EP1257683A1 - Procede pour eloigner d'une chambre des molecules adsorbees - Google Patents

Procede pour eloigner d'une chambre des molecules adsorbees

Info

Publication number
EP1257683A1
EP1257683A1 EP01905813A EP01905813A EP1257683A1 EP 1257683 A1 EP1257683 A1 EP 1257683A1 EP 01905813 A EP01905813 A EP 01905813A EP 01905813 A EP01905813 A EP 01905813A EP 1257683 A1 EP1257683 A1 EP 1257683A1
Authority
EP
European Patent Office
Prior art keywords
chamber
molecules
polar
gas
water
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP01905813A
Other languages
German (de)
English (en)
Inventor
Zsolt Nenyei
Wilfried Lerch
Jürgen NIESS
Thomas Graf
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Steag RTP Systems GmbH
Original Assignee
Steag RTP Systems GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Steag RTP Systems GmbH filed Critical Steag RTP Systems GmbH
Publication of EP1257683A1 publication Critical patent/EP1257683A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
    • C23C16/4408—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber by purging residual gases from the reaction chamber or gas lines
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • C23C14/564—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67098—Apparatus for thermal treatment
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S134/00—Cleaning and liquid contact with solids
    • Y10S134/902—Semiconductor wafer
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00—Semiconductor device manufacturing: process
    • Y10S438/905—Cleaning of reaction chamber
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00—Semiconductor device manufacturing: process
    • Y10S438/906—Cleaning of wafer as interim step

Definitions

  • the present invention relates to a method for removing first molecules adsorbed on the surfaces of a chamber and / or at least one object located in the chamber, in particular to removing polar molecules from a process or lock chamber of a rapid heating system.
  • moisture for example, can impair the process.
  • Moisture tends to be adsorbed on the chamber walls, objects such as semiconductor substrates or other elements in the chamber.
  • processes that are affected by the presence of water are the production of ultra-flat pn junctions (ultra shallow junctions), metallization processes and many CVD processes. Water also affects so-called COP's or crystal originated particles, as well as the formation of oxygen-free surface layers (magic denuded zones).
  • water within the reaction chamber has a negative effect on the substrates to be treated or on the layers applied thereon.
  • water in the order of less than 1 ppm to several 100 ppm in an oxygen-free atmosphere during a thermal treatment, depending on the process temperature has a caustic effect on silicon or GaAs wafers.
  • An originally smooth polished surface of the wafer is atomically roughened. It is possible that Form zones of a diffuse veil on the wafer. Structures applied to the substrate surface can thereby be destroyed or at least impaired.
  • the etched material of the semiconductor wafer may settle elsewhere in the process chamber, thereby contaminating the chamber.
  • the main reason for water within a process chamber is the humidity of the ambient air. Every time the process chamber is opened, for example to remove and insert the object to be treated or during maintenance work, air penetrates into the process chamber.
  • the relative humidity in clean rooms is usually between 38% and 42%.
  • the water present in the air settles on the object to be treated or on the inside of the chamber. This problem is particularly pronounced after a wet chemical treatment of the object. In these cases, water is adsorbed by the substrate surface in much larger quantities.
  • special coatings of a wafer with different materials can increase the adsorption effect against water. Silicon dioxide, which is often used as a coating material, is highly hydrophilic and has a great adsorption effect against water.
  • the process chamber can be contaminated by powdery deposits. In these cases, a large amount of water can be adsorbed because the powdery microparticles in the chamber provide an enlarged surface for adsorption.
  • the present invention is therefore based on the object of a method for the rapid and efficient removal of polar molecules, such as. B. of water molecules, but also of non-polar molecules, such as. B. oxygen molecules from a chamber.
  • polar molecules such as. B. of water molecules
  • non-polar molecules such as. B. oxygen molecules from a chamber.
  • the present invention relates in particular to the removal of water molecules from a process and / or lock chamber of a rapid heating system.
  • the object is achieved by introducing second polar molecules into the chamber, which have a desorbing effect on the first molecules.
  • the introduction of the second polar molecules accelerates the desorption of the undesired first molecules.
  • the second polar molecules preferably take the place of the first molecules, so that a new adsorption is prevented.
  • predetermined limit values for the concentration of the first molecules within the chamber can be reached more quickly, which means that the throughput rates of the system and thus its economy can be increased.
  • lower values of the concentration of the first molecules within the chamber can be achieved, which leads to better process results.
  • the first molecules are preferably water and / or oxygen molecules, which can have an etching effect on semiconductor wafers. Removing these molecules can therefore prevent damage to the wafers or the structures attached to them.
  • a purge gas in particular before, during and / or after the introduction of the second polar molecules, especially an inert gas or N 2) passed through the chamber in order to reliably remove the desorbed first molecules from the chamber.
  • purging gas is preferably first passed through the chamber and then a mixture of purging gas and the second polar molecules in order to first achieve a purging. Only after the pre-rinse are the second polar molecules passed through the chamber in order to cause further desorption of the first molecules. This two-step step can reduce the amount of second polar molecules used. For example, to apply water at a relative humidity of approx. 40% and room temperature using NH 3 , a mixing ratio of 9: 1 between the purge gas and the polar NH3 has proven to be advantageous.
  • the purge gas and then the second polar molecules are first passed through the chamber in order to again achieve a two-stage process.
  • a purge gas can advantageously be passed through the chamber again.
  • the temperature within the chamber is preferably controlled.
  • the walls of the chamber and / or an object located in the chamber, such as a semiconductor wafer, are preferably heated.
  • the object is preferably heated to a temperature range between 400 ° C and 800 ° C.
  • the desorption can advantageously also be promoted in that the second polar molecules and / or the purge gas are heated before being introduced into the chamber.
  • the second polar molecules consist of nitrogen and hydrogen and in particular form NH 3 molecules.
  • the second polar molecules have fluorine and / or chlorine.
  • care must be taken that the second polar molecules support the desired rapid heating process and do not interfere in any way. For example, an undesirable oxidizing effect of water is avoided by selecting NH 3 as the second polar molecule and thus causing a frequently desired nitridation or a reductive effect on the object to be processed.
  • the second polar molecules can be NH 3) 0 3 , NO 2 , NO, PH 3 , SiH C.
  • the pressure in the chamber is advantageously controlled to an overpressure or a vacuum. Sequential desorbing in several rinsing stages can also be advantageous, with different polar molecules or a mixture of molecules being used in each stage.
  • the present invention is particularly suitable for the removal of water and oxygen molecules from the process and / or lock chamber of a rapid heating system for the thermal treatment of semiconductor wafers.
  • FIG. 1 shows a schematic sectional view of a device for thermal treatment of a substrate
  • Fig. 2a shows the water content in a gas flow when leaving a
  • Process chamber as a function of time 2b shows a diagram of a gas flow profile and a temperature profile within a process chamber as a function of time;
  • FIG. 3a, 3b similar diagrams as in Figures 2a and 2b with different gas flows and temperature profiles;
  • Fig. 4 is a diagram showing the effects of repeated repetitions of the method according to the invention on the moisture in a process chamber.
  • FIG. 1 shows a schematic illustration of a rapid heating system 1 for the thermal treatment of substrates 2, as is known, for example, from DE 199 23 400.0, which is based on the same applicant and has not been previously published.
  • the device 1 has a housing 3, which can comprise a mirrored chamber 4 on the inside.
  • a process chamber 6, which preferably consists of quartz, is provided within the housing 3.
  • a support for receiving and holding a semiconductor wafer 2 is provided within the process chamber 6.
  • the process chamber 6 has at one end a gas inlet line 8 which is connected to at least two different gas sources 10 and 11.
  • One end of the process chamber 6 opposite the gas line 8 is closed by a chamber door 14.
  • a lock chamber 16 can be provided on the outside of the housing 3, via which semiconductor wafers 2 are introduced into and removed from the process chamber 6 in a known manner.
  • the process chamber 6 is spaced from an upper and a lower wall of the housing 3, and lamp banks 18, 19 are arranged in the spaces formed therebetween in order to thermally treat the semiconductor wafer 2 in a known manner.
  • the lamp banks 18, 19 can have both tungsten-halogen lamps 7 and UV lamps 9 or only one type of lamp.
  • a flushing gas such as, for example, an inert gas or N 2
  • the purge gas absorbs some of the moisture and transports it out of the process chamber 6.
  • a gas containing polar molecules such as NH 3
  • the polar molecules have a desorbing effect on water and oxygen and thus enable a better removal of the water and oxygen from the chamber 6.
  • the gas from polar molecules can be introduced into the purge gas stream or the purge gas stream can be interrupted and only polar gas in the chamber 6 can be introduced to provide a good desorption.
  • a flushing gas can then be introduced into the chamber 6, or a process gas which promotes certain reactions during the thermal treatment of the semiconductor wafer 2.
  • These steps can be repeated any number of times, whereby different gases can be used in each step.
  • the desorbing effect can also be achieved by a gas mixture of different polar molecules, the concentration of which depends on the process conditions, e.g. B. temperature and pressure can be adjusted.
  • the polar molecules with a desorbing action can also only be generated in the reaction chamber. For example, UV radiation can be used to generate ozone in a process gas atmosphere containing oxygen.
  • Suitable polar gases which have a desorbing effect on water are, for example, nitrogen-hydrogen compounds such as ammonia NH 3 or hydrazine N 2 H 4 , hydrogen-halogen compounds such as HCl, nitrogen-halogen compounds such as NF 3 and halogenated Hydrocarbon compounds such as CH 3 F or CHCI 3 (chloroform) etc., to name just a few examples.
  • nitrogen-hydrogen compounds such as ammonia NH 3 or hydrazine N 2 H 4
  • hydrogen-halogen compounds such as HCl
  • nitrogen-halogen compounds such as NF 3
  • halogenated Hydrocarbon compounds such as CH 3 F or CHCI 3 (chloroform) etc.
  • the use of NH 3 advantageously allows the process temperature to be reduced and thus the thermal load on the substrate, since NH 3 dissociates in various ways and releases reactive hydrogen.
  • a periodic flushing process for removing the water is advantageous, in which a flushing or process gas and a polar gas alternate in the gas stream after a predetermined modulation.
  • the temperature of the process chamber 6 and / or the wafer 2 can be varied during the individual rinsing processes.
  • FIG. 2 shows the results of a test which shows the influence of a polar gas on the moisture concentration within a process chamber of a rapid heating system.
  • the test was carried out on an AST 2800E rapid heating system from STEAG RTP Systems GmbH.
  • An upper diagram shows the content of water molecules in a gas flow emerging from a process chamber in ppm, ie in particles per million.
  • a first curve 21 shows an argon flow through the process chamber of the rapid heating system
  • a second curve 22 shows an ammonia (NH 3 ) flow through the process chamber
  • a third curve 23 the temperature of a semiconductor wafer located in the chamber, as measured by a pyrometer in a known manner.
  • the water content in the gas stream emerging from the process chamber drops continuously to 4 ppm in the first 60 seconds after the start of an argon flow of approx. 10 slm. This is because the argon flow carries water molecules out of the chamber and the water content in the chamber decreases over time.
  • the water content begins to decrease again at approximately 70 seconds.
  • a further increase in the water content is achieved by heating the wafer to an elevated temperature. As can be seen in curve 23 in FIG. 2b, the wafer temperature is heated to approximately 750 ° C. This warming promotes the desorption of water, which results in a renewed increase in the water content in the gas stream emerging from the process chamber, as shown in FIG. 2a.
  • the temperature of the wafer was measured with a pyrometer. Since a weakly doped silicon wafer is semitransparent in the infrared wavelength range below 450 ° C and emits weak thermal radiation that cannot be measured, the temperature curve only starts at this limit temperature.
  • the wafer is preferably heated to a temperature of 750 ° C. and held at this temperature for ten seconds, as can be seen in FIG. 2b.
  • the wafer temperature is preferably in a range between 400 ° C. and 800 ° C. Ten seconds are enough to reach a new maximum of the water content in the purge gas.
  • the argon and / or ammonia gas can also be heated in order to promote the desorption of water.
  • the water content in the gas stream also drops to a range below 3 ppm.
  • FIG. 3 shows the results of a further test with essentially the same test setup as that described above.
  • the chamber is first rinsed with an argon flow of approx. 10 slm (curve 31) for approx. 50 seconds.
  • the proportion of water in the gas stream emerging from the process chamber again decreases continuously.
  • the argon flow is then replaced by a pure NH 3 flow of 10 slm (curve 32).
  • the water content in the gas stream emerging from the process chamber rises to 10 ppm.
  • the water content only increased to 8 ppm.
  • the peak of the maximum is much more pronounced in this test.
  • FIGS. 2 and 3 clearly show an improved removal of water from a process chamber by introducing a polar gas, such as ammonia, into the process chamber.
  • a polar gas such as ammonia
  • FIG. 4 shows the effects of repeated repetition of the above-mentioned process on the moisture content in the process chamber.
  • the diagram in FIG. 4 shows the water content in a gas flow emerging from the process chamber as a function of time.
  • a gas flow and temperature control according to FIG. 3b were used to reduce the moisture concentration in the chamber.
  • Curve 41 shows the course of the water content in the gas flow exiting the process chamber for a first wafer
  • curve 42 shows the course of the water content in the exiting gas flow during the treatment of the tenth wafer.
  • the time ti marks the time at which the ammonia flow starts during the treatment.
  • the method according to the invention can also be used with other devices.
  • the method described is particularly advantageous in systems which have a lock system, for example when the process chamber itself and other components of the system are evacuated.
  • the described removal of adsorbed water can be carried out without or with the optional heating step in the lock before the wafer is introduced into a process chamber. Due to the typically relatively small volume of a lock chamber, rapid desorption of water can be achieved. Of course, in these cases too, a gas introduced into the lock chamber can be heated in order to promote the desorption of water and thus to achieve a more rapid reduction in the moisture concentration within the lock chamber.

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • General Chemical & Material Sciences (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Chemical Vapour Deposition (AREA)
  • Drying Of Semiconductors (AREA)

Abstract

Afin d'éloigner de manière rapide et efficace, hors d'une chambre ou d'objets, des molécules polaires, telles que par ex. des molécules d'eau, mais également des molécules non polaires, telles que par ex. des molécules d'oxygène, il est prévu d'introduire dans la chambre concernée de secondes molécules polaires qui exercent une action désorbante sur les premières molécules.
EP01905813A 2000-02-25 2001-02-21 Procede pour eloigner d'une chambre des molecules adsorbees Withdrawn EP1257683A1 (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE10008829A DE10008829B4 (de) 2000-02-25 2000-02-25 Verfahren zum Entfernen von adsorbierten Molekülen aus einer Kammer
DE10008829 2000-02-25
PCT/EP2001/001931 WO2001063002A1 (fr) 2000-02-25 2001-02-21 Procede pour eloigner d'une chambre des molecules adsorbees

Publications (1)

Publication Number Publication Date
EP1257683A1 true EP1257683A1 (fr) 2002-11-20

Family

ID=7632348

Family Applications (1)

Application Number Title Priority Date Filing Date
EP01905813A Withdrawn EP1257683A1 (fr) 2000-02-25 2001-02-21 Procede pour eloigner d'une chambre des molecules adsorbees

Country Status (6)

Country Link
US (1) US6830631B2 (fr)
EP (1) EP1257683A1 (fr)
JP (1) JP2003526908A (fr)
KR (1) KR100744224B1 (fr)
DE (1) DE10008829B4 (fr)
WO (1) WO2001063002A1 (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6484563B1 (en) * 2001-06-27 2002-11-26 Sensistor Technologies Ab Method at detection of presence of hydrogen gas and measurement of content of hydrogen gas
FR2847714B1 (fr) 2002-11-27 2005-02-18 Soitec Silicon On Insulator Procede et dispositif de recuit de tranche de semiconducteur
JP3776092B2 (ja) * 2003-03-25 2006-05-17 株式会社ルネサステクノロジ エッチング装置、エッチング方法および半導体装置の製造方法
FR2858715B1 (fr) 2003-08-04 2005-12-30 Soitec Silicon On Insulator Procede de detachement de couche de semiconducteur
KR100883148B1 (ko) 2003-12-12 2009-02-10 세미이큅, 인코포레이티드 이온 주입시 설비의 가동 시간을 늘리기 위한 방법과 장치
US7877895B2 (en) 2006-06-26 2011-02-01 Tokyo Electron Limited Substrate processing apparatus
WO2009039382A1 (fr) 2007-09-21 2009-03-26 Semequip. Inc. Procédé d'extension du temps de fonctionnement d'un équipement d'implantation ionique
KR20170122910A (ko) * 2016-04-27 2017-11-07 성균관대학교산학협력단 원자층 식각방법
US20170345665A1 (en) * 2016-05-26 2017-11-30 Tokyo Electron Limited Atomic layer etching systems and methods
KR20180017592A (ko) * 2016-08-10 2018-02-21 삼성전자주식회사 열 탈착 시스템 및 이를 이용한 기판 분석 방법
US10714317B1 (en) 2019-01-04 2020-07-14 Axcelis Technologies, Inc. Reduction of condensed gases on chamber walls via heated chamber housing for semiconductor processing equipment
DE102022002762A1 (de) 2022-07-29 2024-02-01 centrotherm international AG Reinigungsverfahren zum Reinigen eines Hochtemperaturofens

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3279946A (en) * 1962-08-14 1966-10-18 Merck & Co Inc Hydrogen chloride treatment of semiconductor coating chamber
US4512812A (en) * 1983-09-22 1985-04-23 Varian Associates, Inc. Method for reducing phosphorous contamination in a vacuum processing chamber
JPS61208424A (ja) * 1985-03-13 1986-09-16 Gadelius Kk 防蝕保存装置と防蝕保存方法
US4723363A (en) * 1986-12-29 1988-02-09 Motorola Inc. Process for removal of water
JPH05326477A (ja) * 1992-05-26 1993-12-10 Ulvac Japan Ltd 半導体基板表面のハロゲン除去方法
JPH05343335A (ja) * 1992-06-09 1993-12-24 Mitsubishi Electric Corp シリコン窒化膜の形成方法
JPH09106974A (ja) * 1995-10-09 1997-04-22 Nippon Sanso Kk 基板吸着水分の除去方法及び装置
JPH1098019A (ja) * 1996-09-24 1998-04-14 Kawasaki Steel Corp 表面清浄化方法
US6395099B1 (en) * 1999-02-08 2002-05-28 Micron Technology Method of processing selected surfaces in a semiconductor process chamber based on a temperature differential between surfaces
US6528427B2 (en) * 2001-03-30 2003-03-04 Lam Research Corporation Methods for reducing contamination of semiconductor substrates

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See references of WO0163002A1 *

Also Published As

Publication number Publication date
JP2003526908A (ja) 2003-09-09
US20030155000A1 (en) 2003-08-21
KR100744224B1 (ko) 2007-07-30
DE10008829B4 (de) 2005-06-23
WO2001063002A1 (fr) 2001-08-30
KR20020089360A (ko) 2002-11-29
DE10008829A1 (de) 2001-09-06
US6830631B2 (en) 2004-12-14

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