EP0072189B1 - Procédé et dispositif pour calibrer un appareil de contrôle de pièces de monnaie - Google Patents

Procédé et dispositif pour calibrer un appareil de contrôle de pièces de monnaie Download PDF

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Publication number
EP0072189B1
EP0072189B1 EP82304100A EP82304100A EP0072189B1 EP 0072189 B1 EP0072189 B1 EP 0072189B1 EP 82304100 A EP82304100 A EP 82304100A EP 82304100 A EP82304100 A EP 82304100A EP 0072189 B1 EP0072189 B1 EP 0072189B1
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EP
European Patent Office
Prior art keywords
coin
values
parameter signals
tokens
validation apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
EP82304100A
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German (de)
English (en)
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EP0072189A2 (fr
EP0072189A3 (en
Inventor
Ronald Edgar Daw
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Landis and Gyr Communications UK Ltd
Original Assignee
Landis and Gyr Communications UK Ltd
Aeronautical and General Instruments Ltd
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First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=10523833&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=EP0072189(B1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Landis and Gyr Communications UK Ltd, Aeronautical and General Instruments Ltd filed Critical Landis and Gyr Communications UK Ltd
Priority to AT82304100T priority Critical patent/ATE24619T1/de
Publication of EP0072189A2 publication Critical patent/EP0072189A2/fr
Publication of EP0072189A3 publication Critical patent/EP0072189A3/en
Application granted granted Critical
Publication of EP0072189B1 publication Critical patent/EP0072189B1/fr
Expired legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G07D5/08—Testing the magnetic or electric properties
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D2205/00—Coin testing devices
    • G07D2205/001—Reconfiguration of coin testing devices
    • G07D2205/0012—Reconfiguration of coin testing devices automatic adjustment, e.g. self-calibration

Definitions

  • Coin validation apparatus may be associated with a coin freed mechanism on a variety of a coin receiving machines such as coin box telephones or vending machines or may form part of a coin sorting apparatus to check that coins are valid coins and not counterfeit.
  • a coin receiving machines such as coin box telephones or vending machines
  • coin sorting apparatus to check that coins are valid coins and not counterfeit.
  • EP-A-0062411 describes a particularly convenient form of coin validation apparatus comprising a coin testing section, a microprocessor which controls the operation of the apparatus and analyses the output of the coin testing section, and a programmable memory containing the individual reference values for valid coins.
  • the coin testing section includes an electrical coil through which, in use, an alternating current is fed to produce an alternating magnetic field and a coin to be tested is placed adjacent the coil in the alternating magnetic field.
  • the coin testing section produces two parameter signals which are characteristic of the effect of the coin on both the inductance and the loss factor of the coil. With such an apparatus, these two parameter signals are then compared with reference values from the programmable memory by the microprocessor to determine if the coin is valid.
  • the particular parameter signals that are generated by the coin testing section also depend to some extent, upon the particular component values, tolerances, physical sizes, and location of the elements making up the coin testing section and thus, the exact value of the signal that indicates a valid coin in one coin testing section is likely to be different from the exact value of the signal in a different but similar piece of apparatus.
  • the present invention is concerned with a method and an apparatus for calibrating the coin testing sections of such electronic coin validation apparatus to determine the appropriate reference values for the parameter signals that are characteristic of the effect of the coin on the coin testing section.
  • GB-A-1527450 similarly describes a calibration technique in which a typical coin or coin replica capable of generating the same values as a typical coin, is inserted in the coin test section and is subjected to a test. Depending upon the values of the particular parameters that are obtained as a result of this test a particular one of a range of preprogrammed memories are then selected and inserted into the coin validation apparatus.
  • GB-A-1527450 also proposes the use of coin replicas with the same parameters as representative coins, as the references with which the apparatus is calibrated. This has the advantage that the tokens would be identifiable but it is extremely difficult to manufacture such tokens to ensure that they have the same characteristics as valid representative coins. Such tokens also have to be prepared for all denominations of coins in the coin set to be used with the apparatus and for all of the coins in the various different currencies with which the apparatus may be used.
  • the particular values of the two parameters characteristic of the valid coin of each particular denomination can be thought of as points, on a two dimensional graph with the two parameters forming the axes of the graph.
  • the axes would be the inductance and loss factor of the coil and thus, for each denomination of coin there would be a particular point on this graph having particular co-ordinates for both inductance and loss factor. It is the co-ordinates of this particular point which form the reference values for a particular point which form the reference values for this particular denomination of coin.
  • the memory of the coin validation apparatus can be programmed for coins of any number of denominations and coins of any currency by simply determining the appropriate calibration factors from the two tokens and then operating on standard values for any particular coins of any particular currency using these calibration factors. No matter how many coins are present in the set of coins of any particular currency, all that is required to determine the calibration factors and calibrate the apparatus are the tests on two simple tokens. The tokens are produced specifically as calibration tokens and thus do not look like coins and so are not likely to be mistaken or exchanged with coins without this being immediately apparent.
  • the tokens are not acceptable by the validation apparatus as valid coins and the tokens have no intrinsic value other than that of being calibration tokens. Consequently they are not likely to get lost or exchanged for coins.
  • the calibration tokens do not have to mirror any particular coin in their magnetic and electrical parameters although naturally they must have broadly similar parameters and so be formed of metal discs.
  • the apparatus in accordance with the second aspect of this invention is usually referred to as a calibration unit and preferably comprises a microprocessor forming the computer means coupled to the programmed memory.
  • This microprocessor is preferably of the same type as that used in the coin validation apparatus, and, during calibration of the apparatus it replaces that normally used in the coin validation apparatus.
  • the microprocessor in the calibration unit is programmed differently from that normally used in the apparatus.
  • the tokens, the programmed microprocessor and the programmed memory form a readily portable assembly which can be transported to any site at which the coin validation apparatus is situated to enable the coin validation apparatus to be programmed on site.
  • a coin validation apparatus includes a coin testing section for testing a coin and determining the values of two parameters signals which are characteristic of the effect of the coin on the coin testing section, a programmable memory for storing individual reference values of the parameter signals corresponding to valid coins acceptable to the coin validation apparatus, two tokens having different characteristics, a programmed memory containing standard values of the parameter signals for the said two tokens and standard values of the parameter signals for coins acceptable to the coin validation apparatus, and computer means programmed to accept from the coin testing section determined values of the two parameter signals for each token which are characteristic of the effect of each token on the coin testing section these values being different from the values detected upon arrival of a valid acceptable coin, to compare these determined parameter values for the two tokens with the standard values of the parameter signals for the two tokens stored in the programmed memory, to compute from the determined parameter values and from the standard values of the parameter signals for the two tokens, calibration factors relevant to the coin testing section of that particular coin validation apparatus, to operate on the standard values of the parameter signals for the coins acceptable to
  • Such a coin validation apparatus may be formed by a coin validation apparatus including the calibration apparatus or calibration unit in accordance with the second aspect of this invention, or alternatively, the coin validation apparatus may include the means to calibrate it as a permanent part of the coin validation apparatus.
  • the computer means for calibrating the apparatus is preferably the same microprocessor as is used in the coin validation apparatus to control the apparatus and to analyse the output of the coin test section.
  • the standard values of the parameter signals for the tokens and for the coins acceptable to the coin validation apparatus contained in the programmed memory may correspond to the exact values of the parameter signals emitted by a standard coin test section, but preferably they are presented in a modified form to facilitate the computation to be performed by the computer means.
  • the standard values of the parameter signals for the said two tokens and the standard values for the coins acceptable to the coin validation apparatus are all modified in the same way, for example by all being divided by the same number, then when the calibration factors are computed during the calibration sequence this modification of the standard values is taken account of in the calculation of the calibrated factors.
  • a typical coin validation apparatus is described in EP-A-0062411.
  • This coin validation apparatus can be most simply thought of as comprising three separate parts namely a coin test section 1, a microprocessor 2 which controls the coin validation apparatus and performs an analysis on the output of the coin test section, and a programmable read only memory PROM 3 which, once the coin validation apparatus has been calibrated, contains reference values of coins acceptable to the .coin validation apparatus.
  • the coin test section 1 of the coin validation apparatus described in our earlier Patent Application referred to above comprises an electrical coil connected in a resonant feedback circuit of an oscillator.
  • the coin to be tested is placed adjacent the coil and the presence of a coin adjacent the coil influences the inductance and loss factor of the coil and hence influences the oscillation frequency and amplitude of the resonant feedback circuit of the oscillator.
  • the coin test section 1 emits two parameter signals for each coin and these two parameter signals are characteristic of the effect of the coil on the inductance and loss factor of the coil.
  • microprocessor 2 These parameter signals are compared with reference signals located in the PROM 3 by the microprocessor 2 and then the microprocessor 2 emits a valid or reject coin signal depending upon whether the values of the parameter signals obtained from the coin test section 1 correspond to those in the PROM 3 or not.
  • the microprocessor preferred for this function is type RCA 1802 manufactured by Radio Corporation of America.
  • the preferred way of calibrating such a coin validation apparatus is to use a calibration unit consisting of two reference tokens A and B (not shown), a programmed microprocessor 4 which is again of RCA type 1802, and a programmed read only memory PROM 5 containing standard values of the parameter signals corresponding to calibration tokens A and B and corresponding to each of the coins with which the apparatus is to be used. For example, a 50p coin, 10p coin, a 5p coin and a 2p coin.
  • the parameter signals output from the coin test section 1 of the coin validation apparatus described in our earlier patent specification has the form of variable frequency signals. Table I shows the frequencies of typical output signals from the coin test section 1 for the calibration tokens A and B and the coins.
  • the values of the calibration tokens A and B are the most significant as they are used for calibration of the apparatus and inspection of Table I shows that the values of the parameter to signals of tokens A and B are roughly in a 3:1 ratio.
  • a microprocessor such as the RCA type 1802 it is desirable to be able to operate on information using only 8 bits of binary data i.e. on numbers in a range from 0 to 255.
  • calibration token A is given values of 32 and 32 and calibration token B values of 96 and 96 then both the sum and the difference of these values are exact multiples of 2.
  • the microprocessor 2 is replaced by the microprocessor 4 and PROM 5 and then calibration token A is inserted into the coin test section.
  • a push button switch is also actuated such as switch 1 shown in Figure 3, to inform the microprocessor 4 that a calibration token is being inserted or, alternatively, the operation can be triggered automatically for the first coin or token that enters the coin test section 1 when the PROM 3 is in its virgin or unprogrammed state.
  • the coin test section 1 performs its standard testing operations on the calibration token A and two parameter signals are produced by an output from the coin test section 1 into the microprocessor 4. The values of these determined parameter signals are then stored in an internal memory of the microprocessor 4. Token A is then rejected and calibration token B inserted into the coin test section 1.
  • a push button switch such as switch 2 shown in Figure 3 is also actuated to inform the microprocessor that token B has been inserted or if the calibration sequence is triggered automatically then the microprocessor 4 expects the next token to be token B.
  • the coin test section 1 then performs its tests on reference token B and again determined values of the parameter signals are output into the microprocessor 4 where they are stored in an internal memory.
  • the microprocessor compares the determined parameter signal values for the calibration tokens A and B with the standard values for the calibration tokens shown in Table II which it draws from the PROM 5. From these reference values it computes calibration factors a, b, c and d using an algorithm derived as follows.
  • the reference values of the parameter signals can be thought of as representing co-ordinates of points on a graph having the inductance values along one axis-say the X axis and the loss factor values along the other axis-say the Y axis.
  • the calibration factors (a, b, c and d) are used to define the offset to be applied to the origin of the axes-factors a and c, and the scaling factors to be applied to the axes-factors band d.
  • microprocessor 4 uses an algorithm derived as follows:-
  • a similar algorithm can be derived for the y axis 50p coin value and for the x and y values of each of the other coins.
  • the computer solves equation 13 and the equivalent one for the y axis using of course the derived parameter signal values from the tokens A and B for the values of A (x) , A(y), B (x) , B(y) and substitutes the value from the PROM 5 for the X so and Y so .
  • the computer then derives the individual reference values 50 (x) and 50 (y) and loads these values into the PROM 3. The process is repeated for each of the other coins.
  • microprocessor 4 and PROM 5 are removed after the PROM 3 has been programmed and the original microprocessor 2 replaced to provide a complete and calibrated coin validation apparatus as shown in Figure 1.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Coins (AREA)
  • Devices For Checking Fares Or Tickets At Control Points (AREA)
  • Slot Machines And Peripheral Devices (AREA)
  • Telephonic Communication Services (AREA)

Claims (8)

1. Procédé d'étalonnage d'un appareil de validation de pièces de monnaie comprenant une partie de test de pièces et une mémoire programmable, comprenant les étapes consistant à soummetre deux jetons ayant des caractéristiques différentes successivement à un test de pièces en utilisant la partie de test de pièces pour déterminer les valeurs de deux signaux de paramètres pour chaque jeton qui sont caractéristiques de l'effet de chaque jeton sur la partie de test de pièces, ces valeurs'étant différentes des valeurs détectées par suite de l'arrivée d'une pièce acceptable valide, à comparer ces valeurs de paramètres déterminées pour les deux jetons à des valeurs standard des signaux de paramètres pour les deux jetons, et à calculer à partir des valeurs de paramètres déterminées et des valeurs standard des facteurs d'étalonnage concernant cette partie de test de pièces particulière, puis à agir sur les valeurs standard des signaux de paramètres pour un ensemble de pièces à utiliser avec l'appareil de validation de pièces en utilisant les facteurs d'étalonnage calculés pour calculer des valeurs de référence individuelles des signaux de paramètres pour chaque pièce dans l'ensemble approprié pour cette partie de test de pièces particulière, et à programmer la mémoire programmable au moyen de ces valeurs de référence individuelles calculées.
2. Procédé selon la revendication 1, dans lequel la séquence d'étalonnage est initialisée en réponse à la première pièce ou au premier jeton introduit quand la mémoire programmable est dans son étant vierge.
3. Procédé selon l'une des revendications 1 ou 2, dans lequel les valeurs standard des signaux de paramètres pour les jetons et pour les pièces acceptables pour l'appareil de validation de pièces contenues dans la mémoire programmée ne correspondent pas aux valeurs exactes des signaux de paramètres émis par une partie de test de pièces standard mais sont présentées sous une forme modifiée pour faciliter le calcul à réaliser, la modification des valeurs standard étant prise en compte dans le calcul des facteurs d'étalonnage.
4. Appareil d'étalonnage pour étalonner un appareil de validation de pièces comprenant une partie de test de pièces (1) et une mémoire programmable (3) comprenant deux jetons ayant des caractéristiques différentes, une mémoire programmée (5) contenant des valeurs standard des signaux de paramètres pour lesdits deux jetons et des valeurs standard pour des pièces acceptables pour l'appareil de validation, et un moyen d'ordinateur (4) programmé pour accepter à partir de la partie de test de pièces (1) des valeurs déterminées des deux signaux de paramètres pour chaque jeton qui sont caractéristiques de l'effet de chaque pièce sur la partie de test de pièces (1 ), ces valeurs étant différentes des valeurs détectées par suite de l'arrivée d'une pièce valide acceptable, pour comparer ces valeurs de paramètres déterminées pour les deux jetons aux valeurs standard des signaux de paramètres pour les deux jetons mémorisées dans la mémoire programmée (5), pour calculer, à partir des valeurs de paramètres déterminées et à partir des valeurs standard des signaux de paramètres pour les deux jetons, des facteurs d'étalonnage pertinents pour la partie de test de pièces (1) de cet appareil de validation de pièces particulier, pour agir sur les valeurs standard des signaux de paramètres pour les pièces acceptables par l'appareil de validation de pièces mémorisées dans la mémoire programmée (5) en utilisant les facteurs d'étalonnage calculés pour calculer des valeurs de référence individuelles des signaux de paramètres pour chaque pièce acceptable par l'appareil de validation de pièces appropriées pour cette partie de test de pièces particulière (1 et pour programmer la mémoire programmable (3) de l'appareil de validation de pièces au moyen de ces valeurs de référence individuelles calculées des signaux de paramètres.
5. Appareil d'étalonnage selon la revendication 4, comprenant un microprocesseur (4) formant le moyen d'ordinateur couplé à la mémoire programmée (5), le microprocesseur (4) étant du même type que celui (2) utilisé dans l'appareil de validation de pièces, pendant l'étalonnage de l'appareil le microprocesseur (4) remplaçant le microprocesseur (2) normalement utilisé dans l'appareil de validation de pièces.
6. Appareil de validation de pièces comprenant une partie de test de pièces (1) pour tester une pièce et déterminer les valeurs de deux signaux de paramètres qui sont caractéristiques de l'effet de la pièce sur la partie de test de pièces (1), une mémoire programmable (3) pour mémoriser des valeurs de référence individuelles des signaux de paramètres correspondant à des pièces valides acceptables pour l'appareil de validation de pièces, deux jetons ayant des caractéristiques différentes, une mémoire programmée (5) contenant des valeurs standard des signaux de paramètres pour les deux jetons et des valeurs standard des signaux de paramètres pour des pièces acceptables pour l'appareil de validation de pièces, et un moyen d'ordinateur (4) programmé pour accepter à- partir de la partie de test de pièces (1) des valeurs déterminées des deux signaux de paramètres pour chaque jeton qui sont caractéristiques de l'effet de chaque jeton sur la partie de test de pièces (1), ces valeurs étant différentes des valeurs détectées par suite de l'arrivée d'une pièce valide acceptable, pour comparer ces valeurs de paramètres déterminées pour les deux jetons aux valeurs standard des signaux de paramètres pour les deux jetons mémorisées dans la mémoire programmée (5), pour calculer, à partir des valeurs de paramètres déterminées et à partir des valeurs standard des signaux de paramètres pour les deux jetons, des facteurs d'étalonnage pertinents pour la partie de test de pièces (1) de cet appareil de validation de pièces particulier, pour agir sur les valeurs standard des signaux de paramètres pour les pièces acceptables par l'appareil de validation de pie6ces mémorisées dans la mémoire programmée (5) en utilisant les facteurs d'étalonnage calculés pour calculer des valeurs de référence individuelles des signaux de paramètres pour chaque pièce acceptable par l'appareil de validation de pièces appropriées pour cette partie de test de pièces particulière (1) et pour programmer la mémoire programmable (3) de l'appareil de validation de pièces au moyen de ces valeurs de référence individuelles calculées des signaux de paramètres.
7. Appareil de validation de pièces selon la revendication 6, dans lequel le moyen d'ordinateur (4) pour étalonner l'appareil est le même microprocesseur qui celui qui est utilisé dans l'appareil de validation de pièces pour commander l'appareil et pour analyser la sortie de la partie de test de pièces (1).
8. Appareil selon la revendication 7, comprenant également des moyens pour initialiser la séquence d'étalonnage en réponse à l'actionnement d'un commutateur ou en réponse à la première pièce ou au premier jeton introduit quand la mémoire programmable est à l'état vierge.
EP82304100A 1981-08-10 1982-08-03 Procédé et dispositif pour calibrer un appareil de contrôle de pièces de monnaie Expired EP0072189B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AT82304100T ATE24619T1 (de) 1981-08-10 1982-08-03 Verfahren und einrichtung zur eichung eines muenzpruefers.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB8124398 1981-08-10
GB8124398 1981-08-10

Publications (3)

Publication Number Publication Date
EP0072189A2 EP0072189A2 (fr) 1983-02-16
EP0072189A3 EP0072189A3 (en) 1983-11-09
EP0072189B1 true EP0072189B1 (fr) 1986-12-30

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EP82304100A Expired EP0072189B1 (fr) 1981-08-10 1982-08-03 Procédé et dispositif pour calibrer un appareil de contrôle de pièces de monnaie

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EP (1) EP0072189B1 (fr)
AT (1) ATE24619T1 (fr)
DE (1) DE3274914D1 (fr)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2118344A (en) * 1982-02-12 1983-10-26 Mars Inc Coin testing apparatus
JPS5927383A (ja) * 1982-08-06 1984-02-13 株式会社ユニバ−サル 学習式硬貨等の選別装置
ZA851248B (en) * 1984-03-01 1985-11-27 Mars Inc Self tuning coin recognition system
JPH0546127Y2 (fr) * 1986-12-29 1993-12-01
GB2199978A (en) * 1987-01-16 1988-07-20 Mars Inc Coin validators
DE4025073C2 (de) * 1990-08-08 1994-03-31 Nat Rejectors Gmbh Verfahren zum Prüfen von zwei oder mehr Münzen unterschiedlichen Wertes
JP2936752B2 (ja) * 1991-03-04 1999-08-23 富士電機株式会社 硬貨選別装置
US5568854A (en) * 1991-06-28 1996-10-29 Protel, Inc. Coin discrimination method
US5191957A (en) * 1991-06-28 1993-03-09 Protel, Inc. Coin discrimination method
DK0619038T3 (da) * 1992-08-13 1997-10-13 Landis & Gyr Tech Innovat Kalibrering af møntprøveaggregater
DE4233194C2 (de) * 1992-10-02 1995-09-21 Nat Rejectors Gmbh Verfahren zum Eichen eines mindestens eine Münze akzeptierenden Münzprüfers und Eichmodul
DE4242639C2 (de) * 1992-12-17 1996-12-12 Nat Rejectors Gmbh Verfahren zum Eichen eines elektronischen Münzprüfers
ES2066698B1 (es) * 1992-12-29 1995-08-16 Azkoyen Ind Sa Nuevo sistema de programacion de selectores de moneda.
JP4171828B2 (ja) * 1998-07-16 2008-10-29 旭精工株式会社 電子コインセレクタの基準データ作成方法
IT1305807B1 (it) 1998-11-04 2001-05-16 O T R Srl Metodo per abilitare le gettoniere elettroniche al riconoscimento dimonete.
EP1324279A1 (fr) 2001-12-28 2003-07-02 Mars Incorporated Dispositif pour la validation d'objets monétaires et procédé pour configurer un tel dispositif
GB2397158A (en) * 2003-01-08 2004-07-14 Money Controls Ltd Money item acceptor
JP2004355042A (ja) * 2003-05-26 2004-12-16 Asahi Seiko Kk コインセレクタ及びその外部設定装置
US20050061606A1 (en) * 2003-09-05 2005-03-24 Scott Juds Method and apparatus for transfering coin/token signature data between coin/token acceptor devices

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3918565B1 (en) * 1972-10-12 1993-10-19 Mars, Incorporated Method and apparatus for coin selection utilizing a programmable memory
FR2305809A1 (fr) * 1975-03-25 1976-10-22 Crouzet Sa Dispositif d'authentification de titres monetaires
GB1527450A (en) * 1977-07-27 1978-10-04 Mars Inc Digital memory coin testing method and apparatus

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Publication number Publication date
EP0072189A2 (fr) 1983-02-16
ATE24619T1 (de) 1987-01-15
EP0072189A3 (en) 1983-11-09
DE3274914D1 (en) 1987-02-05

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