DE602004011809D1 - Tstelle - Google Patents

Tstelle

Info

Publication number
DE602004011809D1
DE602004011809D1 DE602004011809T DE602004011809T DE602004011809D1 DE 602004011809 D1 DE602004011809 D1 DE 602004011809D1 DE 602004011809 T DE602004011809 T DE 602004011809T DE 602004011809 T DE602004011809 T DE 602004011809T DE 602004011809 D1 DE602004011809 D1 DE 602004011809D1
Authority
DE
Germany
Prior art keywords
pull
voltage reference
reference node
calibration terminal
switch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602004011809T
Other languages
English (en)
Other versions
DE602004011809T2 (de
Inventor
John Zumkehr
James Chandler
Ray Chiang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intel Corp
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Publication of DE602004011809D1 publication Critical patent/DE602004011809D1/de
Application granted granted Critical
Publication of DE602004011809T2 publication Critical patent/DE602004011809T2/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/22—Control and timing of internal memory operations
    • G11C2207/2254—Calibration

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Dram (AREA)
  • Logic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Bipolar Transistors (AREA)
  • Magnetic Heads (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Tests Of Electronic Circuits (AREA)
DE602004011809T 2003-11-14 2004-11-05 Interne spannungsdifferenz für eine speicherschnittstelle Active DE602004011809T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/714,075 US7095245B2 (en) 2003-11-14 2003-11-14 Internal voltage reference for memory interface
US714075 2003-11-14
PCT/US2004/036825 WO2005050656A1 (en) 2003-11-14 2004-11-05 Internal voltage reference for memory interface

Publications (2)

Publication Number Publication Date
DE602004011809D1 true DE602004011809D1 (de) 2008-03-27
DE602004011809T2 DE602004011809T2 (de) 2009-02-05

Family

ID=34573880

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004011809T Active DE602004011809T2 (de) 2003-11-14 2004-11-05 Interne spannungsdifferenz für eine speicherschnittstelle

Country Status (8)

Country Link
US (1) US7095245B2 (de)
EP (1) EP1683156B1 (de)
JP (1) JP4422153B2 (de)
CN (1) CN1906696B (de)
AT (1) ATE386326T1 (de)
DE (1) DE602004011809T2 (de)
TW (1) TWI294217B (de)
WO (1) WO2005050656A1 (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4944793B2 (ja) * 2005-12-15 2012-06-06 株式会社アドバンテスト 試験装置、及びピンエレクトロニクスカード
US7729168B2 (en) 2007-06-28 2010-06-01 Intel Corporation Reduced signal level support for memory devices
US20090009212A1 (en) * 2007-07-02 2009-01-08 Martin Brox Calibration system and method
US7936812B2 (en) * 2007-07-02 2011-05-03 Micron Technology, Inc. Fractional-rate decision feedback equalization useful in a data transmission system
KR101001635B1 (ko) * 2008-06-30 2010-12-17 주식회사 하이닉스반도체 반도체 패키지, 이를 갖는 적층 반도체 패키지 및 적층반도체 패키지의 하나의 반도체 칩 선택 방법
US7830285B2 (en) * 2008-07-10 2010-11-09 Lantiq Deutschland Gmbh Circuit with calibration circuit portion
US7859298B1 (en) * 2009-06-30 2010-12-28 Intel Corporation Method and system to facilitate configurable input/output (I/O) termination voltage reference
DE112011106018B4 (de) * 2011-12-23 2017-08-03 Intel Corporation Leistungsdrosselung des dynamischen Speichers
US8797084B2 (en) 2012-08-31 2014-08-05 International Business Machines Corporation Calibration schemes for charge-recycling stacked voltage domains
US9715467B2 (en) 2012-11-26 2017-07-25 Rambus Inc. Calibration protocol for command and address bus voltage reference in low-swing single-ended signaling
CN104076896B (zh) * 2014-06-24 2016-09-21 北京空间机电研究所 一种高等级ddr供电电路
CN105304110B (zh) * 2015-11-26 2019-02-12 上海兆芯集成电路有限公司 数据接收芯片的控制方法
CN105489235B (zh) * 2015-11-26 2019-04-09 上海兆芯集成电路有限公司 数据接收芯片
CN105321577B (zh) * 2015-11-26 2018-09-14 上海兆芯集成电路有限公司 数据接收芯片
CN105469817B (zh) * 2015-11-26 2018-06-12 上海兆芯集成电路有限公司 数据接收芯片
US9911469B1 (en) * 2016-11-10 2018-03-06 Micron Technology, Inc. Apparatuses and methods for power efficient driver circuits
CN107315442B (zh) * 2017-06-30 2019-04-30 上海兆芯集成电路有限公司 控制器与参考电压产生方法
KR20190099933A (ko) * 2018-02-20 2019-08-28 삼성전자주식회사 외부의 전압을 기반으로 동작 모드를 결정하는 메모리 장치 및 그 동작방법
CN110597529A (zh) * 2019-09-29 2019-12-20 上海菱沃铂智能技术有限公司 一种用于微控制器参数校准的烧录器及烧录方法
JP7369597B2 (ja) 2019-11-11 2023-10-26 ニデックインスツルメンツ株式会社 エンコーダ

Family Cites Families (19)

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Publication number Priority date Publication date Assignee Title
US5206140A (en) * 1988-06-24 1993-04-27 Research Corporation Technologies, Inc. Assay for soluble crosslinked fibrin polymers
DE69309196T2 (de) * 1992-08-31 1997-08-07 Sgs Thomson Microelectronics Ausgangstreiber einer integrierten Schaltung
US6137720A (en) * 1997-11-26 2000-10-24 Cypress Semiconductor Corporation Semiconductor reference voltage generator having a non-volatile memory structure
US6309888B1 (en) * 1998-09-04 2001-10-30 Leuven Research & Development Vzw Detection and determination of the stages of coronary artery disease
US6226205B1 (en) 1999-02-22 2001-05-01 Stmicroelectronics, Inc. Reference voltage generator for an integrated circuit such as a dynamic random access memory (DRAM)
US6246258B1 (en) * 1999-06-21 2001-06-12 Xilinx, Inc. Realizing analog-to-digital converter on a digital programmable integrated circuit
US6316980B1 (en) * 2000-06-30 2001-11-13 Intel Corporation Calibrating data strobe signal using adjustable delays with feedback
US6445245B1 (en) * 2000-10-06 2002-09-03 Xilinx, Inc. Digitally controlled impedance for I/O of an integrated circuit device
JP4128763B2 (ja) * 2000-10-30 2008-07-30 株式会社東芝 電圧切り替え回路
US6617895B2 (en) * 2001-03-30 2003-09-09 Intel Corporation Method and device for symmetrical slew rate calibration
US6456544B1 (en) * 2001-03-30 2002-09-24 Intel Corporation Selective forwarding of a strobe based on a predetermined delay following a memory read command
US6629225B2 (en) * 2001-05-31 2003-09-30 Intel Corporation Method and apparatus for control calibration of multiple memory modules within a memory channel
US6581017B2 (en) * 2001-06-28 2003-06-17 Intel Corporation System and method for minimizing delay variation in double data rate strobes
US6918048B2 (en) * 2001-06-28 2005-07-12 Intel Corporation System and method for delaying a strobe signal based on a slave delay base and a master delay adjustment
US6636821B2 (en) * 2001-07-03 2003-10-21 International Business Machines Corporation Output driver impedance calibration circuit
US6461828B1 (en) * 2001-09-04 2002-10-08 Syn X Pharma Conjunctive analysis of biological marker expression for diagnosing organ failure
US6965529B2 (en) * 2002-06-21 2005-11-15 Intel Coproration Memory bus termination
US7036053B2 (en) * 2002-12-19 2006-04-25 Intel Corporation Two dimensional data eye centering for source synchronous data transfers
US6922077B2 (en) * 2003-06-27 2005-07-26 Intel Corporation Hybrid compensated buffer design

Also Published As

Publication number Publication date
US7095245B2 (en) 2006-08-22
CN1906696A (zh) 2007-01-31
CN1906696B (zh) 2010-05-05
JP2007520839A (ja) 2007-07-26
WO2005050656A1 (en) 2005-06-02
ATE386326T1 (de) 2008-03-15
TWI294217B (en) 2008-03-01
EP1683156A1 (de) 2006-07-26
JP4422153B2 (ja) 2010-02-24
US20050104624A1 (en) 2005-05-19
EP1683156B1 (de) 2008-02-13
TW200529559A (en) 2005-09-01
DE602004011809T2 (de) 2009-02-05

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Legal Events

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