordnung zum ermitteln und beseitigen von fertigungsfehlern einer elektrischen baugruppe |
JP2921937B2 (ja) * | 1990-07-18 | 1999-07-19 | 東京エレクトロン株式会社 | Ic検査装置 |
US5299693A (en) * | 1991-04-12 | 1994-04-05 | Ubaldi Richard A | Method and apparatus for extracting selected materials |
JPH069007A (ja) * | 1992-06-24 | 1994-01-18 | Fujitsu Ltd | プリント板ユニット自動給排装置 |
IT1266653B1 (it) * | 1993-11-02 | 1997-01-09 | Circuit Line Spa | Macchina per eseguire il test elettrico simultaneo, sulle due facce di una piastra con circuiti stampati |
-
1994
- 1994-11-30 IT ITMI942422A patent/IT1272853B/it active IP Right Grant
-
1995
- 1995-11-02 EP EP95117244A patent/EP0715174B1/en not_active Expired - Lifetime
- 1995-11-02 DE DE69527917T patent/DE69527917T2/de not_active Expired - Fee Related
- 1995-11-02 ES ES95117244T patent/ES2180604T3/es not_active Expired - Lifetime
- 1995-11-14 CA CA002162785A patent/CA2162785C/en not_active Expired - Fee Related
- 1995-12-01 US US08/566,174 patent/US5848705A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
ITMI942422A0 (it) | 1994-11-30 |
EP0715174B1 (en) | 2002-08-28 |
CA2162785A1 (en) | 1996-05-31 |
ITMI942422A1 (it) | 1996-05-30 |
DE69527917T2 (de) | 2003-04-24 |
IT1272853B (it) | 1997-06-30 |
EP0715174A3 (en) | 1997-03-19 |
DE69527917D1 (de) | 2002-10-02 |
CA2162785C (en) | 2003-10-14 |
US5848705A (en) | 1998-12-15 |
EP0715174A2 (en) | 1996-06-05 |
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