DE69631395D1 - Quantatives Mikroanalyseverfahren mit Röntgenstrahlen für Metallegierungen - Google Patents

Quantatives Mikroanalyseverfahren mit Röntgenstrahlen für Metallegierungen

Info

Publication number
DE69631395D1
DE69631395D1 DE69631395T DE69631395T DE69631395D1 DE 69631395 D1 DE69631395 D1 DE 69631395D1 DE 69631395 T DE69631395 T DE 69631395T DE 69631395 T DE69631395 T DE 69631395T DE 69631395 D1 DE69631395 D1 DE 69631395D1
Authority
DE
Germany
Prior art keywords
sem
intensities
epma
rays
metal alloys
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69631395T
Other languages
English (en)
Other versions
DE69631395T2 (de
Inventor
De Castillo Y Valder Fernandez
Arboledas Jaime Botella
Bello Juan Francisco Almagro
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Acerinox SA
Original Assignee
Acerinox SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from ES9500880A external-priority patent/ES2114439B1/es
Priority claimed from ES9601013A external-priority patent/ES2114490B1/es
Application filed by Acerinox SA filed Critical Acerinox SA
Publication of DE69631395D1 publication Critical patent/DE69631395D1/de
Application granted granted Critical
Publication of DE69631395T2 publication Critical patent/DE69631395T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20091—Measuring the energy-dispersion spectrum [EDS] of diffracted radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • G01N23/2252—Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE69631395T 1995-05-09 1996-05-08 Quantatives Mikroanalyseverfahren mit Röntgenstrahlen für Metallegierungen Expired - Lifetime DE69631395T2 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
ES9500880A ES2114439B1 (es) 1995-05-09 1995-05-09 Dispositivo que contiene un conjunto de muestras patron de aceros para el microanalisis cuantitativo de aleaciones metalicas de base hierro.
ES9500880 1995-05-09
ES9601013A ES2114490B1 (es) 1996-05-07 1996-05-07 Metodo para el microanalisis cuantitativo de rayos x de aleaciones metalicas basado en un conjunto de muestras patron de la aleacion y un modelo matematico de ajuste.
ES9601013 1996-05-07

Publications (2)

Publication Number Publication Date
DE69631395D1 true DE69631395D1 (de) 2004-03-04
DE69631395T2 DE69631395T2 (de) 2004-11-04

Family

ID=26154885

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69631395T Expired - Lifetime DE69631395T2 (de) 1995-05-09 1996-05-08 Quantatives Mikroanalyseverfahren mit Röntgenstrahlen für Metallegierungen

Country Status (4)

Country Link
EP (1) EP0742434B1 (de)
AT (1) ATE258680T1 (de)
DE (1) DE69631395T2 (de)
PT (1) PT742434E (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010112744A (ko) * 2000-06-15 2001-12-22 권수식 합금화 용융아연도금강판의 합금화도 측정방법
JP6009963B2 (ja) * 2013-02-14 2016-10-19 日本電子株式会社 試料分析方法および試料分析装置
JP6033716B2 (ja) * 2013-03-18 2016-11-30 新日鐵住金株式会社 金属内の異物弁別方法
CN104122283A (zh) * 2014-08-01 2014-10-29 桂林理工大学 一种基于电子探针原位分析的全岩组份测试方法
JP6336881B2 (ja) * 2014-10-20 2018-06-06 日本電子株式会社 散布図表示装置、散布図表示方法、および表面分析装置
KR101639130B1 (ko) * 2014-10-23 2016-07-22 현대제철 주식회사 강 중 구성 원소의 epma 분석 방법
RU2597935C1 (ru) * 2015-06-17 2016-09-20 Федеральное государственное бюджетное учреждение науки Ордена Трудового Красного Знамени Институт нефтехимического синтеза им. А.В. Топчиева Российской академии наук (ИНХС РАН) Способ определения состава твердого раствора
CN110954448A (zh) * 2019-12-11 2020-04-03 中国建材检验认证集团股份有限公司 定量测定物理混合物的组成及其含量的方法、装置和系统
CN110987993A (zh) * 2019-12-17 2020-04-10 中国地质大学（武汉） 一种原位有机质定量统计分析方法
CN111678937B (zh) * 2020-05-21 2023-05-09 首钢集团有限公司 一种确定钢中微观偏析比取值范围的图像方法
CN113138204A (zh) * 2021-04-13 2021-07-20 武汉理工大学 适用于电子探针分析的n-标样的制备方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU890182A1 (ru) * 1980-04-01 1981-12-15 Березниковский филиал Всесоюзного научно-исследовательского и проектного института титана Способ рентгенорадиометрического анализа неоднородных сплавов или лигатур
SU1670551A1 (ru) * 1988-06-15 1991-08-15 Институт нефте- и углехимического синтеза при Иркутском государственном университете Способ проверки качества предварительной аттестации стандартных образцов сплавов
JP2853261B2 (ja) * 1989-05-16 1999-02-03 三菱マテリアル株式会社 金属分析方法および分析装置
JP2759680B2 (ja) * 1989-07-19 1998-05-28 株式会社日立製作所 分析システム

Also Published As

Publication number Publication date
PT742434E (pt) 2004-06-30
EP0742434B1 (de) 2004-01-28
ATE258680T1 (de) 2004-02-15
DE69631395T2 (de) 2004-11-04
EP0742434A1 (de) 1996-11-13

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