EP2823084B1 - Verfahren zur förderung der haftung zwischen dielektrischen substraten und metallschichten - Google Patents
Verfahren zur förderung der haftung zwischen dielektrischen substraten und metallschichten Download PDFInfo
- Publication number
- EP2823084B1 EP2823084B1 EP13710864.3A EP13710864A EP2823084B1 EP 2823084 B1 EP2823084 B1 EP 2823084B1 EP 13710864 A EP13710864 A EP 13710864A EP 2823084 B1 EP2823084 B1 EP 2823084B1
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- European Patent Office
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- solution
- substrate
- metal
- layer
- dielectric
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- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 claims description 26
- 229910052802 copper Inorganic materials 0.000 claims description 25
- 229910000510 noble metal Inorganic materials 0.000 claims description 24
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- 239000007864 aqueous solution Substances 0.000 claims description 16
- 239000007800 oxidant agent Substances 0.000 claims description 15
- 239000012190 activator Substances 0.000 claims description 13
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- JYLNVJYYQQXNEK-UHFFFAOYSA-N 3-amino-2-(4-chlorophenyl)-1-propanesulfonic acid Chemical compound OS(=O)(=O)CC(CN)C1=CC=C(Cl)C=C1 JYLNVJYYQQXNEK-UHFFFAOYSA-N 0.000 description 1
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Images
Classifications
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/31—Coating with metals
- C23C18/38—Coating with copper
- C23C18/40—Coating with copper using reducing agents
- C23C18/405—Formaldehyde
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/02—Electroplating of selected surface areas
- C25D5/022—Electroplating of selected surface areas using masking means
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/54—Electroplating of non-metallic surfaces
- C25D5/56—Electroplating of non-metallic surfaces of plastics
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/12—Electroplating: Baths therefor from solutions of nickel or cobalt
- C25D3/14—Electroplating: Baths therefor from solutions of nickel or cobalt from baths containing acetylenic or heterocyclic compounds
- C25D3/18—Heterocyclic compounds
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/38—Electroplating: Baths therefor from solutions of copper
Claims (15)
- Verfahren zum Behandeln einer Oberfläche eines dielektrischen Substrats zur Vorbereitung der Oberfläche für die anschließende nasschemische Metallabscheidung, wobei das Verfahren folgende Schritte in der angegebenen Reihenfolge umfasst:(i) Behandeln der Oberfläche mit einer mindestens eine Organosilanverbindung umfassenden Lösung;(ii) Behandeln der Oberfläche mit einer ein aus wässrigen sauren oder alkalischen Lösungen eines Permanganatsalzes ausgewähltes Oxidationsmittel umfassenden Lösung.
- Verfahren nach Anspruch 1, bei dem die Permanganatsalz-Konzentration im Bereich von 20-100 g/l liegt.
- Verfahren nach Anspruch 1, bei dem die Organosilanverbindung aus der Gruppe, die durch die Formel
A(4-x)SiBx
wiedergegeben wird, ausgewählt wird, wobei A jeweils unabhängig für eine hydrolysierbare Gruppe steht,
x für 1 bis 3 steht und
B jeweils unabhängig aus der Gruppe bestehend aus C1-C20-Alkyl, Aryl, Aminoaryl und einer funktionellen Gruppe der Formel
CnH2nX
ausgewählt ist, wobei
n für 0 bis 15, vorzugsweise 0 bis 10, noch weiter bevorzugt 1 bis 8 und ganz besonders bevorzugt 1, 2, 3 oder 4 steht und
X aus der Gruppe bestehend aus Amino-, Amido-, Hydroxy-, Alkoxy-, Halogen-, Mercapto-, Carboxy-, Carboxyester-, Carboxamid-, Thiocarboxamid-, Acyl-, Vinyl-, Allyl-, Styryl-, Epoxy-, Epoxycyclohexyl-, Glycidoxy-, Isocyanato-, Thiocyanato-, Thioisocyanato-, Ureido-, Thioureido-, Guanidino-, Thioglycidoxy-, Acryloxy- und Methacryloxygruppen ausgewählt ist oder X für einen Rest eines Carboxyesters steht oder X für Si(OR)3 steht und wobei R für eine C1-C5-Alkylgruppe steht. - Verfahren nach Anspruch 3, bei dem die hydrolysierbare Gruppe A aus der Gruppe bestehend aus -OH und -OR1 ausgewählt ist und wobei R1 für C1-C5-Alkyl oder -(CH2)yOR2 steht und wobei y für 1, 2 oder 3 steht und R2 für H, C1-C5-Alkyl oder -OCOR3 steht und wobei R3 für H oder C1-C5-Alkyl steht.
- Verfahren nach Anspruch 4, bei dem R1, R2 und R3 unabhängig aus Methyl, Ethyl, Propyl und Isopropyl ausgewählt sind.
- Verfahren nach einem der vorhergehenden Ansprüche, bei dem die Organosilanverbindung aus der Gruppe bestehend aus Vinylsilanen, Aminoalkylsilanen, Ureidoalkylsilanen, Methacryloxysilanen und Epoxyalkylsilanen ausgewählt wird.
- Verfahren nach einem der vorhergehenden Ansprüche, bei dem das Organosilan in einer Konzentration zwischen 0,5 Gew.-% und 20 Gew.-% angewendet wird.
- Verfahren nach einem der vorhergehenden Ansprüche, bei dem das Organosilan in einem polaren organischen Lösungsmittel mit einem Siedepunkt im Bereich von 60 bis 250°C gelöst wird.
- Verfahren nach einem der vorhergehenden Ansprüche, bei dem das Organosilan in einem aus Diethylenglykol, 2-Isopropoxyethanol (IPPE), Di(propylenglykol)methyletheracetat (DPGMEA) und 2-Ethyl-1-hexanol ausgewählten polaren organischen Lösungsmittel gelöst wird.
- Verfahren nach einem der vorhergehenden Ansprüche, bei dem es sich bei dem Oxidationsmittel gemäß Schritt 1 ii) um eine alkalische wässrige Lösung von Permanganationen handelt.
- Verfahren nach einem der vorhergehenden Ansprüche, umfassend:(i) Behandeln der Oberfläche mit einer mindestens eine Organosilanverbindung umfassenden Lösung über einen Zeitraum zwischen 10 s und 10 min bei einer Temperatur zwischen 15 und 50°C;(ii) Behandeln der Oberfläche mit einer ein aus einer alkalischen wässrigen Lösung von Permanganationen in einer Konzentration von 20 - 100 g/l ausgewähltes Oxidationsmittel umfassenden Lösung über einen Zeitraum zwischen 1 und 30 min bei einer Temperatur zwischen 20 und 95°C zum Erhalt einer aufgerauten Oberfläche mit einer durchschnittlichen Oberflächenrauheit Ra von weniger als 150 nm.
- Verfahren nach einem der vorhergehenden Ansprüche, ferner umfassend:(iii) Metallisieren des Substrats nach Schritt (ii) durch ein nasschemisches Metallabscheidungsverfahren.
- Verfahren nach Anspruch 12, bei dem es sich bei der Metallisierung um eine Kupfermetallisierung handelt.
- Verfahren nach Anspruch 12 und 13, bei dem (iii) das Metallisieren des Substrats nach Schritt(ii) durch ein nasschemisches Metallabscheidungsverfahren die folgenden Schritte zum Leitfähigmachen der Oberfläche umfasst:(iiia) Kontaktieren des Substrats mit einer Aktivatorlösung, die kolloidales oder ionisches katalysierendes Metall, wie ein Edelmetall,vorzugsweise Palladium, enthält, wodurch die Substratoberfläche katalytisch wird,und gegebenenfalls, insbesondere dann, wenn der Aktivator ionisches katalysierendes Metall enthält,(iiib) Kontaktieren des Substrats mit einem Reduktionsmittel, wobei die Metallionen eines ionischen Aktivators zu elementarem Metall reduziert werden,oder dann, wenn der Aktivator kolloidales katalysierendes Metall enthält,(iiic) Kontaktieren des Substrats mit einem Beschleuniger, wobei die Komponenten des Kolloids, beispielsweise ein Schutzkolloid, von dem katalysierenden Metall entfernt werden.
- Verfahren nach einem der Ansprüche 1 bis 12, bei dem es sich bei dem dielektrischen Substrat um ein Substrat handelt, das eine blanke dielektrische Aufbauschicht (1), die auf mindestens einem Teil der Rückseite einen Kupferbereich (2) aufweist, und eine auf der Rückseite der Aufbauschicht (1) angebrachte zweite dielektrische Schicht (3) mit mindestens einer Öffnung (4) in der Aufbauschicht (1), die sich durch das Substrat bis zum Kontaktbereich (2) erstreckt, umfasst, umfassend:(i) Behandeln der Oberfläche mit einer mindestens eine Organosilanverbindung umfassenden Lösung gemäß einem der vorhergehenden Ansprüche,(ii) Behandeln der Oberfläche mit einer ein Oxidationsmittel enthaltenden Lösung gemäß einem der obigen Ansprüche,(iii) Abscheiden einer leitfähigen Keimschicht (6) auf der oberen Oberfläche (5a) der dielektrischen Aufbauschicht (1) und den dielektrischen Seitenwänden (5b) der mindestens einen Öffnung (4) und(iv) selektives Abscheiden einer Kupferschicht (8) in Öffnungen einer strukturierten Resistschicht (7) durch Galvanisierung.
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EP12075036.9A EP2644744A1 (de) | 2012-03-29 | 2012-03-29 | Verfahren zur Förderung der Haftung zwischen dielektrischen Substraten und Metallschichten |
EP13710864.3A EP2823084B1 (de) | 2012-03-29 | 2013-03-21 | Verfahren zur förderung der haftung zwischen dielektrischen substraten und metallschichten |
PCT/EP2013/055901 WO2013143961A1 (en) | 2012-03-29 | 2013-03-21 | Method for promoting adhesion between dielectric substrates and metal layers |
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EP13710864.3A Active EP2823084B1 (de) | 2012-03-29 | 2013-03-21 | Verfahren zur förderung der haftung zwischen dielektrischen substraten und metallschichten |
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US (1) | US20150050422A1 (de) |
EP (2) | EP2644744A1 (de) |
JP (1) | JP6234429B2 (de) |
KR (1) | KR101927679B1 (de) |
TW (1) | TWI569704B (de) |
WO (1) | WO2013143961A1 (de) |
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WO2015006438A1 (en) | 2013-07-09 | 2015-01-15 | United Technologies Corporation | Plated polymer compressor |
EP3019710A4 (de) | 2013-07-09 | 2017-05-10 | United Technologies Corporation | Beschichteter polymerlüfter |
WO2015006418A1 (en) * | 2013-07-09 | 2015-01-15 | United Technologies Corporation | Plating adhesion promotion |
WO2015006421A1 (en) | 2013-07-09 | 2015-01-15 | United Technologies Corporation | Metal-encapsulated polymeric article |
WO2015017095A2 (en) | 2013-07-09 | 2015-02-05 | United Technologies Corporation | Plated polymer nosecone |
DE102014017886A1 (de) * | 2014-12-04 | 2016-06-09 | Auto-Kabel Management Gmbh | Verfahren zum Herstellen eines elektrischen Anschlussteils |
US10249572B2 (en) | 2014-12-22 | 2019-04-02 | Atotech Deutschland Gmbh | Method for electromagnetic shielding and thermal management of active components |
JP6814028B2 (ja) * | 2016-11-17 | 2021-01-13 | 上村工業株式会社 | プリント配線基板の製造方法 |
KR101994753B1 (ko) * | 2017-06-30 | 2019-07-01 | 삼성전기주식회사 | 커패시터 부품 |
CN108037161A (zh) * | 2017-12-26 | 2018-05-15 | 南方科技大学 | 一种基于氟化咪唑离子凝胶的二氧化碳气体传感器及其制备方法和用途 |
EP3853394A1 (de) * | 2018-09-20 | 2021-07-28 | Industrial Technology Research Institute | Kupfermetallisierung für durchkontaktierungen auf dünnglas |
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-
2012
- 2012-03-29 EP EP12075036.9A patent/EP2644744A1/de not_active Withdrawn
-
2013
- 2013-03-21 US US14/385,779 patent/US20150050422A1/en not_active Abandoned
- 2013-03-21 EP EP13710864.3A patent/EP2823084B1/de active Active
- 2013-03-21 JP JP2015502219A patent/JP6234429B2/ja active Active
- 2013-03-21 KR KR1020147027285A patent/KR101927679B1/ko active IP Right Grant
- 2013-03-21 WO PCT/EP2013/055901 patent/WO2013143961A1/en active Application Filing
- 2013-03-29 TW TW102111595A patent/TWI569704B/zh active
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JP6234429B2 (ja) | 2017-11-22 |
TW201352102A (zh) | 2013-12-16 |
JP2015516509A (ja) | 2015-06-11 |
US20150050422A1 (en) | 2015-02-19 |
KR20140143764A (ko) | 2014-12-17 |
TWI569704B (zh) | 2017-02-01 |
WO2013143961A1 (en) | 2013-10-03 |
EP2823084A1 (de) | 2015-01-14 |
KR101927679B1 (ko) | 2018-12-11 |
EP2644744A1 (de) | 2013-10-02 |
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