DE69030810T2 - Pockelseffekt-Messsonde für elektrische Felder - Google Patents

Pockelseffekt-Messsonde für elektrische Felder

Info

Publication number
DE69030810T2
DE69030810T2 DE69030810T DE69030810T DE69030810T2 DE 69030810 T2 DE69030810 T2 DE 69030810T2 DE 69030810 T DE69030810 T DE 69030810T DE 69030810 T DE69030810 T DE 69030810T DE 69030810 T2 DE69030810 T2 DE 69030810T2
Authority
DE
Germany
Prior art keywords
electric fields
measuring probe
pockels effect
effect measuring
pockels
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69030810T
Other languages
English (en)
Other versions
DE69030810D1 (de
Inventor
Pierre-Alain Chollet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from FR8917179A external-priority patent/FR2656428B1/fr
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Application granted granted Critical
Publication of DE69030810D1 publication Critical patent/DE69030810D1/de
Publication of DE69030810T2 publication Critical patent/DE69030810T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
    • G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
    • G01D5/344—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells using polarisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G01R1/071—Non contact-making probes containing electro-optic elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
    • G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0878—Sensors; antennas; probes; detectors
    • G01R29/0885—Sensors; antennas; probes; detectors using optical probes, e.g. electro-optical, luminescent, glow discharge, or optical interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/12—Measuring electrostatic fields or voltage-potential
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/03—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on ceramics or electro-optical crystals, e.g. exhibiting Pockels effect or Kerr effect

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Ceramic Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Electromagnetism (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE69030810T 1989-12-26 1990-12-21 Pockelseffekt-Messsonde für elektrische Felder Expired - Fee Related DE69030810T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8917179A FR2656428B1 (fr) 1989-12-26 1989-12-26 Capteur de champ electrique a effet pockels.
FR909004731A FR2661003B2 (fr) 1989-12-26 1990-04-12 Capteur de champ electrique a effet pockels.

Publications (2)

Publication Number Publication Date
DE69030810D1 DE69030810D1 (de) 1997-07-03
DE69030810T2 true DE69030810T2 (de) 1997-12-11

Family

ID=26227761

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69030810T Expired - Fee Related DE69030810T2 (de) 1989-12-26 1990-12-21 Pockelseffekt-Messsonde für elektrische Felder

Country Status (4)

Country Link
US (1) US5157324A (de)
EP (1) EP0453693B1 (de)
DE (1) DE69030810T2 (de)
FR (1) FR2661003B2 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1248820B (it) * 1990-05-25 1995-01-30 Pirelli Cavi Spa Sensore polarimetrico direzionale di campo
US5485079A (en) * 1993-03-29 1996-01-16 Matsushita Electric Industrial Co., Ltd. Magneto-optical element and optical magnetic field sensor
EP1099117B1 (de) * 1998-07-23 2002-05-29 Siemens Aktiengesellschaft Verfahren und einrichtung zur messung einer elektrischen spannung mit hilfe des pockelseffektes
JP2000221213A (ja) 1998-11-24 2000-08-11 Ando Electric Co Ltd 電気光学プロ―ブ
DE19955978C2 (de) * 1998-11-24 2002-06-27 Ando Electric Elektrooptische Sonde für ein Oszilloskop das eine Signalwellenform mißt
US6307666B1 (en) * 2000-01-13 2001-10-23 Bechtel Bwxt Idaho, Llc Voltage sensing systems and methods for passive compensation of temperature related intrinsic phase shift
FR2902523B1 (fr) 2006-06-16 2008-09-05 Inst Nat Polytech Grenoble Sonde electro-optique de mesure vectorielle d'un champ electromagnetique
US8896832B2 (en) * 2010-06-17 2014-11-25 Kla-Tencor Corp. Discrete polarization scatterometry
RO128236A0 (ro) * 2012-08-16 2013-03-29 A.O.T. Advanced Optical Transducer Company S.R.L. Senzor optic polarimetric dirijat, pe bază de niobat de litiu pentru măsurarea câmpurilor electrice ca şi cc
US10634704B2 (en) 2016-08-17 2020-04-28 Micatu, Inc. Optical pockels voltage sensor assembly device and methods of use thereof
FR3075386B1 (fr) 2017-12-20 2020-07-10 Supergrid Institute Dispositif de mesure d’un champ electrique et/ou magnetique notamment dans un conducteur de transport d’energie electrique

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2788710A (en) * 1952-08-14 1957-04-16 Polaroid Corp Electro-optical devices
US3575487A (en) * 1969-09-17 1971-04-20 Bell Telephone Labor Inc Two-coordinate quadrupole optical deflector
EP0067683B1 (de) * 1981-06-12 1986-08-20 Kabushiki Kaisha Meidensha Detektor für elektrische Felder
JPS5832171A (ja) * 1981-07-27 1983-02-25 Sumitomo Electric Ind Ltd 光応用電圧電界センサ
JPS58113764A (ja) * 1981-12-26 1983-07-06 Mitsubishi Electric Corp 交流電界測定装置
JPS5927266A (ja) * 1982-08-05 1984-02-13 Hitachi Cable Ltd 偏波面保存光フアイバを用いた電流測定装置
JPS59147274A (ja) * 1983-02-10 1984-08-23 Hitachi Ltd 光方式電界測定装置
JP2725765B2 (ja) * 1983-04-18 1998-03-11 富士通株式会社 光スイッチ用偏光換装置
FR2595820B1 (fr) * 1986-03-13 1990-01-05 Bertin & Cie Dispositif a fibres optiques pour la detection a distance d'une grandeur physique, en particulier de la temperature
DE3729382A1 (de) * 1987-09-03 1989-03-16 Philips Patentverwaltung Optische sensoranordnung
EP0316619B1 (de) * 1987-11-05 1993-12-29 Asea Brown Boveri Ag Faseroptischer Sensor
DE3740468A1 (de) * 1987-11-28 1989-06-08 Kernforschungsz Karlsruhe Vorrichtung zur beruehrungslosen messung statischer und/oder zeitlich veraenderlicher elektrischer felder
JPH01259266A (ja) * 1988-04-08 1989-10-16 Hamamatsu Photonics Kk 電圧測定装置

Also Published As

Publication number Publication date
EP0453693B1 (de) 1997-05-28
US5157324A (en) 1992-10-20
FR2661003A2 (fr) 1991-10-18
DE69030810D1 (de) 1997-07-03
FR2661003B2 (fr) 1992-06-12
EP0453693A1 (de) 1991-10-30

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee