DK1460410T3 - Forsinkelsestidsmoduleret og femtosekund tidsoplöst scanningprobe mikroskopapparat - Google Patents

Forsinkelsestidsmoduleret og femtosekund tidsoplöst scanningprobe mikroskopapparat

Info

Publication number
DK1460410T3
DK1460410T3 DK02803925T DK02803925T DK1460410T3 DK 1460410 T3 DK1460410 T3 DK 1460410T3 DK 02803925 T DK02803925 T DK 02803925T DK 02803925 T DK02803925 T DK 02803925T DK 1460410 T3 DK1460410 T3 DK 1460410T3
Authority
DK
Denmark
Prior art keywords
time
modulated
scanning probe
probe microscope
microscope apparatus
Prior art date
Application number
DK02803925T
Other languages
Danish (da)
English (en)
Inventor
Hidemi Shigekawa
Osamu Takeuchi
Mikio Yamashita
Ryuji Morita
Original Assignee
Japan Science & Tech Agency
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Science & Tech Agency filed Critical Japan Science & Tech Agency
Application granted granted Critical
Publication of DK1460410T3 publication Critical patent/DK1460410T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J3/433—Modulation spectrometry; Derivative spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2889—Rapid scan spectrometers; Time resolved spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/02—Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
    • G01Q60/12—STS [Scanning Tunnelling Spectroscopy]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4242—Modulated light, e.g. for synchronizing source and detector circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • G01N2021/6415—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence with two excitations, e.g. strong pump/probe flash
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/85—Scanning probe control process

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
DK02803925T 2001-11-26 2002-11-25 Forsinkelsestidsmoduleret og femtosekund tidsoplöst scanningprobe mikroskopapparat DK1460410T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001360047 2001-11-26
PCT/JP2002/012273 WO2003046519A1 (fr) 2001-11-26 2002-11-25 Appareil microscope a sonde de balayage a resolution temporelle de l'ordre de la femtoseconde a modulation du temps d'attente

Publications (1)

Publication Number Publication Date
DK1460410T3 true DK1460410T3 (da) 2008-12-08

Family

ID=19170940

Family Applications (1)

Application Number Title Priority Date Filing Date
DK02803925T DK1460410T3 (da) 2001-11-26 2002-11-25 Forsinkelsestidsmoduleret og femtosekund tidsoplöst scanningprobe mikroskopapparat

Country Status (6)

Country Link
US (1) US7002149B2 (fr)
EP (2) EP1460410B1 (fr)
JP (1) JP3796585B2 (fr)
DE (1) DE60228125D1 (fr)
DK (1) DK1460410T3 (fr)
WO (1) WO2003046519A1 (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005014059A (ja) * 2003-06-26 2005-01-20 Ricoh Co Ltd 超短パルスレーザ加工法及び加工装置並びに構造体
JP4425098B2 (ja) * 2004-09-06 2010-03-03 浜松ホトニクス株式会社 蛍光顕微鏡および蛍光相関分光解析装置
US7420106B2 (en) * 2005-03-18 2008-09-02 The University Of Utah Research Foundation Scanning probe characterization of surfaces
US7696479B2 (en) * 2005-06-03 2010-04-13 Massachusetts Institute Of Technology Method and apparatus for frequency-converting infrared light
US7567876B2 (en) * 2006-08-07 2009-07-28 Vialogy Llc Quantum resonance interferometry for detecting signals
JP4839481B2 (ja) 2006-11-29 2011-12-21 独立行政法人科学技術振興機構 ポンププローブ測定装置及びそれを用いた走査プローブ顕微鏡装置
US8064059B2 (en) * 2008-11-04 2011-11-22 Alipasha Vaziri Optical pulse duration measurement
CN101806733B (zh) * 2010-03-11 2011-11-09 中国科学院上海光学精密机械研究所 飞秒数字全息动态观察测量装置
DE102012200858A1 (de) * 2012-01-20 2013-07-25 Freie Universität Berlin Laserpulsformungsverfahren
JP7129099B2 (ja) * 2018-01-19 2022-09-01 Ｇセラノスティックス株式会社 走査プローブ顕微鏡、測定方法
CN113655026B (zh) * 2021-08-05 2024-01-23 中国科学院苏州生物医学工程技术研究所 椭半球曲面大视野高通量双光子显微镜
CN114353686B (zh) * 2021-09-10 2023-10-20 重庆交通大学 隧道衬砌的曲率分布智能获取方法及相关装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3772563D1 (de) * 1987-06-22 1991-10-02 Ibm Verfahren zur oberflaechenuntersuchung mit nanometer- und pikosekundenaufloesung sowie laserabgetastetes rastertunnelmikroskop zur durchfuehrung des verfahrens.
US4918319A (en) * 1987-11-03 1990-04-17 Puretan, Inc. Tanning bed with closure control mechanism
US4980566A (en) * 1989-08-02 1990-12-25 The United States Of America As Represented By The Secretary Of Commerce Ultrashort pulse multichannel infrared spectrometer apparatus and method for obtaining ultrafast time resolution spectral data
JP2743213B2 (ja) * 1990-07-25 1998-04-22 キヤノン株式会社 記録及び／又は再生を行なう装置および方法
JP2744359B2 (ja) * 1991-04-24 1998-04-28 キヤノン株式会社 情報再生及び／又は情報記録装置
US5416327A (en) * 1993-10-29 1995-05-16 Regents Of The University Of California Ultrafast scanning probe microscopy
JP3200263B2 (ja) * 1993-11-11 2001-08-20 シャープ株式会社 試料表面分析装置
JP3145329B2 (ja) * 1997-02-03 2001-03-12 科学技術振興事業団 局所探査顕微鏡
JP4474625B2 (ja) * 1999-12-14 2010-06-09 独立行政法人科学技術振興機構 超広帯域可変波長多重パルス波形整形装置

Also Published As

Publication number Publication date
EP1460410A1 (fr) 2004-09-22
US7002149B2 (en) 2006-02-21
EP1460410A4 (fr) 2005-04-06
DE60228125D1 (de) 2008-09-18
WO2003046519A1 (fr) 2003-06-05
US20050035288A1 (en) 2005-02-17
EP1967839A1 (fr) 2008-09-10
EP1460410B1 (fr) 2008-08-06
JPWO2003046519A1 (ja) 2005-04-07
JP3796585B2 (ja) 2006-07-12

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