EP0072189A2 - Procédé et dispositif pour calibrer un appareil de contrôle de pièces de monnaie - Google Patents

Procédé et dispositif pour calibrer un appareil de contrôle de pièces de monnaie Download PDF

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Publication number
EP0072189A2
EP0072189A2 EP82304100A EP82304100A EP0072189A2 EP 0072189 A2 EP0072189 A2 EP 0072189A2 EP 82304100 A EP82304100 A EP 82304100A EP 82304100 A EP82304100 A EP 82304100A EP 0072189 A2 EP0072189 A2 EP 0072189A2
Authority
EP
European Patent Office
Prior art keywords
coin
values
parameter signals
tokens
validation apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP82304100A
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German (de)
English (en)
Other versions
EP0072189B1 (fr
EP0072189A3 (en
Inventor
Ronald Edgar Daw
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Landis and Gyr Communications UK Ltd
Original Assignee
Landis and Gyr Communications UK Ltd
Aeronautical and General Instruments Ltd
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Publication date
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Application filed by Landis and Gyr Communications UK Ltd, Aeronautical and General Instruments Ltd filed Critical Landis and Gyr Communications UK Ltd
Priority to AT82304100T priority Critical patent/ATE24619T1/de
Publication of EP0072189A2 publication Critical patent/EP0072189A2/fr
Publication of EP0072189A3 publication Critical patent/EP0072189A3/en
Application granted granted Critical
Publication of EP0072189B1 publication Critical patent/EP0072189B1/fr
Expired legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G07D5/08—Testing the magnetic or electric properties
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D2205/00—Coin testing devices
    • G07D2205/001—Reconfiguration of coin testing devices
    • G07D2205/0012—Reconfiguration of coin testing devices automatic adjustment, e.g. self-calibration

Definitions

  • Coin validation apparatus may be associated with a coin freed mechanism on a variety of coin receiving machines such as coin box telephones or vending machines or may form part of a coin sorting apparatus to check that coins are valid coins and not counterfeit.
  • coin validation apparatus There are many different types of coin validation apparatus in use, but recently, with the introduction of modern electronic devices to control the operation of the coin receiving machines and-sorting apparatus, it has become particularly convenient to use the interaction between a coin and an alternating magnetic field to gauge various parameters of the coin thereby to determine if the coin is valid.
  • Our co-pending European Patent Application No 82301161.4 describes a particularly convenient form of coin validation apparatus comprising a coin testing section, a microprocessor which controls the operation of the apparatus and analyses the output of the coin testing section, and a programmable memory containing the individual reference values for valid coins.
  • the coin testing section includes an electrical coil through which, in use, an alternating current is fed to produce an alternating magnetic field and a coin to be tested is placed adjacent the coil in the alternating magnetic field.
  • the coin testing section produces two parameter signals which are characteristic of the effect of the coin on both the inductance and the loss factor of the coil. With such an apparatus, these two parameter signals are then compared with reference values from the programmable memory by the microprocessor to determine if the coin is valid.
  • the particular parameter signals that are generated by the coin testing section also depend to some extent, upon the particular component values, tolerances, physical sizes, and location of the elements making up the coin testing section and thus, the exact value of the signal that indicates a valid coin in one coin testing section is likely to be different from the exact value of the signal in a different but similar piece of apparatus.
  • the present invention is concerned with a method and an apparatus for calibrating the coin testing sections of such electronic coin validation apparatus to determine the appropriate reference values for the parameter signals that are characteristic of the effect of the coin on the coin testing section.
  • the particular values of the two parameters characteristic of the valid coin of each particular denomination can be thought of as points, on a two dimensional graph with the two parameters forming the axes of the graph.
  • the axes would be the inductance and loss factor of the coil and thus, for each denomination of coin there would be a particular point on this graph having particular co-ordinates for both inductance and loss factor. It is the co-ordinates of this particular point which form the reference values for a particular denomination of coin.
  • the co-ordinates of a small area on the graph representing the acceptable range in parameter values for acceptable coins.
  • the memory of the coin validation apparatus can be programmed for coins of any number of denominations and coins of any currency by simply determining the appropriate calibration factors from the two tokens and then operating on standard values for any particular coins of any particular currency using these calibration factors. No matter how many coins are present in the set of coins of any particular currency, all that is required to determine the calibration factors and calibrate the apparatus are the tests on two simple tokens. The tokens are produced specifically as calibration tokens and thus do not look like coins and so are not likely to be mistaken or exchanged with coins without this being immediately apparent.
  • the tokens are not accepted by the validation apparatus as valid coins and the tokens have no intrinsic value other than that of being calibration tokens. Consequently they are not likely to get lost or exchanged for coins.
  • the calibration tokens do not have to mirror any particular coin in their magnetic and electrical parameters although naturally they must have broadly similar parameters and so be formed of metal discs.
  • the apparatus in accordance with the second aspect of this invention is usually referred to as a calibration umt and preferably comprises a microprocessor forming the computer means coupled to the programmed memory.
  • This microprocessor is preferably of the same type as that used in the coin validation apparatus and, during calibration of the apparatus it replaces that normally used in the coin validation apparatus.
  • the microprocessor in the calibration unit is programmed differently from that normally used in the apparatus.
  • the tokens, the programmed microprocessor and the programmed memory form a readily portable assembly which can be transported to any site at which the coin validation apparatus is situated to enable the coin validation apparatus to be programmed on site.
  • a coin validation apparatus includes a coin testing section for testing a coin and determining the values of two parameter signals which are characteristic of the effect of the coin on the coin testing section, a programmable memory for storing individual reference values of the parameter signals corresponding to valid coins acceptable to the coin validation apparatus, two tokens, a programmed memory containing standard values of the parameter signals for the said two tokens and standard values of the parameter signals for coins acceptable to the coin validation apparatus, and computer means programmed to accept from the coin testing section determined values of the two parameter signals for each token which are characteristic of the effect of each token on the coin testing section, to compare these determined parameter values for the two tokens with the standard values of the parameter signals for the two tokens stored in the programmed memory, to compute from the determined parameter values and from the standard values of the parameter signals for the two tokens calibration factors relevant to the coin testing section of thatparticular coin validation apparatus, to operate on the standard values of the parameter signals for the coins acceptable to the coin validation apparatus stored in the programmed memory using the computed calibration factors to compute
  • Such a coin validation apparatus may be formed by a coin validation apparatus including the calibration apparatus or calibration unit in accordance with the second aspect of this invention, or alternatively, the coin validation apparatus may include the means to calibrate it as a permanent part of the coin validation apparatus.
  • the computer means for calibrating the apparatus is preferably the same microprocessor as is used in the coin validation apparatus to control the apparatus and to analyse the output of the coin test section.
  • the standard values of the parameter signals for the tokens and for the coins acceptable to the coin validation apparatus contained in the programmed memory may correspond to the exact values of the parameter signals emitted by a standard coin test section, but preferably they are presented in a modified form to facilitate the computation to be performed by the computer means.
  • the standard values of the parameter signals for the said two tokens and the standard values for the coins acceptable to the coin validation apparatus are all modified in the same way, for example by all being divided by the same number, then when the calibration factors are computed during the calibration sequence this modification of the standard values is taken account of in the calculation of the calibration factors.
  • a typical coin validation apparatus is described in our earlier European Patent Application No 82301161.4 which was filed in the European Patent Office on 8th . March 1982.
  • This coin validation apparatus can be most simply thought of as comprising three separate parts namely a coin test section 1, a microprocessor 2 which controls the coin validation apparatus and performs an analysis on the output of the coin test section, and a progranmable read only memory PROM 3 which, once the coin validation apparatus has been calibrated, contains reference values of coins acceptable to the coin validation apparatus.
  • the coin test section 1 of the coin validation apparatus described in our earlier Patent Application referred to above comprises an electrical coil connected in a resonant feedback circuit of an oscillator.
  • the coin to be tested is placed adjacent the coil and the presence of a coin adjacent the coil influences the inductance and loss factor of the coil and hence influences the oscillation frequency and amplitude of the resonant feedback circuit of the oscillator.
  • the coin test section 1 emits two parameter signals for each coin and these two parameter signals are characteristic of the effect of the coin on the inductance and loss factor of the coil.
  • microprocessor 2 These parameter signals are compared with reference signals located in the PROM 3 by the microprocessor 2 and then the microprocessor 2 emits a valid or reject coin signal depending upon whether the values of the parameter signals obtained from the coin test section 1 correspond to those in the PROM 3 or not.
  • the microprocessor preferred for this function is type RCA 1802 manufactured by Radio Corporation of America.
  • the preferred way of calibrating such a coin validation apparatus is to use a calibration unit consisting of two reference tokens A and B (not shown), a programmed microprocessor 4 which is again of RCA type 1802, and a programmed read only memory PROM 5 containing standard values of the parameter signals corresponding to calibration tokens A and B and corresponding to each of the coins with which the apparatus is to be used.
  • a 50p coin, a lOp coin, a 5p coin and a 2p coin The parameter signals output from the coin test section 1 of the coin validation apparatus described in our earlier patent specification has the form of variable frequency signals. Table I shows the frequencies of typical output signals from the coin test section 1 for the calibration tokens A and B and the coins.
  • the values of the calibration tokens A and B are the most significant as they are used for calibration of the apparatus and inspection of Table I shows that the values of the parameter to signals of tokens A and B are in an approximate 3:1 ratio.
  • a microprocessor such as the RCA type 1802 it is desirable to be able to operate on information using only 8 bits of binary data i.e. on numbers in a range from 0 to 255.
  • calibration token A is given values of 32 and 32 and calibration token B values of 96 and 96 then both the sum and the difference of these values are exact multiples of 2.
  • the microprocessor 2 is replaced by the microprocessor 4 and PROM 5 and then calibration token A is inserted into the coin test section.
  • a push button switch is also actuated such as switch 1 shown in Figure 3, to inform the microprocessor 4 that a calibration token is being inserted or, alternatively, the operation can be triggered automatically for the first coin or token that enters the coin test section 1 when the PROM 3 is in its virgin or unprogrammed state.
  • the coin test section 1 performs its standard testing operations on the calibration token A and two parameter signals are produced by and output from the coin test section 1 into the microprocessor 4. The values of these determined parameter signals are then stored in an internal memory of the microprocessor 4. Token A is then rejected and calibration token B inserted into the coin test section 1.
  • a push button switch such as switch 2 shown in Figure 3 is also actuated to inform the microprocessor that token B has been inserted or if the calibration sequence is triggered automatically then the microprocessor 4 expects the next token to be token B.
  • the coin test section 1 then performs its tests on reference token B and again determined values of the parameter signals are output into the microprocessor 4 where they are stored in an internal memory.
  • the microprocessor compares the determined parameter signal values for the calibration tokens A and B with the standard values for the calibration tokens shown in Table II which it draws from the PROM 5. From these reference values it computes calibration factors a, b, c and d using an algorithm derived as follows.
  • the reference values of the parameter signals can be thought of as representing co-ordinates of points on a graph having the inductance values along one axis - say the X axis and the loss factor values along the other axis - say the Y axis.
  • the calibration factors (a, b, c and d) are used to define the offset to be applied to the origin of the axes- factors a and c, and the scaling factors to be applied to the axes-factors b and d.
  • a (x) and A (y) are the determined parameter signal values for the calibration token A
  • B (x) and B (y) are the determined parameter signal values for the calibration token B
  • x A and y A are the standard values of the parameter signals for calibration token A and x B and y B are the standard parameter signals from reference token B
  • Calibration factor a is equal to the offset of the X axis of the graph, b is the scaling factor of the X axis, calibration factor c is the offset on the Y axis and calibration factor d is the scaling factor of the Y axis.
  • microprocessor 4 uses an algorithm derived as follows:-
  • a similar algorithm can be derived for the y axis 50p coin value and for the x and y values of each of the other coins.
  • the computer solves equation 13 and the equivalent one for the y axis using of course the derived parameter signal values from the tokens A and B for the values of A (x) , A (y) , B (x) , B (y) and substitutes the value from the PROM 5 for the X 50 and Y 50 .
  • the computer then derives the individual reference values 50 (x) and 50 (y) and loads these values into the PROM 3. The process is repeated for each of the other coins.
  • microprocessor 4 and PROM 5 are removed after the PROM 3 has been programmed and the original microprocessor 2 replaced to provide a complete and calibrated coin validation apparatus as shown in Figure 1.
EP82304100A 1981-08-10 1982-08-03 Procédé et dispositif pour calibrer un appareil de contrôle de pièces de monnaie Expired EP0072189B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AT82304100T ATE24619T1 (de) 1981-08-10 1982-08-03 Verfahren und einrichtung zur eichung eines muenzpruefers.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB8124398 1981-08-10
GB8124398 1981-08-10

Publications (3)

Publication Number Publication Date
EP0072189A2 true EP0072189A2 (fr) 1983-02-16
EP0072189A3 EP0072189A3 (en) 1983-11-09
EP0072189B1 EP0072189B1 (fr) 1986-12-30

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ID=10523833

Family Applications (1)

Application Number Title Priority Date Filing Date
EP82304100A Expired EP0072189B1 (fr) 1981-08-10 1982-08-03 Procédé et dispositif pour calibrer un appareil de contrôle de pièces de monnaie

Country Status (3)

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EP (1) EP0072189B1 (fr)
AT (1) ATE24619T1 (fr)
DE (1) DE3274914D1 (fr)

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0086648A2 (fr) * 1982-02-12 1983-08-24 Mars Incorporated Dispositif pour examiner des pièces de monnaie
EP0101276A2 (fr) * 1982-08-06 1984-02-22 Kabushiki Kaisha Universal Procédé et dispositif pour la discrimination de pièces de monnaie ou de billets de banque
EP0155126A2 (fr) * 1984-03-01 1985-09-18 Mars Incorporated Système à auto-accordement pour la reconnaissance de pièces de monnaie
FR2609197A1 (fr) * 1986-12-29 1988-07-01 Laurel Bank Machine Co Dispositif discriminateur de pieces de monnaie
GB2199978A (en) * 1987-01-16 1988-07-20 Mars Inc Coin validators
EP0470439A1 (fr) * 1990-08-08 1992-02-12 National Rejectors Inc. GmbH Appareil accepteur de pièces de monnaie
WO1994004998A1 (fr) * 1992-08-13 1994-03-03 Landis & Gyr Business Support Ag Etalonnage de verificateurs de pieces de monnaie
EP0590381A2 (fr) * 1992-10-02 1994-04-06 National Rejectors Inc. GmbH Méthode et dispositif pour calibrer un contrôleur de pièces de monnaie
EP0602474A1 (fr) * 1992-12-17 1994-06-22 National Rejectors Inc. GmbH Méthode pour calibrer un dispositif pour le contrôle de pièces de monnaie
EP0607741A2 (fr) * 1992-12-29 1994-07-27 Azkoyen Industrial, S.A. Nouveau système pour programmer les sélecteurs de pièces de monnaie
US5351798A (en) * 1991-06-28 1994-10-04 Protel, Inc. Coin discrimination apparatus and method
US5353905A (en) * 1991-03-04 1994-10-11 Fuji Electric Co., Ltd. Coin sorting device
US5568854A (en) * 1991-06-28 1996-10-29 Protel, Inc. Coin discrimination method
EP0986030A1 (fr) * 1998-07-16 2000-03-15 Asahi Seiko Kabushiki Kaisha Sélecteur électronique de pièces de monnaie
EP1003133A2 (fr) 1998-11-04 2000-05-24 O.T.R. S.r.l. Dispositif pour calibrer un appareil accepteur de pièces de monnaie à identifier des pièces de monnaie
EP1324279A1 (fr) * 2001-12-28 2003-07-02 Mars Incorporated Dispositif pour la validation d'objets monétaires et procédé pour configurer un tel dispositif
GB2403330A (en) * 2003-05-26 2004-12-29 Asahi Seiko Co Ltd A coin validator and an external setting unit therefor
EP1513111A1 (fr) * 2003-09-05 2005-03-09 IDX, Inc. Methode et appareil pour l'echange de données characteristiques de proprietes de pièces de monnaie entre des appareils accepteurs de pièces de monnaie
JP2006513473A (ja) * 2003-01-08 2006-04-20 マネー コントロールズ リミテッド 改良型貨幣アイテム受入機

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3918565A (en) * 1972-10-12 1975-11-11 Mars Inc Method and apparatus for coin selection utilizing a programmable memory
US4086527A (en) * 1975-03-25 1978-04-25 Crouzet Method and apparatus for monetary articles authentification
GB1527450A (en) * 1977-07-27 1978-10-04 Mars Inc Digital memory coin testing method and apparatus

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3918565A (en) * 1972-10-12 1975-11-11 Mars Inc Method and apparatus for coin selection utilizing a programmable memory
US3918565B1 (en) * 1972-10-12 1993-10-19 Mars, Incorporated Method and apparatus for coin selection utilizing a programmable memory
US4086527A (en) * 1975-03-25 1978-04-25 Crouzet Method and apparatus for monetary articles authentification
GB1527450A (en) * 1977-07-27 1978-10-04 Mars Inc Digital memory coin testing method and apparatus

Cited By (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0086648A2 (fr) * 1982-02-12 1983-08-24 Mars Incorporated Dispositif pour examiner des pièces de monnaie
EP0086648B1 (fr) * 1982-02-12 1988-01-27 Mars Incorporated Dispositif pour examiner des pièces de monnaie
EP0101276A2 (fr) * 1982-08-06 1984-02-22 Kabushiki Kaisha Universal Procédé et dispositif pour la discrimination de pièces de monnaie ou de billets de banque
EP0101276A3 (en) * 1982-08-06 1985-05-08 Kabushiki Kaisha Universal Method of and apparatus for discriminating coins or bank notes
EP0155126A2 (fr) * 1984-03-01 1985-09-18 Mars Incorporated Système à auto-accordement pour la reconnaissance de pièces de monnaie
EP0155126A3 (en) * 1984-03-01 1987-01-07 Mars Incorporated Self tuning coin recognition system
FR2609197A1 (fr) * 1986-12-29 1988-07-01 Laurel Bank Machine Co Dispositif discriminateur de pieces de monnaie
GB2199438A (en) * 1986-12-29 1988-07-06 Laurel Bank Machine Co Coin discriminating device
GB2199438B (en) * 1986-12-29 1990-12-05 Laurel Bank Machine Co Coin discriminating device
GB2199978A (en) * 1987-01-16 1988-07-20 Mars Inc Coin validators
EP0470439A1 (fr) * 1990-08-08 1992-02-12 National Rejectors Inc. GmbH Appareil accepteur de pièces de monnaie
US5353905A (en) * 1991-03-04 1994-10-11 Fuji Electric Co., Ltd. Coin sorting device
US5351798A (en) * 1991-06-28 1994-10-04 Protel, Inc. Coin discrimination apparatus and method
US5687830A (en) * 1991-06-28 1997-11-18 Protel, Inc. Item discrimination apparatus and method
US5568854A (en) * 1991-06-28 1996-10-29 Protel, Inc. Coin discrimination method
WO1994004998A1 (fr) * 1992-08-13 1994-03-03 Landis & Gyr Business Support Ag Etalonnage de verificateurs de pieces de monnaie
TR27246A (tr) * 1992-08-13 1994-12-21 Landis & Gyr Business Support Madeni para muayene sistemi.
EP0590381A2 (fr) * 1992-10-02 1994-04-06 National Rejectors Inc. GmbH Méthode et dispositif pour calibrer un contrôleur de pièces de monnaie
EP0590381A3 (en) * 1992-10-02 1995-11-02 Nat Rejectors Gmbh Apparatus and method for calibrating a coin tester
US5495931A (en) * 1992-10-02 1996-03-05 National Rejectors Inc. Gmbh Method and apparatus for calibrating a coin checking device
DE4233194A1 (de) * 1992-10-02 1994-04-07 Nat Rejectors Gmbh Verfahren und Vorrichtung zum Eichen eines Münzprüfers
DE4242639A1 (de) * 1992-12-17 1994-06-23 Nat Rejectors Gmbh Verfahren zum Eichen eines Münzprüfers
EP0602474A1 (fr) * 1992-12-17 1994-06-22 National Rejectors Inc. GmbH Méthode pour calibrer un dispositif pour le contrôle de pièces de monnaie
EP0607741A2 (fr) * 1992-12-29 1994-07-27 Azkoyen Industrial, S.A. Nouveau système pour programmer les sélecteurs de pièces de monnaie
EP0607741A3 (fr) * 1992-12-29 1997-11-05 Azkoyen Industrial, S.A. Nouveau système pour programmer les sélecteurs de pièces de monnaie
EP0986030A1 (fr) * 1998-07-16 2000-03-15 Asahi Seiko Kabushiki Kaisha Sélecteur électronique de pièces de monnaie
EP1003133A2 (fr) 1998-11-04 2000-05-24 O.T.R. S.r.l. Dispositif pour calibrer un appareil accepteur de pièces de monnaie à identifier des pièces de monnaie
EP1003133A3 (fr) * 1998-11-04 2001-01-24 O.T.R. S.r.l. Dispositif pour calibrer un appareil accepteur de pièces de monnaie à identifier des pièces de monnaie
EP1324279A1 (fr) * 2001-12-28 2003-07-02 Mars Incorporated Dispositif pour la validation d'objets monétaires et procédé pour configurer un tel dispositif
US6902049B2 (en) 2001-12-28 2005-06-07 Mars, Incorporated Apparatus for validating currency items, and method of configuring such apparatus
JP2006513473A (ja) * 2003-01-08 2006-04-20 マネー コントロールズ リミテッド 改良型貨幣アイテム受入機
JP2011023042A (ja) * 2003-01-08 2011-02-03 Money Controls Ltd 改良型貨幣アイテム受入機
US7946408B2 (en) * 2003-01-08 2011-05-24 Money Controls Limited Money item acceptor
GB2403330A (en) * 2003-05-26 2004-12-29 Asahi Seiko Co Ltd A coin validator and an external setting unit therefor
GB2403330B (en) * 2003-05-26 2006-02-15 Asahi Seiko Co Ltd A coin selector and an external setting apparatus therefor
EP1513111A1 (fr) * 2003-09-05 2005-03-09 IDX, Inc. Methode et appareil pour l'echange de données characteristiques de proprietes de pièces de monnaie entre des appareils accepteurs de pièces de monnaie

Also Published As

Publication number Publication date
EP0072189B1 (fr) 1986-12-30
ATE24619T1 (de) 1987-01-15
EP0072189A3 (en) 1983-11-09
DE3274914D1 (en) 1987-02-05

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