DE69721019T2 - Alkylsulfonyloxime für i-line-photoresists hoher auflösung und empfindlichkeit - Google Patents

Alkylsulfonyloxime für i-line-photoresists hoher auflösung und empfindlichkeit

Info

Publication number
DE69721019T2
DE69721019T2 DE69721019T DE69721019T DE69721019T2 DE 69721019 T2 DE69721019 T2 DE 69721019T2 DE 69721019 T DE69721019 T DE 69721019T DE 69721019 T DE69721019 T DE 69721019T DE 69721019 T2 DE69721019 T2 DE 69721019T2
Authority
DE
Germany
Prior art keywords
c4alkyl
group
unsubstituted
alkylsulfonyloxime
sensitivity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69721019T
Other languages
English (en)
Other versions
DE69721019D1 (de
Inventor
Kurt Dietliker
Martin Kunz
Hitoshi Yamato
Leo Christoph De
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BASF Schweiz AG
Original Assignee
Ciba Spezialitaetenchemie Holding AG
Ciba SC Holding AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ciba Spezialitaetenchemie Holding AG, Ciba SC Holding AG filed Critical Ciba Spezialitaetenchemie Holding AG
Publication of DE69721019D1 publication Critical patent/DE69721019D1/de
Application granted granted Critical
Publication of DE69721019T2 publication Critical patent/DE69721019T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07D—HETEROCYCLIC COMPOUNDS
    • C07D333/00—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom
    • C07D333/02—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom not condensed with other rings
    • C07D333/04—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom not condensed with other rings not substituted on the ring sulphur atom
    • C07D333/06—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom not condensed with other rings not substituted on the ring sulphur atom with only hydrogen atoms, hydrocarbon or substituted hydrocarbon radicals, directly attached to the ring carbon atoms
    • C07D333/22—Radicals substituted by doubly bound hetero atoms, or by two hetero atoms other than halogen singly bound to the same carbon atom
    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C309/00—Sulfonic acids; Halides, esters, or anhydrides thereof
    • C07C309/63—Esters of sulfonic acids
    • C07C309/64—Esters of sulfonic acids having sulfur atoms of esterified sulfo groups bound to acyclic carbon atoms
    • C07C309/65—Esters of sulfonic acids having sulfur atoms of esterified sulfo groups bound to acyclic carbon atoms of a saturated carbon skeleton
    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C309/00—Sulfonic acids; Halides, esters, or anhydrides thereof
    • C07C309/63—Esters of sulfonic acids
    • C07C309/64—Esters of sulfonic acids having sulfur atoms of esterified sulfo groups bound to acyclic carbon atoms
    • C07C309/65—Esters of sulfonic acids having sulfur atoms of esterified sulfo groups bound to acyclic carbon atoms of a saturated carbon skeleton
    • C07C309/66—Methanesulfonates
    • C—CHEMISTRY; METALLURGY
    • C07—ORGANIC CHEMISTRY
    • C07D—HETEROCYCLIC COMPOUNDS
    • C07D333/00—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom
    • C07D333/02—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom not condensed with other rings
    • C07D333/04—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom not condensed with other rings not substituted on the ring sulphur atom
    • C07D333/06—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom not condensed with other rings not substituted on the ring sulphur atom with only hydrogen atoms, hydrocarbon or substituted hydrocarbon radicals, directly attached to the ring carbon atoms
    • C07D333/24—Radicals substituted by carbon atoms having three bonds to hetero atoms with at the most one bond to halogen, e.g. ester or nitrile radicals
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Materials For Photolithography (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
  • Photoreceptors In Electrophotography (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Steroid Compounds (AREA)
DE69721019T 1996-09-02 1997-08-22 Alkylsulfonyloxime für i-line-photoresists hoher auflösung und empfindlichkeit Expired - Lifetime DE69721019T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH214796 1996-09-02
PCT/EP1997/004566 WO1998010335A1 (en) 1996-09-02 1997-08-22 Alkysulfonyloximes for high-resolution i-line photoresists of high sensitivity

Publications (2)

Publication Number Publication Date
DE69721019D1 DE69721019D1 (de) 2003-05-22
DE69721019T2 true DE69721019T2 (de) 2003-12-24

Family

ID=4226975

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69721019T Expired - Lifetime DE69721019T2 (de) 1996-09-02 1997-08-22 Alkylsulfonyloxime für i-line-photoresists hoher auflösung und empfindlichkeit

Country Status (14)

Country Link
EP (1) EP0925529B1 (de)
JP (1) JP3875271B2 (de)
KR (1) KR100686473B1 (de)
CN (1) CN1133901C (de)
AT (1) ATE237830T1 (de)
AU (1) AU726458B2 (de)
BR (1) BR9713311A (de)
CA (1) CA2263254A1 (de)
DE (1) DE69721019T2 (de)
ES (1) ES2194218T3 (de)
ID (1) ID17338A (de)
MY (1) MY118505A (de)
TW (1) TW497011B (de)
WO (1) WO1998010335A1 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW550439B (en) * 1997-07-01 2003-09-01 Ciba Sc Holding Ag New oxime sulfonates as latent acids and compositions and photoresists comprising said oxime sulfonates
DK199901098A (da) * 1998-08-18 2000-02-19 Ciba Sc Holding Ag Sylfonyloximer til i-linie-fotoresists med høj følsomhed og høj resisttykkelse
TW575792B (en) 1998-08-19 2004-02-11 Ciba Sc Holding Ag New unsaturated oxime derivatives and the use thereof as latent acids
WO2000014602A1 (en) * 1998-09-04 2000-03-16 Polaroid Corporation Process for forming a color filter
CN1205215C (zh) * 1998-10-29 2005-06-08 西巴特殊化学品控股有限公司 肟衍生物及其作为潜酸的用途
WO2000052530A1 (en) * 1999-03-03 2000-09-08 Ciba Specialty Chemicals Holding Inc. Oxime derivatives and the use thereof as photoinitiators
US6576394B1 (en) 2000-06-16 2003-06-10 Clariant Finance (Bvi) Limited Negative-acting chemically amplified photoresist composition
US6482567B1 (en) * 2000-08-25 2002-11-19 Shipley Company, L.L.C. Oxime sulfonate and N-oxyimidosulfonate photoacid generators and photoresists comprising same
TW589514B (en) * 2001-09-13 2004-06-01 Matsushita Electric Ind Co Ltd Pattern formation material and pattern formation method
BR0307501A (pt) * 2002-02-06 2004-12-07 Ciba Sc Holding Ag Derivados de sulfonato e o uso destes como ácidos latentes
JP4924813B2 (ja) * 2004-10-29 2012-04-25 日産化学工業株式会社 光酸発生剤を含む染料含有レジスト組成物及びそれを用いるカラーフィルター
KR20090043591A (ko) * 2006-08-24 2009-05-06 시바 홀딩 인크 Ｕｖ-선량 표시기
GB2450975B (en) 2007-07-12 2010-02-24 Ciba Holding Inc Yellow radiation curing inks
CN101638374A (zh) * 2008-07-28 2010-02-03 住友化学株式会社 肟类化合物及包含该化合物的抗蚀剂组合物
EP2414894B1 (de) 2009-03-30 2014-02-12 Basf Se Folien zur uv-dosisanzeige
JP6605820B2 (ja) * 2015-03-11 2019-11-13 株式会社Ａｄｅｋａ オキシムスルホネート化合物、光酸発生剤、レジスト組成物、カチオン重合開始剤、およびカチオン重合性組成物
US20200209749A1 (en) * 2018-12-27 2020-07-02 Sumitomo Chemical Company, Limited Resist composition and method for producing resist pattern

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4123255A (en) * 1977-01-03 1978-10-31 Chevron Research Company O-sulfonyl-alpha-cyano 2,6-dihalobenzaldoximes
US4540598A (en) * 1983-08-17 1985-09-10 Ciba-Geigy Corporation Process for curing acid-curable finishes
GB8608528D0 (en) * 1986-04-08 1986-05-14 Ciba Geigy Ag Production of positive images
US5019488A (en) * 1988-09-29 1991-05-28 Hoechst Celanese Corporation Method of producing an image reversal negative photoresist having a photo-labile blocked imide
KR900005226A (ko) * 1988-09-29 1990-04-13 윌리엄 비이 해리스 감광성 조성물 및 양화 상과 음화 상의 생성방법
EP0571330B1 (de) * 1992-05-22 1999-04-07 Ciba SC Holding AG Hochauflösender I-Linien Photoresist mit höherer Empfindlichkeit
JP3456808B2 (ja) * 1995-09-29 2003-10-14 東京応化工業株式会社 ホトレジスト組成物
JP3587413B2 (ja) * 1995-12-20 2004-11-10 東京応化工業株式会社 化学増幅型レジスト組成物及びそれに用いる酸発生剤
JP3665166B2 (ja) * 1996-07-24 2005-06-29 東京応化工業株式会社 化学増幅型レジスト組成物及びそれに用いる酸発生剤

Also Published As

Publication number Publication date
AU4455297A (en) 1998-03-26
CA2263254A1 (en) 1998-03-12
KR20000068387A (ko) 2000-11-25
CN1133901C (zh) 2004-01-07
ID17338A (id) 1997-12-18
EP0925529A1 (de) 1999-06-30
BR9713311A (pt) 2000-02-01
WO1998010335A1 (en) 1998-03-12
KR100686473B1 (ko) 2007-02-26
DE69721019D1 (de) 2003-05-22
ATE237830T1 (de) 2003-05-15
JP2000517067A (ja) 2000-12-19
JP3875271B2 (ja) 2007-01-31
CN1228851A (zh) 1999-09-15
EP0925529B1 (de) 2003-04-16
TW497011B (en) 2002-08-01
MY118505A (en) 2004-11-30
AU726458B2 (en) 2000-11-09
ES2194218T3 (es) 2003-11-16

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: PFENNING MEINIG & PARTNER GBR, 80339 MUENCHEN

8327 Change in the person/name/address of the patent owner

Owner name: CIBA HOLDING INC., BASEL, CH

8328 Change in the person/name/address of the agent

Representative=s name: MAIWALD PATENTANWALTSGESELLSCHAFT MBH, 80335 MUENC