EP0784345A3 - Circuit de commutation comprenant des transistors à effet de champ - Google Patents

Circuit de commutation comprenant des transistors à effet de champ Download PDF

Info

Publication number
EP0784345A3
EP0784345A3 EP96120817A EP96120817A EP0784345A3 EP 0784345 A3 EP0784345 A3 EP 0784345A3 EP 96120817 A EP96120817 A EP 96120817A EP 96120817 A EP96120817 A EP 96120817A EP 0784345 A3 EP0784345 A3 EP 0784345A3
Authority
EP
European Patent Office
Prior art keywords
electrode
fet
switching circuit
fets
field effect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP96120817A
Other languages
German (de)
English (en)
Other versions
EP0784345A2 (fr
Inventor
Hiroshi Mizutani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Publication of EP0784345A2 publication Critical patent/EP0784345A2/fr
Publication of EP0784345A3 publication Critical patent/EP0784345A3/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/08Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
    • H01L27/085Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
    • H01L27/095Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being Schottky barrier gate field-effect transistors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/08Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
    • H01L27/085Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/06Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
    • H01L27/0605Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits made of compound material, e.g. AIIIBV

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Junction Field-Effect Transistors (AREA)
  • Waveguide Switches, Polarizers, And Phase Shifters (AREA)
  • Electronic Switches (AREA)
EP96120817A 1995-12-28 1996-12-23 Circuit de commutation comprenant des transistors à effet de champ Withdrawn EP0784345A3 (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP342566/95 1995-12-28
JP34256695 1995-12-28
JP34256695A JP3439290B2 (ja) 1995-12-28 1995-12-28 半導体装置

Publications (2)

Publication Number Publication Date
EP0784345A2 EP0784345A2 (fr) 1997-07-16
EP0784345A3 true EP0784345A3 (fr) 1999-12-29

Family

ID=18354758

Family Applications (1)

Application Number Title Priority Date Filing Date
EP96120817A Withdrawn EP0784345A3 (fr) 1995-12-28 1996-12-23 Circuit de commutation comprenant des transistors à effet de champ

Country Status (4)

Country Link
US (1) US5973377A (fr)
EP (1) EP0784345A3 (fr)
JP (1) JP3439290B2 (fr)
KR (1) KR100260329B1 (fr)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002289790A (ja) * 2001-03-27 2002-10-04 Sanyo Electric Co Ltd 化合物半導体スイッチ回路装置
JP2002353411A (ja) * 2001-05-25 2002-12-06 Sanyo Electric Co Ltd 化合物半導体スイッチ回路装置
US6804502B2 (en) 2001-10-10 2004-10-12 Peregrine Semiconductor Corporation Switch circuit and method of switching radio frequency signals
JP2005101565A (ja) * 2003-08-20 2005-04-14 Matsushita Electric Ind Co Ltd スイッチ用半導体装置及びスイッチ回路
EP1508919A1 (fr) * 2003-08-22 2005-02-23 Dialog Semiconductor GmbH Transistors en cascade dans un puits commun
JP4024762B2 (ja) * 2004-01-16 2007-12-19 ユーディナデバイス株式会社 高周波スイッチ
US7550781B2 (en) * 2004-02-12 2009-06-23 International Rectifier Corporation Integrated III-nitride power devices
CN100563106C (zh) * 2005-01-14 2009-11-25 优迪那半导体有限公司 射频开关
USRE48965E1 (en) 2005-07-11 2022-03-08 Psemi Corporation Method and apparatus improving gate oxide reliability by controlling accumulated charge
US7910993B2 (en) 2005-07-11 2011-03-22 Peregrine Semiconductor Corporation Method and apparatus for use in improving linearity of MOSFET's using an accumulated charge sink
US20080076371A1 (en) 2005-07-11 2008-03-27 Alexander Dribinsky Circuit and method for controlling charge injection in radio frequency switches
US9653601B2 (en) 2005-07-11 2017-05-16 Peregrine Semiconductor Corporation Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reduction
US7890891B2 (en) 2005-07-11 2011-02-15 Peregrine Semiconductor Corporation Method and apparatus improving gate oxide reliability by controlling accumulated charge
US7960772B2 (en) 2007-04-26 2011-06-14 Peregrine Semiconductor Corporation Tuning capacitance to enhance FET stack voltage withstand
JP2009231583A (ja) * 2008-03-24 2009-10-08 Sanyo Electric Co Ltd 化合物半導体スイッチ回路装置
JP2010074027A (ja) * 2008-09-22 2010-04-02 Nippon Telegr & Teleph Corp <Ntt> Fetスイッチ
JP2010074025A (ja) * 2008-09-22 2010-04-02 Nippon Telegr & Teleph Corp <Ntt> 多端子半導体スイッチ
US9831857B2 (en) 2015-03-11 2017-11-28 Peregrine Semiconductor Corporation Power splitter with programmable output phase shift
US9948281B2 (en) 2016-09-02 2018-04-17 Peregrine Semiconductor Corporation Positive logic digitally tunable capacitor
US10886911B2 (en) 2018-03-28 2021-01-05 Psemi Corporation Stacked FET switch bias ladders
US10505530B2 (en) 2018-03-28 2019-12-10 Psemi Corporation Positive logic switch with selectable DC blocking circuit
US10236872B1 (en) 2018-03-28 2019-03-19 Psemi Corporation AC coupling modules for bias ladders
US11476849B2 (en) 2020-01-06 2022-10-18 Psemi Corporation High power positive logic switch
JP2024082342A (ja) * 2022-12-08 2024-06-20 国立大学法人東海国立大学機構 電界効果トランジスタ

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6367802A (ja) * 1986-09-09 1988-03-26 Nec Corp スイツチ回路
EP0292913A2 (fr) * 1987-05-27 1988-11-30 Sgs-Thomson Microelectronics Gmbh Dispositif de commutation en circuit intégré
EP0373803A2 (fr) * 1988-12-16 1990-06-20 Raytheon Company Circuits commutateurs en R.F.
EP0445725A1 (fr) * 1990-03-07 1991-09-11 Kabushiki Kaisha Toshiba FET ayant une électrode de grille en forme de U
EP0480611A2 (fr) * 1990-10-09 1992-04-15 Mitsubishi Denki Kabushiki Kaisha Dispositif de transistor à effet de champ pour la commutation d'un signal
JPH0774185A (ja) * 1993-08-31 1995-03-17 Japan Energy Corp 半導体装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS47464Y1 (fr) * 1968-08-26 1972-01-10
JPS5360155A (en) * 1976-11-10 1978-05-30 Fujitsu Ltd Analog fet switch
US4974059A (en) * 1982-12-21 1990-11-27 International Rectifier Corporation Semiconductor high-power mosfet device
JPS63238716A (ja) * 1986-11-14 1988-10-04 Nec Corp スイッチ回路
JP2852051B2 (ja) * 1988-07-06 1999-01-27 日本電気アイシーマイコンシステム株式会社 相補型クロックドナンド回路
JPH0717247B2 (ja) * 1989-10-03 1995-03-01 三井造船株式会社 オーダピッキングシステム
JPH04214665A (ja) * 1990-12-12 1992-08-05 Sharp Corp 定電流源回路及び定電流源回路素子
US5217915A (en) * 1991-04-08 1993-06-08 Texas Instruments Incorporated Method of making gate array base cell
US5367187A (en) * 1992-12-22 1994-11-22 Quality Semiconductor, Inc. Master slice gate array integrated circuits with basic cells adaptable for both input/output and logic functions
JPH07326952A (ja) * 1994-06-02 1995-12-12 Fujitsu Ltd Fetスイッチ
JP2747223B2 (ja) * 1994-06-27 1998-05-06 日本電気アイシーマイコンシステム株式会社 半導体集積回路
JPH08148537A (ja) * 1994-11-18 1996-06-07 Toshiba Corp 半導体集積回路

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6367802A (ja) * 1986-09-09 1988-03-26 Nec Corp スイツチ回路
EP0292913A2 (fr) * 1987-05-27 1988-11-30 Sgs-Thomson Microelectronics Gmbh Dispositif de commutation en circuit intégré
EP0373803A2 (fr) * 1988-12-16 1990-06-20 Raytheon Company Circuits commutateurs en R.F.
EP0445725A1 (fr) * 1990-03-07 1991-09-11 Kabushiki Kaisha Toshiba FET ayant une électrode de grille en forme de U
EP0480611A2 (fr) * 1990-10-09 1992-04-15 Mitsubishi Denki Kabushiki Kaisha Dispositif de transistor à effet de champ pour la commutation d'un signal
JPH0774185A (ja) * 1993-08-31 1995-03-17 Japan Energy Corp 半導体装置

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN vol. 012, no. 291 (E - 644) 9 August 1988 (1988-08-09) *
PATENT ABSTRACTS OF JAPAN vol. 1995, no. 06 31 July 1995 (1995-07-31) *

Also Published As

Publication number Publication date
US5973377A (en) 1999-10-26
EP0784345A2 (fr) 1997-07-16
KR970054536A (ko) 1997-07-31
KR100260329B1 (ko) 2000-07-01
JP3439290B2 (ja) 2003-08-25
JPH09186501A (ja) 1997-07-15

Similar Documents

Publication Publication Date Title
EP0784345A3 (fr) Circuit de commutation comprenant des transistors à effet de champ
EP2093799A3 (fr) Circuit intégré avec sortie haute tension à couplage rigide et paire de transistors
EP0805499A3 (fr) Transistor à effet de champ MIS à tenue en tension élevée et circuit intégré semi-conducteur
EP0913939A3 (fr) Circuit à haute fréquence
DE69031870D1 (de) Halbleiteranordnung
EP1006589A3 (fr) Transistor MOS à couche mince et méthode de fabrication
EP0938138A3 (fr) Rangée de FETs pour opération en niveaux de puissance différents
GB2286723A (en) A mos transistor having a composite gate electrode and method of fabrication
EP0766396A3 (fr) Circuit de commutation
AU5545894A (en) Power mosfet in silicon carbide
US20060038604A1 (en) Circuit and method for lowering insertion loss and increasing bandwidth in MOSFET switches
EP2325889A3 (fr) Circuit intégré à haute tension, structure terminale de jonction à haute tension et transistor MIS à haute tension
TW356584B (en) Ferroelectric transistors of thin film semiconductor gate electrodes
EP1239591A3 (fr) Circuit d&#39;entrée pour circuit intégré
EP0732808A3 (fr) Déphaseur
EP1237277A3 (fr) Dispositif semi-conducteur de commutation
EP0851494A3 (fr) Dispositif semiconducteur comportant un circuit de protection
EP1251563A3 (fr) Structures du type FET comprenant des connexions du type condensateur symétriques et/ou distribués pour la commande directe
EP0785628A3 (fr) Circuit de sortie de transistors
EP0889592A3 (fr) Cicuit d&#39;attaque à faible capacité de sortie
EP0862223A3 (fr) Transistor à effet de champ de puissance, haute fréquence
EP0330142A3 (fr) Transistor à effet de champ multigrille
EP0709897A4 (fr) Dispositif a semiconducteurs
EP0294881A3 (fr) Dispositif semi-conducteur et circuit utilisable dans un commutateur de puissance intelligent
EP0739035A3 (fr) Contact de ligne de bit pour DRAM

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

AK Designated contracting states

Kind code of ref document: A2

Designated state(s): DE FR

PUAL Search report despatched

Free format text: ORIGINAL CODE: 0009013

AK Designated contracting states

Kind code of ref document: A3

Designated state(s): DE FR

RIC1 Information provided on ipc code assigned before grant

Free format text: 6H 01L 27/088 A, 6H 01L 27/06 B, 6H 01L 27/085 B

17P Request for examination filed

Effective date: 20000406

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE APPLICATION HAS BEEN WITHDRAWN

18W Application withdrawn

Effective date: 20031119