ES2080981T3 - Procedimiento y conjunto de medicion, para la medicion en linea, sin contacto, de la estructura de una superficie o del grosor de una capa. - Google Patents
Procedimiento y conjunto de medicion, para la medicion en linea, sin contacto, de la estructura de una superficie o del grosor de una capa.Info
- Publication number
- ES2080981T3 ES2080981T3 ES92106787T ES92106787T ES2080981T3 ES 2080981 T3 ES2080981 T3 ES 2080981T3 ES 92106787 T ES92106787 T ES 92106787T ES 92106787 T ES92106787 T ES 92106787T ES 2080981 T3 ES2080981 T3 ES 2080981T3
- Authority
- ES
- Spain
- Prior art keywords
- field
- temperature
- measurement
- infrared
- reflected radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005259 measurement Methods 0.000 title abstract 4
- 238000000034 method Methods 0.000 title 1
- 230000005855 radiation Effects 0.000 abstract 4
- 238000003754 machining Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0658—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of emissivity or reradiation
Abstract
CON UN RADIADOR 2 DE INFRARROJOS, CUYA TEMPERATURA SUPERFICIAL PERMANECE CONSTANTE DURANTE LA MEDICION, SE RADIA UN CAMPO DE MEDICION 4 SOBRE UNA SUPERFICIE DE MATERIAL BAJO UNA INCIDENCIA DE RADIACION INCLINADA. LA TEMPERATURA DE LA RADIACION REFLEJADA SE MIDE CON UN TERMOMETRO 3 DE INFRARROJOS, QUE SE ENCUENTRA DISPUESTO POR ENCIMA DEL CAMPO DE MEDIDA DE FORMA QUE LA RADIACION REFLEJADA INCIDE EN EL CAMPO DE MIRA DEL TERMOMETRO DE INFRARROJOS. LA TOTALIDAD DEL CAMPO DE MEDIDA DE LA SUPERFICIE DEL MATERIAL, QUE SE ENCUENTRA EN EL CAMPO DE MIRA DEL TERMOMETRO DE INFRARROJOS, DEBE SER RADIADA. SE ALMACENA EL CIRCUITO DE TEMPERATURA DE LA RADIACION REFLEJADA CON DEPENDENCIA DE EL ESTADO O CONDUCCION DE LA SUPERFICIE DEL MATERIAL EN UN EQUIPO DE COMPARACION 7. ESTE EQUIPO DE COMPARACION 7 DISPONE EN SU MEMORIA DE UN VALOR TEORICO PARA LA CONDICION DE LA SUPERFICIE DESEADA. SE MIDE LA TEMPERATURA DE INFRARROJOS DE LA SUPERFICIE DESCONOCIDA DEL MATERIAL EN UNA ZONA PROXIMA RELATIVA A LA CONDICION O ESTADO DE LA SUPERFICIE Y SE COMPARA CON EL CICLO DE TEMPERATURA ALMACENADO PARA LA DETERMINACION DEL TAMAÑO DE LOS PARAMETROS DE LA SUPERFICIE. CON EL VALOR OBTENIDO DE ESTA FORMA Y EL VALOR TEORICO ALMACENADO SE GENERA UNA SEÑAL DIFERENCIAL, QUE SE CONDUCE A TRAVES DE LA SALIDA 8 DEL EQUIPO DE COMPARACION 7 A UN CONTROLADOR 9 DEL EQUIPO DE MECANIZADO DEL MATERIAL.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE4114672A DE4114672A1 (de) | 1991-05-06 | 1991-05-06 | Verfahren und messanordnung zur beruehrungslosen on-line messung |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2080981T3 true ES2080981T3 (es) | 1996-02-16 |
Family
ID=6431036
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES92106787T Expired - Lifetime ES2080981T3 (es) | 1991-05-06 | 1992-04-21 | Procedimiento y conjunto de medicion, para la medicion en linea, sin contacto, de la estructura de una superficie o del grosor de una capa. |
Country Status (8)
Country | Link |
---|---|
US (1) | US5358333A (es) |
EP (1) | EP0512313B1 (es) |
JP (1) | JPH06201358A (es) |
KR (1) | KR100239839B1 (es) |
BR (1) | BR9201682A (es) |
CA (1) | CA2067999A1 (es) |
DE (2) | DE4114672A1 (es) |
ES (1) | ES2080981T3 (es) |
Families Citing this family (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2840181B2 (ja) * | 1993-08-20 | 1998-12-24 | 大日本スクリーン製造株式会社 | 多層膜試料の膜厚測定方法 |
AT407197B (de) * | 1993-11-03 | 2001-01-25 | Johann Gigerl | Thermografisches messverfahren zur wandstärkemessung von schmelzwannen,-tiegeln, -kesseln oder -behältern unter beiziehung von hilfsmitteln bei vollem betrieb |
DE4343076C2 (de) * | 1993-12-16 | 1997-04-03 | Phototherm Dr Petry Gmbh | Vorrichtung zum photothermischen Prüfen einer Oberfläche eines insbesondere bewegten Gegenstandes |
DE19520788C2 (de) * | 1995-01-13 | 2001-08-16 | Optisense Ges Fuer Optische Pr | Verfahren und Vorrichtung zur Bestimmung der Schichtdicke, der Leitfähigkeit und/oder der Schichtkontaktgüte von auf Substraten aufgetragenen Schichten |
US5654977A (en) * | 1995-02-02 | 1997-08-05 | Teledyne Industries Inc. | Method and apparatus for real time defect inspection of metal at elevated temperature |
US5833367A (en) | 1996-11-12 | 1998-11-10 | Trutek, Inc. | Tympanic thermometer probe cover |
US6030117A (en) | 1996-11-12 | 2000-02-29 | Trutek, Inc. | Tympanic thermometer probe cover |
US6000844A (en) * | 1997-03-04 | 1999-12-14 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Method and apparatus for the portable identification of material thickness and defects using spatially controlled heat application |
AU7807898A (en) | 1997-06-03 | 1998-12-21 | Trutek, Inc. | Tympanic thermometer with modular sensing probe |
US6013915A (en) * | 1998-02-10 | 2000-01-11 | Philip Morris Incorporated | Process control by transient thermography |
US5967992A (en) | 1998-06-03 | 1999-10-19 | Trutex, Inc. | Radiometric temperature measurement based on empirical measurements and linear functions |
DE19832833C2 (de) * | 1998-07-21 | 2002-01-31 | Fraunhofer Ges Forschung | Verfahren zur thermographischen Untersuchung eines Werkstückes und Vorrichtung hierfür |
DE19907804C1 (de) * | 1999-02-24 | 2000-03-09 | Phototherm Dr Petry Gmbh | Vorrichtung zur Bestimmung von thermosensitiven und optosensitiven Eigenschaften von Prüfkörpern |
US6123454A (en) | 1999-06-11 | 2000-09-26 | Trutek, Inc. | Tympanic thermometer disposable probe cover with further stretching prevention structure |
US7401976B1 (en) * | 2000-08-25 | 2008-07-22 | Art Advanced Research Technologies Inc. | Detection of defects by thermographic analysis |
US6794651B2 (en) * | 2002-06-13 | 2004-09-21 | The Boeing Company | Method of measuring chromated conversion coating amount using infrared absorbance |
US6903339B2 (en) * | 2002-11-26 | 2005-06-07 | The Boeing Company | Method of measuring thickness of an opaque coating using infrared absorbance |
DE10322271A1 (de) * | 2003-05-19 | 2004-12-16 | Universität Duisburg-Essen | Vorichtung und Verfahren zur Untersuchung von Körpern |
US7220966B2 (en) * | 2003-07-29 | 2007-05-22 | Toyota Motor Manufacturing North America, Inc. | Systems and methods for inspecting coatings, surfaces and interfaces |
US7129492B2 (en) * | 2003-07-29 | 2006-10-31 | Toyota Motor Manufacturing North America, Inc. | Systems and methods for inspecting coatings |
US7075086B2 (en) * | 2003-08-28 | 2006-07-11 | The Boeing Company | Measurement of metal polish quality |
EP1591750B1 (de) * | 2004-04-26 | 2016-04-13 | Applied Materials GmbH & Co. KG | Verfahren und Vorrichtung zur Regelung der Dicke einer Beschichtung auf einem in seiner Längsrichtung bewegten Band |
DE102004060235B4 (de) * | 2004-12-15 | 2006-12-21 | Jrw Technology + Engineering Gmbh | Verfahren und Vorrichtung zur Qualitätsprüfung von Werkstücken |
US8204294B2 (en) * | 2009-11-25 | 2012-06-19 | Toyota Motor Engineering & Manufacturing North America, Inc. | Systems and methods for detecting defects in coatings utilizing color-based thermal mismatch |
KR101249168B1 (ko) * | 2009-12-18 | 2013-03-29 | 주식회사 포스코 | 냉간압연에서의 품질이상 예지 시스템과 그 방법 |
CN104007071A (zh) * | 2014-06-05 | 2014-08-27 | 常州艾瑞特电子有限公司 | 一种红外金属检测仪 |
FR3022621B1 (fr) * | 2014-06-19 | 2022-04-29 | Poncot Jean Claude | Dispositif de mesure d'un ensemble de donnees spatiales d'epaisseur d(x,y) d'une couche mince et procede de mesure utilisant ledit dispositif |
CN104931426A (zh) * | 2015-06-24 | 2015-09-23 | 常州博美新材料科技有限公司 | 一种水下切粒机堵料检测装置 |
CN104949736A (zh) * | 2015-06-24 | 2015-09-30 | 常州博美新材料科技有限公司 | 水下切粒机堵料检测装置 |
WO2018017032A1 (en) * | 2016-07-21 | 2018-01-25 | Assan Alümi̇nyum San. Ve Ti̇c. A. Ş. | Measurement of oxide thickness on aluminum surface by ftir spectroscopy and chemometrics method |
US20180292313A1 (en) * | 2017-04-11 | 2018-10-11 | Novelis Inc. | Systems and methods of detecting coatings on metal substrates |
US10899089B2 (en) * | 2018-03-30 | 2021-01-26 | The Boeing Company | Automated fiber placement end effector with laminar gas cooling jet and infrared image processor for in-situ inspection |
CN111322933B (zh) * | 2020-03-18 | 2021-05-18 | 唐山学院 | 一种自动化平面度检测装置 |
CN112432582B (zh) * | 2020-11-06 | 2022-05-27 | 山东诚信工程建设监理有限公司 | 一种基于互联网的建筑工程用检测装置及其检测方法 |
CN114740045B (zh) * | 2022-06-10 | 2023-03-24 | 江苏满星测评信息技术有限公司 | 一种用于监测全季节控温薄膜材料控温性能的系统 |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3206603A (en) * | 1962-08-16 | 1965-09-14 | Gen Electric | Infrared flaw detector method and apparatus |
US3433052A (en) * | 1965-07-26 | 1969-03-18 | Automation Ind Inc | Material tester |
US3667846A (en) * | 1969-07-28 | 1972-06-06 | Charles Nater | Optical surface inspection apparatus |
US3973122A (en) * | 1974-06-17 | 1976-08-03 | Ixcon Inc. | Measuring apparatus |
US3978713A (en) * | 1975-05-27 | 1976-09-07 | General Electric Company | Laser generation of ultrasonic waves for nondestructive testing |
SU857821A1 (ru) * | 1979-03-11 | 1981-08-23 | Научно-Исследовательский Институт Прикладной Математики И Механики При Томском Государственном Университете Им. В.В.Куйбышева | Способ определени термической стойкости полимерных материалов |
SU868332A1 (ru) * | 1980-01-18 | 1981-09-30 | Рязанский Радиотехнический Институт | Термоэлектронный преобразователь дл контрол толщины пленки в процессе нанесени |
US4513384A (en) * | 1982-06-18 | 1985-04-23 | Therma-Wave, Inc. | Thin film thickness measurements and depth profiling utilizing a thermal wave detection system |
US4522510A (en) * | 1982-07-26 | 1985-06-11 | Therma-Wave, Inc. | Thin film thickness measurement with thermal waves |
US4521118A (en) * | 1982-07-26 | 1985-06-04 | Therma-Wave, Inc. | Method for detection of thermal waves with a laser probe |
US4543486A (en) * | 1983-05-20 | 1985-09-24 | The United States Of America As Represented By The Secretary Of The Army | Method and apparatus for using a photoacoustic effect for controlling various processes utilizing laser and ion beams, and the like |
US4579463A (en) * | 1984-05-21 | 1986-04-01 | Therma-Wave Partners | Detecting thermal waves to evaluate thermal parameters |
US4679946A (en) * | 1984-05-21 | 1987-07-14 | Therma-Wave, Inc. | Evaluating both thickness and compositional variables in a thin film sample |
US4634290A (en) * | 1984-05-21 | 1987-01-06 | Therma-Wave, Inc. | Method and apparatus for detecting thermal waves |
US4818118A (en) * | 1984-11-26 | 1989-04-04 | General Electric Company | Coating thickness measurement |
US4634291A (en) * | 1984-11-26 | 1987-01-06 | General Electric Company | Coating thickness measurement |
JPS62198707A (ja) * | 1986-02-27 | 1987-09-02 | Nippon Kokan Kk <Nkk> | 非接触塗装検査装置 |
SU1395939A1 (ru) * | 1986-05-26 | 1988-05-15 | Харьковский авиационный институт им.Н.Е.Жуковского | Способ измерени толщины листового материала |
GB8813423D0 (en) * | 1988-06-07 | 1988-07-13 | Atomic Energy Authority Uk | Coating inspection |
DE3913474A1 (de) * | 1989-04-24 | 1990-10-25 | Siemens Ag | Photothermisches untersuchungsverfahren, einrichtung zu seiner durchfuehrung und verwendung des verfahrens |
US5166080A (en) * | 1991-04-29 | 1992-11-24 | Luxtron Corporation | Techniques for measuring the thickness of a film formed on a substrate |
-
1991
- 1991-05-06 DE DE4114672A patent/DE4114672A1/de not_active Withdrawn
-
1992
- 1992-04-21 DE DE59204228T patent/DE59204228D1/de not_active Expired - Fee Related
- 1992-04-21 ES ES92106787T patent/ES2080981T3/es not_active Expired - Lifetime
- 1992-04-21 EP EP92106787A patent/EP0512313B1/de not_active Expired - Lifetime
- 1992-04-30 KR KR1019920007349A patent/KR100239839B1/ko not_active IP Right Cessation
- 1992-05-05 CA CA002067999A patent/CA2067999A1/en not_active Abandoned
- 1992-05-05 BR BR929201682A patent/BR9201682A/pt not_active IP Right Cessation
- 1992-05-06 JP JP4140911A patent/JPH06201358A/ja active Pending
-
1993
- 1993-06-04 US US08/072,877 patent/US5358333A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE59204228D1 (de) | 1995-12-14 |
EP0512313B1 (de) | 1995-11-08 |
EP0512313A2 (de) | 1992-11-11 |
BR9201682A (pt) | 1992-12-15 |
KR920021969A (ko) | 1992-12-19 |
JPH06201358A (ja) | 1994-07-19 |
US5358333A (en) | 1994-10-25 |
CA2067999A1 (en) | 1992-11-07 |
KR100239839B1 (ko) | 2000-01-15 |
EP0512313A3 (en) | 1993-04-07 |
DE4114672A1 (de) | 1992-11-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ES2080981T3 (es) | Procedimiento y conjunto de medicion, para la medicion en linea, sin contacto, de la estructura de una superficie o del grosor de una capa. | |
ES2080980T3 (es) | Procedimiento y conjunto de medicion para la medicion en linea, sin contacto, de la rugosidad de una superficie. | |
GB1401778A (en) | Method for measuring the surface temperature of a metal object | |
US3413474A (en) | Coating thickness determination by means of measuring black-body radiation resultant from infrared irradiation | |
JPS5571919A (en) | Measurement of temperature | |
Gunn | Volume‐absorbing calorimeters for high‐power laser pulses | |
US3401263A (en) | Apparatus and method of measuring emissivity of an object | |
US3464267A (en) | Laser powermeter | |
FR2391466A1 (fr) | Procede et appareil de mesure du facteur d'absorptivite ou d'emissivite infrarouge de materiaux | |
JPS5529794A (en) | Temperature detector for deep-part temperature measurement | |
SU1483289A1 (ru) | Способ определени температуры поверхности твердого тела | |
Rice | Emittance factors for infrared thermometers used for wood products | |
Hager Jr | Absolute differential radiometer | |
RU2796399C1 (ru) | Измеритель плотности энергии импульсного полихроматического оптического излучения | |
JPS561323A (en) | Contact-type temperature detector | |
GB1007081A (en) | Solar radiation measuring device | |
Yuningsih | The Relationship Between Measurable Temperature by Infrared Thermometer with the Distance to Heat Source | |
FR2389128A1 (fr) | Sonde thermo-electronique | |
SU129365A1 (ru) | Тепломер | |
King | Compensating radiometer | |
JPS55101026A (en) | Zero-method heat flow meter | |
GB1395797A (en) | Apparatus to measure radiant heat | |
SU609976A1 (ru) | Радиоционный пирометр | |
JPS6232348A (ja) | 露点検知装置および検知方法 | |
Zieniuk | Ultrasonic thermoprobe |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
FG2A | Definitive protection |
Ref document number: 512313 Country of ref document: ES |