EP0231219A1 - Dispositif de controle de pieces de monnaie - Google Patents

Dispositif de controle de pieces de monnaie

Info

Publication number
EP0231219A1
EP0231219A1 EP86904067A EP86904067A EP0231219A1 EP 0231219 A1 EP0231219 A1 EP 0231219A1 EP 86904067 A EP86904067 A EP 86904067A EP 86904067 A EP86904067 A EP 86904067A EP 0231219 A1 EP0231219 A1 EP 0231219A1
Authority
EP
European Patent Office
Prior art keywords
coin
signals
signal
comparison
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
EP86904067A
Other languages
German (de)
English (en)
Inventor
Bernhard Trummer
Stefan Luder
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ascom Autelca AG
Original Assignee
Ascom Autelca AG
Autelca AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ascom Autelca AG, Autelca AG filed Critical Ascom Autelca AG
Publication of EP0231219A1 publication Critical patent/EP0231219A1/fr
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G07D5/02—Testing the dimensions, e.g. thickness, diameter; Testing the deformation
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G07D5/005—Testing the surface pattern, e.g. relief
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G07D5/08—Testing the magnetic or electric properties

Definitions

  • the invention relates to a device for coin testing, with at least one self-induction coil excited with high frequency and serving as an inductive probe, which can be influenced by the coin to be tested to generate a signal dependent on the type of coin.
  • the embossing pattern for example, specifying a number and the currency on one side and the 'Playing a mint design, such as a coat of arms, on the other side of the coin. Coins of approximately the same dimensions and alloy differ only in the minting pattern. In the case of known devices for checking coins, however, the embossing pattern is disregarded.
  • the invention seeks to remedy this.
  • the invention as characterized in claim 1, solves the problem of creating a device for coin testing which emits a coincidence signal if the minting pattern of the coin to be tested matches the minting pattern of one of several, specific, to be accepted coins .
  • Particular embodiments of this invention are specified in the dependent patent claims.
  • the advantages achieved by the invention are essentially to be seen in the fact that the embossing pattern on one side of the coin is generally sufficient to distinguish the coin from coins of all other types and, if appropriate, to assign them to a specific one of several types of coin provided as acceptable. Since several types of coins of the same currency are often the same Having a coin picture in different sizes, it is essential that the device according to the invention also distinguishes such coins. Further advantages of the invention and its embodiments are apparent from the following description.
  • 1 and 2 is a side view and a section through a coin guide
  • 5 is an overview circuit diagram of a device for coin testing
  • Fig. 6 is a signal diagram.
  • the coin guide of which FIG. 1 shows a side view and FIG. 2 shows a cross section along the line II-II in FIG. 1, has a runway surface 1 for the coin 2 to be tested and a steep guide surface 3, on which the runway surface 1 rolling coin 2 with its front or back side slides.
  • an inductive probe 5 which extends up to or almost up to the guide surface 3.
  • the diameter of the probe 5 is substantially smaller than the diameter of the smallest acceptable coin, and the distance of the probe 5 from the runway surface 1 is larger than the radius and smaller than the diameter of the coins to be accepted that has the smallest diameter. It is thereby achieved that the probe 5 scans a track of coins of the intended diameter range rolling past it that is sufficiently long for the present purposes described in more detail below.
  • Fig. 3 shows the coin 2 with a scanning track
  • Fig. 4 shows three phases of the scanning process.
  • the coin reaches the probe 5 in its position 2a, whereupon the point 7 of the coin edge passes the probe 5.
  • the coin 2 is in a middle
  • Probe 5 passes. 10 denotes the track which is scanned by the probe 5 in this process.
  • Position 2b is scanned half 10a of track 10.
  • the location of the track 10 relative to the pattern of the embossing is indefinite because it is uncertain as to the locations 7, 8 and 9 with respect to that
  • Embossing patterns lie. If, for example, the coin reaches the probe 5 in a position which is offset by 90 angular degrees in a clockwise direction relative to the one shown, the track designated 11 is formed. It can also be seen that two coins of different diameters are the same
  • the oscillating circuit voltage decreases due to the influence on the damping when the point 7 of the (not recessed) coin edge of the coin 2 passes the probe 5.
  • the oscillating circuit voltage then fluctuates in accordance with the changes in the embossing depth along the scanned track, and finally the oscillating circuit voltage rises again when the point 9 of the coin edge passes the probe 5.
  • Such a course of the resonant circuit voltage is shown in FIG. 6. The frequency of the oscillator vibrations changes accordingly.
  • signals of this type obtained on different tracks on both sides of each type of coin to be accepted are stored in a memory (33, FIG. 5).
  • an acceptable coin is released from a part of the runway surface (not shown) with a gradient in different starting positions, in order to roll past the probe 5.
  • the different starting positions are obtained either by placing the coin in the same place but at the same angle Rotational positions offset against each other or in each case in the same position at points on the runway that are offset along the same by a fraction of the coin circumference.
  • analog signals are obtained for each coin to be accepted on tracks evenly distributed over the embossing pattern.
  • the diameter of the area of its alternating magnetic field in which its self-induction or damping can be most strongly influenced corresponds to a width of the scanning track, in which adjacent tracks essentially adjoin one another.
  • the signal obtained with a coin to be checked is compared with each of the stored signals and, if there is sufficient agreement, a match signal is emitted.
  • the probe 5 forms the resonant circuit coil of an oscillator 13. Its output voltage is demodulated in a demodulator 18, as a result of which the analog signal 14 shown in FIG. 6 is obtained.
  • a scanner 20 controlled by a time pulse generator 19 supplies signals 21 which correspond to discrete values of the analog signal 14 which follow one another at a distance of, for example, 1 ms. 6 shows only some of these signals 21. In this case, for example, 50 signals 21 are obtained from the signal 14.
  • the signals 21 are further processed and compared with the stored signals using the digital method. Accordingly, an analog-to-digital converter 23 follows the scanner 20.
  • the digital method is carried out in practice by means of a microprocessor, which is indicated in FIG. 5 by a dash-dotted frame 25.
  • some assemblies that are essential for the mode of operation are shown in simplified form in this frame 25.
  • sequences of signals of discrete values can only be compared with one another if each sequence contains the same number of signals, an always the same number Z of signals which are essentially uniformly distributed over this signal sequence is selected from the signal sequence 21.
  • the signals 21 are transmitted to a first shift register 27 and at the same time to a counter 28.
  • a divider 29 divides the number Z of the signals 21 by the desired number z of the signals to be selected.
  • the selection principle then consists in that a selection circuit 31 transmits the first (or last) of n successive signals 21 into a second shift register 32, where n is equal to Z by z.
  • n is usually not an integer.
  • n is rounded down to the next, smaller, whole number and the selection circuit 31 with the rounded number controlled. Although the desired number of signals is selected, a last part of the signal sequence 21 is not taken into account.
  • the integer multiples of the quotient n are rounded off or rounded up to an integer, and those of the signals 21 are selected whose position in the signal sequence corresponds to the rounded up or down numbers. For example, if n is 3.3, the integer multiples are 3.3, 6.6, 9.9, 13.2, ..., and the third, seventh, tenth, thirteenth, ... of the signals 21 is selected, that is, from the first shift register 27 in transmit the second shift register 32.
  • the signal sequence stored in the second shift register 32 is compared in a comparator with each of the signal sequences stored in the memory 33 and with the coin types to be accepted, in each case by the first, second, ..., zth signal of the signals in the second shift register 32 stored signal sequence with the first, second, ... z-th signal of the signal sequence to be compared in the memory 33 and the difference is formed in a subtraction unit 34.
  • An adder 36 adds the absolute values of the differences.
  • a comparator 38 outputs a match signal on a line 39 when the sum obtained from the adder 36 falls below a predetermined value.
  • two probes which follow one another in the direction of the coin movement can be arranged at equal distances from the runway surface 1 (FIGS. 1 and 2). ordered, the test signal from each of the two probes is compared with the signals stored in the memory and a match signal is generated if the comparison of one of the two test signals shows a match within the given limits.
  • the two test signals (if the distance between the probes in the direction of the coins is small) can be sampled alternately (as in the time-division multiplex method) and the discrete values of one test signal can be stored in one and the other in another of two shift registers, which replace the shift register 27.
  • the influence of the probe depends not only on the distance of the probe from the point of the coin surface in front of it, but also on the property of the coin alloy. For this reason, coins with the same diameter and the same minting pattern only give a match signal if the alloys also match within the given limits. Since - as mentioned - coins of different diameters, which have the same minting pattern in a correspondingly different size, are distinguished from one another by the test described, this test is sufficient in principle to distinguish coins that are to be accepted from those that are not. Because of its complexity, the test of the embossing pattern is preferably applied to coins of higher values.
  • the present device in a coin validator, in which the diameter, thickness and alloying properties of the coins are checked in the usual way, and to switch on the checking of the minting pattern only if these usual checks show that it can be a coin of higher value to be accepted.
  • the signal processing in all tests can be carried out with one and the same microprocessor. If the test of the embossing pattern is only used for coins of higher values, a smaller capacity of the memory 33 is sufficient, or, which may be more important, it is possible, for a given storage capacity, to store more discrete values of a larger number of tracks for each of the few coins of higher values and gains greater resolution in pattern scanning.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Coins (AREA)
  • Detergent Compositions (AREA)
  • Control Of Vending Devices And Auxiliary Devices For Vending Devices (AREA)
  • Photoreceptors In Electrophotography (AREA)

Abstract

Afin de contrôler si une pièce de monnaie (2) porte le motif estampé d'une pièce acceptable de monnaie, la surface de la pièce est explorée par une sonde inductive (5) le long d'une piste (10), ce qui génère un signal qui correspond à la profondeur d'estampage le long de la piste (10). Le mouvement relatif de la sonde (5) par rapport à la pièce de monnaie (2), nécessaire à son exploration, est obtenu par le roulement de la pièce de monnaie (2) devant la sonde (5). Dans une mémoire sont enregistrés, en tant que signaux de comparaison, des signaux concernant les pistes (10, 11) décalées l'une par rapport à l'autre du côté pile et du côté face de toute pièce de monnaie acceptable. Ces signaux sont obtenus en faisant rouler les pièces de monnaie à contrôler devant la sonde (5), depuis des positions diverses de départ. Le signal de contrôle obtenu concernant la pièce de monnaie à contrôler est comparé à chacun des signaux de comparaison enregistrés. Au cas où une de ces comparaisons a pour résultat une acceptation dans des limites déterminées, un signal d'acceptation est généré.
EP86904067A 1985-07-26 1986-07-25 Dispositif de controle de pieces de monnaie Ceased EP0231219A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH3254/85A CH667546A5 (de) 1985-07-26 1985-07-26 Einrichtung zur muenzenpruefung.
CH3254/85 1985-07-26

Publications (1)

Publication Number Publication Date
EP0231219A1 true EP0231219A1 (fr) 1987-08-12

Family

ID=4251994

Family Applications (3)

Application Number Title Priority Date Filing Date
EP86107405A Expired - Lifetime EP0213283B1 (fr) 1985-07-26 1986-05-31 Dispositif pour l'examen de pièces de monnaie
EP86904067A Ceased EP0231219A1 (fr) 1985-07-26 1986-07-25 Dispositif de controle de pieces de monnaie
EP86904068A Pending EP0231220A1 (fr) 1985-07-26 1986-07-25 Dispositif de controle de pieces de monnaie

Family Applications Before (1)

Application Number Title Priority Date Filing Date
EP86107405A Expired - Lifetime EP0213283B1 (fr) 1985-07-26 1986-05-31 Dispositif pour l'examen de pièces de monnaie

Family Applications After (1)

Application Number Title Priority Date Filing Date
EP86904068A Pending EP0231220A1 (fr) 1985-07-26 1986-07-25 Dispositif de controle de pieces de monnaie

Country Status (8)

Country Link
US (2) US4742903A (fr)
EP (3) EP0213283B1 (fr)
AT (1) ATE50654T1 (fr)
CA (1) CA1250919A (fr)
CH (1) CH667546A5 (fr)
DE (1) DE3669215D1 (fr)
WO (2) WO1987000662A1 (fr)
YU (1) YU128886A (fr)

Families Citing this family (50)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0786939B2 (ja) * 1988-05-27 1995-09-20 株式会社日本コンラックス 硬貨識別装置
US4936435A (en) * 1988-10-11 1990-06-26 Unidynamics Corporation Coin validating apparatus and method
CH676162A5 (fr) * 1988-11-07 1990-12-14 Ascom Autelca Ag
JP2767278B2 (ja) * 1989-04-10 1998-06-18 株式会社日本コンラックス 硬貨選別装置
GB2234619B (en) * 1989-07-28 1993-04-14 Mars Inc Coin validators
GB2243238B (en) * 1990-04-20 1994-06-01 Tetrel Ltd Coin validators
DE4101157A1 (de) * 1991-01-14 1992-07-16 Trenner D Wh Muenzpruefer Vorrichtung zur pruefung von muenzen oder dergleichen metallischen scheiben
EP0500367A3 (en) * 1991-02-20 1993-07-21 Telkor (Proprietary) Limited Coil arrangement and static measuring device
US5220614A (en) * 1991-02-22 1993-06-15 Professional Coin Grading Service, Inc. Automated coin grading system
GB2253297B (en) * 1991-02-27 1994-11-16 Mars Inc Coin validation
US5361886A (en) * 1991-04-11 1994-11-08 Act Gesellschaft Fuer Soft- Und Hardware-Systeme Gmbh Method and apparatus for examining coins
US5615760A (en) * 1991-04-18 1997-04-01 Mars Incorporated Method and apparatus for validating money
DE4121033C2 (de) * 1991-06-26 1994-10-27 Nat Rejectors Gmbh Elektronischer Münzprüfer
US5191957A (en) * 1991-06-28 1993-03-09 Protel, Inc. Coin discrimination method
US5568854A (en) * 1991-06-28 1996-10-29 Protel, Inc. Coin discrimination method
US5293979A (en) * 1991-12-10 1994-03-15 Coin Acceptors, Inc. Coin detection and validation means
GB2266804B (en) * 1992-05-06 1996-03-27 Mars Inc Coin validator
US5379875A (en) * 1992-07-17 1995-01-10 Eb Metal Industries, Inc. Coin discriminator and acceptor arrangement
JP3170147B2 (ja) * 1993-08-19 2001-05-28 ローレルバンクマシン株式会社 硬貨判別装置
US5433310A (en) * 1994-01-04 1995-07-18 Coin Mechanisms, Inc. Coin discriminator with offset null coils
CA2113492A1 (fr) * 1994-01-14 1995-07-15 Donald W. Church Appareil et methode servant a identifier les jetons metalliques et les pieces de monnaie
DE59501034D1 (de) * 1994-09-21 1998-01-08 Landis & Gyr Tech Innovat Einrichtung zur Prüfung der Echtheit von Münzen, Jetons oder anderen flachen metallischen Gegenständen
US5630494A (en) * 1995-03-07 1997-05-20 Cummins-Allison Corp. Coin discrimination sensor and coin handling system
CA2173428A1 (fr) 1995-04-06 1996-10-07 Donald W. Church Parametre electronique
US5579887A (en) * 1995-06-15 1996-12-03 Coin Acceptors, Inc. Coin detection apparatus
DE19548233C2 (de) * 1995-12-21 1998-03-12 Nat Rejectors Gmbh Elektronischer Münzprüfer
AU2288397A (en) * 1996-03-19 1997-10-10 Electrowatt Technology Innovation Ag Coin-checking arrangement
EP0923767B1 (fr) * 1996-07-29 2002-06-19 QVEX, Inc. Dispositif et procede de validation pour pieces de monnaie
WO1998014910A1 (fr) * 1996-09-30 1998-04-09 Coin Mechanisms, Inc. Procede et dispositif de differenciation pour pieces de monnaie
GB2323200B (en) 1997-02-24 2001-02-28 Mars Inc Coin validator
KR100296694B1 (ko) 1997-05-21 2001-08-07 오까다 마사하루 화폐선별방법및장치
GB2331614A (en) * 1997-11-19 1999-05-26 Tetrel Ltd Inductive coin validation system
JP2000242823A (ja) * 1999-02-24 2000-09-08 Nippon Conlux Co Ltd 硬貨選別方法および装置
WO2002067209A2 (fr) * 2001-02-20 2002-08-29 Cubic Corporation Detecteur de pieces a induction dote d'une correction de position
JP4022583B2 (ja) * 2002-03-11 2007-12-19 旭精工株式会社 コインセレクタ
AU2003900636A0 (en) * 2003-02-13 2003-02-27 Microsystem Controls Pty Ltd Identification of coins, including magnetic characteristics
US20050224313A1 (en) * 2004-01-26 2005-10-13 Cubic Corporation Robust noncontact media processor
CA2664291C (fr) 2008-04-25 2013-09-17 J.J. Mackay Canada Limited Systeme ameliore de collecte de donnees pour parcometres electroniques
WO2010071972A1 (fr) 2008-12-23 2010-07-01 J.J.Mackay Canada Limited Parcmètre sans fil basse puissance et réseau de parcmètres
CA3178279A1 (fr) 2011-03-03 2012-09-03 J.J. Mackay Canada Limited Parcometre avec methode de paiement sans contact
US9329650B2 (en) 2012-03-14 2016-05-03 Accenture Global Services Limited Customer-centric demand side management for utilities
CA145137S (en) 2012-04-02 2013-07-22 Jj Mackay Canada Ltd Single space parking meter
CN104813369B (zh) * 2012-10-25 2018-01-12 魅股份有限公司 将有价值物品分类的系统
CA2894350C (fr) 2015-06-16 2023-03-28 J.J. Mackay Canada Limited Goulotte de monnaie dotee d'un mecanisme anti repechage
USRE48566E1 (en) 2015-07-15 2021-05-25 J.J. Mackay Canada Limited Parking meter
CA3176773A1 (fr) 2015-08-11 2017-02-11 J.J. Mackay Canada Limited Renovation d'un parcometre pour espace unique
USD813059S1 (en) 2016-02-24 2018-03-20 J.J. Mackay Canada Limited Parking meter
US10957445B2 (en) 2017-10-05 2021-03-23 Hill-Rom Services, Inc. Caregiver and staff information system
CA3031936A1 (en) 2019-01-30 2020-07-30 J.J. Mackay Canada Limited Spi keyboard module for a parking meter and a parking meter having an spi keyboard module
US11922756B2 (en) 2019-01-30 2024-03-05 J.J. Mackay Canada Limited Parking meter having touchscreen display

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL131067C (fr) * 1963-06-04
FR1401488A (fr) * 1964-05-09 1965-06-04 Compteurs De Geneve Soc D Dispositif pour contrôler le versement de pièces de monnaie dans un automate
US3328720A (en) * 1965-07-15 1967-06-27 Westinghouse Electric Corp Dual mode oscillator circuits
CH503338A (fr) * 1969-02-04 1971-02-15 Sodeco Compteurs De Geneve Dispositif d'identification de pièces de monnaie
US3738469A (en) * 1969-08-22 1973-06-12 G Prumm Tester for different types of coins
DE2014023A1 (de) * 1970-03-24 1971-10-07 Nat Rejectors Gmbh Vorrichtung zum Prüfen der Eigen schäften von Metallscheiben
DE2146184A1 (de) * 1971-09-15 1973-03-22 Standard Elektrik Lorenz Ag Muenzpruefer
US3749220A (en) * 1971-10-06 1973-07-31 Anritsu Electric Co Ltd Coin discriminating apparatus
US3918565B1 (en) * 1972-10-12 1993-10-19 Mars, Incorporated Method and apparatus for coin selection utilizing a programmable memory
GB1453283A (en) * 1973-10-03 1976-10-20 Mars Inc Apparatus for identifying coins
FR2275829A1 (fr) * 1974-06-19 1976-01-16 Automatisme Cie Gle Dispositif pour la reconnaissance d'une categorie de pieces de monnaie
JPS5611181Y2 (fr) * 1975-12-02 1981-03-13
DE2636922A1 (de) * 1976-08-17 1978-02-23 Nat Rejectors Gmbh Schaltungsanordnung zur ueberwachung einer muenzpruefeinrichtung
FR2408183A1 (fr) * 1977-11-03 1979-06-01 Signaux Entr Electriques Controleur de pieces metalliques, et notamment de pieces de monnaie
US4254857A (en) * 1978-09-15 1981-03-10 H. R. Electronics Company Detection device
US4323148A (en) * 1979-03-12 1982-04-06 Matsushita Electric Industrial Co., Ltd. Coin selector for vending machine
DE2916123C2 (de) * 1979-04-19 1987-01-29 Walter Hanke Mechanische Werkstätten GmbH & Co KG, 1000 Berlin Anordnung zur Prüfung von Münzen
GB2093620B (en) * 1981-02-11 1985-09-04 Mars Inc Checking coins
DE3267960D1 (en) * 1981-03-06 1986-01-30 Sodeco Compteurs De Geneve Coin testing apparatus
GB2141277B (en) * 1983-06-06 1986-05-08 Coin Controls Electronic coin validator
GB8500220D0 (en) * 1985-01-04 1985-02-13 Coin Controls Discriminating between metallic articles

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See references of WO8700661A1 *

Also Published As

Publication number Publication date
US4819780A (en) 1989-04-11
DE3669215D1 (de) 1990-04-05
US4742903A (en) 1988-05-10
EP0231220A1 (fr) 1987-08-12
EP0213283B1 (fr) 1990-02-28
WO1987000661A1 (fr) 1987-01-29
EP0213283A1 (fr) 1987-03-11
CA1250919A (fr) 1989-03-07
ATE50654T1 (de) 1990-03-15
WO1987000662A1 (fr) 1987-01-29
YU128886A (en) 1989-12-31
CH667546A5 (de) 1988-10-14

Similar Documents

Publication Publication Date Title
EP0231219A1 (fr) Dispositif de controle de pieces de monnaie
DE2350989C2 (fr)
DE2832618C2 (fr)
DE2350990C2 (fr)
DE3345252C2 (fr)
DE2715403C2 (fr)
DE3600022C2 (de) Münzunterscheidungsvorrichtung
DE68913621T2 (de) Vorrichtung und Verfahren zum Sortieren und Zählen von Münzen.
DE69109287T2 (de) Vorrichtung zum unterscheiden von münzen.
DE2240145C2 (de) Vorrichtung zum Prüfen von Münzen
DE3235114A1 (de) Muenzpruefgeraet
DE2654472A1 (de) Muenzpruefgeraet
DE2612613B2 (de) Verfahren und schaltungsanordnung zum identifizieren von gegenstaenden, insbesondere von muenzen oder wertpapieren
DE3313756A1 (de) Verfahren und vorrichtung zum abtasten einer periodischen wellenstruktur
EP0367921A2 (fr) Dispositif de contrôle de pièces de monnaie
DE2705244A1 (de) Muenzpruefvorrichtung
DE69510140T2 (de) Münzprüfung
EP0060392B1 (fr) Dispositif d'examen de pièces de monnaie
EP0886247B1 (fr) Méthode et circuit pour l'examen de pièces de monnaie
DE2158025C3 (de) Vorrichtung zum Prüfen der Echtheit und des Wertes von Münzen
DE2825651A1 (de) Muenzensortiervorrichtung
DE2240162A1 (de) Muenzpruefer und muenzpruefverfahren
DE69112398T2 (de) Verfahren und vorrichtung zum prüfen von münzen.
DE4339543C2 (de) Verfahren zur Prüfung von Münzen
DE3436117C2 (fr)

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

17P Request for examination filed

Effective date: 19870221

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): AT BE CH DE FR GB IT LI NL SE

RBV Designated contracting states (corrected)

Designated state(s): AT BE CH DE FR GB LI NL SE

RAP1 Party data changed (applicant data changed or rights of an application transferred)

Owner name: ASCOM AUTELCA AG

17Q First examination report despatched

Effective date: 19910221

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE APPLICATION HAS BEEN REFUSED

18R Application refused

Effective date: 19920614

RIN1 Information on inventor provided before grant (corrected)

Inventor name: TRUMMER, BERNHARD

Inventor name: LUDER, STEFAN