EP2141261B1 - Elektrolytische Zinnbeschichtungslösung und elektrolytisches Zinnbeschichtungsverfahren - Google Patents

Elektrolytische Zinnbeschichtungslösung und elektrolytisches Zinnbeschichtungsverfahren Download PDF

Info

Publication number
EP2141261B1
EP2141261B1 EP09155197.8A EP09155197A EP2141261B1 EP 2141261 B1 EP2141261 B1 EP 2141261B1 EP 09155197 A EP09155197 A EP 09155197A EP 2141261 B1 EP2141261 B1 EP 2141261B1
Authority
EP
European Patent Office
Prior art keywords
plating
acid
tin plating
tin
plating solution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
EP09155197.8A
Other languages
English (en)
French (fr)
Other versions
EP2141261A2 (de
EP2141261A3 (de
Inventor
Masaaki Imanari
Fai Lung Ting
Motoya Shimazu
Yasuo Ohta
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohm and Haas Electronic Materials LLC
Original Assignee
Rohm and Haas Electronic Materials LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohm and Haas Electronic Materials LLC filed Critical Rohm and Haas Electronic Materials LLC
Publication of EP2141261A2 publication Critical patent/EP2141261A2/de
Publication of EP2141261A3 publication Critical patent/EP2141261A3/de
Application granted granted Critical
Publication of EP2141261B1 publication Critical patent/EP2141261B1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/30Electroplating: Baths therefor from solutions of tin
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/16Apparatus for electrolytic coating of small objects in bulk

Definitions

  • the present invention relates to a tin plating solution and an electrolytic tin plating method; and in further detail relates to an electrolytic tin plating solution and plating method for plating chip components such as ceramic capacitors.
  • Chip components are metal plated with tin, copper, silver, gold, nickel, palladium, or an alloy thereof, or the like, using a plating method such as barrel plating, plating with a flow-through plater, or the like, depending on the shape of the chip and the construction of the regions to be plated.
  • a plating method such as barrel plating, plating with a flow-through plater, or the like, depending on the shape of the chip and the construction of the regions to be plated.
  • the purpose for tin plating is to provide solderability to the electrode parts of the chip component.
  • the chip components will stick to each other (hereinafter also referred to as aggregation, sticking, and coupling). Chips that stick together become defective products, and reduce the yield of the product.
  • the ratio of chip components that stick together from the total number of chip components is referred to as the coupling rate, and in severe cases, the coupling rate can exceed 90%.
  • a tin plating bath with excellent solder wetting properties is important for tin plating to provide solderability to the chip components, or the like.
  • the present inventors have previously improved on this point, and have discovered that specific naphthol compounds are useful as an additive for electrolytic tin plating that can form a tin film with uniform appearance, and the deposited tin film will have favorable solder wetting properties, and have also discovered that the solderability can be improved using specific naphthol compounds.
  • an objective present invention is to provide a plating solution for chip components and a plating method for chip components, which does not use a complexing agent, and which provides favorable solder wetting properties and an extremely low coupling rate when electrolytic tin plating is performed, and particularly when electrolytic tin plating is performed using a barrel plating method.
  • a smooth tin plating film with higher film surface hardness than a conventional film and which can minimize sticking between plated substrates can be achieved by using specific compounds in a strongly acidic (pH of 1 or lower) tin plating bath, and particularly in a barrel tin plating bath that does not contain a complexing agent.
  • one aspect of the present invention provides an electrolytic tin plating solution for chip components, comprising (A) stannous ions; (B) acid; (C) N,N-dipolyoxy-alkylene-N-alkyl amine, amine oxide, or blend thereof; (D) an anti-sticking agent; (E) a plating uniformity Improver; (F) an acrylic acid or acrylic acid derivative; and (G) an antioxidant, wherein the pH is 1 or lower.
  • the acrylic acid or acrylic acid derivative is compound expressed by the following General Formula (1)
  • R represents a hydrogen atom or an alkyl group containing between 1 and 3 carbon atoms.
  • N,N-dipolyoxyalkylene-N-alkyl amine is one or more compounds expressed by the following General Formula (2). RN[(CH 2 CH 2 CH 2 O) x (CH 2 CH 2 O) z H][(CH 2 CH 2 CH 2 O) y (CH 2 CH 2 O) w H] (2)
  • R represents an alkyl group with between 6 and 28 carbon atoms
  • w, x, y, and z each represent an integer between 0 and 30.
  • the sum ofw, x, y, and z is not 0.
  • one aspect of the present invention provides an electrolytic tin plating solution for chip components, wherein the aforementioned amine oxide is one or more compound expressed by the following General Formula (3).
  • R represents an alkyl group, cycloalkyl group, or aryl group
  • R' represents a hydrogen atom, alkyl group, or cycloalkyl group
  • the aforementioned (D) anti-sticking agent is one or more compound selected from a group consisting of aromatic aldehydes and aromatic ketones.
  • one aspect of the present invention provides a method of plating chip components, comprising electrolytically tin plating chip components using an electrolytic tin plating solution comprising (A) stannous ions; (B) acid; (C) N,N-dipolyoxyalkylene-N-alkyl amine, amine oxide, or blend thereof; (D) an anti-sticking agent; (E) a plating uniformity Improver; (F) an acrylic acid or acrylic acid derivative; and (G) an antioxidant, wherein the pH is 1 or lower.
  • an electrolytic tin plating solution comprising (A) stannous ions; (B) acid; (C) N,N-dipolyoxyalkylene-N-alkyl amine, amine oxide, or blend thereof; (D) an anti-sticking agent; (E) a plating uniformity Improver; (F) an acrylic acid or acrylic acid derivative; and (G) an antioxidant, wherein the pH is 1 or lower.
  • the plating solution of the present invention is very effective at preventing substrates from sticking together and can minimize plating defects so the product yield increases when a plurality of substrates such as chip components, or the like, are electrolytically tin plated, and particularly when electrolytically tin plated using a barrel plating method.
  • making the tin plating film smooth can reduce the sticking phenomenon that occurs when substrates come in contact with each other, where substrates lock together and physically cannot be peeled apart, similar to mat plating.
  • increasing the film surface hardness can prevent tin plating films from deforming when substrates come in mutual contact, caused by the film surface being soft such as with mat plating, and can minimize the occurrence of tin plating films sticking together.
  • the plating solution of the present invention does not include a complexing agent, so wastewater treatment is easier than with a convention plating solution for barrel plating.
  • the terms "plating solution” and “plating bath” used in this specification have exactly the same meaning and are used interchangeably.
  • the electrolytic tin plating solution of the present invention is an electrolytic tin plating solution for chip components, containing: (A) stannous ions, (B) acid, (C) N,N-dipolyoxy-alkylene-N-alkyl amine, amine oxide, or blend thereof, (D) an anti-sticking agent, (E) a plating uniformity Improver, (F) an acrylic acid or acrylic acid derivative, and (G) an antioxidant; wherein the pH is 1 or lower.
  • A stannous ions
  • B acid
  • C N,N-dipolyoxy-alkylene-N-alkyl amine, amine oxide, or blend thereof
  • D an anti-sticking agent
  • E a plating uniformity Improver
  • F an acrylic acid or acrylic acid derivative
  • G an antioxidant
  • the plating bath of the present invention contains stannous ions as an essential component.
  • Stannous ions are bivalent tin ions. Any compound that can provide stannous ions to the plating bath can be used. Generally, the tin salt of an inorganic acid or an organic acid is preferable.
  • tin salts of inorganic acids include the stannous salt of sulfuric acid or hydrochloric acid
  • examples of tin salts of organic acids include the stannous salt of substituted or unsubstituted alkanesulfonic acids or alkanolsulfonic acids, such as methanesulfonic acid, ethanesulfonic acid, propanesulfonic acid, 2-hydroxyethane-1-sulfonic acid, 2-hydroxypropane-1-sulfonic acid, and 1-hydroxypropane-2-sulfonic acid, and the like.
  • Particularly preferable sources of stannous ions are stannous sulfate for salts of inorganic acids and stannous methanesulfonate for salts of organic acids.
  • the compounds which can provide these ions can be used individually, or as a blend of 2 or more types.
  • the amount of stannous ion added to the plating bath is, for example, between 1 g/L and 150 g/L, preferably between 5 g/L and 50 g/L, and more preferably between 8 g/L and 20 g/L.
  • the acid can be any arbitrary acid that can adjust the pH to 1 or lower and can provide conductivity to the plating bath.
  • the acid can be any inorganic or organic acid.
  • organic acids include substituted or unsubstituted alkanesulfonic acids or alkanolsulfonic acids, such as methanesulfonic acid, ethanesulfonic acid, propanesulfonic acid, 2-hydroxyethane-1-sulfonic acid, 2-hydroxypropane-1-sulfonic acid, and 1-hydroxypropane-2-sulfonic acid. Methanesulfonic acid is preferable.
  • examples of inorganic acids include sulfuric acid and hydrochloric acid, and sulfuric acid is preferable. These acids that can adjust the pH to 1 or lower and can provide conductivity to the plating bath can be used individually, or as a blend of 2 or more types.
  • the amount of acid in the plating bath solution is preferably at least stoichiometically equivalent to the amount of bivalent tin ions in the plating bath.
  • the amount of free acid in the plating bath is, for example, between 10 g/L and 500 g/L, preferably between 30 g/L and 300 g/L, and more preferably between 50 g/L and 200 g/L.
  • the plating bath of the present invention contains N,N-dipolyoxyalkylene-N-alkyl amine, amine oxide, or blend thereof as an essential component.
  • the present inventors have evaluated various nonionic surfactants, and have discovered that uniform plating at the required plating film thickness can be achieved by using N,N-dipolyoxyalkylene-N-alkyl amine or amine oxides which are specific anionic surfactants.
  • N,N-dipolyoxyalkylene-N-alkyl amine is a polyoxypropylene polyoxyethylenealkylamine expressed by the following General Formula (2). RN[(CH 2 CH 2 CH 2 O) x (CH 2 CH 2 O) z H][(CH 2 CH 2 CH 2 O) y (CH 2 CH 2 O) w H] (2)
  • R represents a straight or branched alkyl group with between 6 and 26 carbon atoms, and w, x, y, and z each represent an integer between 0 and 30. However, the sum of w, x, y, and z is not 0. Preferably, R represents a straight chain alkyl group with between 8 and 18 carbon atoms, and the sum of w, x, y, and z is between 10 and 20.
  • the amine oxide is one or more compound expressed by the following General Formula (4).
  • R 1 , R 2 , and R 3 each represent an alkyl group, a cycloalkyl group, or an aryl group, which may have a substitution group. Examples include a methyl group, ethyl group, propyl group, butyl group, pentyl group, hexyl group, phenyl group, tolyl group xylyl group and naphthyl group, and the like.
  • the amine oxide of the present invention is preferably one or more amine oxides with a structure as expressed by General Formula (3).
  • R represents an alkyl group, cycloalkyl group or aryl group
  • R' represents an alkyl group or a cycloalkyl group
  • N,N-dipolyoxyalkylene-N-alkyl amine or amine oxide can act as a film modifying agent in the plating bath of the present invention.
  • smoothing the plating film with N,N-dipolyoxyalkylene-N-alkyl amine or amine oxide can minimize the sticking phenomenon where substrates lock together and physically cannot be peeled apart, similar to mat plating, which occurs when substrates come in contact with each other.
  • the concentration of N,N-dipolyoxyalkylene-N-alkyl amine or amine oxide in the plating bath is suitably between 0.01 g/L and 100 g/L, preferably between 0.1 g/L and 50 g/L, and more preferably between 1 g/L and 25 g/L.
  • the plating bath of the present invention contains an anti-sticking agent as an essential component.
  • the anti-sticking agent acts to prevent the plated chip components from agglomerating (sticking) together in the plating bath of the present invention.
  • the anti-sticking agent is useful for preventing the chip components from agglomerating together, or in other words, preventing the chip components from sticking together, particularly during barrel plating.
  • the anti-sticking agent is selected from aromatic aldehydes and aromatic ketones. Examples of preferable anti-sticking agents include benzaldehyde and benzylidene acetone. These compounds act to increase the film surface hardness in particular. In other words, increasing the film surface hardness can prevent tin plating films from deforming when substrates come in mutual contact, which is caused by the film surface being soft such as with mat plating, and can minimize the occurrence of tin plating films sticking together.
  • the aforementioned preferable anti-sticking agents are particular effective when used in combination with the aforementioned (C) N,N-dipolyoxyalkylene-N-alkyl amine or amine oxide.
  • concentration of anti-sticking agent in the plating bath is suitably between 1 mg/L and 50 g/L, preferably between 5 mg/L and 10 g/L, and more preferably between 10 mg/L and 5 g/L.
  • the plating bath of the present invention contains a plating uniformity improver.
  • the plating uniformity improver of the present invention is a compound that improves the plating uniformity particularly in areas of low current density.
  • barrel plating in particular, the object to be plated is placed in a barrel and electroplating is performed while rotating the barrel with the parts immersed in the plating solution, and therefore variation in the current density will occur, the current density range of the object to be plated will vary widely from a high current density region to a low current density region, and in the low current density region, there will be problems with lower plating uniformity, and therefore the plating film will have variation.
  • the plating uniformity improver By adding a plating uniformity improver, the plating can be uniformly performed even in the low current density regions.
  • the plating uniformity improver is 2-naphthol-7-sulfonic acid, which can be either in the form of a free acid or as a salt.
  • Suitable salts of 2-naphthol-7-sulfonic acid include water soluble salts such as potassium, sodium, ammonium, and tin, or the like, but potassium and sodium salts are preferable, and sodium 2-naphthol-7-sulfonate is even more preferable. These salts can be used individually, or as a blend of two or more types.
  • the amount of 2-naphthol-7-sulfonic acid or salt thereof added to the plating bath is between 0.01 g/L and 20 g/L, preferably between 0.1 g/L and 10 g/L, and more preferably between 0.2 g/L and 5 g/L.
  • the plating bath of the present invention contains one or more acrylic acid or acrylic acid derivative expressed by the following General Formula (1).
  • acrylic acid and methacrylic acid are preferable.
  • R represents a hydrogen atom or an alkyl group containing between 1 and 3 carbon atoms.
  • the methacrylic acid or acrylic acid is preferably added to the plating solution of the present invention as an auxiliary anti-sticking agent that supports the aforementioned (D) anti-sticking agent.
  • the methacrylic acid or acrylic acid can further increase the component anti-sticking effect of the (D) anti-sticking agent, and in particular has the effect of increasing the film surface hardness, and can increase the sustainability of the anti-sticking effect, by being used in combination with the (D) anti-sticking agent.
  • the amount of acrylic acid or acrylic acid derivative expressed by the aforementioned General Formula (1) in the plating solution is suitably such that the concentration is between 0.1 g/L and 100 g/L, preferably between 0.1 g/L and 50 g/L, more preferably between 0.5 g/L and 10 g/L.
  • An antioxidant is used in the plating solution of the present invention.
  • the antioxidant is used to prevent oxidation of the bivalent tin ions to tetravalent tin ions, and examples include hydroquinone, catechol, resorcin, phloroglucin, pyrogallol, hydroquinonesulfonic acid, and salts thereof.
  • the concentration of antioxidant in the plating bath is suitably between 10 mg/L and 100 g/L, preferably between 100 mg/L and 50 g/L, more preferably between 0.5 g/L and 5 g/L.
  • additives can be added to the plating bath of the present invention, if necessary, such as glossing agents, smoothing agents, conductivity agents, and anode dissolving agents, and the like.
  • the order when adding the various components when making the plating bath is not restricted in particular, but from the perspective of safety, the acid is added after adding the water, and after sufficiently mixing, the tin salt is added, and after sufficiently mixing, the other required chemicals are added in order.
  • Examples of the chip components that can be plated using the plating solution of the present invention include electronic components such as resistors, capacitors, inductors, variable resistors, variable capacitors, and other passive components, quartz oscillator, LC filter, ceramic filter, delay lines, SAW filters, and other functional components, switches, connectors, relay fuses, optical components, and other contact components.
  • electronic components such as resistors, capacitors, inductors, variable resistors, variable capacitors, and other passive components, quartz oscillator, LC filter, ceramic filter, delay lines, SAW filters, and other functional components, switches, connectors, relay fuses, optical components, and other contact components.
  • the electroplating method that is used with the plating solution of the present invention can be a commonly known plating method such as barrel plating, and plating using a flow-through plater, or the like.
  • the concentration of the various components (A) through (G) in the plating solution can be arbitrarily selected based on the forgoing descriptions for each of the components.
  • the electroplating method that is used with the plating solution of the present invention can be performed at a bath temperature between 10°C and 50°C, preferably between 15°C and 30°C.
  • the cathode current density is suitably selected within a range between 0.01 and 5 A/dm 2 , preferably between 0.05 and 3 A/dm 2 .
  • the plating bath may be left without stirring, or can be stirred using a stirrer, or the like, or re-circulated using a pump, or the like.
  • a bath was formed using the tin plating solution with the following composition.
  • B (A) Methanesulfonic acid (as free acid): 50 g/L
  • C Amine oxide: oxirane, methyl-, polymer with oxirane, ether with 2,2'-(oxidoimino)bis[ethanol] (2:1) N-[3-(C9-11-isoalkyloxy)propyl] derives 10 g/L
  • E Methacrylic acid: 2 g/L
  • F Sodium 2-naphthol-7-sulfonate: 0.5 g/L
  • G Potassium hydroquinonesulfonate: 2 g/L
  • Distilled water balance
  • Barrel tin plating was performed on chip resistors that had been nickel plated using a 1 L tin plating solution at the conditions shown below, and then various evaluations were performed. The results are shown in Table 1.
  • the plating thickness on the front surface, back surface, and on the left and right sides was measured using a fluorescent light x-ray film thickness meter, and the thickness and the plating thickness various between each point were evaluated.
  • the barrel-plated chip components were sorted into chips which were stuck together and chips that were not stuck together, and the coupling rate was calculated as a ratio (%) with the weight of chips that stuck together in the numerator and the weight of all of the chips in the denominator (stuck chips/(stuck chips + unstuck chips) x 100).
  • the zero cross time was measured and a value of 3.0 seconds or less was considered a PASS.
  • the pass rate was calculated as a percentage using the number of samples with a zero cross time of 3 seconds or less in the numerator, and the total number of samples measured (10 samples) in the denominator.
  • Tin plating baths were created at the ratios shown in Table 1 and Table 2 in a similar manner to Example 1, and the various tests were performed similar to Example 1. The results are also shown in Table 1 and Table 2. Note, the symbols related to the evaluation of the plating thickness are as shown below.
  • Plating thickness is uniform on the front surface, back surface, and on the left and right

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Electroplating And Plating Baths Therefor (AREA)
  • Electroplating Methods And Accessories (AREA)

Claims (4)

  1. Eine elektrolytische Zinnplattierungslösung für Chipkomponenten, die Folgendes beinhaltet:
    (A) Zinn-(II)-Ionen;
    (B) Säure;
    (C) eine oder mehrere Verbindungen, ausgedrückt durch die folgende allgemeine Formel:

            RN[(CH2CH2CH2O)x(CH2CH2O)zH][(CH2CH2CH2O)y(CH2CH2O)wH],

    wobei R eine Alkylgruppe mit zwischen 6 und 28 Kohlenstoffatomen darstellt und w, x, y und z jeweils eine ganze Zahl zwischen 0 und 30 darstellen, wobei die Summe von w, x, y und z allerdings nicht 0, ein Aminoxid oder eine Mischung davon ist; und
    (D) ein Antihaftmittel, das ausgewählt ist aus der Gruppe, bestehend aus aromatischen Aldehyden und aromatischen Ketonen;
    (E) 2-Naphthol-7-sulfonsäure oder ein Alkalisalz davon;
    (F) eine oder mehrere Acrylsäuren oder ein oder mehrere Acrylsäurederivate, wie durch die folgende allgemeine Formel (1) ausgedrückt:
    Figure imgb0012
    wobei R Wasserstoff oder eine Alkylgruppe, die zwischen 1 und 3 Kohlenstoffatome enthält, darstellt; und
    (G) ein Antioxidationsmittel;
    wobei der pH-Wert 1 oder niedriger ist.
  2. Elektrolytische Zinnplattierungslösung für Chipkomponenten gemäß Anspruch 1, wobei das oben erwähnte Aminoxid eine oder mehrere Verbindungen, ausgedrückt durch die folgende allgemeine Formel (3), ist:
    Figure imgb0013
    wobei R eine Alkylgruppe, Cycloalkylgruppe oder Arylgruppe darstellt und R' ein Wasserstoffatom, eine Alkylgruppe oder eine Cycloalkylgruppe darstellt.
  3. Elektrolytische Zinnplattierungslösung für Chipkomponenten gemäß Anspruch 1, wobei das Antihaftmittel aus Benzaldehyd und Benzylidinaceton ausgewählt ist.
  4. Ein Verfahren zum Plattieren von Chipkomponenten, beinhaltend das elektrolytische Zinnplattieren von Chipkomponenten unter Verwendung einer elektrolytischen Zinnplattierungslösung, welche Folgendes beinhaltet:
    (A) Zinn-(II)-Ionen;
    (B) Säure;
    (C) eine oder mehrere Verbindungen, ausgedrückt durch die folgende allgemeine Formel:

            RN[(CH2CH2CH2O)x(CH2CH2O)zH][(CH2CH2CH2O)y(CH2CH2O)wH],

    wobei R eine Alkylgruppe mit zwischen 6 und 28 Kohlenstoffatomen darstellt und w, x, y und z jeweils eine ganze Zahl zwischen 0 und 30 darstellen, wobei die Summe von w, x, y und z allerdings nicht 0, Aminoxid oder eine Mischung davon ist;
    (D) ein Antihaftmittel, das ausgewählt ist aus der Gruppe, bestehend aus aromatischen Aldehyden und aromatischen Ketonen;
    (E) 2-Naphthol-7-sulfonsäure oder ein Alkalisalz davon;
    (F) eine oder mehrere Acrylsäuren oder ein oder mehrere Acrylsäurederivate, wie durch die folgende allgemeine Formel (1) ausgedrückt:
    Figure imgb0014
    wobei R Wasserstoff oder eine Alkylgruppe, die zwischen 1 und 3 Kohlenstoffatome enthält, darstellt; und
    (G) ein Antioxidationsmittel;
    wobei der pH-Wert 1 oder weniger ist.
EP09155197.8A 2008-06-12 2009-03-16 Elektrolytische Zinnbeschichtungslösung und elektrolytisches Zinnbeschichtungsverfahren Active EP2141261B1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008154461A JP5583894B2 (ja) 2008-06-12 2008-06-12 電気錫めっき液および電気錫めっき方法

Publications (3)

Publication Number Publication Date
EP2141261A2 EP2141261A2 (de) 2010-01-06
EP2141261A3 EP2141261A3 (de) 2010-07-28
EP2141261B1 true EP2141261B1 (de) 2017-03-01

Family

ID=41334608

Family Applications (1)

Application Number Title Priority Date Filing Date
EP09155197.8A Active EP2141261B1 (de) 2008-06-12 2009-03-16 Elektrolytische Zinnbeschichtungslösung und elektrolytisches Zinnbeschichtungsverfahren

Country Status (6)

Country Link
US (1) US20100000873A1 (de)
EP (1) EP2141261B1 (de)
JP (1) JP5583894B2 (de)
KR (1) KR101593475B1 (de)
CN (1) CN101619470B (de)
TW (1) TWI468554B (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4435862B1 (ja) 2009-02-06 2010-03-24 謙治 出分 銀含有合金メッキ浴、およびこれを用いた電解メッキ方法
CA2769569C (en) 2009-07-31 2014-07-15 M-Tech Japan Co., Ltd. Tin-containing alloy plating bath, electroplating method using same, and substrate with the electroplating deposited thereon
JP2012021224A (ja) * 2010-06-15 2012-02-02 Mitsubishi Shindoh Co Ltd 錫めっき液中のスラッジ発生防止方法
US8888984B2 (en) * 2012-02-09 2014-11-18 Rohm And Haas Electronic Materials Llc Plating bath and method
EP2740820A1 (de) 2012-12-04 2014-06-11 Dr.Ing. Max Schlötter GmbH & Co. KG Elektrolyt und Verfahren zur Abscheidung von lötbaren Schichten
JP6133056B2 (ja) 2012-12-27 2017-05-24 ローム・アンド・ハース電子材料株式会社 スズまたはスズ合金めっき液
US20150122662A1 (en) * 2013-11-05 2015-05-07 Rohm And Haas Electronic Materials Llc Plating bath and method
US20150122661A1 (en) * 2013-11-05 2015-05-07 Rohm And Haas Electronic Materials Llc Plating bath and method
EP3077578A4 (de) * 2013-12-05 2017-07-26 Honeywell International Inc. Zinn-methansulfonat-lösung mit eingestelltem ph-wert
CN105755513A (zh) * 2016-04-28 2016-07-13 四川昊吉科技有限公司 一种镀锡防腐剂
JP6818520B2 (ja) 2016-11-11 2021-01-20 ローム・アンド・ハース電子材料株式会社 中性スズめっき液を用いたバレルめっきまたは高速回転めっき方法
JP6620858B2 (ja) * 2017-10-24 2019-12-18 三菱マテリアル株式会社 錫又は錫合金めっき堆積層の形成方法
US11268203B2 (en) * 2017-10-24 2022-03-08 Mitsubishi Materials Corporation Tin or tin alloy plating solution
KR102653074B1 (ko) 2017-12-20 2024-03-29 바스프 에스이 억제제를 포함하는 주석 또는 주석 합금 전기도금을 위한 조성물
EP3781729A1 (de) 2018-04-20 2021-02-24 Basf Se Zusammensetzung zur galvanisierung von zinn oder zinnlegierungen mit einem unterdrückungsmittel
CN109518233B (zh) * 2018-11-27 2020-07-14 东莞美坚化工原料有限公司 一种防止微型电子元器件粘片的导电溶液及其制备方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE553400A (de) * 1956-01-16
US3616306A (en) * 1969-11-19 1971-10-26 Conversion Chem Corp Tin plating bath and method
US4000047A (en) * 1972-11-17 1976-12-28 Lea-Ronal, Inc. Electrodeposition of tin, lead and tin-lead alloys
US4135991A (en) * 1977-08-12 1979-01-23 R. O. Hull & Company, Inc. Bath and method for electroplating tin and/or lead
US4871429A (en) * 1981-09-11 1989-10-03 Learonal, Inc Limiting tin sludge formation in tin or tin/lead electroplating solutions
US4717460A (en) * 1983-12-22 1988-01-05 Learonal, Inc. Tin lead electroplating solutions
US4582576A (en) * 1985-03-26 1986-04-15 Mcgean-Rohco, Inc. Plating bath and method for electroplating tin and/or lead
US4885064A (en) * 1989-05-22 1989-12-05 Mcgean-Rohco, Inc. Additive composition, plating bath and method for electroplating tin and/or lead
JP2856857B2 (ja) * 1990-07-27 1999-02-10 石原薬品株式会社 錫、鉛または錫―鉛合金めっき浴
JP2001040498A (ja) * 1999-07-27 2001-02-13 Ne Chemcat Corp 錫−銅合金めっき皮膜で被覆された電子部品
JP2001234387A (ja) * 2000-02-17 2001-08-31 Yuken Industry Co Ltd 錫系電気めっきのウィスカー発生防止剤および防止方法
DE60226196T2 (de) * 2001-05-24 2009-05-14 Shipley Co., L.L.C., Marlborough Zinn-Plattieren
JP3910028B2 (ja) 2001-09-13 2007-04-25 株式会社村田製作所 チップ型セラミックス電子部品の電極形成法
JP4812365B2 (ja) * 2005-08-19 2011-11-09 ローム・アンド・ハース・エレクトロニック・マテリアルズ,エル.エル.シー. 錫電気めっき液および錫電気めっき方法
DK1948852T3 (da) * 2005-11-18 2019-01-02 Luxembourg Inst Science & Tech List Hovedelektrode og fremgangsmåde til dannelse af hovedelektroden

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
None *

Also Published As

Publication number Publication date
CN101619470B (zh) 2012-03-28
US20100000873A1 (en) 2010-01-07
TWI468554B (zh) 2015-01-11
TW201006966A (en) 2010-02-16
EP2141261A2 (de) 2010-01-06
CN101619470A (zh) 2010-01-06
KR101593475B1 (ko) 2016-02-12
KR20090129373A (ko) 2009-12-16
JP5583894B2 (ja) 2014-09-03
JP2009299123A (ja) 2009-12-24
EP2141261A3 (de) 2010-07-28

Similar Documents

Publication Publication Date Title
EP2141261B1 (de) Elektrolytische Zinnbeschichtungslösung und elektrolytisches Zinnbeschichtungsverfahren
EP1754805B1 (de) Zinn galvanisches Bad und Zinn galvanisches Abscheidungsverfahren
TWI308938B (en) Pyrophosphoric acid bath for use in copper-tin alloy plating
US7931793B2 (en) Tin or tin alloy electroplating solution
JP4162246B2 (ja) シアン化物非含有銀系メッキ浴、メッキ体及びメッキ方法
US20030159938A1 (en) Electroplating solution containing organic acid complexing agent
EP3002350B1 (de) Cyanidfreie galvanische bäder für weisse bronze basierend auf kupfer (i) ionen
DE112007000903T5 (de) Zinn-Elektroplattierungsbad, Zinn-plattierter Beschichtungsfilm, Zinn-Elektroplattierungsverfahren, und Bauelement eines elektronischen Geräts
TWI548782B (zh) 無氰化物之酸性消光銀電鍍組成物及方法
EP3321396B1 (de) Trommelplattierung oder hochgeschwindigkeitsdrehplattierung mit einer neutralen zinnplattierungslösung
US8277630B2 (en) Tin electroplating solution and a method for tin electroplating
TWI623654B (zh) 鉍電鍍浴及將鉍電鍍於基板上的方法
EP3276046A1 (de) Plattierungslösung mit verwendung von ammoniumsalz
JP2001107287A (ja) Sn−Cu合金めっき浴

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

17P Request for examination filed

Effective date: 20090316

AK Designated contracting states

Kind code of ref document: A2

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK TR

AX Request for extension of the european patent

Extension state: AL BA RS

PUAL Search report despatched

Free format text: ORIGINAL CODE: 0009013

AK Designated contracting states

Kind code of ref document: A3

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK TR

AX Request for extension of the european patent

Extension state: AL BA RS

RIC1 Information provided on ipc code assigned before grant

Ipc: C25D 3/32 20060101ALI20100624BHEP

Ipc: C23C 18/54 20060101AFI20091127BHEP

AKX Designation fees paid

Designated state(s): DE FR GB

17Q First examination report despatched

Effective date: 20160629

REG Reference to a national code

Ref country code: DE

Ref legal event code: R079

Ref document number: 602009044411

Country of ref document: DE

Free format text: PREVIOUS MAIN CLASS: C23C0018540000

Ipc: C25D0003300000

GRAP Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOSNIGR1

RIC1 Information provided on ipc code assigned before grant

Ipc: C25D 7/12 20060101ALN20160919BHEP

Ipc: C25D 17/16 20060101ALN20160919BHEP

Ipc: C25D 3/30 20060101AFI20160919BHEP

INTG Intention to grant announced

Effective date: 20161019

RIN1 Information on inventor provided before grant (corrected)

Inventor name: IMANARI, MASAAKI

Inventor name: SHIMAZU, MOTOYA

Inventor name: OHTA, YASUO

Inventor name: TING, FAI LUNG

GRAS Grant fee paid

Free format text: ORIGINAL CODE: EPIDOSNIGR3

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

REG Reference to a national code

Ref country code: FR

Ref legal event code: PLFP

Year of fee payment: 9

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): DE FR GB

REG Reference to a national code

Ref country code: GB

Ref legal event code: FG4D

REG Reference to a national code

Ref country code: DE

Ref legal event code: R096

Ref document number: 602009044411

Country of ref document: DE

REG Reference to a national code

Ref country code: DE

Ref legal event code: R097

Ref document number: 602009044411

Country of ref document: DE

PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

26N No opposition filed

Effective date: 20171204

REG Reference to a national code

Ref country code: FR

Ref legal event code: PLFP

Year of fee payment: 10

GBPC Gb: european patent ceased through non-payment of renewal fee

Effective date: 20170601

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GB

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20170601

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: FR

Payment date: 20230208

Year of fee payment: 15

P01 Opt-out of the competence of the unified patent court (upc) registered

Effective date: 20230530

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: DE

Payment date: 20240130

Year of fee payment: 16