DE69831967D1 - Monolithischer magnetischer sensor mit extern einstellbarer temperaturkompensation - Google Patents

Monolithischer magnetischer sensor mit extern einstellbarer temperaturkompensation

Info

Publication number
DE69831967D1
DE69831967D1 DE69831967T DE69831967T DE69831967D1 DE 69831967 D1 DE69831967 D1 DE 69831967D1 DE 69831967 T DE69831967 T DE 69831967T DE 69831967 T DE69831967 T DE 69831967T DE 69831967 D1 DE69831967 D1 DE 69831967D1
Authority
DE
Germany
Prior art keywords
magnetic sensor
temperature compensation
adjustable temperature
external adjustable
monolithic magnetic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69831967T
Other languages
English (en)
Other versions
DE69831967T2 (de
Inventor
G W Alexander
R Nickson
P Foley
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Analog Devices Inc
Original Assignee
Analog Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Analog Devices Inc filed Critical Analog Devices Inc
Application granted granted Critical
Publication of DE69831967D1 publication Critical patent/DE69831967D1/de
Publication of DE69831967T2 publication Critical patent/DE69831967T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices
    • G01R33/072—Constructional adaptation of the sensor to specific applications
    • G01R33/075—Hall devices configured for spinning current measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Hall/Mr Elements (AREA)
  • Measuring Magnetic Variables (AREA)
DE69831967T 1997-10-20 1998-08-14 Monolithischer magnetischer sensor mit extern einstellbarer temperaturkompensation Expired - Lifetime DE69831967T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US08/953,884 US6154027A (en) 1997-10-20 1997-10-20 Monolithic magnetic sensor having externally adjustable temperature compensation
US953884 1997-10-20
PCT/US1998/016931 WO1999021023A1 (en) 1997-10-20 1998-08-14 Monolithic magnetic sensor having externally adjustable temperature compensation

Publications (2)

Publication Number Publication Date
DE69831967D1 true DE69831967D1 (de) 2005-11-24
DE69831967T2 DE69831967T2 (de) 2006-07-27

Family

ID=25494663

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69831967T Expired - Lifetime DE69831967T2 (de) 1997-10-20 1998-08-14 Monolithischer magnetischer sensor mit extern einstellbarer temperaturkompensation

Country Status (5)

Country Link
US (1) US6154027A (de)
EP (1) EP1025448B1 (de)
JP (1) JP2001521152A (de)
DE (1) DE69831967T2 (de)
WO (1) WO1999021023A1 (de)

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DE19910411C2 (de) * 1999-03-10 2001-08-30 Daimler Chrysler Ag Verfahren und Vorrichtung zur Offset-kompensierten Magnetfeldmessung mittels eines Hallsensors
DE19943128A1 (de) * 1999-09-09 2001-04-12 Fraunhofer Ges Forschung Hall-Sensoranordnung zur Offset-kompensierten Magnetfeldmessung
DE19951045B4 (de) * 1999-10-22 2005-03-17 Micronas Gmbh Magnetfeldsensor mit Kettenleiterfilter
US6777932B2 (en) 2000-03-23 2004-08-17 Matsushita Electric Industrial Co., Ltd. Magnetic field sensor
US6357279B1 (en) * 2001-01-29 2002-03-19 Leco Corporation Control circuit for thermal conductivity cell
DE10117382B4 (de) * 2001-04-06 2006-04-06 Infineon Technologies Ag Schaltungsanordnung und Sensorvorrichtung
JP4451577B2 (ja) * 2001-07-26 2010-04-14 パナソニック株式会社 磁界センサ
US6794863B2 (en) * 2002-11-13 2004-09-21 Matsushta Electric Industrial Co., Ltd. Magnetic field sensor, method for detecting magnetic field and device for detecting magnetic field
DE10313642A1 (de) * 2003-03-26 2004-10-14 Micronas Gmbh Offset-reduzierter Hall-sensor
NL1024114C1 (nl) * 2003-08-15 2005-02-16 Systematic Design Holding B V Werkwijze en inrichting voor het verrichten van metingen aan magnetische velden met gebruik van een hall-sensor.
NL1025089C2 (nl) * 2003-12-19 2005-06-21 Xensor Integration B V Magneetveldsensor, drager van een dergelijke magneetveldsensor en een kompas, voorzien van een dergelijke magneetveldsensor.
JP4514104B2 (ja) * 2004-03-30 2010-07-28 旭化成エレクトロニクス株式会社 磁気検出装置
JP4049125B2 (ja) * 2004-05-20 2008-02-20 コニカミノルタオプト株式会社 位置検出装置、手振れ補正機構、および撮像装置
JP4641775B2 (ja) * 2004-09-29 2011-03-02 ルネサスエレクトロニクス株式会社 磁気検出用半導体集積回路およびそれを搭載した電子部品
JP4553714B2 (ja) * 2004-12-14 2010-09-29 Ｎｔｎ株式会社 回転検出装置および回転検出装置付き軸受
WO2006064687A1 (ja) * 2004-12-14 2006-06-22 Ntn Corporation 回転検出装置およびこれを備えた軸受
US7180359B2 (en) * 2004-12-22 2007-02-20 Analog Devices, Inc. Logarithmic temperature compensation for detectors
DE102005028461A1 (de) * 2005-06-17 2006-12-28 Micronas Gmbh Verfahren zum Testen eines Wafers, insbesondere Hall-Magnetfeld-Sensors und Wafer bzw. Hallsensor
JP2008309626A (ja) * 2007-06-14 2008-12-25 Oki Electric Ind Co Ltd 感磁出力ｉｃ
GB0723973D0 (en) * 2007-12-07 2008-01-16 Melexis Nv Hall sensor array
US8054071B2 (en) * 2008-03-06 2011-11-08 Allegro Microsystems, Inc. Two-terminal linear sensor
FR2947060B1 (fr) * 2009-06-18 2011-10-28 Socomec Sa Capteur de champ magnetique a effet hall
CN102460199B (zh) * 2009-06-30 2014-01-08 旭化成微电子株式会社 磁传感器
US9013167B2 (en) * 2010-11-09 2015-04-21 Texas Instruments Incorporated Hall effect device having voltage based biasing for temperature compensation
US8957676B2 (en) * 2011-05-06 2015-02-17 Allegro Microsystems, Llc Magnetic field sensor having a control node to receive a control signal to adjust a threshold
DE102011077580A1 (de) 2011-06-16 2012-12-20 Robert Bosch Gmbh Hallsensor und Verfahren zum Betreiben eines Hallsensors
US20140145714A1 (en) * 2012-01-25 2014-05-29 Asahi Kasei Microdevices Corporation Hall electromotive force signal detection circuit and current sensor thereof
JP5865108B2 (ja) * 2012-02-16 2016-02-17 セイコーインスツル株式会社 磁気センサ装置
US9817083B2 (en) * 2012-07-05 2017-11-14 Allegro Microsystems, Llc Magnetic field sensors and associated methods for removing undesirable spectral components
US9063174B2 (en) 2012-11-14 2015-06-23 Olympus Scientific Solutions Americas Inc. Hall effect measurement instrument with temperature compensation
JP6158682B2 (ja) * 2013-10-25 2017-07-05 エスアイアイ・セミコンダクタ株式会社 磁気センサ回路
US9297865B2 (en) * 2013-11-12 2016-03-29 Olympus Scientific Solutions Americas Inc. Hall effect measurement instrument with temperature compensation
JP6457192B2 (ja) * 2014-03-31 2019-01-23 旭化成エレクトロニクス株式会社 ホール起電力信号処理装置、電流センサ及びホール起電力信号処理方法
CN103929166B (zh) * 2014-04-25 2016-11-16 成都芯进电子有限公司 一种可编程开关型霍尔传感器
DE102015117109A1 (de) * 2015-10-07 2017-04-13 Infineon Technologies Ag Digital gesteuerte Ausgangsamplitude eines Analogsensorsignals
US10101410B2 (en) 2015-10-21 2018-10-16 Allegro Microsystems, Llc Methods and apparatus for sensor having fault trip level setting
JP2017161475A (ja) * 2016-03-11 2017-09-14 株式会社東芝 半導体装置および磁気センサ
JP6568825B2 (ja) * 2016-06-20 2019-08-28 旭化成エレクトロニクス株式会社 制御回路および電流センサ
CN107014401B (zh) * 2016-11-18 2019-12-31 清华四川能源互联网研究院 一种磁阻传感器温度补偿装置
US10444299B2 (en) 2017-09-11 2019-10-15 Allegro Microsystems, Llc Magnetic field sensor's front end and associated mixed signal method for removing chopper's related ripple
US10481219B2 (en) 2017-09-11 2019-11-19 Allegro Microsystems, Llc Magnetic field sensor with feedback loop for test signal processing
US10574259B2 (en) * 2017-10-03 2020-02-25 Invensense, Inc. Continuous-time sensing apparatus
US11047933B2 (en) 2019-04-02 2021-06-29 Allegro Microsystems, Llc Fast response magnetic field sensors and associated methods for removing undesirable spectral components
JP7367350B2 (ja) * 2019-06-21 2023-10-24 セイコーエプソン株式会社 回路装置、発振器、電子機器及び移動体
DE102022129671B3 (de) * 2022-11-09 2024-03-07 Senis Ag Magnetfeldsensorsystem mit einem temperaturgangskompensierten Ausgangssignal sowie Verfahren für die Temperaturgangskompensation eines Ausgangssignals eines Magnetfeldsensorsystems
CN117519404B (zh) * 2024-01-05 2024-03-22 深圳市信瑞达电力设备有限公司 一种调节霍尔元件输出增益的方法和电路拓扑

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US4734594A (en) * 1986-12-31 1988-03-29 Honeywell Inc. Offset correction for sensor with temperature dependent sensitivity
US4760285A (en) * 1987-03-30 1988-07-26 Honeywell Inc. Hall effect device with epitaxal layer resistive means for providing temperature independent sensitivity
DE3827606A1 (de) * 1987-08-18 1989-03-02 Kostal Leopold Gmbh & Co Kg Temperaturkompensationsschaltung fuer einen hall-generator
US5317259A (en) * 1990-05-14 1994-05-31 The United States Of America As Represented By The United States Department Of Energy DC-based magnetic field controller
JP2750788B2 (ja) * 1991-08-08 1998-05-13 ローム株式会社 モータ制御回路およびモータ制御装置
EP0548391B1 (de) * 1991-12-21 1997-07-23 Deutsche ITT Industries GmbH Offsetkompensierter Hallsensor
US5389889A (en) * 1993-09-10 1995-02-14 Allegro Microsystems, Inc. Temperature-compensated current source for use in a hall analog magnetic-field detector
DE4431703C2 (de) * 1994-09-06 1997-01-30 Itt Ind Gmbh Deutsche Magnetfeldsensor mit Hallelement
US5900995A (en) * 1994-11-25 1999-05-04 Canon Kabushiki Kaisha Driving device and optical apparatus
US5589792A (en) * 1995-04-19 1996-12-31 Analog Devices, Inc. Resistor programmable temperature switch
DE19544863C2 (de) * 1995-12-01 2000-01-13 Bosch Gmbh Robert Sensorvorrichtung
US5621319A (en) * 1995-12-08 1997-04-15 Allegro Microsystems, Inc. Chopped hall sensor with synchronously chopped sample-and-hold circuit
US5686827A (en) * 1996-02-09 1997-11-11 Eaton Corporation Temperature compensated Hall effect device

Also Published As

Publication number Publication date
DE69831967T2 (de) 2006-07-27
JP2001521152A (ja) 2001-11-06
US6154027A (en) 2000-11-28
EP1025448B1 (de) 2005-10-19
EP1025448A1 (de) 2000-08-09
WO1999021023A1 (en) 1999-04-29

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