DE69915592D1 - BESCHICHTUNGSVERFAHREN ZUR BENUTZUNG EINES Cu(hfac)-VORLÄUFERS MIT EINEM PHENYLETHYLEN-LIGAND - Google Patents
BESCHICHTUNGSVERFAHREN ZUR BENUTZUNG EINES Cu(hfac)-VORLÄUFERS MIT EINEM PHENYLETHYLEN-LIGANDInfo
- Publication number
- DE69915592D1 DE69915592D1 DE69915592T DE69915592T DE69915592D1 DE 69915592 D1 DE69915592 D1 DE 69915592D1 DE 69915592 T DE69915592 T DE 69915592T DE 69915592 T DE69915592 T DE 69915592T DE 69915592 D1 DE69915592 D1 DE 69915592D1
- Authority
- DE
- Germany
- Prior art keywords
- hfac
- phase
- coating method
- phenylethylene ligand
- phenylethylene
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 title 1
- 238000000576 coating method Methods 0.000 title 1
- 239000003446 ligand Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76841—Barrier, adhesion or liner layers
- H01L21/76871—Layers specifically deposited to enhance or enable the nucleation of further layers, i.e. seed layers
- H01L21/76876—Layers specifically deposited to enhance or enable the nucleation of further layers, i.e. seed layers for deposition from the gas phase, e.g. CVD
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/18—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metallo-organic compounds
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F1/00—Compounds containing elements of Groups 1 or 11 of the Periodic Table
- C07F1/08—Copper compounds
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical Vapour Deposition (AREA)
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10789298P | 1998-11-10 | 1998-11-10 | |
US107892P | 1998-11-10 | ||
US09/351,645 US6204176B1 (en) | 1998-11-10 | 1999-07-12 | Substituted phenylethylene precursor deposition method |
US351645 | 1999-07-12 | ||
PCT/JP1999/006246 WO2000028107A1 (en) | 1998-11-10 | 1999-11-10 | Substituted phenylethylene precursor deposition method |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69915592D1 true DE69915592D1 (de) | 2004-04-22 |
DE69915592T2 DE69915592T2 (de) | 2005-02-03 |
Family
ID=26805299
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69915592T Expired - Lifetime DE69915592T2 (de) | 1998-11-10 | 1999-11-10 | BESCHICHTUNGSVERFAHREN ZUR BENUTZUNG EINES Cu(hfac)-VORLÄUFERS MIT EINEM PHENYLETHYLEN-LIGAND |
Country Status (7)
Country | Link |
---|---|
US (1) | US6204176B1 (de) |
EP (1) | EP1047807B1 (de) |
JP (1) | JP3729739B2 (de) |
KR (1) | KR100347834B1 (de) |
DE (1) | DE69915592T2 (de) |
TW (1) | TW518371B (de) |
WO (1) | WO2000028107A1 (de) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5939334A (en) * | 1997-05-22 | 1999-08-17 | Sharp Laboratories Of America, Inc. | System and method of selectively cleaning copper substrate surfaces, in-situ, to remove copper oxides |
US6596344B2 (en) * | 2001-03-27 | 2003-07-22 | Sharp Laboratories Of America, Inc. | Method of depositing a high-adhesive copper thin film on a metal nitride substrate |
JP2010209410A (ja) * | 2009-03-10 | 2010-09-24 | Tokyo Electron Ltd | Cu膜の成膜方法および記憶媒体 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4385005A (en) | 1981-07-13 | 1983-05-24 | Exxon Research And Engineering Co. | Process for separating unsaturated hydrocarbons using copper or silver complexes with fluorinated diketonates |
US4425281A (en) | 1981-07-13 | 1984-01-10 | Exxon Research And Engineering Co. | Copper or silver complexes with fluorinated diketones and unsaturated ligands |
US4434317A (en) | 1983-05-06 | 1984-02-28 | Exxon Research And Engineering Company | Separation and recovery of unsaturated hydrocarbons by copper (I) complexes |
US5028724A (en) | 1990-03-30 | 1991-07-02 | Air Products And Chemicals, Inc. | Synthesis of volatile fluorinated and non-fluorinated metal-beta-ketonate and metal-beta-ketoiminato complexes |
US5273775A (en) * | 1990-09-12 | 1993-12-28 | Air Products And Chemicals, Inc. | Process for selectively depositing copper aluminum alloy onto a substrate |
US5096737A (en) | 1990-10-24 | 1992-03-17 | International Business Machines Corporation | Ligand stabilized +1 metal beta-diketonate coordination complexes and their use in chemical vapor deposition of metal thin films |
US5098516A (en) * | 1990-12-31 | 1992-03-24 | Air Products And Chemicals, Inc. | Processes for the chemical vapor deposition of copper and etching of copper |
US5187300A (en) * | 1991-02-04 | 1993-02-16 | Air Products And Chemicals, Inc. | Volatile precursors for copper CVD |
US5085731A (en) * | 1991-02-04 | 1992-02-04 | Air Products And Chemicals, Inc. | Volatile liquid precursors for the chemical vapor deposition of copper |
US5144049A (en) * | 1991-02-04 | 1992-09-01 | Air Products And Chemicals, Inc. | Volatile liquid precursors for the chemical vapor deposition of copper |
CA2082771C (en) * | 1992-11-12 | 1998-02-10 | Vu Quoc Ho | Method for forming interconnect structures for integrated circuits |
US5913147A (en) * | 1997-01-21 | 1999-06-15 | Advanced Micro Devices, Inc. | Method for fabricating copper-aluminum metallization |
US6001730A (en) * | 1997-10-20 | 1999-12-14 | Motorola, Inc. | Chemical mechanical polishing (CMP) slurry for polishing copper interconnects which use tantalum-based barrier layers |
-
1999
- 1999-07-12 US US09/351,645 patent/US6204176B1/en not_active Expired - Lifetime
- 1999-11-10 EP EP99971871A patent/EP1047807B1/de not_active Expired - Lifetime
- 1999-11-10 DE DE69915592T patent/DE69915592T2/de not_active Expired - Lifetime
- 1999-11-10 KR KR1020007007614A patent/KR100347834B1/ko not_active IP Right Cessation
- 1999-11-10 JP JP2000581271A patent/JP3729739B2/ja not_active Expired - Fee Related
- 1999-11-10 TW TW088119655A patent/TW518371B/zh not_active IP Right Cessation
- 1999-11-10 WO PCT/JP1999/006246 patent/WO2000028107A1/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
US6204176B1 (en) | 2001-03-20 |
EP1047807A1 (de) | 2000-11-02 |
WO2000028107A1 (en) | 2000-05-18 |
JP3729739B2 (ja) | 2005-12-21 |
TW518371B (en) | 2003-01-21 |
EP1047807B1 (de) | 2004-03-17 |
KR100347834B1 (ko) | 2002-08-07 |
JP2002529602A (ja) | 2002-09-10 |
KR20010034018A (ko) | 2001-04-25 |
DE69915592T2 (de) | 2005-02-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE69937326D1 (de) | Verfahren zur bestimmung eines substrates | |
DE69801032D1 (de) | Verfahren zur Beschichtung eines Gegenstandes mit einem Polysilsesquioxan | |
DE69912376D1 (de) | Verfahren zur herstellung eines halbleiterbauelements | |
DE69304924D1 (de) | Verfahren zur herstellung eines beschichteten schleifmittels mit einem leitenden träger. | |
ATE204250T1 (de) | Verfahren zur aufbereitung eines kohlenwasserstoffgases | |
DE69822949D1 (de) | Verfahren zur quantitativen Messung eines Substrats | |
DE69933300D1 (de) | Verfahren zur entwässerung komplexer schlämme | |
DE69824302D1 (de) | Verfahren zur bearbeitung eines metallstreifens | |
DE69522464T2 (de) | Verfahren zur Innenbeschichtung eines Rohres | |
DE69831064D1 (de) | Verfahren zur Bestimmung der Position eines Punktes | |
DE69730429D1 (de) | Verfahren zum kontinuierlichen beschichten eines sich bewegenden substrats mit einem metalldampf | |
DE50004625D1 (de) | Verfahren zur Ermittlung der Schichtdickenverteilung in einer Lackschicht | |
DE69922617D1 (de) | Verfahren zur Herstellung eines Halbleiterbauelementes | |
DE69629431D1 (de) | Verfahren zur herstellung eines niederschlags aus metalloxid | |
DE69915592D1 (de) | BESCHICHTUNGSVERFAHREN ZUR BENUTZUNG EINES Cu(hfac)-VORLÄUFERS MIT EINEM PHENYLETHYLEN-LIGAND | |
DE69705265T2 (de) | Schnittstellenvorrichtung zur Verbindung eines Multimediennetzwerkes mit einem Musiknetzwerk | |
DE69904438T2 (de) | Verfahren zur entfernung von halogenverbindungen in einem gas oder einer flüssigkeit | |
DE59901823D1 (de) | Verfahren zur beschichtung einer oberfläche mit einem trennmittel | |
DE59908397D1 (de) | Verfahren zur Ermittlung eines Pumpenzustandes | |
DE69701806T2 (de) | Verfahren zur leistungsregelung eines anwenderprogramms in einem digitalrechner | |
ATE251006T1 (de) | Verfahren zur herstellung eines mit einer überzugschicht beschichteten schneidelements. | |
DE69511572T2 (de) | Verfahren zur beschichtung eines substrates mit einer pulverlackzusammensetzung | |
DE60239007D1 (de) | Verfahren zur herstellung eines kontinuierlichen überzugs an der oberfläche eines bauteils | |
DE59902312D1 (de) | Anordnung zur Verbindung eines Leichtmetallbauteils mit einem Stahlbauteil und Verfahren zur Herstellung der Anordnung | |
DE69517393D1 (de) | Verfahren zur Innenbeschichtung eines Rohres |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |