DE69320824D1 - Integrierte Schaltung zur Überwachung der Benutzung von Redunanzspeicherbauelementen in einer Halbleiterspeichereinrichtung - Google Patents
Integrierte Schaltung zur Überwachung der Benutzung von Redunanzspeicherbauelementen in einer HalbleiterspeichereinrichtungInfo
- Publication number
- DE69320824D1 DE69320824D1 DE69320824T DE69320824T DE69320824D1 DE 69320824 D1 DE69320824 D1 DE 69320824D1 DE 69320824 T DE69320824 T DE 69320824T DE 69320824 T DE69320824 T DE 69320824T DE 69320824 D1 DE69320824 D1 DE 69320824D1
- Authority
- DE
- Germany
- Prior art keywords
- monitoring
- integrated circuit
- memory device
- semiconductor memory
- redundancy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012544 monitoring process Methods 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
- G11C29/785—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes
- G11C29/789—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes using non-volatile cells or latches
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
- G11C29/835—Masking faults in memories by using spares or by reconfiguring using programmable devices with roll call arrangements for redundant substitutions
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP93830493A EP0657811B1 (de) | 1993-12-09 | 1993-12-09 | Integrierte Schaltung zur Überwachung der Benutzung von Redunanzspeicherbauelementen in einer Halbleiterspeichereinrichtung |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69320824D1 true DE69320824D1 (de) | 1998-10-08 |
DE69320824T2 DE69320824T2 (de) | 1999-05-12 |
Family
ID=8215273
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69320824T Expired - Fee Related DE69320824T2 (de) | 1993-12-09 | 1993-12-09 | Integrierte Schaltung zur Überwachung der Benutzung von Redunanzspeicherbauelementen in einer Halbleiterspeichereinrichtung |
Country Status (4)
Country | Link |
---|---|
US (1) | US5493531A (de) |
EP (1) | EP0657811B1 (de) |
JP (1) | JP2591922B2 (de) |
DE (1) | DE69320824T2 (de) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5708601A (en) * | 1993-12-09 | 1998-01-13 | Sgs-Thomson Microelectronics S.R.L. | Integrated circuitry for checking the utilization rate of redundancy memory elements in a semiconductor memory device |
DE19507312C1 (de) * | 1995-03-02 | 1996-07-25 | Siemens Ag | Halbleiterspeicher, dessen Speicherzellen zu einzeln adressierbaren Einheiten zusammengefaßt sind und Verfahren zum Betrieb solcher Speicher |
US5841712A (en) * | 1996-09-30 | 1998-11-24 | Advanced Micro Devices, Inc. | Dual comparator circuit and method for selecting between normal and redundant decode logic in a semiconductor memory device |
US20040023874A1 (en) * | 2002-03-15 | 2004-02-05 | Burgess Catherine E. | Therapeutic polypeptides, nucleic acids encoding same, and methods of use |
US20040229779A1 (en) * | 1999-05-14 | 2004-11-18 | Ramesh Kekuda | Therapeutic polypeptides, nucleic acids encoding same, and methods of use |
US6974684B2 (en) * | 2001-08-08 | 2005-12-13 | Curagen Corporation | Therapeutic polypeptides, nucleic acids encoding same, and methods of use |
US20040067490A1 (en) * | 2001-09-07 | 2004-04-08 | Mei Zhong | Therapeutic polypeptides, nucleic acids encoding same, and methods of use |
US6855806B1 (en) * | 1999-10-15 | 2005-02-15 | Curagen Corporation | Thymosin beta 10-like proteins and nucleic acids encoding same |
DE10012104C2 (de) * | 2000-03-13 | 2002-05-02 | Infineon Technologies Ag | Redundanz-Multiplexer für Halbleiterspeicheranordnung |
US20040005554A1 (en) * | 2000-05-08 | 2004-01-08 | Tayar Nabil El | Novel glycoproteins and methods of use thereof |
US20030219786A1 (en) * | 2000-08-11 | 2003-11-27 | Applied Research Systems Ars Holding N.V. | Novel glycoproteins and methods of use thereof |
US20040023259A1 (en) * | 2000-07-26 | 2004-02-05 | Luca Rastelli | Therapeutic polypeptides, nucleic acids encoding same, and methods of use |
UA83458C2 (uk) | 2000-09-18 | 2008-07-25 | Байоджен Айдек Ма Інк. | Виділений поліпептид baff-r (рецептор фактора активації в-клітин сімейства tnf) |
US20040043928A1 (en) * | 2001-08-02 | 2004-03-04 | Ramesh Kekuda | Therapeutic polypeptides, nucleic acids encoding same, and methods of use |
US20030017159A1 (en) * | 2001-05-02 | 2003-01-23 | Jerome Ritz | Immunogenic tumor antigens: nucleic acids and polypeptides encoding the same and methods of use thereof |
US20030087274A1 (en) * | 2001-07-05 | 2003-05-08 | Anderson David W. | Therapeutic polypeptides, nucleic acids encoding same, and methods of use |
US20040029790A1 (en) * | 2001-07-05 | 2004-02-12 | Meera Patturajan | Novel human proteins, polynucleotides encoding them and methods of using the same |
US20040030096A1 (en) * | 2001-08-02 | 2004-02-12 | Linda Gorman | Novel human proteins, polynucleotides encoding them and methods of using the same |
US20030092040A1 (en) * | 2001-08-08 | 2003-05-15 | Bader Joel S. | System and method for identifying a genetic risk factor for a disease or pathology |
US20030199442A1 (en) * | 2001-10-09 | 2003-10-23 | Alsobrook John P. | Therapeutic polypeptides, nucleic acids encoding same, and methods of use |
US20040162236A1 (en) * | 2002-04-01 | 2004-08-19 | John Alsobrook | Therapeutic polypeptides, nucleic acids encoding same, and methods of use |
BRPI0508286B8 (pt) | 2004-03-31 | 2021-05-25 | Dana Farber Cancer Inst Inc | método para determinar a probabilidade de eficácia de um inibidor da tirosina quinase egfr para tratar câncer, uso de um inibidor da tirosina quinase de egfr, sonda, kit, e, par de iniciadores |
WO2006108087A2 (en) | 2005-04-05 | 2006-10-12 | Cellpoint Diagnostics | Devices and methods for enrichment and alteration of circulating tumor cells and other particles |
JP5014125B2 (ja) * | 2005-05-30 | 2012-08-29 | スパンション エルエルシー | 半導体装置及びプログラムデータ冗長方法 |
US7609562B2 (en) * | 2007-01-31 | 2009-10-27 | Intel Corporation | Configurable device ID in non-volatile memory |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1982002793A1 (en) * | 1981-02-02 | 1982-08-19 | Otoole James E | Semiconductor memory redundant element identification circuit |
JPH03160695A (ja) * | 1989-11-17 | 1991-07-10 | Nec Corp | 半導体記憶装置 |
US5343429A (en) * | 1991-12-06 | 1994-08-30 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory device having redundant circuit and method of testing to see whether or not redundant circuit is used therein |
-
1993
- 1993-12-09 DE DE69320824T patent/DE69320824T2/de not_active Expired - Fee Related
- 1993-12-09 EP EP93830493A patent/EP0657811B1/de not_active Expired - Lifetime
-
1994
- 1994-12-07 US US08/350,961 patent/US5493531A/en not_active Expired - Lifetime
- 1994-12-08 JP JP6304900A patent/JP2591922B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH07254296A (ja) | 1995-10-03 |
JP2591922B2 (ja) | 1997-03-19 |
EP0657811B1 (de) | 1998-09-02 |
US5493531A (en) | 1996-02-20 |
EP0657811A1 (de) | 1995-06-14 |
DE69320824T2 (de) | 1999-05-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |