DE69523940D1 - Plasmakontrollgerät für grosse werkstücke - Google Patents

Plasmakontrollgerät für grosse werkstücke

Info

Publication number
DE69523940D1
DE69523940D1 DE69523940T DE69523940T DE69523940D1 DE 69523940 D1 DE69523940 D1 DE 69523940D1 DE 69523940 T DE69523940 T DE 69523940T DE 69523940 T DE69523940 T DE 69523940T DE 69523940 D1 DE69523940 D1 DE 69523940D1
Authority
DE
Germany
Prior art keywords
control unit
plasma control
large workpieces
workpieces
plasma
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69523940T
Other languages
English (en)
Other versions
DE69523940T2 (de
Inventor
Michael Barnes
Neil Benjamin
John Holland
Richard Beer
Robert Veltrop
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lam Research Corp
Original Assignee
Lam Research Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lam Research Corp filed Critical Lam Research Corp
Application granted granted Critical
Publication of DE69523940D1 publication Critical patent/DE69523940D1/de
Publication of DE69523940T2 publication Critical patent/DE69523940T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32192—Microwave generated discharge
    • H01J37/32211—Means for coupling power to the plasma
    • H01J37/3222—Antennas
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082—Radio frequency generated discharge
    • H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32192—Microwave generated discharge
    • H01J37/32211—Means for coupling power to the plasma
    • H01J37/32238—Windows

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Plasma Technology (AREA)
  • Chemical Vapour Deposition (AREA)
  • Drying Of Semiconductors (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)
DE69523940T 1994-12-06 1995-12-05 Plasmakontrollgerät für grosse werkstücke Expired - Lifetime DE69523940T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/354,122 US5589737A (en) 1994-12-06 1994-12-06 Plasma processor for large workpieces
PCT/US1995/015753 WO1996018208A1 (en) 1994-12-06 1995-12-05 Plasma processor for large workpieces

Publications (2)

Publication Number Publication Date
DE69523940D1 true DE69523940D1 (de) 2001-12-20
DE69523940T2 DE69523940T2 (de) 2002-04-04

Family

ID=23391956

Family Applications (2)

Application Number Title Priority Date Filing Date
DE69535922T Expired - Lifetime DE69535922D1 (de) 1994-12-06 1995-12-05 Plasmakontrollgerät für grosse Werkstücke
DE69523940T Expired - Lifetime DE69523940T2 (de) 1994-12-06 1995-12-05 Plasmakontrollgerät für grosse werkstücke

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE69535922T Expired - Lifetime DE69535922D1 (de) 1994-12-06 1995-12-05 Plasmakontrollgerät für grosse Werkstücke

Country Status (11)

Country Link
US (1) US5589737A (de)
EP (2) EP0929093B1 (de)
JP (2) JP2001511945A (de)
KR (1) KR100645283B1 (de)
CN (2) CN1090807C (de)
AU (1) AU4373796A (de)
CA (1) CA2206679C (de)
DE (2) DE69535922D1 (de)
ES (1) ES2163537T3 (de)
TW (1) TW347549B (de)
WO (1) WO1996018208A1 (de)

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US6534922B2 (en) 1996-09-27 2003-03-18 Surface Technology Systems, Plc Plasma processing apparatus
KR100505176B1 (ko) * 1996-09-27 2005-10-10 서페이스 테크놀로지 시스템스 피엘씨 플라즈마가공장치
GB9714142D0 (en) * 1997-07-05 1997-09-10 Surface Tech Sys Ltd An arrangement for the feeding of RF power to one or more antennae
US6835279B2 (en) * 1997-07-30 2004-12-28 Hitachi Kokusai Electric Inc. Plasma generation apparatus
US6028395A (en) * 1997-09-16 2000-02-22 Lam Research Corporation Vacuum plasma processor having coil with added conducting segments to its peripheral part
US6028285A (en) * 1997-11-19 2000-02-22 Board Of Regents, The University Of Texas System High density plasma source for semiconductor processing
JP3129265B2 (ja) * 1997-11-28 2001-01-29 日新電機株式会社 薄膜形成装置
JPH11317299A (ja) * 1998-02-17 1999-11-16 Toshiba Corp 高周波放電方法及びその装置並びに高周波処理装置
US5944942A (en) * 1998-03-04 1999-08-31 Ogle; John Seldon Varying multipole plasma source
US6155199A (en) * 1998-03-31 2000-12-05 Lam Research Corporation Parallel-antenna transformer-coupled plasma generation system
JP2961103B1 (ja) 1998-04-28 1999-10-12 三菱重工業株式会社 プラズマ化学蒸着装置
US6204607B1 (en) 1998-05-28 2001-03-20 Applied Komatsu Technology, Inc. Plasma source with multiple magnetic flux sources each having a ferromagnetic core
US6164241A (en) * 1998-06-30 2000-12-26 Lam Research Corporation Multiple coil antenna for inductively-coupled plasma generation systems
US6074953A (en) * 1998-08-28 2000-06-13 Micron Technology, Inc. Dual-source plasma etchers, dual-source plasma etching methods, and methods of forming planar coil dual-source plasma etchers
GB2344930B (en) * 1998-12-17 2003-10-01 Trikon Holdings Ltd Inductive coil assembly
US6474258B2 (en) 1999-03-26 2002-11-05 Tokyo Electron Limited Apparatus and method for improving plasma distribution and performance in an inductively coupled plasma
US6237526B1 (en) 1999-03-26 2001-05-29 Tokyo Electron Limited Process apparatus and method for improving plasma distribution and performance in an inductively coupled plasma
US6331754B1 (en) 1999-05-13 2001-12-18 Tokyo Electron Limited Inductively-coupled-plasma-processing apparatus
US6228438B1 (en) * 1999-08-10 2001-05-08 Unakis Balzers Aktiengesellschaft Plasma reactor for the treatment of large size substrates
DE19955671B4 (de) * 1999-11-19 2004-07-22 Muegge Electronic Gmbh Vorrichtung zur Erzeugung von Plasma
US6772827B2 (en) * 2000-01-20 2004-08-10 Applied Materials, Inc. Suspended gas distribution manifold for plasma chamber
US6494998B1 (en) 2000-08-30 2002-12-17 Tokyo Electron Limited Process apparatus and method for improving plasma distribution and performance in an inductively coupled plasma using an internal inductive element
US6568896B2 (en) * 2001-03-21 2003-05-27 Applied Materials, Inc. Transfer chamber with side wall port
WO2002097937A1 (en) * 2001-03-23 2002-12-05 Tokyo Electron Limited Inductively coupled high-density plasma source
US6583572B2 (en) 2001-03-30 2003-06-24 Lam Research Corporation Inductive plasma processor including current sensor for plasma excitation coil
US7096819B2 (en) * 2001-03-30 2006-08-29 Lam Research Corporation Inductive plasma processor having coil with plural windings and method of controlling plasma density
US7571697B2 (en) * 2001-09-14 2009-08-11 Lam Research Corporation Plasma processor coil
JP3847184B2 (ja) * 2002-03-14 2006-11-15 東京エレクトロン株式会社 プラズマ処理装置
JP3935401B2 (ja) * 2002-07-22 2007-06-20 東京エレクトロン株式会社 誘導結合プラズマ処理装置
US20040110388A1 (en) * 2002-12-06 2004-06-10 International Business Machines Corporation Apparatus and method for shielding a wafer from charged particles during plasma etching
US6822396B2 (en) * 2003-01-31 2004-11-23 Advanced Energy Industries, Inc. Transformer ignition circuit for a transformer coupled plasma source
US7232767B2 (en) * 2003-04-01 2007-06-19 Mattson Technology, Inc. Slotted electrostatic shield modification for improved etch and CVD process uniformity
US7273533B2 (en) * 2003-11-19 2007-09-25 Tokyo Electron Limited Plasma processing system with locally-efficient inductive plasma coupling
JP4741845B2 (ja) * 2004-01-13 2011-08-10 株式会社 セルバック 誘導結合プラズマ処理装置
US7276135B2 (en) * 2004-05-28 2007-10-02 Lam Research Corporation Vacuum plasma processor including control in response to DC bias voltage
US7169256B2 (en) * 2004-05-28 2007-01-30 Lam Research Corporation Plasma processor with electrode responsive to multiple RF frequencies
US8540843B2 (en) * 2004-06-30 2013-09-24 Lam Research Corporation Plasma chamber top piece assembly
EP1662546A1 (de) * 2004-11-25 2006-05-31 The European Community, represented by the European Commission Induktiv gekoppelte Plasmabearbeitungsvorrichtung
JP2007123008A (ja) * 2005-10-27 2007-05-17 Nissin Electric Co Ltd プラズマ生成方法及び装置並びにプラズマ処理装置
US20070137576A1 (en) * 2005-12-19 2007-06-21 Varian Semiconductor Equipment Associates, Inc. Technique for providing an inductively coupled radio frequency plasma flood gun
US8454810B2 (en) 2006-07-14 2013-06-04 4D-S Pty Ltd. Dual hexagonal shaped plasma source
US7837826B2 (en) * 2006-07-18 2010-11-23 Lam Research Corporation Hybrid RF capacitively and inductively coupled plasma source using multifrequency RF powers and methods of use thereof
CN101165868B (zh) * 2006-10-20 2010-05-12 北京北方微电子基地设备工艺研究中心有限责任公司 晶片处理室的内衬及包含该内衬的晶片处理室
KR100929119B1 (ko) * 2008-03-12 2009-11-30 주식회사 만도 랙-타입 전동식 조향 장치
JP5229995B2 (ja) * 2008-04-07 2013-07-03 株式会社アルバック アンテナ、交流回路、及びプラズマ処理装置
CN102027811B (zh) * 2008-05-22 2015-12-09 Emd株式会社 等离子体产生装置及等离子体处理装置
JP5278148B2 (ja) * 2008-11-05 2013-09-04 東京エレクトロン株式会社 プラズマ処理装置
TWI498053B (zh) * 2008-12-23 2015-08-21 Ind Tech Res Inst 電漿激發模組
JP5479867B2 (ja) * 2009-01-14 2014-04-23 東京エレクトロン株式会社 誘導結合プラズマ処理装置
JP5506826B2 (ja) * 2009-02-10 2014-05-28 ヘリッセン，サール 大面積プラズマ処理装置
KR101155121B1 (ko) * 2009-03-25 2012-06-11 도쿄엘렉트론가부시키가이샤 유도 결합 플라즈마 처리 장치의 커버 고정구 및 커버 고정 장치
KR101081743B1 (ko) * 2009-08-17 2011-11-09 주성엔지니어링(주) 기판처리장치
JP5642181B2 (ja) * 2009-08-21 2014-12-17 マットソン テクノロジー インコーポレイテッドＭａｔｔｓｏｎ Ｔｅｃｈｎｏｌｏｇｙ， Ｉｎｃ． 基体を処理する装置及び基体の処理方法
TW201130401A (en) * 2009-11-23 2011-09-01 Jusung Eng Co Ltd Apparatus for processing substrate
US8471476B2 (en) 2010-10-08 2013-06-25 Varian Semiconductor Equipment Associates, Inc. Inductively coupled plasma flood gun using an immersed low inductance FR coil and multicusp magnetic arrangement
JP5745812B2 (ja) * 2010-10-27 2015-07-08 東京エレクトロン株式会社 プラズマ処理装置
KR101246857B1 (ko) * 2011-01-10 2013-03-25 엘아이지에이디피 주식회사 플라즈마 처리장치
KR101246859B1 (ko) * 2011-01-10 2013-03-25 엘아이지에이디피 주식회사 플라즈마 처리장치
JP5551635B2 (ja) * 2011-02-28 2014-07-16 三井造船株式会社 薄膜形成装置
JP5638449B2 (ja) * 2011-04-21 2014-12-10 東京エレクトロン株式会社 誘導結合プラズマ処理装置
KR101921222B1 (ko) * 2011-06-30 2018-11-23 삼성디스플레이 주식회사 플라즈마를 이용한 기판 처리장치 및 이를 이용한 유기 발광 표시장치의 제조 방법
JP6010305B2 (ja) * 2012-02-07 2016-10-19 東京エレクトロン株式会社 誘導結合プラズマ用アンテナユニット、誘導結合プラズマ処理装置および誘導結合プラズマ処理方法
CN104752140B (zh) * 2013-12-31 2017-06-06 北京北方微电子基地设备工艺研究中心有限责任公司 一种反应腔室及等离子体加工设备
KR101640092B1 (ko) * 2014-07-25 2016-07-18 인베니아 주식회사 플라즈마 발생모듈 및 이를 포함하는 플라즈마 처리장치
EP3032565A1 (de) * 2014-12-08 2016-06-15 Soleras Advanced Coatings bvba Vorrichtung mit zwei Endblöcken, Anordnung und Sputtersystem damit und Verfahren zur Bereitstellung von HF-Leistung in einem Zielrohr mit dieser Vorrichtung oder Anordnung
US10332725B2 (en) 2015-03-30 2019-06-25 Lam Research Corporation Systems and methods for reversing RF current polarity at one output of a multiple output RF matching network
DE102016107400B4 (de) * 2015-12-23 2021-06-10 VON ARDENNE Asset GmbH & Co. KG Induktiv gekoppelte Plasmaquelle und Vakuumprozessieranlage
US9515633B1 (en) 2016-01-11 2016-12-06 Lam Research Corporation Transformer coupled capacitive tuning circuit with fast impedance switching for plasma etch chambers
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JP6341329B1 (ja) * 2017-02-16 2018-06-13 日新電機株式会社 プラズマ発生用のアンテナ及びそれを備えるプラズマ処理装置

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Also Published As

Publication number Publication date
US5589737A (en) 1996-12-31
TW347549B (en) 1998-12-11
DE69535922D1 (de) 2009-04-09
KR20060009408A (ko) 2006-01-31
CA2206679A1 (en) 1996-06-13
EP0793855B1 (de) 2001-11-14
CN1090807C (zh) 2002-09-11
DE69523940T2 (de) 2002-04-04
AU4373796A (en) 1996-06-26
CN1183853A (zh) 1998-06-03
EP0929093A3 (de) 2003-05-14
WO1996018208A1 (en) 1996-06-13
CN1318862A (zh) 2001-10-24
JP2001511945A (ja) 2001-08-14
EP0929093B1 (de) 2009-02-25
KR100645283B1 (ko) 2006-11-15
EP0793855A1 (de) 1997-09-10
JP2004235157A (ja) 2004-08-19
ES2163537T3 (es) 2002-02-01
CN1163942C (zh) 2004-08-25
EP0929093A2 (de) 1999-07-14
CA2206679C (en) 2007-09-11

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