DE60326955D1 - Halbleiterabbildungseinrichtung und halbleiterabbildungsarray - Google Patents
Halbleiterabbildungseinrichtung und halbleiterabbildungsarrayInfo
- Publication number
- DE60326955D1 DE60326955D1 DE60326955T DE60326955T DE60326955D1 DE 60326955 D1 DE60326955 D1 DE 60326955D1 DE 60326955 T DE60326955 T DE 60326955T DE 60326955 T DE60326955 T DE 60326955T DE 60326955 D1 DE60326955 D1 DE 60326955D1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor imaging
- array
- imaging device
- semiconductor
- imaging array
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000003384 imaging method Methods 0.000 title 2
- 239000004065 semiconductor Substances 0.000 title 2
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
- H01L27/14831—Area CCD imagers
- H01L27/1485—Frame transfer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
- H01L27/14806—Structural or functional details thereof
- H01L27/14812—Special geometry or disposition of pixel-elements, address lines or gate-electrodes
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002153035A JP4246964B2 (ja) | 2002-05-27 | 2002-05-27 | 固体撮像装置及び固体撮像装置アレイ |
PCT/JP2003/005610 WO2003100862A1 (fr) | 2002-05-27 | 2003-05-02 | Dispositif de formation d'images a semi-conducteurs et reseau d'imageurs a semi-conducteurs |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60326955D1 true DE60326955D1 (de) | 2009-05-14 |
Family
ID=29561286
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60326955T Expired - Lifetime DE60326955D1 (de) | 2002-05-27 | 2003-05-02 | Halbleiterabbildungseinrichtung und halbleiterabbildungsarray |
Country Status (6)
Country | Link |
---|---|
US (1) | US7193252B2 (de) |
EP (1) | EP1515370B1 (de) |
JP (1) | JP4246964B2 (de) |
AU (1) | AU2003231373A1 (de) |
DE (1) | DE60326955D1 (de) |
WO (1) | WO2003100862A1 (de) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005241513A (ja) * | 2004-02-27 | 2005-09-08 | Rigaku Corp | Ccdセンサの制御方法及び装置並びにx線回折装置 |
JP4714502B2 (ja) * | 2005-04-26 | 2011-06-29 | パナソニック株式会社 | 固体撮像装置 |
US20060267059A1 (en) * | 2005-05-25 | 2006-11-30 | Macronix International Co., Ltd. | Peripheral circuit architecture for array memory |
JP4731278B2 (ja) * | 2005-10-25 | 2011-07-20 | パナソニック株式会社 | 固体撮像素子の駆動法方法 |
JP5000258B2 (ja) * | 2006-10-18 | 2012-08-15 | 浜松ホトニクス株式会社 | 固体撮像装置 |
JP5470928B2 (ja) * | 2009-03-11 | 2014-04-16 | ソニー株式会社 | 固体撮像装置の製造方法 |
JP2011056170A (ja) * | 2009-09-14 | 2011-03-24 | Fujifilm Corp | X線撮影システム及びその制御方法 |
JP6110154B2 (ja) | 2013-02-13 | 2017-04-05 | 浜松ホトニクス株式会社 | 固体撮像装置及び固体撮像装置の製造方法 |
US10903258B2 (en) * | 2017-10-11 | 2021-01-26 | Kla Corporation | Image sensors with grounded or otherwise biased channel-stop contacts |
JP6788648B2 (ja) * | 2018-10-24 | 2020-11-25 | キヤノン株式会社 | 放射線撮影装置、放射線撮影方法及びプログラム |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57188183A (en) * | 1981-05-15 | 1982-11-19 | Canon Inc | Solid-state image pickup device |
US4689687A (en) * | 1984-11-13 | 1987-08-25 | Hitachi, Ltd. | Charge transfer type solid-state imaging device |
JPS62220807A (ja) * | 1986-03-20 | 1987-09-29 | Toshiba Corp | スタ−スキヤナ |
US4972254A (en) | 1987-02-24 | 1990-11-20 | Kabushiki Kaisha Toshiba | Solid state image sensors for reproducing high definition images |
JP2880026B2 (ja) * | 1992-08-28 | 1999-04-05 | 富士写真フイルム株式会社 | Ccd撮像装置とその駆動方法 |
JP3203060B2 (ja) | 1992-08-28 | 2001-08-27 | 浜松ホトニクス株式会社 | 放射線検出器 |
US5483090A (en) * | 1993-04-09 | 1996-01-09 | Sanyo Electric Co., Ltd. | Solid-state image pickup device and method for manufacturing such device |
JP3310404B2 (ja) * | 1993-07-23 | 2002-08-05 | 浜松ホトニクス株式会社 | 冷却型固体撮像装置 |
JP2701726B2 (ja) * | 1993-12-28 | 1998-01-21 | 日本電気株式会社 | 固体撮像装置 |
JP3334992B2 (ja) * | 1994-02-22 | 2002-10-15 | 浜松ホトニクス株式会社 | Ccd固体撮像装置および製造方法 |
US5530475A (en) * | 1994-11-30 | 1996-06-25 | Eastman Kodak Company | Image sensor with oversized vertical shift registers for marker pixel generation |
US5821547A (en) * | 1997-03-10 | 1998-10-13 | Talmi; Yair | Temporal filter using interline charged coupled device |
DE19818975A1 (de) * | 1997-08-12 | 1999-02-18 | Hewlett Packard Co | Verfahren zum Korrigieren des Dunkelstroms in CMOS-Bilderzeugungssensoren |
JP3426935B2 (ja) | 1997-10-21 | 2003-07-14 | 三洋電機株式会社 | 固体撮像素子及び固体撮像素子の製造方法 |
JP4271753B2 (ja) | 1998-09-21 | 2009-06-03 | 浜松ホトニクス株式会社 | 固体撮像装置 |
JP2000069373A (ja) * | 1999-08-23 | 2000-03-03 | Hamamatsu Photonics Kk | Ccd固体撮像装置 |
DE60045484D1 (de) * | 1999-09-30 | 2011-02-17 | Shimadzu Corp | Ultraschnelles bildaufnahmegerät |
EP1102323B1 (de) | 1999-11-19 | 2012-08-15 | CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement | Verfahren zum Detektieren von elektromagnetischer Strahlung mittels eines optoelektronischen Sensors |
US6744526B2 (en) * | 2001-02-09 | 2004-06-01 | Eastman Kodak Company | Image sensor having black pixels disposed in a spaced-apart relationship from the active pixels |
JP2002289822A (ja) * | 2001-03-23 | 2002-10-04 | Hamamatsu Photonics Kk | X線ccd |
US7218351B2 (en) * | 2002-04-05 | 2007-05-15 | Victor Company Of Japan, Limited | Image-sensing apparatus for compensating video signal of a plurality of channels |
US9386241B2 (en) * | 2003-07-02 | 2016-07-05 | Verity Instruments, Inc. | Apparatus and method for enhancing dynamic range of charge coupled device-based spectrograph |
-
2002
- 2002-05-27 JP JP2002153035A patent/JP4246964B2/ja not_active Expired - Lifetime
-
2003
- 2003-05-02 AU AU2003231373A patent/AU2003231373A1/en not_active Abandoned
- 2003-05-02 WO PCT/JP2003/005610 patent/WO2003100862A1/ja active Application Filing
- 2003-05-02 EP EP03725732A patent/EP1515370B1/de not_active Expired - Lifetime
- 2003-05-02 DE DE60326955T patent/DE60326955D1/de not_active Expired - Lifetime
- 2003-05-02 US US10/515,548 patent/US7193252B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP2003347539A (ja) | 2003-12-05 |
US7193252B2 (en) | 2007-03-20 |
EP1515370A4 (de) | 2006-03-15 |
EP1515370B1 (de) | 2009-04-01 |
JP4246964B2 (ja) | 2009-04-02 |
EP1515370A1 (de) | 2005-03-16 |
AU2003231373A1 (en) | 2003-12-12 |
WO2003100862A1 (fr) | 2003-12-04 |
US20050151169A1 (en) | 2005-07-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |