DE602004010737D1 - Massenspektrometer und seine Verwendung - Google Patents

Massenspektrometer und seine Verwendung

Info

Publication number
DE602004010737D1
DE602004010737D1 DE602004010737T DE602004010737T DE602004010737D1 DE 602004010737 D1 DE602004010737 D1 DE 602004010737D1 DE 602004010737 T DE602004010737 T DE 602004010737T DE 602004010737 T DE602004010737 T DE 602004010737T DE 602004010737 D1 DE602004010737 D1 DE 602004010737D1
Authority
DE
Germany
Prior art keywords
mass spectrometer
spectrometer
mass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004010737T
Other languages
English (en)
Other versions
DE602004010737T2 (de
Inventor
Izumi Waki
Akihiko Okumura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of DE602004010737D1 publication Critical patent/DE602004010737D1/de
Application granted granted Critical
Publication of DE602004010737T2 publication Critical patent/DE602004010737T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/401—Time-of-flight spectrometers characterised by orthogonal acceleration, e.g. focusing or selecting the ions, pusher electrode
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
    • H01J49/4215—Quadrupole mass filters
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
DE602004010737T 2003-02-24 2004-01-30 Massenspektrometer und seine Verwendung Expired - Lifetime DE602004010737T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2003045345 2003-02-24
JP2003045345A JP2004259452A (ja) 2003-02-24 2003-02-24 質量分析装置及び質量分析方法

Publications (2)

Publication Number Publication Date
DE602004010737D1 true DE602004010737D1 (de) 2008-01-31
DE602004010737T2 DE602004010737T2 (de) 2008-12-04

Family

ID=32866506

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004010737T Expired - Lifetime DE602004010737T2 (de) 2003-02-24 2004-01-30 Massenspektrometer und seine Verwendung

Country Status (4)

Country Link
US (1) US7034287B2 (de)
EP (1) EP1467397B1 (de)
JP (1) JP2004259452A (de)
DE (1) DE602004010737T2 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007060760A1 (ja) * 2005-11-22 2007-05-31 Shimadzu Corporation 質量分析装置
CA2636822C (en) * 2006-01-11 2015-03-03 Mds Inc., Doing Business Through Its Mds Sciex Division Fragmenting ions in mass spectrometry
JP5214607B2 (ja) * 2006-08-25 2013-06-19 サーモ フィニガン リミテッド ライアビリティ カンパニー 質量分析計での解離型のデータ依存式選択
JP5081436B2 (ja) * 2006-11-24 2012-11-28 株式会社日立ハイテクノロジーズ 質量分析装置及び質量分析方法
GB0817433D0 (en) * 2008-09-23 2008-10-29 Thermo Fisher Scient Bremen Ion trap for cooling ions
CN102169791B (zh) * 2010-02-05 2015-11-25 岛津分析技术研发（上海）有限公司 一种串级质谱分析装置及质谱分析方法
GB201103854D0 (en) 2011-03-07 2011-04-20 Micromass Ltd Dynamic resolution correction of quadrupole mass analyser
CN103594324B (zh) * 2012-08-14 2016-04-06 上海华质生物技术有限公司 四极杆分析器与3d离子阱分析器串接的装置
CN104769425B (zh) * 2012-11-13 2017-08-25 株式会社岛津制作所 串联四极型质量分析装置
GB201314977D0 (en) 2013-08-21 2013-10-02 Thermo Fisher Scient Bremen Mass spectrometer
US9711341B2 (en) * 2014-06-10 2017-07-18 The University Of North Carolina At Chapel Hill Mass spectrometry systems with convective flow of buffer gas for enhanced signals and related methods
JPWO2018138838A1 (ja) * 2017-01-26 2019-06-27 株式会社島津製作所 質量分析方法及び質量分析装置
WO2018163926A1 (ja) * 2017-03-06 2018-09-13 株式会社島津製作所 タンデム型質量分析装置及び該装置用プログラム
US10964521B2 (en) 2017-07-18 2021-03-30 Shimadzu Corporation Mass spectrometer

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT528250A (de) * 1953-12-24
JP2735596B2 (ja) * 1989-01-20 1998-04-02 出光石油化学株式会社 スチレン系重合体の製造方法
JP3671354B2 (ja) * 1994-02-28 2005-07-13 アナリチカ オブ ブランフォード，インコーポレーテッド 質量分析用の多重極イオンガイド
US6011259A (en) * 1995-08-10 2000-01-04 Analytica Of Branford, Inc. Multipole ion guide ion trap mass spectrometry with MS/MSN analysis
US5521381A (en) * 1994-12-12 1996-05-28 The Regents Of The University Of California Contamination analysis unit
US5572022A (en) * 1995-03-03 1996-11-05 Finnigan Corporation Method and apparatus of increasing dynamic range and sensitivity of a mass spectrometer
US5484862A (en) * 1995-03-10 1996-01-16 The Dow Chemical Company Liquid phase powder bed syndiotactic vinylaromatic polymerization
US5696376A (en) * 1996-05-20 1997-12-09 The Johns Hopkins University Method and apparatus for isolating ions in an ion trap with increased resolving power
DE19631365A1 (de) * 1996-08-02 1998-02-05 Basf Ag Verfahren zur Herstellung von teilkristallinen syndiotaktischen Polymerisaten aus vinylaromatischen Monomeren
US6228795B1 (en) * 1997-06-05 2001-05-08 Exxon Chemical Patents, Inc. Polymeric supported catalysts
ATE398635T1 (de) * 1997-06-05 2008-07-15 Exxonmobil Chem Patents Inc Katalysator auf polymerträger zur polymerisation von olefinen
DE69807497T2 (de) * 1997-08-27 2003-04-24 Dow Chemical Co Syndiotaktische vinylaromatische polymerisation unter verwendung von mehrstufen-serienreaktoren
US6096677A (en) * 1997-10-17 2000-08-01 Sri International Supported metallocene catalysts
EP1196940A2 (de) * 1999-06-11 2002-04-17 Perseptive Biosystems, Inc. Tandemflugzeitmassenspektrometer mit stosszellendämpfung und verfahren zu seiner anwendung
JP3855593B2 (ja) 2000-04-14 2006-12-13 株式会社日立製作所 質量分析装置
WO2002048699A2 (en) * 2000-12-14 2002-06-20 Mds Inc. Doing Business As Mds Sciex Apparatus and method for msnth in a tandem mass spectrometer system
US6627883B2 (en) * 2001-03-02 2003-09-30 Bruker Daltonics Inc. Apparatus and method for analyzing samples in a dual ion trap mass spectrometer
JP3971958B2 (ja) * 2002-05-28 2007-09-05 株式会社日立ハイテクノロジーズ 質量分析装置

Also Published As

Publication number Publication date
EP1467397A3 (de) 2006-03-22
JP2004259452A (ja) 2004-09-16
US7034287B2 (en) 2006-04-25
US20040164240A1 (en) 2004-08-26
EP1467397A2 (de) 2004-10-13
DE602004010737T2 (de) 2008-12-04
EP1467397B1 (de) 2007-12-19

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