DE69838023D1 - Nichtflüchtige Speicherstruktur und das entsprechende Herstellungsverfahren - Google Patents
Nichtflüchtige Speicherstruktur und das entsprechende HerstellungsverfahrenInfo
- Publication number
- DE69838023D1 DE69838023D1 DE69838023T DE69838023T DE69838023D1 DE 69838023 D1 DE69838023 D1 DE 69838023D1 DE 69838023 T DE69838023 T DE 69838023T DE 69838023 T DE69838023 T DE 69838023T DE 69838023 D1 DE69838023 D1 DE 69838023D1
- Authority
- DE
- Germany
- Prior art keywords
- volatile memory
- memory structure
- corresponding manufacturing
- manufacturing
- volatile
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004519 manufacturing process Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
- H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
- H01L29/42312—Gate electrodes for field effect devices
- H01L29/42316—Gate electrodes for field effect devices for field-effect transistors
- H01L29/4232—Gate electrodes for field effect devices for field-effect transistors with insulated gate
- H01L29/42324—Gate electrodes for transistors with a floating gate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP98202563A EP0977267B1 (de) | 1998-07-30 | 1998-07-30 | Nichtflüchtige Speicherstruktur und das entsprechende Herstellungsverfahren |
Publications (1)
Publication Number | Publication Date |
---|---|
DE69838023D1 true DE69838023D1 (de) | 2007-08-16 |
Family
ID=8233990
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69838023T Expired - Lifetime DE69838023D1 (de) | 1998-07-30 | 1998-07-30 | Nichtflüchtige Speicherstruktur und das entsprechende Herstellungsverfahren |
Country Status (3)
Country | Link |
---|---|
US (2) | US6204531B1 (de) |
EP (1) | EP0977267B1 (de) |
DE (1) | DE69838023D1 (de) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20180036652A (ko) * | 2015-05-24 | 2018-04-09 | 리보닉스 인코포레이티드 | 표면을 소독하기 위한 시스템 및 방법 |
CN110854115B (zh) * | 2019-11-26 | 2023-09-22 | 上海华力集成电路制造有限公司 | 一种基于FinFET工艺的标准单元版图结构 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2365859A1 (fr) * | 1976-09-24 | 1978-04-21 | Thomson Csf | Memoire non volatile pour signaux rapides |
US4288256A (en) * | 1977-12-23 | 1981-09-08 | International Business Machines Corporation | Method of making FET containing stacked gates |
JPH02237077A (ja) * | 1989-03-09 | 1990-09-19 | Toshiba Corp | 不揮発性画像記憶装置 |
JPH0821638B2 (ja) * | 1989-12-15 | 1996-03-04 | 株式会社東芝 | 不揮発性半導体記憶装置およびその製造方法 |
US5338969A (en) * | 1991-06-27 | 1994-08-16 | Texas Instruments, Incorporated | Unerasable programmable read-only memory |
JPH05190809A (ja) * | 1992-01-14 | 1993-07-30 | Kawasaki Steel Corp | 半導体装置の製造方法 |
JP3150438B2 (ja) * | 1992-08-18 | 2001-03-26 | ローム株式会社 | 光記憶装置およびその製法 |
US6023085A (en) * | 1997-12-18 | 2000-02-08 | Advanced Micro Devices, Inc. | Core cell structure and corresponding process for NAND-type high performance flash memory device |
-
1998
- 1998-07-30 DE DE69838023T patent/DE69838023D1/de not_active Expired - Lifetime
- 1998-07-30 EP EP98202563A patent/EP0977267B1/de not_active Expired - Lifetime
-
1999
- 1999-07-29 US US09/363,429 patent/US6204531B1/en not_active Expired - Lifetime
-
2001
- 2001-01-16 US US09/761,330 patent/US20010005333A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
US6204531B1 (en) | 2001-03-20 |
EP0977267A1 (de) | 2000-02-02 |
EP0977267B1 (de) | 2007-07-04 |
US20010005333A1 (en) | 2001-06-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de |