EP0829000A1 - Procede pour etalonner un thermometre a rayonnement - Google Patents
Procede pour etalonner un thermometre a rayonnementInfo
- Publication number
- EP0829000A1 EP0829000A1 EP97914310A EP97914310A EP0829000A1 EP 0829000 A1 EP0829000 A1 EP 0829000A1 EP 97914310 A EP97914310 A EP 97914310A EP 97914310 A EP97914310 A EP 97914310A EP 0829000 A1 EP0829000 A1 EP 0829000A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- radiation
- ambient temperature
- sensor
- temperature
- determined
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 230000005855 radiation Effects 0.000 title claims abstract description 58
- 238000000034 method Methods 0.000 title claims abstract description 21
- 230000035945 sensitivity Effects 0.000 claims description 4
- 230000001419 dependent effect Effects 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000012790 confirmation Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
- G01J5/064—Ambient temperature sensor; Housing temperature sensor; Constructional details thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
- G01J5/53—Reference sources, e.g. standard lamps; Black bodies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/80—Calibration
Definitions
- the present invention relates to a method for calibrating a radiation thermometer, which contains a radiation sensor and an ambient temperature sensor, by means of a radiation standard with a known temperature.
- the temperature difference between a measurement object and a reference object - for example a shutter or the radiation sensor itself - can be determined.
- knowledge of the temperature of the reference object is additionally necessary. This temperature is expediently determined using a temperature sensor that is thermally coupled as well as possible to the reference object.
- both sensors When calibrating a radiation thermometer that includes a radiation sensor and an ambient temperature sensor, both sensors must be calibrated. In known calibration methods, the output signals of the two sensors are determined at different radiation and ambient or reference temperatures. The corresponding calibration parameters can then be determined from this.
- the ambient temperature (possibly several) is determined with an external calibrated thermometer. The temperature of the external thermometer must come as close as possible to the temperature of the sensor to be calibrated (e.g. by immersing the sensor and the thermometer in the same liquid or by a longer adjustment phase). The calibration of the ambient temperature sensor therefore takes place independently of the calibration of the radiation sensor.
- the applicant is known from the field of control engineering that the time behavior of a system is described on the basis of certain system variables and parameters which ultimately describe the time behavior of the overall system. It is known to determine the parameters of the system which vary over time in order to determine these parameters and to use the variables to solve the system of equations according to the parameters. The time behavior of the system can then be described for the future on the basis of the parameters determined in this way. This method has become known as process parameter identification. It will
- the parameters to be determined are determined using these six equations in such a way that, for example, the quadratic errors are minimized. Inaccuracies in the measurement of individual system variables can thereby be compensated for.
- the invention has for its object to provide a method with which the calibration of a radiation thermometer can be carried out in a simple manner, which has a radiation sensor and an ambient temperature sensor.
- the essential feature of the method according to the invention is the fact that for calibration the temperature of a radiation standard must be known, but not the ambient temperatures. If necessary, however, the ambient temperatures can be determined during calibration from the output signals of the radiation sensor.
- the method according to the invention is therefore also particularly suitable for calibrating thermometers which have a radiation sensor with a built-in ambient temperature sensor, that is to say the ambient temperature sensor is not accessible from the outside at all.
- the exact determination of the respective ambient temperatures is also relatively complex when calibrating other sensors. With the method described here, especially in the series production of high-precision radiation thermometers for not too high temperatures (e.g. radiation clinical thermometers), the time and measurement effort for calibration is significantly less.
- the method according to claim 3 advantageously shows that possible errors in the measurement of the radiation temperature and the detection of the sensor output signals can be compensated for in the calibration of the radiation thermometer.
- the ambient temperature Tu is determined in the radiation thermometer from the output signal R of the corresponding temperature sensor and the function g.
- m further calibration parameters c ,, c 2 , ..., c m must generally be known:
- T ⁇ g (R, c 1 f c 2 , ... cJ
- the output signal of the radiation sensor and the output signal of the ambient temperature sensor are determined with a suitable variation of the ambient and radiation temperature p times. This results in a (non-linear) system of equations with p equations and p unknowns:
- T s f (g (R, c 1 ( c 2 , ..., c m ), U, k,, k 2 , ..., k n )
- a radiation thermometer which contains a thermopile radiation sensor and a silicon resistor is to serve as an example below.
- the silicon resistor is used to measure the ambient temperature, which here is identical to the reference temperature.
- the following relationship between the radiation temperature T s , the output signal U of the radiation sensor and the ambient temperature T u is used for calibration in this example:
- the resistance R of the ambient temperature sensor can be represented in the following form:
- T 0 is a reference temperature (25 ° C.) at which the resistance has the value R 0 .
- the parameters R 0 and are usually specified by the manufacturer of the sensor, but with certain tolerances.
- further calibration parameters can be determined, for example the temperature coefficient of the sensitivity of the radiation sensor.
- equation (2.1) it is also possible to use equations during calibration which are adapted to the radiation characteristics of the measurement objects, the temperatures of which are to be measured with the radiation thermometer.
- the aforementioned method can be programmed on a microcontroller, for example.
- the parameters can be set by the microcontroller.
- This microcontroller can be present as an external device and store the specific parameters in a corresponding device of the radiation thermometer. It is also possible to use the microcontroller present in a radiation thermometer to determine the parameters.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Radiation Pyrometers (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Abstract
L'invention concerne un procédé permettant d'étalonner un thermomètre à rayonnement, comportant un capteur de rayonnement et un capteur de température ambiante, au moyen d'un étalon de rayonnement dont la température est connue. Lors de l'étalonnage, les paramètres à déterminer et/ou la température ambiante sont déterminés à partir d'au moins deux températures de rayonnement mesurées.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19613229A DE19613229C2 (de) | 1996-04-02 | 1996-04-02 | Verfahren zur Kalibrierung eines Strahlungsthermometers |
DE19613229 | 1996-04-02 | ||
PCT/EP1997/001531 WO1997037201A1 (fr) | 1996-04-02 | 1997-03-26 | Procede pour etalonner un thermometre a rayonnement |
Publications (1)
Publication Number | Publication Date |
---|---|
EP0829000A1 true EP0829000A1 (fr) | 1998-03-18 |
Family
ID=7790306
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP97914310A Withdrawn EP0829000A1 (fr) | 1996-04-02 | 1997-03-26 | Procede pour etalonner un thermometre a rayonnement |
Country Status (7)
Country | Link |
---|---|
US (2) | US6065866A (fr) |
EP (1) | EP0829000A1 (fr) |
JP (1) | JPH11507136A (fr) |
CN (1) | CN1185831A (fr) |
CA (1) | CA2219274A1 (fr) |
DE (1) | DE19613229C2 (fr) |
WO (1) | WO1997037201A1 (fr) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19613229C2 (de) * | 1996-04-02 | 1999-01-28 | Braun Ag | Verfahren zur Kalibrierung eines Strahlungsthermometers |
JP3873528B2 (ja) * | 1999-06-18 | 2007-01-24 | オムロンヘルスケア株式会社 | 放射体温計 |
US6908224B2 (en) * | 2002-05-21 | 2005-06-21 | Kendro Laboratory Products, Lp | Temperature sensor pre-calibration method and apparatus |
US20040057494A1 (en) * | 2002-09-19 | 2004-03-25 | Simon Tsao | Ear thermometer with improved temperature coefficient and method of calibration thereof |
US7422365B2 (en) * | 2003-04-25 | 2008-09-09 | Land Instruments International Limited | Thermal imaging system and method |
DE10333774B4 (de) * | 2003-07-24 | 2005-06-23 | Atlas Material Testing Technology Gmbh | Kalibrierung von Temperatursensoren von Bewitterungsgeräten durch kontaktlose Temperaturmessung |
US20070268954A1 (en) * | 2006-05-19 | 2007-11-22 | Sherwood Services Ag | Portable test apparatus for radiation-sensing thermometer |
US7507019B2 (en) * | 2006-05-19 | 2009-03-24 | Covidien Ag | Thermometer calibration |
US7549792B2 (en) | 2006-10-06 | 2009-06-23 | Covidien Ag | Electronic thermometer with selectable modes |
US20080170599A1 (en) * | 2007-01-15 | 2008-07-17 | Shang Mei Precision Industrial Co., Ltd. | Calibration Method for Infrared Temperature Measuring Instruments |
TW200834047A (en) * | 2007-02-09 | 2008-08-16 | Radiant Innovation Inc | The calibrating method of infrared thermometer |
CN100547367C (zh) * | 2007-06-15 | 2009-10-07 | 热映光电股份有限公司 | 红外线温度计的校准方法 |
JP2011089983A (ja) * | 2009-09-28 | 2011-05-06 | Asahi Kasei Electronics Co Ltd | 赤外線センサを用いた温度測定装置及びその補正方法 |
JP5648283B2 (ja) * | 2009-12-24 | 2015-01-07 | セイコーエプソン株式会社 | 電子体温計及び体温測定方法 |
CN101839790A (zh) * | 2010-05-06 | 2010-09-22 | 上海哈德电气技术有限公司 | 智能在线标定系统 |
CN102313912B (zh) * | 2010-06-30 | 2014-09-24 | 清华大学 | 毫米波检查设备的辐射计温度校准装置 |
CN102374902B (zh) * | 2010-08-11 | 2014-03-26 | 曹柏林 | 一种提高辐射温度计测温准确度的量子论修正方法 |
US20130223472A1 (en) * | 2012-02-27 | 2013-08-29 | Cvg Management Corporation | Infrared temperature sensor calibration system and method |
CN102818635B (zh) * | 2012-08-25 | 2015-06-10 | 河南省高远公路养护技术有限公司 | 一种提高红外传感器标定精度的方法 |
JP6318599B2 (ja) * | 2013-12-17 | 2018-05-09 | 株式会社リコー | 半導体集積回路 |
CN104316194A (zh) * | 2014-09-24 | 2015-01-28 | 中国人民解放军63620部队 | 一种调光式红外辐射标定方法 |
CN109579999B (zh) * | 2017-09-29 | 2020-12-15 | 青岛海尔特种电冰柜有限公司 | 红外传感器检测温度校准方法、系统和冷柜 |
CN108760091B (zh) * | 2018-05-29 | 2019-11-08 | 中北大学 | 基于改进检定炉的热电偶传感器动态补偿系统构建方法 |
FR3099408B1 (fr) * | 2019-07-30 | 2021-07-09 | Optiwaves | Creuset pour traitement thermique hautes températures de pièces massives |
CN111045074B (zh) * | 2019-12-26 | 2023-07-28 | 上海金鹏源辐照技术有限公司 | 一种辐照剂量随温度响应的校准方法 |
CN111579096B (zh) * | 2020-05-07 | 2022-03-25 | 深圳市微电元科技有限公司 | 一种红外测温传感器模组及测温方法、测温设备 |
Family Cites Families (21)
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US3318133A (en) * | 1964-08-27 | 1967-05-09 | Round Hill Associates Inc | Apparatus for calibrating thermistor thermometers |
GB2071316B (en) * | 1979-09-12 | 1983-11-09 | Raytek Inc | Hand-held digital temperature measuring instrument |
DD158493A3 (de) * | 1980-12-29 | 1983-01-19 | Manfred Zimmerhackl | Verfahren und einrichtung zur emissionsgradunabhaengigen temperaturmessung |
US4464725A (en) * | 1981-05-19 | 1984-08-07 | Setra Systems, Inc. | Temperature compensated measuring system |
DE3343043A1 (de) * | 1983-11-28 | 1985-06-05 | Deutsche Forschungs- und Versuchsanstalt für Luft- und Raumfahrt e.V., 5000 Köln | Verfahren zur beruehrungslosen, emissionsgradunabhaengigen strahlungsmessung der temperatur eines objektes |
US4790324A (en) * | 1984-10-23 | 1988-12-13 | Intelligent Medical Systems, Inc. | Method and apparatus for measuring internal body temperature utilizing infrared emissions |
USRE34789E (en) * | 1985-04-17 | 1994-11-15 | Thermoscan Inc. | Infrared electronic thermometer and method for measuring temperature |
DD254114A3 (de) * | 1985-07-30 | 1988-02-17 | Univ Dresden Tech | Pyrometrisches messverfahren |
US4784149A (en) * | 1986-01-13 | 1988-11-15 | Optical Sensors, Inc. | Infrared thermometer with automatic calibration |
JPS62291526A (ja) * | 1986-06-11 | 1987-12-18 | Chino Corp | 放射温度測定装置 |
US5001657A (en) * | 1986-06-24 | 1991-03-19 | Minolta Camera Kabushiki Kaisha | Radiation thermometer |
JP2826337B2 (ja) * | 1988-04-12 | 1998-11-18 | シチズン時計株式会社 | 放射体温計 |
US4993419A (en) * | 1988-12-06 | 1991-02-19 | Exergen Corporation | Radiation detector suitable for tympanic temperature measurement |
EP0446788B1 (fr) * | 1990-03-12 | 1996-07-03 | Ivac Corporation | Système pour déterminer la température et pour la calibration dans un thermomètre biomédical |
US5150969A (en) * | 1990-03-12 | 1992-09-29 | Ivac Corporation | System and method for temperature determination and calibration in a biomedical probe |
CA2098313C (fr) * | 1990-12-12 | 2001-06-19 | Gary J. O'hara | Thermometre a infrarouges utilisant une cartographie etalonnee |
AU2487692A (en) * | 1991-08-20 | 1993-03-16 | Diatek Incorporated | Infrared thermometer and related method of calibration |
US5333784A (en) * | 1993-03-02 | 1994-08-02 | Exergen Corporation | Radiation detector with thermocouple calibration and remote temperature reference |
CH685021A5 (de) * | 1993-05-05 | 1995-02-28 | Landis & Gyr Business Support | Verfahren zur Anpassung einer fühlertypspezifischen Kennlinienfunktion eines Widerstands-Temperaturfühlers sowie Vorrichtung zur Durchführung des Verfahrens. |
DE19613229C2 (de) * | 1996-04-02 | 1999-01-28 | Braun Ag | Verfahren zur Kalibrierung eines Strahlungsthermometers |
US5967992A (en) * | 1998-06-03 | 1999-10-19 | Trutex, Inc. | Radiometric temperature measurement based on empirical measurements and linear functions |
-
1996
- 1996-04-02 DE DE19613229A patent/DE19613229C2/de not_active Expired - Fee Related
-
1997
- 1997-03-26 CA CA002219274A patent/CA2219274A1/fr not_active Abandoned
- 1997-03-26 WO PCT/EP1997/001531 patent/WO1997037201A1/fr not_active Application Discontinuation
- 1997-03-26 EP EP97914310A patent/EP0829000A1/fr not_active Withdrawn
- 1997-03-26 CN CN97190259A patent/CN1185831A/zh active Pending
- 1997-03-26 JP JP9534908A patent/JPH11507136A/ja active Pending
- 1997-11-21 US US08/976,354 patent/US6065866A/en not_active Expired - Fee Related
-
2000
- 2000-04-04 US US09/542,214 patent/US6283629B1/en not_active Expired - Fee Related
Non-Patent Citations (1)
Title |
---|
See references of WO9737201A1 * |
Also Published As
Publication number | Publication date |
---|---|
US6283629B1 (en) | 2001-09-04 |
DE19613229C2 (de) | 1999-01-28 |
WO1997037201A1 (fr) | 1997-10-09 |
CN1185831A (zh) | 1998-06-24 |
US6065866A (en) | 2000-05-23 |
JPH11507136A (ja) | 1999-06-22 |
CA2219274A1 (fr) | 1997-10-09 |
DE19613229A1 (de) | 1997-10-09 |
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Legal Events
Date | Code | Title | Description |
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PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
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17P | Request for examination filed |
Effective date: 19970820 |
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AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AT BE CH DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE |
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RAP1 | Party data changed (applicant data changed or rights of an application transferred) |
Owner name: BRAUN GMBH |
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17Q | First examination report despatched |
Effective date: 20030317 |
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STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
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18D | Application deemed to be withdrawn |
Effective date: 20040527 |