DE602007009170D1 - Schnittstellentestschaltung und Verfahren - Google Patents

Schnittstellentestschaltung und Verfahren

Info

Publication number
DE602007009170D1
DE602007009170D1 DE602007009170T DE602007009170T DE602007009170D1 DE 602007009170 D1 DE602007009170 D1 DE 602007009170D1 DE 602007009170 T DE602007009170 T DE 602007009170T DE 602007009170 T DE602007009170 T DE 602007009170T DE 602007009170 D1 DE602007009170 D1 DE 602007009170D1
Authority
DE
Germany
Prior art keywords
test circuit
interface test
interface
circuit
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602007009170T
Other languages
English (en)
Inventor
Chinsong Sul
Heon C Kim
Gijung Ahn
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Silicon Image Inc
Original Assignee
Silicon Image Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Silicon Image Inc filed Critical Silicon Image Inc
Publication of DE602007009170D1 publication Critical patent/DE602007009170D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/24—Testing correct operation
    • H04L1/245—Testing correct operation by using the properties of transmission codes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
DE602007009170T 2006-11-15 2007-10-31 Schnittstellentestschaltung und Verfahren Active DE602007009170D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US85935506P 2006-11-15 2006-11-15
US11/742,358 US7698088B2 (en) 2006-11-15 2007-04-30 Interface test circuitry and methods

Publications (1)

Publication Number Publication Date
DE602007009170D1 true DE602007009170D1 (de) 2010-10-28

Family

ID=39205047

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602007009170T Active DE602007009170D1 (de) 2006-11-15 2007-10-31 Schnittstellentestschaltung und Verfahren

Country Status (7)

Country Link
US (1) US7698088B2 (de)
EP (1) EP1924020B1 (de)
JP (1) JP5697833B2 (de)
KR (1) KR101499922B1 (de)
CN (1) CN101183327B (de)
DE (1) DE602007009170D1 (de)
TW (1) TWI363184B (de)

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EP3408935B1 (de) 2016-01-25 2023-09-27 Kandou Labs S.A. Spannungssamplertreiber mit verbesserter hochfrequenzverstärkung
CN105847077B (zh) * 2016-03-17 2019-03-08 华为技术有限公司 一种检测多路串行数据冲突的方法及装置、设备
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US10003454B2 (en) 2016-04-22 2018-06-19 Kandou Labs, S.A. Sampler with low input kickback
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CN110888036B (zh) * 2018-09-07 2022-02-15 长鑫存储技术有限公司 测试项目确定方法及装置、存储介质和电子设备
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Also Published As

Publication number Publication date
TW200821603A (en) 2008-05-16
CN101183327A (zh) 2008-05-21
US7698088B2 (en) 2010-04-13
JP5697833B2 (ja) 2015-04-08
TWI363184B (en) 2012-05-01
EP1924020B1 (de) 2010-09-15
KR101499922B1 (ko) 2015-03-18
EP1924020A1 (de) 2008-05-21
JP2008122399A (ja) 2008-05-29
KR20080044199A (ko) 2008-05-20
CN101183327B (zh) 2012-07-04
US20080114562A1 (en) 2008-05-15

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