DE69132242D1 - Anzeigevorrichtung zur einfachen Beobachtung von Signalverläufen bei hoher Auflösung - Google Patents

Anzeigevorrichtung zur einfachen Beobachtung von Signalverläufen bei hoher Auflösung

Info

Publication number
DE69132242D1
DE69132242D1 DE69132242T DE69132242T DE69132242D1 DE 69132242 D1 DE69132242 D1 DE 69132242D1 DE 69132242 T DE69132242 T DE 69132242T DE 69132242 T DE69132242 T DE 69132242T DE 69132242 D1 DE69132242 D1 DE 69132242D1
Authority
DE
Germany
Prior art keywords
display device
high resolution
signal profiles
easy observation
observation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69132242T
Other languages
English (en)
Other versions
DE69132242T2 (de
Inventor
Takehiko Kawauchi
Yoshifumi Imazu
Katsuhiko Kamiyama
Mitsuyoshi Takano
Katsuhisa Iiyoshi
Takahiro Wada
Aiichi Katayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Application granted granted Critical
Publication of DE69132242D1 publication Critical patent/DE69132242D1/de
Publication of DE69132242T2 publication Critical patent/DE69132242T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/163—Spectrum analysis; Fourier analysis adapted for measuring in circuits having distributed constants
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/345—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/173—Wobbulating devices similar to swept panoramic receivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S715/00—Data processing: presentation processing of document, operator interface processing, and screen saver display processing
    • Y10S715/961—Operator interface with visual structure or function dictated by intended use
    • Y10S715/965—Operator interface with visual structure or function dictated by intended use for process control and configuration
    • Y10S715/97—Instrumentation and component modelling, e.g. interactive control panel

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
DE69132242T 1990-03-30 1991-03-30 Anzeigevorrichtung zur einfachen Beobachtung von Signalverläufen bei hoher Auflösung Expired - Fee Related DE69132242T2 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP8697390 1990-03-30
JP14078290 1990-05-30
JP18975490 1990-07-18
JP33734790 1990-11-30

Publications (2)

Publication Number Publication Date
DE69132242D1 true DE69132242D1 (de) 2000-07-06
DE69132242T2 DE69132242T2 (de) 2001-01-25

Family

ID=27467316

Family Applications (2)

Application Number Title Priority Date Filing Date
DE69132242T Expired - Fee Related DE69132242T2 (de) 1990-03-30 1991-03-30 Anzeigevorrichtung zur einfachen Beobachtung von Signalverläufen bei hoher Auflösung
DE69117409T Expired - Fee Related DE69117409T2 (de) 1990-03-30 1991-03-30 Wellenformanzeigegerät zur einfachen beobachtung hoch-auflösender wellenformen

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE69117409T Expired - Fee Related DE69117409T2 (de) 1990-03-30 1991-03-30 Wellenformanzeigegerät zur einfachen beobachtung hoch-auflösender wellenformen

Country Status (5)

Country Link
US (2) US5434954A (de)
EP (4) EP0664457A3 (de)
JP (1) JP3184832B2 (de)
DE (2) DE69132242T2 (de)
WO (1) WO1991015776A1 (de)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5617523A (en) * 1990-11-30 1997-04-01 Anritsu Corporation Waveform display apparatus for easily realizing high-definition waveform observation
US8381126B2 (en) * 1992-12-14 2013-02-19 Monkeymedia, Inc. Computer user interface with non-salience deemphasis
US5623588A (en) * 1992-12-14 1997-04-22 New York University Computer user interface with non-salience deemphasis
US8370746B2 (en) * 1992-12-14 2013-02-05 Monkeymedia, Inc. Video player with seamless contraction
US5684508A (en) * 1995-11-21 1997-11-04 Fluke Corporation Method of displaying continuously acquired data as multiple traces on a fixed length display
JPH1038927A (ja) * 1996-07-23 1998-02-13 Advantest Corp 波形解析装置
JP3377391B2 (ja) 1997-02-12 2003-02-17 日本テクトロニクス株式会社 リアルタイム信号アナライザ
US10051298B2 (en) 1999-04-23 2018-08-14 Monkeymedia, Inc. Wireless seamless expansion and video advertising player
US6393158B1 (en) 1999-04-23 2002-05-21 Monkeymedia, Inc. Method and storage device for expanding and contracting continuous play media seamlessly
US6515665B1 (en) * 1999-06-21 2003-02-04 Tektronix, Inc. Data filtering/suppression of data acquisitions/samples for multi-channel electronic display and analysis
JP3375919B2 (ja) * 1999-11-11 2003-02-10 アンリツ株式会社 信号分析装置
US7443396B2 (en) * 2000-11-29 2008-10-28 National Instruments Corporation Instrument having a virtual magnifying glass for displaying magnified portions of a signal waveform
US6751565B2 (en) * 2002-06-21 2004-06-15 Springsoft, Inc. Fast waveform display method and system
US7227549B2 (en) * 2003-02-13 2007-06-05 Tektronix, Inc. Indicating and manipulating a zoom region of a waveform
US6904381B2 (en) * 2003-03-07 2005-06-07 Agilent Technologies, Inc. Testing of a frequency converter device
JP2004347320A (ja) * 2003-05-15 2004-12-09 Advantest Corp 信号測定表示装置および方法
US7663624B2 (en) * 2004-06-30 2010-02-16 Lecroy Corporation Report generating method and apparatus
WO2006100784A1 (ja) * 2005-03-24 2006-09-28 Advantest Corporation 測定装置、図形生成方法、プログラムおよび記録媒体
US7813825B2 (en) * 2006-07-10 2010-10-12 Apple Inc. Multiband dynamic range control graphical interface
JP5705395B2 (ja) * 2006-07-21 2015-04-22 テクトロニクス・インターナショナル・セールス・ゲーエムベーハー 信号分析装置
WO2009012342A2 (en) * 2007-07-16 2009-01-22 Tektronix, Inc. Apparatus and methods of defining spectral regions of interest for signal analysis
JP5445135B2 (ja) * 2007-11-27 2014-03-19 株式会社ニコン 蛍光顕微鏡
CN101650377A (zh) * 2008-08-11 2010-02-17 鸿富锦精密工业（深圳）有限公司 信号测量系统及方法
US8284200B2 (en) * 2009-01-29 2012-10-09 Agilent Technologies, Inc. Systems and methods for focus plus context viewing of dense, ordered line graphs
US8464171B2 (en) * 2009-06-26 2013-06-11 Eppendorf Ag Device for displaying a function chart
GB201019077D0 (en) * 2010-11-11 2010-12-29 Benmore Ventures Ltd Electronic display device
US8872504B2 (en) * 2011-04-29 2014-10-28 Tektronix, Inc. Method for automatically setting frequency span in a spectrum analyzer
JP2013053873A (ja) * 2011-09-01 2013-03-21 Jeol Ltd スペクトル表示装置、スペクトル表示方法、およびプログラム
JP5880314B2 (ja) * 2012-06-29 2016-03-09 株式会社Ｊｖｃケンウッド 無線機器及び周波数表示方法
US9329967B2 (en) * 2012-11-13 2016-05-03 Tektronix, Inc. Methods and systems for aiding the analysis of a signal
US9858240B2 (en) * 2012-12-13 2018-01-02 Tektronix, Inc. Automatic center frequency and span setting in a test and measurement instrument
DE102014203355A1 (de) * 2014-02-25 2015-09-10 Rohde & Schwarz Gmbh & Co. Kg Messverfahren und Messgerät mit Fingertip-Zoom
EP2990809B8 (de) * 2014-08-29 2018-10-24 Rohde & Schwarz GmbH & Co. KG Messvorrichtung mit Anzeigespeicher mit Speicherzellen mit einer reduzierten Bitzahl und zugehöriges Verfahren
JP6862621B2 (ja) * 2015-12-21 2021-04-21 アンリツ株式会社 測定装置及び測定方法
US10852323B2 (en) * 2018-12-28 2020-12-01 Rohde & Schwarz Gmbh & Co. Kg Measurement apparatus and method for analyzing a waveform of a signal
CN109781856A (zh) * 2019-02-25 2019-05-21 河北普阳钢铁有限公司 双晶直探头判断扁平金属板材中夹杂物群缺陷的方法
USD987459S1 (en) * 2021-04-26 2023-05-30 Yokogawa Electric Corporation Spectrum analyzer

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5310413B2 (de) * 1974-09-06 1978-04-13
US4257104A (en) * 1978-08-10 1981-03-17 Hewlett-Packard Company Apparatus for spectrum analysis of an electrical signal
JPS5926902B2 (ja) * 1979-03-31 1984-07-02 アンリツ株式会社 周波数マ−カ表示装置
JPS59145970A (ja) * 1983-01-11 1984-08-21 Horiba Ltd スペクトルの表示方法
JPS59157574A (ja) * 1983-02-27 1984-09-06 Anritsu Corp スペクトラムアナライザ
JPS59157575A (ja) * 1983-02-27 1984-09-06 Anritsu Corp スペクトラムアナライザ
US4649496A (en) * 1984-02-16 1987-03-10 Hewlett-Packard Company Spectrum analyzer with improved data analysis and display features
JPS60203862A (ja) * 1984-03-29 1985-10-15 Jeol Ltd スペクトル・デ−タの表示制御方式
JPS61288164A (ja) * 1985-06-17 1986-12-18 Advantest Corp 波形表示装置
US4947338A (en) * 1986-08-22 1990-08-07 Tektronix, Inc. Signal identification method
US4868785A (en) * 1987-01-27 1989-09-19 Tektronix, Inc. Block diagram editor system and method for controlling electronic instruments
JPH0769364B2 (ja) * 1987-03-06 1995-07-31 アンリツ株式会社 スペクトラムアナライザ
JP2627501B2 (ja) * 1987-03-06 1997-07-09 アンリツ株式会社 スペクトラムアナライザ
JP2577566B2 (ja) * 1987-07-01 1997-02-05 アンリツ株式会社 スペクトラムアナライザ
US4839582A (en) * 1987-07-01 1989-06-13 Anritsu Corporation Signal analyzer apparatus with automatic frequency measuring function
JP2766685B2 (ja) * 1988-09-26 1998-06-18 アンリツ株式会社 スペクトラムアナライザ
DE3900534A1 (de) * 1989-01-10 1990-07-12 Boehringer Mannheim Gmbh Diagnostischer nachweis unter verwendung von chimaeren antikoerpern
JP2891497B2 (ja) * 1990-01-25 1999-05-17 アンリツ株式会社 スペクトラムアナライザ

Also Published As

Publication number Publication date
EP0664459A3 (de) 1996-05-22
JP3184832B2 (ja) 2001-07-09
EP0477379B1 (de) 1996-02-28
EP0664459A2 (de) 1995-07-26
EP0664459B1 (de) 2000-05-31
EP0477379A1 (de) 1992-04-01
EP0664457A3 (de) 1996-05-22
DE69117409D1 (de) 1996-04-04
US5519820A (en) 1996-05-21
EP0664458A2 (de) 1995-07-26
US5434954A (en) 1995-07-18
DE69117409T2 (de) 1996-11-14
DE69132242T2 (de) 2001-01-25
EP0664457A2 (de) 1995-07-26
EP0477379A4 (en) 1992-09-30
EP0664458A3 (de) 1996-05-22
WO1991015776A1 (en) 1991-10-17

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee