DE69109890T2 - Lateraler Heterogrenzflächen-Bipolartransistor. - Google Patents

Lateraler Heterogrenzflächen-Bipolartransistor.

Info

Publication number
DE69109890T2
DE69109890T2 DE69109890T DE69109890T DE69109890T2 DE 69109890 T2 DE69109890 T2 DE 69109890T2 DE 69109890 T DE69109890 T DE 69109890T DE 69109890 T DE69109890 T DE 69109890T DE 69109890 T2 DE69109890 T2 DE 69109890T2
Authority
DE
Germany
Prior art keywords
bipolar transistor
base
heterojunction bipolar
lateral heterojunction
lateral
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69109890T
Other languages
English (en)
Other versions
DE69109890D1 (de
Inventor
Masakazu Morishita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2042068A external-priority patent/JP3001601B2/ja
Priority claimed from JP2042067A external-priority patent/JP3001600B2/ja
Priority claimed from JP2042066A external-priority patent/JP3001599B2/ja
Application filed by Canon Inc filed Critical Canon Inc
Application granted granted Critical
Publication of DE69109890D1 publication Critical patent/DE69109890D1/de
Publication of DE69109890T2 publication Critical patent/DE69109890T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/1004—Base region of bipolar transistors
    • H01L29/1008—Base region of bipolar transistors of lateral transistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/08—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/0895—Tunnel injectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/16—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table
    • H01L29/161—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table including two or more of the elements provided for in group H01L29/16, e.g. alloys
    • H01L29/165—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic Table including two or more of the elements provided for in group H01L29/16, e.g. alloys in different semiconductor regions, e.g. heterojunctions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70—Bipolar devices
    • H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
    • H01L29/73—Bipolar junction transistors
    • H01L29/735—Lateral transistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70—Bipolar devices
    • H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
    • H01L29/73—Bipolar junction transistors
    • H01L29/737—Hetero-junction transistors

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Bipolar Transistors (AREA)
DE69109890T 1990-02-22 1991-02-21 Lateraler Heterogrenzflächen-Bipolartransistor. Expired - Fee Related DE69109890T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2042068A JP3001601B2 (ja) 1990-02-22 1990-02-22 半導体装置
JP2042067A JP3001600B2 (ja) 1990-02-22 1990-02-22 半導体装置
JP2042066A JP3001599B2 (ja) 1990-02-22 1990-02-22 半導体装置

Publications (2)

Publication Number Publication Date
DE69109890D1 DE69109890D1 (de) 1995-06-29
DE69109890T2 true DE69109890T2 (de) 1995-11-02

Family

ID=27291053

Family Applications (3)

Application Number Title Priority Date Filing Date
DE69128364T Expired - Fee Related DE69128364T2 (de) 1990-02-22 1991-02-21 Lateraler Bipolartransistor
DE69109890T Expired - Fee Related DE69109890T2 (de) 1990-02-22 1991-02-21 Lateraler Heterogrenzflächen-Bipolartransistor.
DE69129376T Expired - Fee Related DE69129376T2 (de) 1990-02-22 1991-02-21 Lateraler Bipolartransistor

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE69128364T Expired - Fee Related DE69128364T2 (de) 1990-02-22 1991-02-21 Lateraler Bipolartransistor

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE69129376T Expired - Fee Related DE69129376T2 (de) 1990-02-22 1991-02-21 Lateraler Bipolartransistor

Country Status (4)

Country Link
US (1) US5734183A (de)
EP (3) EP0443852B1 (de)
AT (1) ATE123175T1 (de)
DE (3) DE69128364T2 (de)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0616370B1 (de) * 1993-03-16 2004-06-09 Canon Kabushiki Kaisha Halbleiteranordnung mit einem lateralen Bipolartransistor, welcher SiGe enthält, und Verfahren zu deren Herstellung
US5422502A (en) * 1993-12-09 1995-06-06 Northern Telecom Limited Lateral bipolar transistor
US6034413A (en) * 1997-02-27 2000-03-07 Texas Instruments Incorporated High speed biCMOS gate power for power MOSFETs incorporating improved injection immunity
EP0881688A1 (de) * 1997-05-30 1998-12-02 STMicroelectronics S.r.l. Elektronisches Bauelement vom Typ lateral-bipolar-pnp
US6423990B1 (en) 1997-09-29 2002-07-23 National Scientific Corporation Vertical heterojunction bipolar transistor
US5912481A (en) 1997-09-29 1999-06-15 National Scientific Corp. Heterojunction bipolar transistor having wide bandgap, low interdiffusion base-emitter junction
US6674103B2 (en) * 2000-07-31 2004-01-06 The Regents Of The University Of California HBT with nitrogen-containing current blocking base collector interface and method for current blocking
US6362065B1 (en) * 2001-02-26 2002-03-26 Texas Instruments Incorporated Blocking of boron diffusion through the emitter-emitter poly interface in PNP HBTs through use of a SiC layer at the top of the emitter epi layer
US6459104B1 (en) * 2001-05-10 2002-10-01 Newport Fab Method for fabricating lateral PNP heterojunction bipolar transistor and related structure
US6670654B2 (en) * 2002-01-09 2003-12-30 International Business Machines Corporation Silicon germanium heterojunction bipolar transistor with carbon incorporation
US6927140B2 (en) 2002-08-21 2005-08-09 Intel Corporation Method for fabricating a bipolar transistor base
US7517768B2 (en) * 2003-03-31 2009-04-14 Intel Corporation Method for fabricating a heterojunction bipolar transistor
EP2180517A1 (de) * 2008-10-24 2010-04-28 Epcos Ag Bipolarer PNP-Transistor mit seitlichem Kollektor und Herstellungsverfahren
CN102386219B (zh) * 2010-08-31 2013-07-24 上海华虹Nec电子有限公司 SiGe HBT工艺中的寄生横向型PNP三极管及制造方法
CN102412280B (zh) * 2010-09-21 2013-09-11 上海华虹Nec电子有限公司 锗硅hbt工艺中的横向型寄生pnp器件
CN103377918B (zh) * 2012-04-27 2015-10-21 中芯国际集成电路制造(上海)有限公司 Npn异质结双极晶体管及其制造方法
US8558282B1 (en) 2012-09-08 2013-10-15 International Business Machines Corporation Germanium lateral bipolar junction transistor
JP6491201B2 (ja) * 2013-06-24 2019-03-27 アイディール パワー インコーポレイテッド 双方向バイポーラトランジスタを有するシステム、回路、素子、及び方法
CN110556420B (zh) * 2019-08-23 2022-11-04 北京工业大学 一种掺杂浓度可调的横向SiGe异质结双极晶体管
US11462632B2 (en) 2020-12-22 2022-10-04 Globalfoundries U.S. Inc. Lateral bipolar junction transistor device and method of making such a device
US11424349B1 (en) 2021-02-17 2022-08-23 Globalfoundries U.S. Inc. Extended shallow trench isolation for ultra-low leakage in fin-type lateral bipolar junction transistor devices

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4672413A (en) * 1984-04-16 1987-06-09 Trw Inc. Barrier emitter transistor
FR2625612B1 (fr) * 1987-12-30 1990-05-04 Labo Electronique Physique Procede de realisation d'un dispositif semiconducteur du type transistor bipolaire a heterojonction
US4987468A (en) * 1988-06-17 1991-01-22 Xerox Corporation Lateral heterojunction bipolar transistor (LHBT) and suitability thereof as a hetero transverse junction (HTJ) laser

Also Published As

Publication number Publication date
EP0642170A3 (de) 1995-08-09
EP0642171B1 (de) 1998-05-06
DE69128364D1 (de) 1998-01-15
DE69129376D1 (de) 1998-06-10
DE69128364T2 (de) 1998-04-09
DE69129376T2 (de) 1998-09-24
EP0642171A2 (de) 1995-03-08
EP0443852B1 (de) 1995-05-24
EP0443852A1 (de) 1991-08-28
US5734183A (en) 1998-03-31
EP0642170A2 (de) 1995-03-08
DE69109890D1 (de) 1995-06-29
EP0642170B1 (de) 1997-12-03
ATE123175T1 (de) 1995-06-15
EP0642171A3 (de) 1995-08-09

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee