ES2005965A6 - Dispositivo para la verificacion de superficies. - Google Patents
Dispositivo para la verificacion de superficies.Info
- Publication number
- ES2005965A6 ES2005965A6 ES8703493A ES8703493A ES2005965A6 ES 2005965 A6 ES2005965 A6 ES 2005965A6 ES 8703493 A ES8703493 A ES 8703493A ES 8703493 A ES8703493 A ES 8703493A ES 2005965 A6 ES2005965 A6 ES 2005965A6
- Authority
- ES
- Spain
- Prior art keywords
- radiation
- sensors
- sensor
- output signal
- evaluation unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19863641863 DE3641863A1 (de) | 1986-12-08 | 1986-12-08 | Oberflaechenpruefvorrichtung |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2005965A6 true ES2005965A6 (es) | 1989-04-01 |
Family
ID=6315699
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES8703493A Expired ES2005965A6 (es) | 1986-12-08 | 1987-12-04 | Dispositivo para la verificacion de superficies. |
Country Status (3)
Country | Link |
---|---|
DE (1) | DE3641863A1 (de) |
ES (1) | ES2005965A6 (de) |
WO (1) | WO1988004422A1 (de) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3819900A1 (de) * | 1988-06-11 | 1989-12-14 | Daimler Benz Ag | Verfahren zur bestimmung der korrosionsstabilitaet von tiefziehfaehigen eisenblechen fuer karosserieteile von kraftfahrzeugen und vorrichtung zur durchfuehrung dieses verfahrens |
DE4343058A1 (de) * | 1993-12-19 | 1995-06-22 | Robert Prof Dr Ing Massen | Multisensorielle Kamera für die Qualitätssicherung |
DE4434474C2 (de) * | 1994-09-27 | 2000-06-15 | Basler Ag | Verfahren und Vorrichtung zur vollständigen optischen Qualitätskontrolle von Gegenständen |
DE69530007D1 (de) * | 1995-06-15 | 2003-04-24 | British Nuclear Fuels Plc | Prüfen der oberfläche eines objekts |
DE102009030644B4 (de) * | 2009-06-25 | 2011-02-03 | Gottfried Wilhelm Leibniz Universität Hannover | Berührungslose Erfassungseinrichtung |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3917414A (en) * | 1973-10-11 | 1975-11-04 | Geisco Associates | Optical inspection system |
DE2433682C3 (de) * | 1974-07-12 | 1979-02-15 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Vorrichtung zur Überwachung einer Materialbahn oder einer sonstigen Abtastebene |
US4265545A (en) * | 1979-07-27 | 1981-05-05 | Intec Corporation | Multiple source laser scanning inspection system |
US4352017A (en) * | 1980-09-22 | 1982-09-28 | Rca Corporation | Apparatus for determining the quality of a semiconductor surface |
JPS5766345A (en) * | 1980-10-09 | 1982-04-22 | Hitachi Ltd | Inspection device for defect |
US4532723A (en) * | 1982-03-25 | 1985-08-06 | General Electric Company | Optical inspection system |
US4520388A (en) * | 1982-11-01 | 1985-05-28 | General Electric Company | Optical signal projector |
GB2173294B (en) * | 1985-04-02 | 1988-10-12 | Glaverbel | Method of and apparatus for determining the location of defects present in flat glass |
-
1986
- 1986-12-08 DE DE19863641863 patent/DE3641863A1/de not_active Ceased
-
1987
- 1987-12-04 WO PCT/DE1987/000573 patent/WO1988004422A1/de unknown
- 1987-12-04 ES ES8703493A patent/ES2005965A6/es not_active Expired
Also Published As
Publication number | Publication date |
---|---|
WO1988004422A1 (en) | 1988-06-16 |
DE3641863A1 (de) | 1988-06-09 |
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