DE69621280T2 - Speichergerätschaltkreis und Verfahren zur gleichzeitigen Adressierung der Spalten einer Vielzahl von Banken einer Vielzahlbankspeicheranordnung - Google Patents
Speichergerätschaltkreis und Verfahren zur gleichzeitigen Adressierung der Spalten einer Vielzahl von Banken einer VielzahlbankspeicheranordnungInfo
- Publication number
- DE69621280T2 DE69621280T2 DE69621280T DE69621280T DE69621280T2 DE 69621280 T2 DE69621280 T2 DE 69621280T2 DE 69621280 T DE69621280 T DE 69621280T DE 69621280 T DE69621280 T DE 69621280T DE 69621280 T2 DE69621280 T2 DE 69621280T2
- Authority
- DE
- Germany
- Prior art keywords
- banks
- columns
- device circuitry
- memory device
- simultaneously addressing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000003491 array Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/12—Group selection circuits, e.g. for memory block selection, chip selection, array selection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/26—Accessing multiple arrays
- G11C29/28—Dependent multiple arrays, e.g. multi-bit arrays
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Dram (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/419,909 US5671392A (en) | 1995-04-11 | 1995-04-11 | Memory device circuit and method for concurrently addressing columns of multiple banks of multi-bank memory array |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69621280D1 DE69621280D1 (de) | 2002-06-27 |
DE69621280T2 true DE69621280T2 (de) | 2002-10-02 |
Family
ID=23664256
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69621280T Expired - Fee Related DE69621280T2 (de) | 1995-04-11 | 1996-01-04 | Speichergerätschaltkreis und Verfahren zur gleichzeitigen Adressierung der Spalten einer Vielzahl von Banken einer Vielzahlbankspeicheranordnung |
Country Status (5)
Country | Link |
---|---|
US (1) | US5671392A (de) |
EP (1) | EP0737981B1 (de) |
JP (1) | JPH09147551A (de) |
KR (1) | KR100386442B1 (de) |
DE (1) | DE69621280T2 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102004060644B4 (de) * | 2003-12-16 | 2014-02-06 | Qimonda Ag | Direktzugriffsspeicher, Speichersteuerung und Verfahren unter Verwendung von Vorladezeitgebern in einem Testmodus |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6330644B1 (en) * | 1994-10-27 | 2001-12-11 | Canon Kabushiki Kaisha | Signal processor with a plurality of kinds of processors and a shared memory accessed through a versatile control means |
US5996106A (en) | 1997-02-04 | 1999-11-30 | Micron Technology, Inc. | Multi bank test mode for memory devices |
JPH10275460A (ja) * | 1997-04-01 | 1998-10-13 | Sega Enterp Ltd | メモリ装置及びこれを用いた画像処理装置 |
US5996051A (en) * | 1997-04-14 | 1999-11-30 | Advanced Micro Devices, Inc. | Communication system which in a first mode supports concurrent memory acceses of a partitioned memory array and in a second mode supports non-concurrent memory accesses to the entire memory array |
US5913928A (en) | 1997-05-09 | 1999-06-22 | Micron Technology, Inc. | Data compression test mode independent of redundancy |
US5959911A (en) * | 1997-09-29 | 1999-09-28 | Siemens Aktiengesellschaft | Apparatus and method for implementing a bank interlock scheme and related test mode for multibank memory devices |
GB2381103B (en) | 1997-12-17 | 2003-06-04 | Fujitsu Ltd | Memory access methods and devices for use with random access memories |
JPH11283395A (ja) * | 1998-03-30 | 1999-10-15 | Toshiba Microelectronics Corp | 半導体記憶装置 |
US6088293A (en) * | 1998-09-08 | 2000-07-11 | Texas Instruments Incorporated | Low-power column decode circuit |
KR100517544B1 (ko) * | 1999-01-20 | 2005-09-28 | 삼성전자주식회사 | 멀티-뱅크 플래시 메모리 장치 |
KR100331284B1 (ko) * | 1999-12-29 | 2002-04-06 | 박종섭 | 병렬테스트회로를 갖는 메모리장치 |
US7302621B2 (en) * | 2000-01-03 | 2007-11-27 | Icoding Technology, Inc. | High spread highly randomized generatable interleavers |
US6775800B2 (en) * | 2000-01-03 | 2004-08-10 | Icoding Technology, Inc. | System and method for high speed processing of turbo codes |
US6320803B1 (en) * | 2000-03-23 | 2001-11-20 | Infineon Technologies Ac | Method and apparatus for improving the testing, yield and performance of very large scale integrated circuits |
US6965527B2 (en) * | 2002-11-27 | 2005-11-15 | Matrix Semiconductor, Inc | Multibank memory on a die |
KR100558552B1 (ko) | 2003-12-30 | 2006-03-10 | 삼성전자주식회사 | 반도체 메모리장치의 데이터 억세스회로 |
KR100576454B1 (ko) * | 2004-03-22 | 2006-05-08 | 주식회사 하이닉스반도체 | 뱅크 선택이 가능한 병렬 테스트 회로 및 그 병렬 테스트방법 |
KR100618696B1 (ko) * | 2004-04-28 | 2006-09-08 | 주식회사 하이닉스반도체 | 인식 정보를 갖는 메모리 장치 |
KR100781973B1 (ko) * | 2006-05-08 | 2007-12-06 | 삼성전자주식회사 | 반도체 메모리 장치 및 그의 테스트 방법 |
JP2008065862A (ja) * | 2006-09-04 | 2008-03-21 | System Fabrication Technologies Inc | 半導体記憶装置 |
US7631233B2 (en) * | 2007-10-07 | 2009-12-08 | United Memories, Inc. | Data inversion register technique for integrated circuit memory testing |
US7944773B2 (en) * | 2008-04-30 | 2011-05-17 | Micron Technology, Inc. | Synchronous command-based write recovery time auto-precharge control |
US8171234B2 (en) | 2009-03-16 | 2012-05-01 | Mosys, Inc. | Multi-bank multi-port architecture |
US20110228620A1 (en) * | 2010-03-22 | 2011-09-22 | Elite Semiconductor Memory Technology Inc. | Testing method for semiconductor memory device |
JP5954498B2 (ja) * | 2013-07-29 | 2016-07-20 | 富士通株式会社 | 半導体記憶装置、及び、半導体記憶装置の試験方法 |
WO2016125202A1 (en) | 2015-02-04 | 2016-08-11 | Renesas Electronics Corporation | Data transfer apparatus |
WO2018044391A1 (en) | 2016-09-02 | 2018-03-08 | Rambus Inc. | Memory component with input/output data rate alignment |
US11449250B2 (en) | 2019-10-14 | 2022-09-20 | Micron Technology, Inc. | Managing a mode to access a memory component or a logic component for machine learning computation in a memory sub-system |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60115099A (ja) * | 1983-11-25 | 1985-06-21 | Fujitsu Ltd | 半導体記憶装置 |
US4598388A (en) * | 1985-01-22 | 1986-07-01 | Texas Instruments Incorporated | Semiconductor memory with redundant column circuitry |
JPS6212991A (ja) * | 1985-07-10 | 1987-01-21 | Fujitsu Ltd | 半導体記憶装置 |
JP3532932B2 (ja) * | 1991-05-20 | 2004-05-31 | モトローラ・インコーポレイテッド | 時間重複メモリ・アクセスを有するランダムにアクセス可能なメモリ |
JPH0792790B2 (ja) * | 1992-11-18 | 1995-10-09 | 野木 達夫 | ベクトル並列計算機 |
US5386385A (en) * | 1994-01-31 | 1995-01-31 | Texas Instruments Inc. | Method and apparatus for preventing invalid operating modes and an application to synchronous memory devices |
-
1995
- 1995-04-11 US US08/419,909 patent/US5671392A/en not_active Expired - Lifetime
-
1996
- 1996-01-04 EP EP96630001A patent/EP0737981B1/de not_active Expired - Lifetime
- 1996-01-04 DE DE69621280T patent/DE69621280T2/de not_active Expired - Fee Related
- 1996-04-05 JP JP8084238A patent/JPH09147551A/ja active Pending
- 1996-04-09 KR KR1019960010668A patent/KR100386442B1/ko not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102004060644B4 (de) * | 2003-12-16 | 2014-02-06 | Qimonda Ag | Direktzugriffsspeicher, Speichersteuerung und Verfahren unter Verwendung von Vorladezeitgebern in einem Testmodus |
Also Published As
Publication number | Publication date |
---|---|
US5671392A (en) | 1997-09-23 |
KR100386442B1 (ko) | 2003-08-14 |
DE69621280D1 (de) | 2002-06-27 |
EP0737981A2 (de) | 1996-10-16 |
JPH09147551A (ja) | 1997-06-06 |
EP0737981B1 (de) | 2002-05-22 |
EP0737981A3 (de) | 1997-07-30 |
KR960038618A (ko) | 1996-11-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: PROMOS TECHNOLOGIES, INC., HSINCHU, TW |
|
8339 | Ceased/non-payment of the annual fee |