DE69536005D1 - Einrichtung zum behandeln flacher elemente mit einem plasmajet - Google Patents

Einrichtung zum behandeln flacher elemente mit einem plasmajet

Info

Publication number
DE69536005D1
DE69536005D1 DE69536005T DE69536005T DE69536005D1 DE 69536005 D1 DE69536005 D1 DE 69536005D1 DE 69536005 T DE69536005 T DE 69536005T DE 69536005 T DE69536005 T DE 69536005T DE 69536005 D1 DE69536005 D1 DE 69536005D1
Authority
DE
Germany
Prior art keywords
plasmajet
flat elements
treating flat
treating
elements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69536005T
Other languages
English (en)
Inventor
Iskander Malikovich Tokmulin
Igor Petrovich Bagry
Boris Mikhailovich Balats
Oleg Vyacheslavovich Sinyagin
Aleksei Borisovich Virovets
Vyacheslav Gennadie Shamshurin
Aleksandr Mikhailovich Antropov
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Application granted granted Critical
Publication of DE69536005D1 publication Critical patent/DE69536005D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/3065—Plasma etching; Reactive-ion etching
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67745—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber characterized by movements or sequence of movements of transfer devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Plasma & Fusion (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Drying Of Semiconductors (AREA)
  • Plasma Technology (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
DE69536005T 1995-01-13 1995-04-11 Einrichtung zum behandeln flacher elemente mit einem plasmajet Expired - Lifetime DE69536005D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
RU9595100180A RU2075135C1 (ru) 1995-01-13 1995-01-13 Установка для плазмоструйной обработки пластин
PCT/RU1995/000063 WO1996021943A1 (fr) 1995-01-13 1995-04-11 Dispositif de traitement d'elements plans au moyen d'un jet de plasma

Publications (1)

Publication Number Publication Date
DE69536005D1 true DE69536005D1 (de) 2009-10-29

Family

ID=20163778

Family Applications (2)

Application Number Title Priority Date Filing Date
DE0807964T Pending DE807964T1 (de) 1995-01-13 1995-04-11 Einrichtung zum behandeln flacher elemente mit einem plasmajet
DE69536005T Expired - Lifetime DE69536005D1 (de) 1995-01-13 1995-04-11 Einrichtung zum behandeln flacher elemente mit einem plasmajet

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE0807964T Pending DE807964T1 (de) 1995-01-13 1995-04-11 Einrichtung zum behandeln flacher elemente mit einem plasmajet

Country Status (7)

Country Link
US (1) US6845733B1 (de)
EP (1) EP0807964B1 (de)
JP (1) JP3568958B2 (de)
KR (1) KR100322524B1 (de)
DE (2) DE807964T1 (de)
RU (1) RU2075135C1 (de)
WO (1) WO1996021943A1 (de)

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US6882030B2 (en) 1996-10-29 2005-04-19 Tru-Si Technologies, Inc. Integrated circuit structures with a conductor formed in a through hole in a semiconductor substrate and protruding from a surface of the substrate
EP0948808A4 (de) 1996-10-29 2000-05-10 Trusi Technologies Llc Integrierte schaltungen und verfahren zur herstellung
US6498074B2 (en) 1996-10-29 2002-12-24 Tru-Si Technologies, Inc. Thinning and dicing of semiconductor wafers using dry etch, and obtaining semiconductor chips with rounded bottom edges and corners
US5767627A (en) * 1997-01-09 1998-06-16 Trusi Technologies, Llc Plasma generation and plasma processing of materials
US6183183B1 (en) 1997-01-16 2001-02-06 Asm America, Inc. Dual arm linear hand-off wafer transfer assembly
US6139678A (en) 1997-11-20 2000-10-31 Trusi Technologies, Llc Plasma processing methods and apparatus
US6168697B1 (en) * 1998-03-10 2001-01-02 Trusi Technologies Llc Holders suitable to hold articles during processing and article processing methods
US6095582A (en) * 1998-03-11 2000-08-01 Trusi Technologies, Llc Article holders and holding methods
US6318957B1 (en) * 1998-07-10 2001-11-20 Asm America, Inc. Method for handling of wafers with minimal contact
US6287976B1 (en) 1999-05-19 2001-09-11 Tru-Si Technologies, Inc. Plasma processing methods and apparatus
US6467297B1 (en) 2000-10-12 2002-10-22 Jetek, Inc. Wafer holder for rotating and translating wafers
US6322903B1 (en) 1999-12-06 2001-11-27 Tru-Si Technologies, Inc. Package of integrated circuits and vertical integration
US6631935B1 (en) 2000-08-04 2003-10-14 Tru-Si Technologies, Inc. Detection and handling of semiconductor wafer and wafer-like objects
US6423923B1 (en) 2000-08-04 2002-07-23 Tru-Si Technologies, Inc. Monitoring and controlling separate plasma jets to achieve desired properties in a combined stream
US6534921B1 (en) 2000-11-09 2003-03-18 Samsung Electronics Co., Ltd. Method for removing residual metal-containing polymer material and ion implanted photoresist in atmospheric downstream plasma jet system
US6749764B1 (en) * 2000-11-14 2004-06-15 Tru-Si Technologies, Inc. Plasma processing comprising three rotational motions of an article being processed
EP1233442B1 (de) 2001-02-20 2009-10-14 Harmotec Corporation Kontaktlose Transportvorrichtung
US6717254B2 (en) 2001-02-22 2004-04-06 Tru-Si Technologies, Inc. Devices having substrates with opening passing through the substrates and conductors in the openings, and methods of manufacture
US6787916B2 (en) 2001-09-13 2004-09-07 Tru-Si Technologies, Inc. Structures having a substrate with a cavity and having an integrated circuit bonded to a contact pad located in the cavity
US6848177B2 (en) 2002-03-28 2005-02-01 Intel Corporation Integrated circuit die and an electronic assembly having a three-dimensional interconnection scheme
KR100464856B1 (ko) * 2002-11-07 2005-01-05 삼성전자주식회사 표면 식각 방법 및 실리콘 기판 이면 식각 방법.
US20070050128A1 (en) * 2005-08-31 2007-03-01 Garmin Ltd., A Cayman Islands Corporation Method and system for off-board navigation with a portable device
CN105364621B (zh) * 2015-11-20 2018-07-24 广东天机工业智能系统有限公司 智能机器手
RU2620452C1 (ru) * 2016-07-15 2017-05-25 Общество с ограниченной ответственностью "НТЦ тонкопленочных технологий в энергетике", ООО "НТЦ ТПТ" Способ и устройство переворота подложек в процессе производства фотопреобразователей

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US3278796A (en) * 1962-06-15 1966-10-11 Hitachi Ltd Magnetically controllable plasma flame generator
US4222345A (en) * 1978-11-30 1980-09-16 Optical Coating Laboratory, Inc. Vacuum coating apparatus with rotary motion assembly
JPS55134175A (en) * 1979-04-06 1980-10-18 Hitachi Ltd Microwave plasma etching unit
DE3027934A1 (de) * 1980-07-23 1982-02-25 Siemens AG, 1000 Berlin und 8000 München Verfahren zur einseitigen aetzung von halbleiterscheiben
US4343830A (en) * 1980-11-13 1982-08-10 Motorola, Inc. Method for improving the efficiency of solar cells having imperfections
US4392915A (en) * 1982-02-16 1983-07-12 Eaton Corporation Wafer support system
DE3811068C2 (de) * 1988-03-31 1995-07-20 Telefunken Microelectron Vorrichtung zum einseitigen Bearbeiten von flächenhaft ausgedehnten Körpern, insbesondere von Halbleiterscheiben
JP2865690B2 (ja) * 1989-02-17 1999-03-08 株式会社日立製作所 嵌合挿入装置
JPH02312256A (ja) * 1989-05-26 1990-12-27 Sumitomo Metal Ind Ltd ウエハ保持装置
DE4025659A1 (de) * 1990-08-14 1992-02-20 Leybold Ag Umlaufraedergetriebe mit einem raedersatz, insbesondere fuer vorrichtungen zum beschichten von substraten
JPH04124092A (ja) * 1990-09-14 1992-04-24 Hitachi Chem Co Ltd ダイヤモンドの気相合成方法およびその装置
JPH0757873B2 (ja) 1990-09-20 1995-06-21 宇部興産株式会社 スラリの加熱蒸発装置
US5204145A (en) * 1991-03-04 1993-04-20 General Electric Company Apparatus for producing diamonds by chemical vapor deposition and articles produced therefrom
JPH05179428A (ja) * 1991-05-23 1993-07-20 Matsushita Electric Ind Co Ltd 薄膜形成装置
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JPH0533534A (ja) 1991-05-31 1993-02-09 Alpha:Kk シリンダ錠
JPH0538569A (ja) 1991-08-02 1993-02-19 Canon Inc 印刷配線板の自動はんだ付け装置
JPH0533534U (ja) * 1991-10-04 1993-04-30 住友金属工業株式会社 試料保持装置
JPH05138569A (ja) * 1991-11-13 1993-06-01 Hiroshi Akashi 無接触プレス
US5308461A (en) * 1992-01-14 1994-05-03 Honeywell Inc. Method to deposit multilayer films
JP3203754B2 (ja) * 1992-03-30 2001-08-27 住友電気工業株式会社 ダイヤモンドの製造法および製造装置
US5273588A (en) * 1992-06-15 1993-12-28 Materials Research Corporation Semiconductor wafer processing CVD reactor apparatus comprising contoured electrode gas directing means
US5820686A (en) * 1993-01-21 1998-10-13 Moore Epitaxial, Inc. Multi-layer susceptor for rapid thermal process reactors
US5613821A (en) * 1995-07-06 1997-03-25 Brooks Automation, Inc. Cluster tool batchloader of substrate carrier
US5708556A (en) * 1995-07-10 1998-01-13 Watkins Johnson Company Electrostatic chuck assembly
US5886864A (en) * 1996-12-02 1999-03-23 Applied Materials, Inc. Substrate support member for uniform heating of a substrate
US6139678A (en) * 1997-11-20 2000-10-31 Trusi Technologies, Llc Plasma processing methods and apparatus
US6168697B1 (en) * 1998-03-10 2001-01-02 Trusi Technologies Llc Holders suitable to hold articles during processing and article processing methods
US6467297B1 (en) * 2000-10-12 2002-10-22 Jetek, Inc. Wafer holder for rotating and translating wafers

Also Published As

Publication number Publication date
JPH11502049A (ja) 1999-02-16
WO1996021943A1 (fr) 1996-07-18
EP0807964B1 (de) 2009-09-16
EP0807964A4 (de) 2002-05-22
KR19980701318A (ko) 1998-05-15
RU95100180A (ru) 1996-10-27
RU2075135C1 (ru) 1997-03-10
JP3568958B2 (ja) 2004-09-22
EP0807964A1 (de) 1997-11-19
DE807964T1 (de) 1998-03-12
KR100322524B1 (ko) 2002-07-03
US6845733B1 (en) 2005-01-25

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Legal Events

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