DE69936277D1 - Synchron-Halbleiterspeichervorrichtung - Google Patents

Synchron-Halbleiterspeichervorrichtung

Info

Publication number
DE69936277D1
DE69936277D1 DE69936277T DE69936277T DE69936277D1 DE 69936277 D1 DE69936277 D1 DE 69936277D1 DE 69936277 T DE69936277 T DE 69936277T DE 69936277 T DE69936277 T DE 69936277T DE 69936277 D1 DE69936277 D1 DE 69936277D1
Authority
DE
Germany
Prior art keywords
iclk
mode
signal
synchronous
internal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69936277T
Other languages
English (en)
Other versions
DE69936277T2 (de
Inventor
Junya Taniguchi
Yasuji Koshikawa
Kouji Mine
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micron Memory Japan Ltd
Original Assignee
Elpida Memory Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elpida Memory Inc filed Critical Elpida Memory Inc
Publication of DE69936277D1 publication Critical patent/DE69936277D1/de
Application granted granted Critical
Publication of DE69936277T2 publication Critical patent/DE69936277T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Dram (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Static Random-Access Memory (AREA)
DE69936277T 1998-04-27 1999-04-26 Synchron-Halbleiterspeichervorrichtung Expired - Lifetime DE69936277T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP11740298 1998-04-27
JP11740298A JP3169071B2 (ja) 1998-04-27 1998-04-27 同期型半導体記憶装置

Publications (2)

Publication Number Publication Date
DE69936277D1 true DE69936277D1 (de) 2007-07-26
DE69936277T2 DE69936277T2 (de) 2007-10-04

Family

ID=14710770

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69936277T Expired - Lifetime DE69936277T2 (de) 1998-04-27 1999-04-26 Synchron-Halbleiterspeichervorrichtung

Country Status (7)

Country Link
US (1) US6175534B1 (de)
EP (1) EP0953987B1 (de)
JP (1) JP3169071B2 (de)
KR (1) KR100327858B1 (de)
CN (1) CN1143320C (de)
DE (1) DE69936277T2 (de)
TW (1) TW422979B (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4712183B2 (ja) * 2000-11-30 2011-06-29 富士通セミコンダクター株式会社 同期型半導体装置、及び試験システム
KR100400309B1 (ko) * 2001-05-04 2003-10-01 주식회사 하이닉스반도체 반도체 메모리 소자의 내부 동작명령 발생장치 및 방법
KR100401506B1 (ko) * 2001-05-10 2003-10-17 주식회사 하이닉스반도체 비동기 프리차지 기능을 갖는 싱크로노스 메모리 디바이스
US6782467B1 (en) 2001-06-29 2004-08-24 Cypress Semiconductor Corp. Method and apparatus for fast limited core area access and cross-port word size multiplication in synchronous multiport memories
KR100428684B1 (ko) * 2001-09-24 2004-04-30 주식회사 하이닉스반도체 제어신호의 마스킹을 고려한 반도체 기억장치
JP3792602B2 (ja) 2002-05-29 2006-07-05 エルピーダメモリ株式会社 半導体記憶装置
KR100452335B1 (ko) * 2002-11-25 2004-10-12 삼성전자주식회사 고속동작 테스트가 가능한 반도체 메모리장치의 데이터확장회로 및 그 방법
US7796464B1 (en) 2003-06-27 2010-09-14 Cypress Semiconductor Corporation Synchronous memory with a shadow-cycle counter
KR100505706B1 (ko) * 2003-08-25 2005-08-02 삼성전자주식회사 테스트 패턴 신호의 주파수를 선택적으로 가변시키는반도체 메모리 장치의 테스트 장치 및 그 테스트 방법
DE102004030053B3 (de) * 2004-06-22 2005-12-29 Infineon Technologies Ag Halbleiterspeichervorrichtung
KR100812600B1 (ko) * 2005-09-29 2008-03-13 주식회사 하이닉스반도체 주파수가 다른 복수의 클럭을 사용하는 반도체메모리소자
JP2012203970A (ja) * 2011-03-28 2012-10-22 Elpida Memory Inc 半導体装置及び半導体装置の制御方法
KR20190075202A (ko) * 2017-12-21 2019-07-01 에스케이하이닉스 주식회사 테스트 제어 회로, 이를 이용하는 반도체 메모리 장치 및 반도체 시스템
CN116844600B (zh) * 2022-03-23 2024-05-03 长鑫存储技术有限公司 一种信号采样电路以及半导体存储器

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3346827B2 (ja) * 1993-05-25 2002-11-18 三菱電機株式会社 同期型半導体記憶装置
US5384737A (en) * 1994-03-08 1995-01-24 Motorola Inc. Pipelined memory having synchronous and asynchronous operating modes
US5570381A (en) * 1995-04-28 1996-10-29 Mosaid Technologies Incorporated Synchronous DRAM tester
JP3710845B2 (ja) * 1995-06-21 2005-10-26 株式会社ルネサステクノロジ 半導体記憶装置
JP4141520B2 (ja) * 1997-11-14 2008-08-27 株式会社ルネサステクノロジ 同期型半導体記憶装置

Also Published As

Publication number Publication date
EP0953987A2 (de) 1999-11-03
US6175534B1 (en) 2001-01-16
CN1235352A (zh) 1999-11-17
EP0953987B1 (de) 2007-06-13
KR100327858B1 (ko) 2002-03-09
EP0953987A3 (de) 2005-06-08
DE69936277T2 (de) 2007-10-04
CN1143320C (zh) 2004-03-24
JP3169071B2 (ja) 2001-05-21
JPH11312397A (ja) 1999-11-09
KR19990083513A (ko) 1999-11-25
TW422979B (en) 2001-02-21

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