DK1012838T3 - Fremgangsmåde til regulering af en belægningsproces - Google Patents

Fremgangsmåde til regulering af en belægningsproces

Info

Publication number
DK1012838T3
DK1012838T3 DK98945308T DK98945308T DK1012838T3 DK 1012838 T3 DK1012838 T3 DK 1012838T3 DK 98945308 T DK98945308 T DK 98945308T DK 98945308 T DK98945308 T DK 98945308T DK 1012838 T3 DK1012838 T3 DK 1012838T3
Authority
DK
Denmark
Prior art keywords
regulating
intensity
diffracted
light bundle
coating process
Prior art date
Application number
DK98945308T
Other languages
English (en)
Inventor
Uwe Sarbacher
Wilbert Windeln
Original Assignee
Steag Hamatech Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Steag Hamatech Ag filed Critical Steag Hamatech Ag
Application granted granted Critical
Publication of DK1012838T3 publication Critical patent/DK1012838T3/da

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/26—Apparatus or processes specially adapted for the manufacture of record carriers
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y15/00—Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/54—Controlling or regulating the coating process
    • C23C14/542—Controlling the film thickness or evaporation rate
    • C23C14/545—Controlling the film thickness or evaporation rate using measurement on deposited material
    • C23C14/547—Controlling the film thickness or evaporation rate using measurement on deposited material using optical methods
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B2220/00—Record carriers by type
    • G11B2220/20—Disc-shaped record carriers
    • G11B2220/25—Disc-shaped record carriers characterised in that the disc is based on a specific recording technology
    • G11B2220/2537—Optical discs
    • G11B2220/2545—CDs

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Manufacturing & Machinery (AREA)
  • Organic Chemistry (AREA)
  • Metallurgy (AREA)
  • Mechanical Engineering (AREA)
  • Materials Engineering (AREA)
  • Molecular Biology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Fertilizers (AREA)
  • Materials For Medical Uses (AREA)
  • Optical Fibers, Optical Fiber Cores, And Optical Fiber Bundles (AREA)
  • Non-Metallic Protective Coatings For Printed Circuits (AREA)
  • Polymers With Sulfur, Phosphorus Or Metals In The Main Chain (AREA)
  • Manufacturing Optical Record Carriers (AREA)
DK98945308T 1997-09-10 1998-09-04 Fremgangsmåde til regulering af en belægningsproces DK1012838T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19739794A DE19739794C2 (de) 1997-09-10 1997-09-10 Verfahren zur Regelung eines Beschichtungsvorgangs
PCT/EP1998/005612 WO1999013468A1 (de) 1997-09-10 1998-09-04 Verfahren zur regelung eines beschichtungsvorgangs

Publications (1)

Publication Number Publication Date
DK1012838T3 true DK1012838T3 (da) 2002-03-11

Family

ID=7841912

Family Applications (1)

Application Number Title Priority Date Filing Date
DK98945308T DK1012838T3 (da) 1997-09-10 1998-09-04 Fremgangsmåde til regulering af en belægningsproces

Country Status (13)

Country Link
US (1) US20020160100A1 (da)
EP (1) EP1012838B1 (da)
JP (1) JP2002510107A (da)
KR (1) KR100365196B1 (da)
CN (1) CN1269905A (da)
AT (1) ATE208947T1 (da)
CA (1) CA2303792C (da)
DE (2) DE19739794C2 (da)
DK (1) DK1012838T3 (da)
ES (1) ES2168792T3 (da)
IL (1) IL134922A0 (da)
TW (1) TW448078B (da)
WO (1) WO1999013468A1 (da)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19950559B4 (de) * 1999-10-20 2006-08-17 Steag Eta-Optik Gmbh Verfahren zum Bestimmen von geometrischen Strukturen auf oder in einem Substrat sowie von Materialparametern
DE10054099B4 (de) * 2000-10-31 2005-09-01 Steag Eta-Optik Gmbh Verfahren und Vorrichtung zum Bestimmen von Defektenauf oder in einem Gegenstand
DE10148778C2 (de) * 2001-10-02 2003-10-09 Univ Braunschweig Tech Verfahren zur Bestimmung der Beschaffenheit einer Probe
CN100371492C (zh) * 2004-08-06 2008-02-27 台达电子工业股份有限公司 镀膜系统及其膜厚监控装置
NL1027448C2 (nl) * 2004-11-08 2006-05-09 Otb Groep B V Werkwijze en inrichting voor het aanbrengen van een materiaallaag op een schijfvormig substraat.
JP2006313077A (ja) * 2005-05-06 2006-11-16 Ricoh Co Ltd 光学積層体検査方法，光学積層体製造方法および光学積層体検査装置ならびに光学積層体製造装置
DE102009012756B4 (de) * 2009-03-12 2012-11-22 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zur Messung der optischen Eigenschaften einer bewegten Probe in einer Beschichtungsanlage
JP7002476B2 (ja) * 2016-07-13 2022-01-20 エヴァテック・アーゲー 広帯域光学監視
US10861755B2 (en) 2017-02-08 2020-12-08 Verity Instruments, Inc. System and method for measurement of complex structures
DE102018103171A1 (de) * 2017-11-23 2019-05-23 Tdk Electronics Ag Verfahren zum Bestimmen von Eigenschaften einer Beschichtung auf einer transparenten Folie, Verfahren zur Herstellung einer Kondensatorfolie und Einrichtung zum Bestimmen von Eigenschaften einer Beschichtung auf einer transparenten Folie
CN111682079B (zh) * 2020-06-01 2021-12-14 大连理工大学 一种中/远红外透明导电材料体系及其制备导电薄膜的方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU947640A1 (ru) * 1980-07-04 1982-07-30 Предприятие П/Я В-2892 Способ измерени толщины пленки на подложке
US4457794A (en) * 1982-06-25 1984-07-03 Matsushita Electric Industrial Co., Ltd. Method for manufacturing optical memory disc
JPS6175203A (ja) * 1984-09-20 1986-04-17 Oak Seisakusho:Kk 膜厚測定装置
JPS6176904A (ja) * 1984-09-21 1986-04-19 Oak Seisakusho:Kk 膜厚測定方法
DE3689524T2 (de) * 1985-06-10 1994-05-11 Energy Conversion Devices Inc Optische Speichervorrichtung und Verfahren zur Herstellung.
JPH01268859A (ja) * 1988-04-20 1989-10-26 Casio Comput Co Ltd 透明導電膜の形成方法および形成装置
JPH0252205A (ja) * 1988-08-17 1990-02-21 Dainippon Screen Mfg Co Ltd 膜厚測定方法
JPH0443906A (ja) * 1990-06-11 1992-02-13 Matsushita Electric Ind Co Ltd 光学的膜厚モニタ装置
DE29502560U1 (de) * 1995-02-16 1995-03-30 Wissenschaftlich Tech Optikzen Vorrichtung zur Bestimmung der Schichtdicke farbiger Schichten auf transparenten Substraten
DE29506765U1 (de) * 1995-04-21 1995-06-22 Wissenschaftlich Tech Optikzen Vorrichtung zum Messen der Dicke dünner farbiger Schichten
JPH09128818A (ja) * 1995-11-02 1997-05-16 Sony Corp 露光装置

Also Published As

Publication number Publication date
EP1012838B1 (de) 2001-11-14
CA2303792C (en) 2003-01-14
WO1999013468A1 (de) 1999-03-18
JP2002510107A (ja) 2002-04-02
DE59802169D1 (de) 2001-12-20
DE19739794C2 (de) 1999-11-18
IL134922A0 (en) 2001-05-20
EP1012838A1 (de) 2000-06-28
US20020160100A1 (en) 2002-10-31
CN1269905A (zh) 2000-10-11
DE19739794A1 (de) 1999-04-01
ATE208947T1 (de) 2001-11-15
KR100365196B1 (ko) 2002-12-18
TW448078B (en) 2001-08-01
CA2303792A1 (en) 1999-03-18
ES2168792T3 (es) 2002-06-16
KR20010023817A (ko) 2001-03-26

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