DE60219781D1 - Universelle rückwandvorrichtung und verfahren - Google Patents

Universelle rückwandvorrichtung und verfahren

Info

Publication number
DE60219781D1
DE60219781D1 DE60219781T DE60219781T DE60219781D1 DE 60219781 D1 DE60219781 D1 DE 60219781D1 DE 60219781 T DE60219781 T DE 60219781T DE 60219781 T DE60219781 T DE 60219781T DE 60219781 D1 DE60219781 D1 DE 60219781D1
Authority
DE
Germany
Prior art keywords
reverse device
universal reverse
universal
reverse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60219781T
Other languages
English (en)
Inventor
Doug Caldwell
Albert Garcia Jr
Thomas J Horback
Michael James Lombardi
Mark Mcnicholas
Dean Mize
Gon Wang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Application granted granted Critical
Publication of DE60219781D1 publication Critical patent/DE60219781D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68757—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a coating or a hardness or a material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
DE60219781T 2001-05-18 2002-04-29 Universelle rückwandvorrichtung und verfahren Expired - Lifetime DE60219781D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/861,322 US6645344B2 (en) 2001-05-18 2001-05-18 Universal backplane assembly and methods
PCT/US2002/013423 WO2002095806A1 (en) 2001-05-18 2002-04-29 Universal backplane assembly and methods

Publications (1)

Publication Number Publication Date
DE60219781D1 true DE60219781D1 (de) 2007-06-06

Family

ID=25335492

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60219781T Expired - Lifetime DE60219781D1 (de) 2001-05-18 2002-04-29 Universelle rückwandvorrichtung und verfahren

Country Status (7)

Country Link
US (1) US6645344B2 (de)
EP (1) EP1388162B1 (de)
JP (1) JP4398155B2 (de)
KR (1) KR100884873B1 (de)
DE (1) DE60219781D1 (de)
TW (1) TW546691B (de)
WO (1) WO2002095806A1 (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003253449A (ja) * 2002-02-27 2003-09-10 Sumitomo Electric Ind Ltd 半導体／液晶製造装置
US7279068B2 (en) * 2003-12-15 2007-10-09 Texas Instruments Incorporated Temperature control assembly for use in etching processes
US20060281310A1 (en) * 2005-06-08 2006-12-14 Applied Materials, Inc. Rotating substrate support and methods of use
US7470919B2 (en) * 2005-09-30 2008-12-30 Applied Materials, Inc. Substrate support assembly with thermal isolating plate
US20080026598A1 (en) * 2006-07-26 2008-01-31 Taek Yong Jang Semiconductor manufacturing device and method
KR100829923B1 (ko) * 2006-08-30 2008-05-16 세메스 주식회사 스핀헤드 및 이를 이용하는 기판처리방법
US8905124B2 (en) 2007-06-27 2014-12-09 Taiwan Semiconductor Manufacturing Company, Ltd. Temperature controlled loadlock chamber
CN102598212B (zh) 2010-09-24 2015-07-15 日本碍子株式会社 半导体制造装置部件
US8514552B2 (en) 2010-12-17 2013-08-20 Eaton Corporation Electrical system and matrix assembly therefor
US8445800B2 (en) 2010-12-17 2013-05-21 Eaton Corporation Electrical system, and circuit protection module and electrical switching apparatus therefor
US9421617B2 (en) 2011-06-22 2016-08-23 Tel Nexx, Inc. Substrate holder
US8967935B2 (en) 2011-07-06 2015-03-03 Tel Nexx, Inc. Substrate loader and unloader
US9793144B2 (en) * 2011-08-30 2017-10-17 Evatec Ag Wafer holder and temperature conditioning arrangement and method of manufacturing a wafer
US20140273498A1 (en) * 2013-03-15 2014-09-18 Dainippon Screen Mfg. Co., Ltd. Substrate processing apparatus and substrate processing method
US10032601B2 (en) 2014-02-21 2018-07-24 Varian Semiconductor Equipment Associates, Inc. Platen support structure
JP6338904B2 (ja) 2014-03-24 2018-06-06 株式会社Ｓｃｒｅｅｎホールディングス 基板処理装置
KR20170101985A (ko) * 2014-12-31 2017-09-06 알이씨 실리콘 인코포레이티드 하부 밀봉 장치를 갖는 실리콘 증착 반응기
KR20200124762A (ko) 2018-03-23 2020-11-03 어플라이드 머티어리얼스, 인코포레이티드 격리형 후면 헬륨 전달 시스템
US10927461B2 (en) * 2018-08-31 2021-02-23 Applied Materials, Inc. Gas diffuser support structure for reduced particle generation
TWI721578B (zh) * 2019-09-27 2021-03-11 聚昌科技股份有限公司 快速更換產線之模組化電漿反應腔室結構
KR20220095677A (ko) * 2020-12-30 2022-07-07 세메스 주식회사 온도 측정 유닛을 포함하는 공정 챔버 및 온도 측정 유닛을 포함하는 기판 처리 장치
CN112899627B (zh) * 2021-01-16 2022-09-27 重庆电子工程职业学院 一种靶材安装结构、磁控溅射设备及磁控溅射方法
US20220384214A1 (en) * 2021-05-28 2022-12-01 Taiwan Semiconductor Manufacturing Company Ltd. Method for managing temperature in semiconductor fabrication facility
CN116072015B (zh) * 2023-03-03 2023-06-13 惠科股份有限公司 支撑件及显示装置

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4915564A (en) 1986-04-04 1990-04-10 Materials Research Corporation Method and apparatus for handling and processing wafer-like materials
US4788994A (en) 1986-08-13 1988-12-06 Dainippon Screen Mfg. Co. Wafer holding mechanism
US5168887A (en) 1990-05-18 1992-12-08 Semitool, Inc. Single wafer processor apparatus
JP2939355B2 (ja) * 1991-04-22 1999-08-25 東京エレクトロン株式会社 プラズマ処理装置
US5516732A (en) 1992-12-04 1996-05-14 Sony Corporation Wafer processing machine vacuum front end method and apparatus
US5444217A (en) 1993-01-21 1995-08-22 Moore Epitaxial Inc. Rapid thermal processing apparatus for processing semiconductor wafers
JP3257741B2 (ja) * 1994-03-03 2002-02-18 東京エレクトロン株式会社 プラズマエッチング装置及び方法
AU3553795A (en) * 1994-09-15 1996-03-29 Materials Research Corporation Apparatus and method for clampling a substrate
US6053982A (en) * 1995-09-01 2000-04-25 Asm America, Inc. Wafer support system
JP2726410B2 (ja) * 1996-12-05 1998-03-11 株式会社日立製作所 静電吸着電極
JP3201302B2 (ja) * 1997-02-10 2001-08-20 松下電器産業株式会社 基板のプラズマクリーニング装置
US5879459A (en) * 1997-08-29 1999-03-09 Genus, Inc. Vertically-stacked process reactor and cluster tool system for atomic layer deposition
JP3758009B2 (ja) * 1998-07-01 2006-03-22 日本エー・エス・エム株式会社 半導体処理用の基板保持装置
US6313441B1 (en) * 1999-08-18 2001-11-06 Applied Materials, Inc. Control system and method for providing variable ramp rate operation of a thermal cycling system
JP4700819B2 (ja) 2000-03-10 2011-06-15 キヤノン株式会社 基板保持装置、半導体製造装置および半導体デバイス製造方法
US6310323B1 (en) * 2000-03-24 2001-10-30 Micro C Technologies, Inc. Water cooled support for lamps and rapid thermal processing chamber
US6508883B1 (en) * 2000-04-29 2003-01-21 Advanced Technology Materials, Inc. Throughput enhancement for single wafer reactor

Also Published As

Publication number Publication date
US6645344B2 (en) 2003-11-11
US20020172764A1 (en) 2002-11-21
JP2005501401A (ja) 2005-01-13
JP4398155B2 (ja) 2010-01-13
KR100884873B1 (ko) 2009-02-23
KR20030096408A (ko) 2003-12-24
EP1388162B1 (de) 2007-04-25
WO2002095806A1 (en) 2002-11-28
EP1388162A1 (de) 2004-02-11
TW546691B (en) 2003-08-11

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Legal Events

Date Code Title Description
8332 No legal effect for de