ES2180604T3 - Procedimiento y aparato para la carga y la descarga automatica de tarjetas de circuitos impresos en maquinas para la verificacion electrica. - Google Patents

Procedimiento y aparato para la carga y la descarga automatica de tarjetas de circuitos impresos en maquinas para la verificacion electrica.

Info

Publication number
ES2180604T3
ES2180604T3 ES95117244T ES95117244T ES2180604T3 ES 2180604 T3 ES2180604 T3 ES 2180604T3 ES 95117244 T ES95117244 T ES 95117244T ES 95117244 T ES95117244 T ES 95117244T ES 2180604 T3 ES2180604 T3 ES 2180604T3
Authority
ES
Spain
Prior art keywords
printed circuit
circuits
appliance
machines
area
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES95117244T
Other languages
English (en)
Inventor
Gianpaolo Antonello
Giovanni Marchi
Riccardo Martini
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mania Tecnologie Italia SpA
Original Assignee
Mania Tecnologie Italia SpA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mania Tecnologie Italia SpA filed Critical Mania Tecnologie Italia SpA
Application granted granted Critical
Publication of ES2180604T3 publication Critical patent/ES2180604T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834Automated test systems [ATE]; using microprocessors or computers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S209/00Classifying, separating, and assorting solids
    • Y10S209/905Feeder conveyor holding item by suction

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Charge And Discharge Circuits For Batteries Or The Like (AREA)

Abstract

SE DESCRIBE UN METODO PARA LA CARGA Y DESCARGA AUTOMATICA DE TARJETAS DE CIRCUITO IMPRESO EN MAQUINAS PARA COMPROBACION ELECTRICA, EL METODO CONSTA DEL SUMINISTRO DE LOS CIRCUITOS A COMPROBAR A UN AREA DE RECOGIDA (16), LA DETECCION DE LA POSICION DE LOS CIRCUITOS SIMPLES Y LA COMPARACION DE LA POSICION DETECTADA CON UNA POSICION DE REFERENCIA CORRECTA, LA TRANSFERENCIA DE LOS CIRCUITOS DESDE EL AREA DE RECOGIDA (16) HASTA UN AREA DE CARGA (4) EN LA MAQUINA DE COMPROBACION, LA TOMA EN CUENTA DURANTE LA TRANSFERENCIA DE CUALQUIER DESVIACION DE LA POSICION ACTUAL DE LA TARJETA DE CIRCUITO IMPRESO DE LA POSICION DE REFERENCIA, DE MANERA QUE EL CIRCUITO IMPRESO SEA SIEMPRE RECOGIDO DE LA MISMA FORMA, PARA SER DISPUESTO EN LA REGION PREESTABLECIDA DEL AREA DE CARGA (4), Y LA DESCARGA DE LOS CIRCUITOS COMPROBADOS DESDE EL AREA (4) DE LA MAQUINA SOBRE UNA LINEA DE DESCARGA (7) PARA CIRCUITOS EN BUEN ESTADO Y UN DEPOSITO (17) PARA CIRCUITOS CON FALLOS, DEPENDIENDO DEL RESULTADO DE LA COMPROBACION.TAMBIEN SE DESCRIBE UN APARATO PARA LLEVAR A CABO EL METODO.
ES95117244T 1994-11-30 1995-11-02 Procedimiento y aparato para la carga y la descarga automatica de tarjetas de circuitos impresos en maquinas para la verificacion electrica. Expired - Lifetime ES2180604T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ITMI942422A IT1272853B (it) 1994-11-30 1994-11-30 Metodo e apparecchiatura per il carico e lo scarico automatico di circuiti stampati su macchine per l'esecuzione del test elettrico

Publications (1)

Publication Number Publication Date
ES2180604T3 true ES2180604T3 (es) 2003-02-16

Family

ID=11369933

Family Applications (1)

Application Number Title Priority Date Filing Date
ES95117244T Expired - Lifetime ES2180604T3 (es) 1994-11-30 1995-11-02 Procedimiento y aparato para la carga y la descarga automatica de tarjetas de circuitos impresos en maquinas para la verificacion electrica.

Country Status (6)

Country Link
US (1) US5848705A (es)
EP (1) EP0715174B1 (es)
CA (1) CA2162785C (es)
DE (1) DE69527917T2 (es)
ES (1) ES2180604T3 (es)
IT (1) IT1272853B (es)

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US6232766B1 (en) * 1997-12-31 2001-05-15 Gte Communication Systems Corporation Test station for sequential testing
US6246251B1 (en) * 1998-04-24 2001-06-12 International Rectifier Corp. Test process and apparatus for testing singulated semiconductor die
KR100269948B1 (ko) * 1998-08-07 2000-10-16 윤종용 반도체 번-인 공정의 반도체 디바이스 추출/삽입 및자동분류장치
US6218852B1 (en) * 1998-10-29 2001-04-17 Paul E. Smith Automated circuit board testing apparatus
DE19923384A1 (de) * 1999-05-21 2000-11-23 Atg Test Systems Gmbh Vorrichtung zum automatischen Testen von unbestückten Leiterplatten
KR100310706B1 (ko) * 1999-10-15 2001-10-18 윤종용 솔더볼 어탯치 시스템 및 그에 따른 솔더볼 어탯치 방법
US6521853B1 (en) * 2000-05-08 2003-02-18 Micro Component Technology, Inc. Method and apparatus for sorting semiconductor devices
FI117809B (fi) * 2000-09-21 2007-02-28 Cencorp Oyj Testausjärjestelmä piirilevyvalmistuslinjassa piirilevyjen automaattiseksi testaamiseksi
US7819163B2 (en) * 2003-09-16 2010-10-26 Masonite Corporation Automated door assembly system and method
US20050139525A1 (en) * 2003-11-28 2005-06-30 Tung-Hung Tsai Chip sorting apparatus and method for fabricating the same
US7345254B2 (en) * 2003-12-09 2008-03-18 Asm Assembly Automation Ltd. Die sorting apparatus and method
CN101900787A (zh) * 2009-05-25 2010-12-01 鸿富锦精密工业(深圳)有限公司 电路板测试系统及方法
EP2284862A1 (en) * 2009-08-11 2011-02-16 Nederlandse Organisatie voor toegepast -natuurwetenschappelijk onderzoek TNO System and method for picking and placement of chip dies
CN101943708B (zh) * 2010-09-01 2012-03-21 王少波 一种自动测试机
CN102103182B (zh) * 2010-11-29 2013-09-04 经续检验技术(东莞)有限公司 耐高压自动检测设备
TW201228786A (en) * 2011-01-13 2012-07-16 Hon Hai Prec Ind Co Ltd Mechanical arm movement controlling system and method
CN102976097B (zh) * 2012-11-30 2015-01-14 胡小青 自动完成检查装置的用途
CN104609126B (zh) * 2012-11-30 2016-08-24 胡小青 一种自动完成检查装置的工作方法
CN102981080B (zh) * 2012-11-30 2016-06-08 机械科学研究总院青岛分院 自动中间检查装置及其方法
WO2014145510A1 (en) 2013-03-15 2014-09-18 Masonite Corporation Automated door assembly systems and methods
US9511573B2 (en) 2013-07-25 2016-12-06 Masonite Corporation Automated door assembly, press, and adhesive therefor
CN104897053A (zh) * 2014-03-05 2015-09-09 泰科电子(上海)有限公司 可编程数字化机器视觉检测平台
KR102650702B1 (ko) * 2016-03-04 2024-03-25 (주)테크윙 전자부품 공급용 트레이 공급대차 및 전자부품을 처리하는 핸들러
CN106324478A (zh) * 2016-08-05 2017-01-11 Tcl王牌电器(惠州)有限公司 Pcba测试设备
CN108971023A (zh) * 2017-01-03 2018-12-11 东莞理工学院 一种pcb线路板检测下料一体机
CN107470170B (zh) * 2017-07-13 2019-03-19 上海第二工业大学 基于机器视觉的pcb检测分拣系统及方法
CN108144872A (zh) * 2017-12-25 2018-06-12 东莞辰达电器有限公司 一种利用ccd视觉技术的pcba自动外观检查系统
CN110723523B (zh) * 2019-10-23 2021-10-22 珠海格力智能装备有限公司 收板机的控制方法、装置及系统
CN110665832A (zh) * 2019-11-18 2020-01-10 珠海景旺柔性电路有限公司 Fpc功能测试与规范放取一体化的操作方法
CN111744820B (zh) * 2020-06-13 2022-02-11 深圳市宏毅泰科技有限公司 一种印刷线路板的自动化测试设备及其流水线接驳方法
CN112526626B (zh) * 2020-06-29 2023-09-12 北京清大视觉科技有限公司 一种安检托盘清空状态智能检测系统及方法

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IT1266653B1 (it) * 1993-11-02 1997-01-09 Circuit Line Spa Macchina per eseguire il test elettrico simultaneo, sulle due facce di una piastra con circuiti stampati

Also Published As

Publication number Publication date
ITMI942422A0 (it) 1994-11-30
EP0715174B1 (en) 2002-08-28
CA2162785A1 (en) 1996-05-31
ITMI942422A1 (it) 1996-05-30
DE69527917T2 (de) 2003-04-24
IT1272853B (it) 1997-06-30
EP0715174A3 (en) 1997-03-19
DE69527917D1 (de) 2002-10-02
CA2162785C (en) 2003-10-14
US5848705A (en) 1998-12-15
EP0715174A2 (en) 1996-06-05

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