PT742434E - Metodo de microanalise quatitativa por raios x para ligas metalicas - Google Patents

Metodo de microanalise quatitativa por raios x para ligas metalicas

Info

Publication number
PT742434E
PT742434E PT96500055T PT96500055T PT742434E PT 742434 E PT742434 E PT 742434E PT 96500055 T PT96500055 T PT 96500055T PT 96500055 T PT96500055 T PT 96500055T PT 742434 E PT742434 E PT 742434E
Authority
PT
Portugal
Prior art keywords
sem
intensities
microanalysis
epma
ray
Prior art date
Application number
PT96500055T
Other languages
English (en)
Inventor
Ignacio Fernandez D Valderrama
Jaime Botella Arboledas
Juan Francisco Almagro Bello
Original Assignee
Acerinox Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from ES9500880A external-priority patent/ES2114439B1/es
Priority claimed from ES9601013A external-priority patent/ES2114490B1/es
Application filed by Acerinox Sa filed Critical Acerinox Sa
Publication of PT742434E publication Critical patent/PT742434E/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20091—Measuring the energy-dispersion spectrum [EDS] of diffracted radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • G01N23/2252—Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
PT96500055T 1995-05-09 1996-05-08 Metodo de microanalise quatitativa por raios x para ligas metalicas PT742434E (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
ES9500880A ES2114439B1 (es) 1995-05-09 1995-05-09 Dispositivo que contiene un conjunto de muestras patron de aceros para el microanalisis cuantitativo de aleaciones metalicas de base hierro.
ES9601013A ES2114490B1 (es) 1996-05-07 1996-05-07 Metodo para el microanalisis cuantitativo de rayos x de aleaciones metalicas basado en un conjunto de muestras patron de la aleacion y un modelo matematico de ajuste.

Publications (1)

Publication Number Publication Date
PT742434E true PT742434E (pt) 2004-06-30

Family

ID=26154885

Family Applications (1)

Application Number Title Priority Date Filing Date
PT96500055T PT742434E (pt) 1995-05-09 1996-05-08 Metodo de microanalise quatitativa por raios x para ligas metalicas

Country Status (4)

Country Link
EP (1) EP0742434B1 (pt)
AT (1) ATE258680T1 (pt)
DE (1) DE69631395T2 (pt)
PT (1) PT742434E (pt)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010112744A (ko) * 2000-06-15 2001-12-22 권수식 합금화 용융아연도금강판의 합금화도 측정방법
JP6009963B2 (ja) * 2013-02-14 2016-10-19 日本電子株式会社 試料分析方法および試料分析装置
JP6033716B2 (ja) * 2013-03-18 2016-11-30 新日鐵住金株式会社 金属内の異物弁別方法
CN104122283A (zh) * 2014-08-01 2014-10-29 桂林理工大学 一种基于电子探针原位分析的全岩组份测试方法
JP6336881B2 (ja) * 2014-10-20 2018-06-06 日本電子株式会社 散布図表示装置、散布図表示方法、および表面分析装置
KR101639130B1 (ko) * 2014-10-23 2016-07-22 현대제철 주식회사 강 중 구성 원소의 epma 분석 방법
RU2597935C1 (ru) * 2015-06-17 2016-09-20 Федеральное государственное бюджетное учреждение науки Ордена Трудового Красного Знамени Институт нефтехимического синтеза им. А.В. Топчиева Российской академии наук (ИНХС РАН) Способ определения состава твердого раствора
CN110954448A (zh) * 2019-12-11 2020-04-03 中国建材检验认证集团股份有限公司 定量测定物理混合物的组成及其含量的方法、装置和系统
CN110987993A (zh) * 2019-12-17 2020-04-10 中国地质大学（武汉） 一种原位有机质定量统计分析方法
CN111678937B (zh) * 2020-05-21 2023-05-09 首钢集团有限公司 一种确定钢中微观偏析比取值范围的图像方法
CN113138204B (zh) * 2021-04-13 2024-07-09 武汉理工大学 适用于电子探针分析的n-标样的制备方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU890182A1 (ru) * 1980-04-01 1981-12-15 Березниковский филиал Всесоюзного научно-исследовательского и проектного института титана Способ рентгенорадиометрического анализа неоднородных сплавов или лигатур
SU1670551A1 (ru) * 1988-06-15 1991-08-15 Институт нефте- и углехимического синтеза при Иркутском государственном университете Способ проверки качества предварительной аттестации стандартных образцов сплавов
JP2853261B2 (ja) * 1989-05-16 1999-02-03 三菱マテリアル株式会社 金属分析方法および分析装置
JP2759680B2 (ja) * 1989-07-19 1998-05-28 株式会社日立製作所 分析システム

Also Published As

Publication number Publication date
DE69631395T2 (de) 2004-11-04
EP0742434A1 (en) 1996-11-13
ATE258680T1 (de) 2004-02-15
DE69631395D1 (de) 2004-03-04
EP0742434B1 (en) 2004-01-28

Similar Documents

Publication Publication Date Title
Orfanou et al. A (not so) dangerous method: pXRF vs. EPMA-WDS analyses of copper-based artefacts
PT742434E (pt) Metodo de microanalise quatitativa por raios x para ligas metalicas
EP0400396A3 (en) Metals assay apparatus and method
Potts et al. Analysis of silicate rocks using field-portable X-ray fluorescence instrumentation incorporating a mercury (II) iodide detector: a preliminary assessment of analytical performance
Boekestein et al. Surface roughness and the use of a peak to background ratio in the X‐ray microanalysis of bio‐organic bulk specimens
Gusarova et al. Comparison of different calibration strategies for the analysis of zinc and other pure metals by using the GD-MS instruments VG 9000 and Element GD
Krummenauer et al. Portable EDXRF spectrometer: determination of linearity, LOD, LOQ, and working range for the analysis of base and precious metals in liquid matrices
JP2018163069A (ja) Ｅｐｍａ定量分析方法
Kipphardt et al. Purity determination as needed for the realisation of primary standards for elemental determination: status of international comparability
Blum et al. The evaluation of the use of a scanning electron microscope combined with an energy dispersive X‐ray analyser for quantitative analysis
Ekinci et al. Determination of iodine and calcium concentrations in the bread improver using EDXRF
Lankosz et al. Research in quantitative microscopic X-ray fluorescence analysis
DE102007039000B4 (de) Verfahren für die Probenpräparation flüssiger oder pastöser Stoffe zur Messung mittels Röntgenfluoreszenz und dafür geeigneter Probenkörper
Reske et al. Non-destructive analysis of drug content in polymer coatings with Raman spectroscopy
Newbury Microbeam analysis of samples of unusual shape
ES2114439A1 (es) Dispositivo que contiene un conjunto de muestras patron de aceros para el microanalisis cuantitativo de aleaciones metalicas de base hierro.
Ekinci et al. Energy dispersive X-ray fluorescence spectrometry in the detection of Ikizdere ore concentrates
ES2114490A1 (es) Metodo para el microanalisis cuantitativo de rayos x de aleaciones metalicas basado en un conjunto de muestras patron de la aleacion y un modelo matematico de ajuste.
Amr et al. Quantification of heavy metals in clays by dry plasma laser ablation-ICP-MS
Herrera-Basurto et al. Method validation for chemical composition determination by electron microprobe with wavelength dispersive spectrometer
Wollein et al. X‐ray mapping of microstructures in hardmetals and cermets
le Sage et al. Concerning the obtaining of effective influence coefficients for X‐ray spectrometric analysis
Fernandes et al. Metal distributions in human hair strand cross-section: Advanced analysis using LA-ICP-MS in dentistry
Arana et al. Bronze analysis by k 0-NAA and PIXE
Kuharic et al. FPXRF, EDXRF and ICP comparison of Pb contaminated soils from Leadville, Colorado