DE60323070D1 - Abtastungsschaltung mit aktiver Last - Google Patents

Abtastungsschaltung mit aktiver Last

Info

Publication number
DE60323070D1
DE60323070D1 DE60323070T DE60323070T DE60323070D1 DE 60323070 D1 DE60323070 D1 DE 60323070D1 DE 60323070 T DE60323070 T DE 60323070T DE 60323070 T DE60323070 T DE 60323070T DE 60323070 D1 DE60323070 D1 DE 60323070D1
Authority
DE
Germany
Prior art keywords
sample circuit
active load
load
active
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60323070T
Other languages
English (en)
Inventor
Bernhard Roth
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Verigy Singapore Pte Ltd
Original Assignee
Verigy Singapore Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Verigy Singapore Pte Ltd filed Critical Verigy Singapore Pte Ltd
Application granted granted Critical
Publication of DE60323070D1 publication Critical patent/DE60323070D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/1201—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details comprising I/O circuitry
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5602—Interface to device under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
DE60323070T 2003-06-27 2003-06-27 Abtastungsschaltung mit aktiver Last Expired - Lifetime DE60323070D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP03101930A EP1491905B1 (de) 2003-06-27 2003-06-27 Abtastungsschaltung mit aktiver Last

Publications (1)

Publication Number Publication Date
DE60323070D1 true DE60323070D1 (de) 2008-10-02

Family

ID=33396000

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60323070T Expired - Lifetime DE60323070D1 (de) 2003-06-27 2003-06-27 Abtastungsschaltung mit aktiver Last

Country Status (4)

Country Link
US (2) US7129695B2 (de)
EP (1) EP1491905B1 (de)
JP (1) JP2005017294A (de)
DE (1) DE60323070D1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE602006007307D1 (de) * 2006-03-09 2009-07-30 Teradyne Inc V/I-Quelle und Testsystem damit
US10394552B2 (en) * 2016-05-17 2019-08-27 Dropbox, Inc. Interface description language for application programming interfaces
GB201804881D0 (en) 2018-03-27 2018-05-09 Lam Res Ag Method of producing rinsing liquid
CN114089226B (zh) * 2022-01-18 2022-04-12 成都市安比科技有限公司 具有防静电损伤和可控过流保护功能的有源负载检测电路

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3075086A (en) * 1958-01-13 1963-01-22 Raytheon Co Diode bridge sampler and capacitor storage device with feed-back means preventing drift caused by diode leakage
JPS58158566A (ja) * 1982-03-17 1983-09-20 Hitachi Ltd 検査装置
JP2866750B2 (ja) * 1991-01-28 1999-03-08 三菱電機株式会社 半導体試験装置および半導体装置の試験方法
JP3003282B2 (ja) * 1991-06-27 2000-01-24 横河電機株式会社 回路検査装置
JPH06347570A (ja) * 1993-06-04 1994-12-22 Sony Tektronix Corp 時間−電圧変換及びトラックホールド回路
JPH0750099A (ja) * 1993-08-05 1995-02-21 Fujitsu Ltd サンプルホールド回路
JP3448623B2 (ja) * 1994-07-26 2003-09-22 富士通株式会社 荷電粒子ビーム露光方法及び装置
WO1996001475A2 (en) * 1994-07-04 1996-01-18 Philips Electronics N.V. Sampling circuit
US5521493A (en) * 1994-11-21 1996-05-28 Megatest Corporation Semiconductor test system including a novel driver/load circuit
EP0744755A1 (de) * 1995-05-25 1996-11-27 International Business Machines Corporation Prüfungsverfahren und Vorrichtung für Speicherschaltungen auf Halbleitersubstrat
JP3219653B2 (ja) * 1995-09-21 2001-10-15 株式会社テラテック 信号保持回路
US5661690A (en) * 1996-02-27 1997-08-26 Micron Quantum Devices, Inc. Circuit and method for performing tests on memory array cells using external sense amplifier reference current
JPH1082831A (ja) * 1996-09-09 1998-03-31 Yokogawa Electric Corp 能動負荷回路
JPH10188589A (ja) * 1996-12-26 1998-07-21 Canon Inc サンプル・ホールド回路
JP3869541B2 (ja) * 1997-11-20 2007-01-17 オリンパス株式会社 サンプルホールド回路
JP4173229B2 (ja) * 1998-10-09 2008-10-29 株式会社アドバンテスト Ｉｃ試験装置
US6211723B1 (en) * 1999-01-20 2001-04-03 Ltx Corporation Programmable load circuit for use in automatic test equipment
US6232815B1 (en) * 1999-05-06 2001-05-15 Analog Devices, Inc. ATE pin electronics with complementary waveform drivers
JP2000353955A (ja) * 1999-06-11 2000-12-19 Advantest Corp サンプリング・デジタイザ

Also Published As

Publication number Publication date
US20050007180A1 (en) 2005-01-13
EP1491905A1 (de) 2004-12-29
US20070018638A1 (en) 2007-01-25
JP2005017294A (ja) 2005-01-20
EP1491905B1 (de) 2008-08-20
US7495980B2 (en) 2009-02-24
US7129695B2 (en) 2006-10-31

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition