EP2245424B8 - Messstation für hochglänzende flächen - Google Patents

Messstation für hochglänzende flächen

Info

Publication number
EP2245424B8
EP2245424B8 EP09711674A EP09711674A EP2245424B8 EP 2245424 B8 EP2245424 B8 EP 2245424B8 EP 09711674 A EP09711674 A EP 09711674A EP 09711674 A EP09711674 A EP 09711674A EP 2245424 B8 EP2245424 B8 EP 2245424B8
Authority
EP
European Patent Office
Prior art keywords
particles
measuring
workpiece
measuring method
measuring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Not-in-force
Application number
EP09711674A
Other languages
English (en)
French (fr)
Other versions
EP2245424A1 (de
EP2245424B1 (de
Inventor
Ulrich Rattunde
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rattunde AG
Original Assignee
Rattunde AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rattunde AG filed Critical Rattunde AG
Publication of EP2245424A1 publication Critical patent/EP2245424A1/de
Publication of EP2245424B1 publication Critical patent/EP2245424B1/de
Application granted granted Critical
Publication of EP2245424B8 publication Critical patent/EP2245424B8/de
Not-in-force legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Claims

Patentansprüche
1. Messverfahren für ein Profil einer reflektierenden Fläche eines Werkstücks, insbesondere einer reflektierenden Fläche eines Rohrabschnittsendes (2), indem ein elektrisches Feld zwischen in der Umgebungsluft der Fläche schwebenden
Schwebepartikeln (19) und der Fläche erzeugt wird, durch das die Partikel (19) zu der Fläche angezogen werden und die Fläche, indem sie sich auf ihr ablagern, mattieren und die mattierte Fläche danach mit einem Laserstrahl (16) abgetastet wird und von der mattierten Fläche reflektiertes Streulicht (17) mit einem Sensor (11 ) gemessen wird und damit das Profil der Fläche bestimmt wird.
2. Messverfahren nach Anspruch 1 , dadurch gekennzeichnet, dass die Partikel (19) elektrostatisch aufgeladen werden.
3. Messverfahren nach Anspruch 1 oder 2, dadurch gekennzeichnet, dass die Fläche elektrostatisch aufgeladen wird.
4. Messverfahren nach Anspruch 1 , dadurch gekennzeichnet, dass Schwebepartikel (19) über eine Partikelzufuhr (21) der Umgebung im Bereich der Fläche zugeführt werden.
5. Messverfahren nach Anspruch 1 , dadurch gekennzeichnet, dass das Werkstück in einer Messvorrichtung aufgenommen wird und nach der Profilmessung aus der Messvorrichtung entfernt wird.
6. Messverfahren nach wenigstens einem der vorstehenden Ansprüche, dadurch gekennzeichnet, dass das Werkstück von einem Profilmaterial abgelängt wird und dann in der Messvorrichtung aufgenommen wird.
7. Messverfahren nach Anspruch 6, dadurch gekennzeichnet, dass das Werkstück nach weniger als 20 s nach dem Ablängen vermessen wird.
8. Messvorrichtung zur Durchführung eines Verfahrens der Ansprüche 1 bis 7 mit einer Aufnahme (4) für ein Werkstück mit einer reflektierenden Fläche, deren Profil bestimmt werden soll und mit einer
Aufladevorrichtung (6, 7, 8) mit der ein elektrisches Feld zwischen in der Umgebungsluft der Fläche schwebenden Schwebepartikeln (19) und der Fläche erzeugbar ist, durch das die Partikel (19) zu der Fläche angezogen werden, sich dort ablagern und die Fläche mattieren und einem Laser (9) mit einem die mattierte Fläche abtastenden Laserstrahl (16) und mit einem von der mattierten Fläche reflektiertes Streulicht (17) messenden Sensor (11).
9. Messvorrichtung nach Anspruch 8, gekennzeichnet durch eine bei der Aufnahme (4) angeordneten elektrischen Kontakt (6), die mit dem aufgenommenen Werkstück automatisch in Kontakt kommt.
10. Messvorrichtung nach Anspruch 9, gekennzeichnet durch einen Partikelzufuhreinrichtung (21) für in der Umgebungsluft schwebende Partikel (19).
1 1. Messvorrichtung nach Anspruch 10, dadurch gekennzeichnet, dass die Aufladeeinrichtung (7) an der Partikelzufuhreinrichtung (21 ) vorgesehen ist.
EP09711674A 2008-02-18 2009-02-16 Messstation für hochglänzende flächen Not-in-force EP2245424B8 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102008009757A DE102008009757A1 (de) 2008-02-18 2008-02-18 Messstation für hochglänzende Flächen
PCT/DE2009/000210 WO2009103272A1 (de) 2008-02-18 2009-02-16 Messstation für hochglänzende flächen

Publications (3)

Publication Number Publication Date
EP2245424A1 EP2245424A1 (de) 2010-11-03
EP2245424B1 EP2245424B1 (de) 2012-07-25
EP2245424B8 true EP2245424B8 (de) 2012-12-19

Family

ID=40672215

Family Applications (1)

Application Number Title Priority Date Filing Date
EP09711674A Not-in-force EP2245424B8 (de) 2008-02-18 2009-02-16 Messstation für hochglänzende flächen

Country Status (7)

Country Link
US (1) US8614796B2 (de)
EP (1) EP2245424B8 (de)
JP (1) JP5757050B2 (de)
CA (1) CA2715345C (de)
DE (2) DE102008009757A1 (de)
ES (1) ES2390249T3 (de)
WO (1) WO2009103272A1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9272382B2 (en) * 2013-10-08 2016-03-01 The Boeing Company Automated sanding system
DE102014101888B4 (de) 2014-02-14 2016-07-28 SmartRay GmbH Verfahren und Vorrichtung zum optischen, berührungslosen Abtasten von Oberflächen
JP5978338B1 (ja) * 2015-03-16 2016-08-24 日本碍子株式会社 製品を生産する方法及び立体形状を測定する方法
CN109489578A (zh) * 2018-11-12 2019-03-19 江西兆九光电技术有限公司 一种光学测量光洁物体表面形貌的方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61193768A (ja) * 1985-02-22 1986-08-28 Hitachi Ltd 形状認識装置
JPH03218404A (ja) * 1990-01-24 1991-09-26 Sumitomo Metal Ind Ltd 板材の形状測定方法および装置
JPH03249511A (ja) * 1990-02-28 1991-11-07 Mitsubishi Heavy Ind Ltd 三次元形状認識装置
JP2526727B2 (ja) * 1990-08-31 1996-08-21 日本鋼管株式会社 艶消し塗装金属板の製造方法及び装置
JP3388479B2 (ja) * 1994-09-29 2003-03-24 川崎製鉄株式会社 形状測定方法
US6287595B1 (en) 1998-06-10 2001-09-11 Delsys Pharmaceuticals Corporation Biomedical assay device
JP2002146289A (ja) * 2000-11-10 2002-05-22 Nippon Paint Co Ltd 粉体塗料
DE10108221A1 (de) * 2001-02-21 2002-09-12 Charalambos Tassakos Verfahren und Vorrichtung zur optischen Erfassung eines Objekts
JP4095566B2 (ja) * 2003-09-05 2008-06-04 キヤノン株式会社 光学素子を評価する方法
DE102004025490A1 (de) 2004-05-22 2005-12-15 Hubert Kammer Verfahren zum optischen Vermessen reflektierender und/oder transparenter Objekte mittels Lasermesstechnik
DE102005043223B4 (de) 2005-09-09 2008-05-21 Rattunde & Co Gmbh Messstation für eine Rohrschneidemaschine
DE102005054373A1 (de) 2005-11-15 2007-05-16 Mtu Aero Engines Gmbh Optische Vermessung metallischer Oberflächen
ES2421324T3 (es) * 2006-12-11 2013-08-30 Mallinckrodt Llc Cuerpos diana y sus usos en la producción de materiales de radioisótopo

Also Published As

Publication number Publication date
CA2715345A1 (en) 2009-08-27
DE112009000952B4 (de) 2014-05-22
DE112009000952A5 (de) 2011-01-20
DE102008009757A1 (de) 2009-09-24
CA2715345C (en) 2014-01-14
JP5757050B2 (ja) 2015-07-29
JP2011512527A (ja) 2011-04-21
WO2009103272A1 (de) 2009-08-27
US20110199619A1 (en) 2011-08-18
ES2390249T3 (es) 2012-11-08
US8614796B2 (en) 2013-12-24
EP2245424A1 (de) 2010-11-03
EP2245424B1 (de) 2012-07-25

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