EP0072189B1 - Verfahren und Einrichtung zur Eichung eines Münzprüfers - Google Patents

Verfahren und Einrichtung zur Eichung eines Münzprüfers Download PDF

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Publication number
EP0072189B1
EP0072189B1 EP82304100A EP82304100A EP0072189B1 EP 0072189 B1 EP0072189 B1 EP 0072189B1 EP 82304100 A EP82304100 A EP 82304100A EP 82304100 A EP82304100 A EP 82304100A EP 0072189 B1 EP0072189 B1 EP 0072189B1
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EP
European Patent Office
Prior art keywords
coin
values
parameter signals
tokens
validation apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
EP82304100A
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English (en)
French (fr)
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EP0072189A2 (de
EP0072189A3 (en
Inventor
Ronald Edgar Daw
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Landis and Gyr Communications UK Ltd
Original Assignee
Landis and Gyr Communications UK Ltd
Aeronautical and General Instruments Ltd
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First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=10523833&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=EP0072189(B1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Landis and Gyr Communications UK Ltd, Aeronautical and General Instruments Ltd filed Critical Landis and Gyr Communications UK Ltd
Priority to AT82304100T priority Critical patent/ATE24619T1/de
Publication of EP0072189A2 publication Critical patent/EP0072189A2/de
Publication of EP0072189A3 publication Critical patent/EP0072189A3/en
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Publication of EP0072189B1 publication Critical patent/EP0072189B1/de
Expired legal-status Critical Current

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    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G07D5/08—Testing the magnetic or electric properties
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D2205/00—Coin testing devices
    • G07D2205/001—Reconfiguration of coin testing devices
    • G07D2205/0012—Reconfiguration of coin testing devices automatic adjustment, e.g. self-calibration

Definitions

  • Coin validation apparatus may be associated with a coin freed mechanism on a variety of a coin receiving machines such as coin box telephones or vending machines or may form part of a coin sorting apparatus to check that coins are valid coins and not counterfeit.
  • a coin receiving machines such as coin box telephones or vending machines
  • coin sorting apparatus to check that coins are valid coins and not counterfeit.
  • EP-A-0062411 describes a particularly convenient form of coin validation apparatus comprising a coin testing section, a microprocessor which controls the operation of the apparatus and analyses the output of the coin testing section, and a programmable memory containing the individual reference values for valid coins.
  • the coin testing section includes an electrical coil through which, in use, an alternating current is fed to produce an alternating magnetic field and a coin to be tested is placed adjacent the coil in the alternating magnetic field.
  • the coin testing section produces two parameter signals which are characteristic of the effect of the coin on both the inductance and the loss factor of the coil. With such an apparatus, these two parameter signals are then compared with reference values from the programmable memory by the microprocessor to determine if the coin is valid.
  • the particular parameter signals that are generated by the coin testing section also depend to some extent, upon the particular component values, tolerances, physical sizes, and location of the elements making up the coin testing section and thus, the exact value of the signal that indicates a valid coin in one coin testing section is likely to be different from the exact value of the signal in a different but similar piece of apparatus.
  • the present invention is concerned with a method and an apparatus for calibrating the coin testing sections of such electronic coin validation apparatus to determine the appropriate reference values for the parameter signals that are characteristic of the effect of the coin on the coin testing section.
  • GB-A-1527450 similarly describes a calibration technique in which a typical coin or coin replica capable of generating the same values as a typical coin, is inserted in the coin test section and is subjected to a test. Depending upon the values of the particular parameters that are obtained as a result of this test a particular one of a range of preprogrammed memories are then selected and inserted into the coin validation apparatus.
  • GB-A-1527450 also proposes the use of coin replicas with the same parameters as representative coins, as the references with which the apparatus is calibrated. This has the advantage that the tokens would be identifiable but it is extremely difficult to manufacture such tokens to ensure that they have the same characteristics as valid representative coins. Such tokens also have to be prepared for all denominations of coins in the coin set to be used with the apparatus and for all of the coins in the various different currencies with which the apparatus may be used.
  • the particular values of the two parameters characteristic of the valid coin of each particular denomination can be thought of as points, on a two dimensional graph with the two parameters forming the axes of the graph.
  • the axes would be the inductance and loss factor of the coil and thus, for each denomination of coin there would be a particular point on this graph having particular co-ordinates for both inductance and loss factor. It is the co-ordinates of this particular point which form the reference values for a particular point which form the reference values for this particular denomination of coin.
  • the memory of the coin validation apparatus can be programmed for coins of any number of denominations and coins of any currency by simply determining the appropriate calibration factors from the two tokens and then operating on standard values for any particular coins of any particular currency using these calibration factors. No matter how many coins are present in the set of coins of any particular currency, all that is required to determine the calibration factors and calibrate the apparatus are the tests on two simple tokens. The tokens are produced specifically as calibration tokens and thus do not look like coins and so are not likely to be mistaken or exchanged with coins without this being immediately apparent.
  • the tokens are not acceptable by the validation apparatus as valid coins and the tokens have no intrinsic value other than that of being calibration tokens. Consequently they are not likely to get lost or exchanged for coins.
  • the calibration tokens do not have to mirror any particular coin in their magnetic and electrical parameters although naturally they must have broadly similar parameters and so be formed of metal discs.
  • the apparatus in accordance with the second aspect of this invention is usually referred to as a calibration unit and preferably comprises a microprocessor forming the computer means coupled to the programmed memory.
  • This microprocessor is preferably of the same type as that used in the coin validation apparatus, and, during calibration of the apparatus it replaces that normally used in the coin validation apparatus.
  • the microprocessor in the calibration unit is programmed differently from that normally used in the apparatus.
  • the tokens, the programmed microprocessor and the programmed memory form a readily portable assembly which can be transported to any site at which the coin validation apparatus is situated to enable the coin validation apparatus to be programmed on site.
  • a coin validation apparatus includes a coin testing section for testing a coin and determining the values of two parameters signals which are characteristic of the effect of the coin on the coin testing section, a programmable memory for storing individual reference values of the parameter signals corresponding to valid coins acceptable to the coin validation apparatus, two tokens having different characteristics, a programmed memory containing standard values of the parameter signals for the said two tokens and standard values of the parameter signals for coins acceptable to the coin validation apparatus, and computer means programmed to accept from the coin testing section determined values of the two parameter signals for each token which are characteristic of the effect of each token on the coin testing section these values being different from the values detected upon arrival of a valid acceptable coin, to compare these determined parameter values for the two tokens with the standard values of the parameter signals for the two tokens stored in the programmed memory, to compute from the determined parameter values and from the standard values of the parameter signals for the two tokens, calibration factors relevant to the coin testing section of that particular coin validation apparatus, to operate on the standard values of the parameter signals for the coins acceptable to
  • Such a coin validation apparatus may be formed by a coin validation apparatus including the calibration apparatus or calibration unit in accordance with the second aspect of this invention, or alternatively, the coin validation apparatus may include the means to calibrate it as a permanent part of the coin validation apparatus.
  • the computer means for calibrating the apparatus is preferably the same microprocessor as is used in the coin validation apparatus to control the apparatus and to analyse the output of the coin test section.
  • the standard values of the parameter signals for the tokens and for the coins acceptable to the coin validation apparatus contained in the programmed memory may correspond to the exact values of the parameter signals emitted by a standard coin test section, but preferably they are presented in a modified form to facilitate the computation to be performed by the computer means.
  • the standard values of the parameter signals for the said two tokens and the standard values for the coins acceptable to the coin validation apparatus are all modified in the same way, for example by all being divided by the same number, then when the calibration factors are computed during the calibration sequence this modification of the standard values is taken account of in the calculation of the calibrated factors.
  • a typical coin validation apparatus is described in EP-A-0062411.
  • This coin validation apparatus can be most simply thought of as comprising three separate parts namely a coin test section 1, a microprocessor 2 which controls the coin validation apparatus and performs an analysis on the output of the coin test section, and a programmable read only memory PROM 3 which, once the coin validation apparatus has been calibrated, contains reference values of coins acceptable to the .coin validation apparatus.
  • the coin test section 1 of the coin validation apparatus described in our earlier Patent Application referred to above comprises an electrical coil connected in a resonant feedback circuit of an oscillator.
  • the coin to be tested is placed adjacent the coil and the presence of a coin adjacent the coil influences the inductance and loss factor of the coil and hence influences the oscillation frequency and amplitude of the resonant feedback circuit of the oscillator.
  • the coin test section 1 emits two parameter signals for each coin and these two parameter signals are characteristic of the effect of the coil on the inductance and loss factor of the coil.
  • microprocessor 2 These parameter signals are compared with reference signals located in the PROM 3 by the microprocessor 2 and then the microprocessor 2 emits a valid or reject coin signal depending upon whether the values of the parameter signals obtained from the coin test section 1 correspond to those in the PROM 3 or not.
  • the microprocessor preferred for this function is type RCA 1802 manufactured by Radio Corporation of America.
  • the preferred way of calibrating such a coin validation apparatus is to use a calibration unit consisting of two reference tokens A and B (not shown), a programmed microprocessor 4 which is again of RCA type 1802, and a programmed read only memory PROM 5 containing standard values of the parameter signals corresponding to calibration tokens A and B and corresponding to each of the coins with which the apparatus is to be used. For example, a 50p coin, 10p coin, a 5p coin and a 2p coin.
  • the parameter signals output from the coin test section 1 of the coin validation apparatus described in our earlier patent specification has the form of variable frequency signals. Table I shows the frequencies of typical output signals from the coin test section 1 for the calibration tokens A and B and the coins.
  • the values of the calibration tokens A and B are the most significant as they are used for calibration of the apparatus and inspection of Table I shows that the values of the parameter to signals of tokens A and B are roughly in a 3:1 ratio.
  • a microprocessor such as the RCA type 1802 it is desirable to be able to operate on information using only 8 bits of binary data i.e. on numbers in a range from 0 to 255.
  • calibration token A is given values of 32 and 32 and calibration token B values of 96 and 96 then both the sum and the difference of these values are exact multiples of 2.
  • the microprocessor 2 is replaced by the microprocessor 4 and PROM 5 and then calibration token A is inserted into the coin test section.
  • a push button switch is also actuated such as switch 1 shown in Figure 3, to inform the microprocessor 4 that a calibration token is being inserted or, alternatively, the operation can be triggered automatically for the first coin or token that enters the coin test section 1 when the PROM 3 is in its virgin or unprogrammed state.
  • the coin test section 1 performs its standard testing operations on the calibration token A and two parameter signals are produced by an output from the coin test section 1 into the microprocessor 4. The values of these determined parameter signals are then stored in an internal memory of the microprocessor 4. Token A is then rejected and calibration token B inserted into the coin test section 1.
  • a push button switch such as switch 2 shown in Figure 3 is also actuated to inform the microprocessor that token B has been inserted or if the calibration sequence is triggered automatically then the microprocessor 4 expects the next token to be token B.
  • the coin test section 1 then performs its tests on reference token B and again determined values of the parameter signals are output into the microprocessor 4 where they are stored in an internal memory.
  • the microprocessor compares the determined parameter signal values for the calibration tokens A and B with the standard values for the calibration tokens shown in Table II which it draws from the PROM 5. From these reference values it computes calibration factors a, b, c and d using an algorithm derived as follows.
  • the reference values of the parameter signals can be thought of as representing co-ordinates of points on a graph having the inductance values along one axis-say the X axis and the loss factor values along the other axis-say the Y axis.
  • the calibration factors (a, b, c and d) are used to define the offset to be applied to the origin of the axes-factors a and c, and the scaling factors to be applied to the axes-factors band d.
  • microprocessor 4 uses an algorithm derived as follows:-
  • a similar algorithm can be derived for the y axis 50p coin value and for the x and y values of each of the other coins.
  • the computer solves equation 13 and the equivalent one for the y axis using of course the derived parameter signal values from the tokens A and B for the values of A (x) , A(y), B (x) , B(y) and substitutes the value from the PROM 5 for the X so and Y so .
  • the computer then derives the individual reference values 50 (x) and 50 (y) and loads these values into the PROM 3. The process is repeated for each of the other coins.
  • microprocessor 4 and PROM 5 are removed after the PROM 3 has been programmed and the original microprocessor 2 replaced to provide a complete and calibrated coin validation apparatus as shown in Figure 1.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Coins (AREA)
  • Devices For Checking Fares Or Tickets At Control Points (AREA)
  • Slot Machines And Peripheral Devices (AREA)
  • Telephonic Communication Services (AREA)

Claims (8)

1. Verfahren zum Eichen eines Münzprüfers mit einem Münzprüfabschnitt und einem programmierbaren Speicher, dadurch gekennzeichnet, daß zwei Testmünzen mit verschiedenen Eigenschaften nacheinander unter Verwendung des Münzprüfabschnittes einer Münzprüfung unterworfen werden, um für jede Testmünze die Werte von zwei Parametersignalen zu ermitteln, welche charakteristisch für den Einfluß der betreffenden Testmünze auf den Münzprüfabschnitt sind, wobei sich diese Werte von den bei Einsatz einer gültigen und abzeptierbaren Münze festgestellten Werten unterscheiden, daß die erhaltenen Parameterwerte für die beiden Testmünzen mit Standardwerten der Parametersignale für die beiden Testmünzen verglichen und aus den ermittelten Parameterwerten und den Standardwerten für dten verwendeten Münzprüfabschnitt geltende Eichfaktoren berechnet werden, daß sodann die Standardwerte der Parametersignale für einen Satz von Münzen, für welche der Münzprüfer verwendet werden soll, unter Verwendung der berechneten Eichfaktoren korrigiert werden, um so individuelle, für den verwendeten Münzprüfabschnitt geltende Bezugswerte der Parametersignale für jede Münze des Münzensatzes zu berechnen, und daß schließlich der programmierbare Speicher mit diesen berechneten individuellen Bezugswerten programmiert wird.
2. Verfahren nach Anspruch 1, dadurch gekennzeichnet, daß die Folge der Eichvorgänge durch das Einführen der ersten Münze oder Testmünze eingeleitet wird, wenn sich der programmierbare Speicher im Neuzustand befindet.
3. Verfahren nach Anspruch 1 oder 2, dadurch gekennzeichnet, daß die im programmierten Speicher enthaltenen Standardwerte der Parametersignale für die Testmünzen und für die vom Münzprüfer zu akzeptierenden Münzen nicht den genauen Werten der von einem Standard-Münzprüfabschnitt gelieferten Parametersignale entsprechen, sondern in einer modifizierten Form dargeboten werden, um die vorzunehmende Berechnung zu erleichtern, wobei diese Modifikation der Standardwerte bei der Berechnung der Eichfaktoren berücksichtigt wird.
4. Eicheinheit zum Eichen eines Münzprüfers mit einem Münzprüfabschnitt (1) und einem programmierbaren Speicher (3), gekennzeichnet durch zwei Testmünzen mit verschiedenen Eigenschaften, einen programmierten Speicher (5), der Standardwerte der Parametersignale für die beiden Testmünzen und für die vom Münzprüfer zu akzeptierenden Münzen enthält, und einem Computer (4), der so programmiert ist, daß er vom Münzprüfabschnitt (1) für jede Testmünze ermittelte Werte von zwei Parametersignalen aufnimmt, welche charakteristisch für den Einfluß jeder Testmünze auf den Münzprüfabschnitt (1) sind, wobei sich diese Werte von den bei Einsatz einer gültigen und akzeptierbaren Münze festgestellten Werten unterscheiden, daß er die für die beiden Testmünzen ermittelten Parameterwerte mit den im programmierten Speicher (5) gespeicherten Standardwerten der Parametersignale für die beiden Testmünzen vergleicht, daß er aus den ermittelten Parameterwerten und den Standardwerten der Parametersignale für die beiden Testmünzen für den verwendeten Münzprüfabschnitt (1) des Münzprüfers geltende Eichfaktoren berechnet, daß er die im programmierten Speicher (5) gespeicherten Standardwerte der Parametersignale für die vom Münzprüfer zu akzeptierenden Münzen unter Verwendung der Eichfaktoren korrigiert, um so für den betreffenden Münzprüfabschnitt (1) geltende individuelle Bezugswerte der Parametersignale für jede vom Münzprüfer zu akzeptierende Münze zu erhalten, und daß er den programmierbaren Speicher (3) mit diesen berechneten individuellen Bezugswerten der Parametersignale programmiert.
5. Eicheinheit nach Anspruch 4, gekennzeichnet durch einen als Computer dienenden Mikroprozessor (4), der mit dem programmierten Speicher (5) verbunden ist, wobei dieser Mikroprozessor (4) der gleichen Type angehört wie ein im Münzprüfer vorgesehener Mikroprozessor (2) und während der Eichung des Münzprüfers diesen normalerweise im Münzprüfer verwendeten Mikroprozessor (2) ersetzt.
6. Münzprüfer, gekennzeichnet durch einen Münzprüfabschnitt (1) zum Prüfen einer Münze und zum Ermitteln der Werte von zwei Parametersignalen, die charakteristisch für den Einfluß der Münze auf den Münzprüfabschnitt (1) sind, einen programmierbaren Speicher (3) zum Speichern individueller Bezugswerte von Parametersignalen, welche gültigen und vom Münzprüfer zu akzeptierenden Münzen entsprechen, zwei Testmünzen mit unterschiedlichen Eigenschaften, einen programmierten Speicher (5), der Standardwerte der Parametersignale für die beiden Testmünzen und Standardwerte der Parametersignale für vom Münzprüfer zu akzeptierende Münzen enthält, und einen Computer (4), der so programmiert ist, daß er für jede Testmünze vom Münzprüfabschnitt (1) ermittelte Werte von zwei Parametersignalen aufnimmt, welche charakteristisch für den Einfluß der betreffenden Testmünze auf den Münzprüfabschnitt sind und sich von den bei Einsatz einer gültigen und akzeptierbaren Münze festgestellten Werten unterscheiden, daß er diese ermittelten Parameterwerte für die beiden Testmünzen mit den im programmierten Speicher (5) enthaltenen Standardwerten der Parametersignale für die beiden Testmünzen vergleicht, daß er aus den ermittelten Parameterwerten und aus den Standardwerten der Parametersignale für die beiden Testmünzen für den Münzprüfabschnitt (1) des betreffenden Münzprüfers geltende Eichfaktoren berechnet, daß er die im programmierten Speicher (5) gespeicherten Standardwerte der Parametersignale für die vom Münzprüfer zu akzeptierenden Münzen unter Verwendung der berechneten Eichfaktoren korrigiert, um so individuelle, für den betreffenden Münzprüfabschnitt (1) geltende Bezugswerte der Parametersignale für jede vom Münzprüfer zu akzeptierende Münze zu berechnen, und daß er den programmierbaren Speicher (3) des Münzprüfers mit diesen individuellen Bezugswerten- der Parametersignale programmiert.-
7. Münzprüfer nach Anspruch 6, dadurch gekennzeichnet, daß der Computer (4) zum Eichen des Münzprüfers der gleiche Mikroprozessor ist, der im Münzprüfer zu dessen Steuerung und zur Analyse der Ausgangssignale des Münzprüfabschnittes (1) dient.
8. Münzprüfer nach Anspruch 7, dadurch gekennzeichnet, daß er Mittel zum Einleiten der Folge von Eichvorgänge in Abhängigkeit von der Betätigung eines Schalters oder in Abhängigkeit von der Einführung der ersten Münze oder der ersten Testmünze aufweist, wenn sich der programmierbare Speicher im Neuzustand befindet.
EP82304100A 1981-08-10 1982-08-03 Verfahren und Einrichtung zur Eichung eines Münzprüfers Expired EP0072189B1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AT82304100T ATE24619T1 (de) 1981-08-10 1982-08-03 Verfahren und einrichtung zur eichung eines muenzpruefers.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB8124398 1981-08-10
GB8124398 1981-08-10

Publications (3)

Publication Number Publication Date
EP0072189A2 EP0072189A2 (de) 1983-02-16
EP0072189A3 EP0072189A3 (en) 1983-11-09
EP0072189B1 true EP0072189B1 (de) 1986-12-30

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EP82304100A Expired EP0072189B1 (de) 1981-08-10 1982-08-03 Verfahren und Einrichtung zur Eichung eines Münzprüfers

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EP (1) EP0072189B1 (de)
AT (1) ATE24619T1 (de)
DE (1) DE3274914D1 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2118344A (en) * 1982-02-12 1983-10-26 Mars Inc Coin testing apparatus
JPS5927383A (ja) * 1982-08-06 1984-02-13 株式会社ユニバ−サル 学習式硬貨等の選別装置
ZA851248B (en) * 1984-03-01 1985-11-27 Mars Inc Self tuning coin recognition system
JPH0546127Y2 (de) * 1986-12-29 1993-12-01
GB2199978A (en) * 1987-01-16 1988-07-20 Mars Inc Coin validators
DE4025073C2 (de) * 1990-08-08 1994-03-31 Nat Rejectors Gmbh Verfahren zum Prüfen von zwei oder mehr Münzen unterschiedlichen Wertes
JP2936752B2 (ja) * 1991-03-04 1999-08-23 富士電機株式会社 硬貨選別装置
US5191957A (en) * 1991-06-28 1993-03-09 Protel, Inc. Coin discrimination method
US5568854A (en) * 1991-06-28 1996-10-29 Protel, Inc. Coin discrimination method
ES2098044T3 (es) * 1992-08-13 1997-04-16 Landis & Gyr Tech Innovat Calibracion de verificadores de monedas.
DE4233194C2 (de) * 1992-10-02 1995-09-21 Nat Rejectors Gmbh Verfahren zum Eichen eines mindestens eine Münze akzeptierenden Münzprüfers und Eichmodul
DE4242639C2 (de) * 1992-12-17 1996-12-12 Nat Rejectors Gmbh Verfahren zum Eichen eines elektronischen Münzprüfers
ES2066698B1 (es) * 1992-12-29 1995-08-16 Azkoyen Ind Sa Nuevo sistema de programacion de selectores de moneda.
JP4171828B2 (ja) * 1998-07-16 2008-10-29 旭精工株式会社 電子コインセレクタの基準データ作成方法
IT1305807B1 (it) 1998-11-04 2001-05-16 O T R Srl Metodo per abilitare le gettoniere elettroniche al riconoscimento dimonete.
EP1324279A1 (de) * 2001-12-28 2003-07-02 Mars Incorporated Bargeldprüfungsvorrichtung und Einstellverfahren für eine solche Vorrichtung
GB2397158A (en) * 2003-01-08 2004-07-14 Money Controls Ltd Money item acceptor
JP2004355042A (ja) * 2003-05-26 2004-12-16 Asahi Seiko Kk コインセレクタ及びその外部設定装置
US20050061606A1 (en) * 2003-09-05 2005-03-24 Scott Juds Method and apparatus for transfering coin/token signature data between coin/token acceptor devices

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3918565B1 (en) * 1972-10-12 1993-10-19 Mars, Incorporated Method and apparatus for coin selection utilizing a programmable memory
FR2305809A1 (fr) * 1975-03-25 1976-10-22 Crouzet Sa Dispositif d'authentification de titres monetaires
GB1527450A (en) * 1977-07-27 1978-10-04 Mars Inc Digital memory coin testing method and apparatus

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Publication number Publication date
DE3274914D1 (en) 1987-02-05
EP0072189A2 (de) 1983-02-16
EP0072189A3 (en) 1983-11-09
ATE24619T1 (de) 1987-01-15

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