ATE258680T1 - Quantatives mikroanalyseverfahren mit röntgenstrahlen für metallegierungen - Google Patents

Quantatives mikroanalyseverfahren mit röntgenstrahlen für metallegierungen

Info

Publication number
ATE258680T1
ATE258680T1 AT96500055T AT96500055T ATE258680T1 AT E258680 T1 ATE258680 T1 AT E258680T1 AT 96500055 T AT96500055 T AT 96500055T AT 96500055 T AT96500055 T AT 96500055T AT E258680 T1 ATE258680 T1 AT E258680T1
Authority
AT
Austria
Prior art keywords
sem
intensities
epma
quantative
rays
Prior art date
Application number
AT96500055T
Other languages
English (en)
Inventor
De Castillo Y Valder Fernandez
Gibraltar De
Arboledas Jaime Botella
Bello Juan Francisco Almagro
Original Assignee
Acerinox Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from ES9500880A external-priority patent/ES2114439B1/es
Priority claimed from ES9601013A external-priority patent/ES2114490B1/es
Application filed by Acerinox Sa filed Critical Acerinox Sa
Application granted granted Critical
Publication of ATE258680T1 publication Critical patent/ATE258680T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20091Measuring the energy-dispersion spectrum [EDS] of diffracted radiation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • G01N23/2252Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AT96500055T 1995-05-09 1996-05-08 Quantatives mikroanalyseverfahren mit röntgenstrahlen für metallegierungen ATE258680T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
ES9500880A ES2114439B1 (es) 1995-05-09 1995-05-09 Dispositivo que contiene un conjunto de muestras patron de aceros para el microanalisis cuantitativo de aleaciones metalicas de base hierro.
ES9601013A ES2114490B1 (es) 1996-05-07 1996-05-07 Metodo para el microanalisis cuantitativo de rayos x de aleaciones metalicas basado en un conjunto de muestras patron de la aleacion y un modelo matematico de ajuste.

Publications (1)

Publication Number Publication Date
ATE258680T1 true ATE258680T1 (de) 2004-02-15

Family

ID=26154885

Family Applications (1)

Application Number Title Priority Date Filing Date
AT96500055T ATE258680T1 (de) 1995-05-09 1996-05-08 Quantatives mikroanalyseverfahren mit röntgenstrahlen für metallegierungen

Country Status (4)

Country Link
EP (1) EP0742434B1 (de)
AT (1) ATE258680T1 (de)
DE (1) DE69631395T2 (de)
PT (1) PT742434E (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010112744A (ko) * 2000-06-15 2001-12-22 권수식 합금화 용융아연도금강판의 합금화도 측정방법
JP6009963B2 (ja) * 2013-02-14 2016-10-19 日本電子株式会社 試料分析方法および試料分析装置
JP6033716B2 (ja) * 2013-03-18 2016-11-30 新日鐵住金株式会社 金属内の異物弁別方法
CN104122283A (zh) * 2014-08-01 2014-10-29 桂林理工大学 一种基于电子探针原位分析的全岩组份测试方法
JP6336881B2 (ja) * 2014-10-20 2018-06-06 日本電子株式会社 散布図表示装置、散布図表示方法、および表面分析装置
KR101639130B1 (ko) * 2014-10-23 2016-07-22 현대제철 주식회사 강 중 구성 원소의 epma 분석 방법
RU2597935C1 (ru) * 2015-06-17 2016-09-20 Федеральное государственное бюджетное учреждение науки Ордена Трудового Красного Знамени Институт нефтехимического синтеза им. А.В. Топчиева Российской академии наук (ИНХС РАН) Способ определения состава твердого раствора
CN110954448A (zh) * 2019-12-11 2020-04-03 中国建材检验认证集团股份有限公司 定量测定物理混合物的组成及其含量的方法、装置和系统
CN110987993A (zh) * 2019-12-17 2020-04-10 中国地质大学(武汉) 一种原位有机质定量统计分析方法
CN111678937B (zh) * 2020-05-21 2023-05-09 首钢集团有限公司 一种确定钢中微观偏析比取值范围的图像方法
CN113138204A (zh) * 2021-04-13 2021-07-20 武汉理工大学 适用于电子探针分析的n-标样的制备方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU890182A1 (ru) * 1980-04-01 1981-12-15 Березниковский филиал Всесоюзного научно-исследовательского и проектного института титана Способ рентгенорадиометрического анализа неоднородных сплавов или лигатур
SU1670551A1 (ru) * 1988-06-15 1991-08-15 Институт нефте- и углехимического синтеза при Иркутском государственном университете Способ проверки качества предварительной аттестации стандартных образцов сплавов
JP2853261B2 (ja) * 1989-05-16 1999-02-03 三菱マテリアル株式会社 金属分析方法および分析装置
JP2759680B2 (ja) * 1989-07-19 1998-05-28 株式会社日立製作所 分析システム

Also Published As

Publication number Publication date
PT742434E (pt) 2004-06-30
DE69631395D1 (de) 2004-03-04
EP0742434B1 (de) 2004-01-28
DE69631395T2 (de) 2004-11-04
EP0742434A1 (de) 1996-11-13

Similar Documents

Publication Publication Date Title
EP0400396A3 (de) Vorrichtung und Verfahren zur Metallanalyse
ATE258680T1 (de) Quantatives mikroanalyseverfahren mit röntgenstrahlen für metallegierungen
Potts et al. Analysis of silicate rocks using field-portable X-ray fluorescence instrumentation incorporating a mercury (II) iodide detector: a preliminary assessment of analytical performance
Seah et al. Quantitative XPS: The calibration of spectrometer intensity—energy response functions. 2—Results of interlaboratory measurements for commercial instruments
WO2002063286A3 (en) X-ray fluorescence analyzer
Fierascu et al. Complex archaeometallurgical investigation of silver coins from the XVIth-XVIIIth century
Ja The use of a glow-discharge lamp as a light source in the spectrometric analysis of gold
Cumpson et al. Stability of reference masses I: Evidence for possible variations in the mass of reference kilograms arising from mercury contamination
Manninen et al. Determination of the effective atomic number using elastic and inelastic scattering of γ-rays
Krummenauer et al. Portable EDXRF spectrometer: determination of linearity, LOD, LOQ, and working range for the analysis of base and precious metals in liquid matrices
JP2018163069A (ja) Epma定量分析方法
Jalas et al. XRF analysis of jewelry using fully standardless fundamental parameter approach
Blum et al. The evaluation of the use of a scanning electron microscope combined with an energy dispersive X‐ray analyser for quantitative analysis
Willich et al. Quantitative electron microprobe determination of oxygen in metal layers covered by surface oxide films
Newbury Microbeam analysis of samples of unusual shape
Webb et al. Semi-quantitative analysis by means of the laser microprobe
Hurley et al. Quantitative energy‐dispersive X‐ray analysis using relative k‐ratios
Romanov Mathematical Assessment of Combined Standard Uncertainty of Measurements in Using Concentration Ratio Calibration in Inductively Coupled Plasma Atomic Emission Spectrometry
Ariga et al. Quantification of elemental area densities in multiple metal layers (Au/Ni/Cu) on a Cr-coated quartz glass substrate for certification of NMIJ CRM 5208-a
ES2114490A1 (es) Metodo para el microanalisis cuantitativo de rayos x de aleaciones metalicas basado en un conjunto de muestras patron de la aleacion y un modelo matematico de ajuste.
Sawley et al. X-ray microanalysis of thin foil Al-Ag alloys
Elliott et al. Quantitative Determination of Impurities in Solids by Mass Spectrometry
Mansour Use of ZAF and PAP matrix correction models for the determination of carbon in steels by electron probe microanalysis
MASLIANA et al. REDUCING MATRIX EFFECT ERROR IN EDXRF: COMPARATIVE STUDY OF USING STANDARD AND STANDARDLESS METHODS FOR STAINLESS STEEL SAMPLES
Arana et al. Bronze analysis by k 0-NAA and PIXE

Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification

Ref document number: 0742434

Country of ref document: EP

REN Ceased due to non-payment of the annual fee